1. A thin-film piezoelectric element, comprising a pair of electrode layers and a piezoelectric thin film sandwiched between the pair of electrode layers, wherein a surface roughness P-V of an interface between the piezoelectric thin film and at least one of the pair of electrode layers is 220 nm or more and 500 nm or less, wherein the surface roughness P-V is defined by a difference between a maximum height (peak value P) and a minimum height (valley value V).
2. The thin-film piezoelectric element according to claim 1, wherein a surface roughness Ra of the interface is 90 nm or more and 220 nm or less, and the surface roughness Ra is larger than an average crystal grain size of crystal grains constituting the piezoelectric thin film.
3. The thin-film piezoelectric element according to claim 1, wherein the piezoelectric thin film has a thickness of 220 nm or more and 3000 nm or less.
4. The thin-film piezoelectric element according to claim 1, wherein the piezoelectric thin film is a potassium sodium niobate-based piezoelectric thin film.
5. A thin-film piezoelectric actuator comprising the thin-film piezoelectric element according to claim 1.
6. A thin-film piezoelectric sensor comprising the thin-film piezoelectric element according to claim 1.
7. A hard disk drive comprising the thin-film piezoelectric actuator according to claim 5.
8. An ink jet printer apparatus comprising the thin-film piezoelectric actuator according to claim 5.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An apparatus, comprising:
a filter configured to allow high frequencies of interest to pass through the filter;
an antenna configured to receive the high frequencies of interest; and
a plurality of bolometers configured to measure data regarding the high frequencies of interest received by the antenna.
2. The apparatus of claim 1, wherein the filter comprises a plurality of holes configured to allow high frequencies of interest to pass through the filter.
3. The apparatus of claim 1, wherein the filter comprises a plurality of square holes configured to allow high frequencies of interest to pass through the filter.
4. The apparatus of claim 1, further comprising:
a dielectric coating between the antenna and the filter configured to increase an absorption bandwidth; and.
a resonant absorber configured to reflect the high frequencies of interest received from the filter back to the antenna.
5. The apparatus of claim 4, further comprising:
a first vacuum gap between the dielectric coating and the antenna; and
a second vacuum gap between the antenna and the resonant absorber.
6. The apparatus of claim of claim 1, wherein the antenna comprises:
one or more slots configured to receive the high frequencies of interest, and
a plurality of leads, wherein each lead operatively connects a slot to a bolometer such that the bolometer is configured to measure data regarding the high frequencies of interest.
7. The apparatus of claim 6, wherein, when the antenna is a dual slot antenna, a first slot and a second slot are separated by a distance of \u02dc2(\u03bbn), where \u03bb is a wavelength of the frequency of interest and n is an index over a fraction of the square root of the effective dielectric constant.
8. The apparatus of claim 6, wherein, when the antenna is a single slot antenna, then a length of the slot is \u03bbmax\u2208eff12, where \u03bbmax represents a largest wavelength intended to detect more than one frequency and \u2208eff12 represents the square root of the effective dielectric constant.
9. The apparatus of claim 1, wherein the antenna and the filter are separated by a distance based on 2*(speed of light in a vacuum)(radio frequency signal bandwidth).
10. The apparatus of claim 1, further comprising:
wiring connecting each bolometer to an amplifier configured to transmit data read by each bolometer to the amplifier.
11. An apparatus, comprising:
a quasioptical filter configured to prevent frequencies below a cut-off from passing through the filter; and
an antenna with a single slot having a plurality of tap points configured to receive and measure high frequencies of interest ranging between 1 terahertz and 10 terahertz.
12. The apparatus of claim 11, wherein the quasioptical filter comprises a plurality of circular, square, rectangular, or elliptical holes configured to allow high frequencies of interest to pass through the filter.
13. The apparatus of claim 11, further comprising:
a dielectric coating between the antenna and the filter configured to increase an absorption of the frequencies of interest; and.
a resonant absorber configured to reflect the high frequencies of interest received from the filter back to the antenna.
14. The apparatus of claim 13, further comprising:
a first vacuum gap between the dielectric coating and the antenna; and
a second vacuum gap between the antenna and the resonant absorber.
15. The apparatus of claim 11, further comprising:
a plurality of leads placed at different tap points and across the single slot in order to allow measurements at different frequencies of interest.
16. The apparatus of claim 15, further comprising:
a plurality of bolometers, each bolometer connected to a corresponding lead, and configured to measure data regarding the frequencies of interest.
17. An apparatus, comprising:
a quasioptical filter configured to prevent frequencies below a cut-off from passing through the filter; and
an antenna with a plurality of slots, each slot configured with a plurality of tap points to receive high frequencies in order to allow measurements of high frequencies of interest ranging between 1 terahertz and 10 terahertz.
18. The apparatus of claim 17, wherein the quasioptical filter comprises a plurality of circular, rectangular, square, or elliptical holes configured to allow high frequencies of interest to pass through the filter.
19. The apparatus of claim 17, further comprising:
a dielectric coating between the antenna and the filter configured to increase an absorption of the frequencies of interest; and.
a resonant absorber configured to reflect the high frequencies of interest received from the filter back to the antenna.
20. The apparatus of claim 17, wherein the antenna and the filter are separated by a distance based on 2*(speed of light in a vacuum)(RF signal bandwidth).