1. A film for a display comprising a cellulose ester and a compound represented by Formula (I) or (Ia):
wherein R2 to R5 each independently represent a hydrogen atom or a substituent; R2 and R3, R3 and R4, and R4 and R5 may be combined to form a ring; R6 represents a hydrogen atom or a substituent; n represents an integer of 1-4; when n equals to 1, R1 represents a substituent; and when n is 2-4, R1 represents a di- to tetra-valent linkage group,
wherein n represents an integer of 2 to 4; m represents an integer of 1-3; R1a and R6a each independently represent a hydrogen atom or a substituent; Rta represents a hydrogen atom or a substituent; a plurality of Rta may be combined to form a ring; and Rka represents a di- to tetra-valent linkage group.
2. The film for a display of claim 1, wherein
R1 in Formula (I) is a conjugated substituent when n is 1; or
R1a in Formula (Ia) is a conjugated substituent when n is 1.
3. The film for a display of claim 1, wherein the compound represented by Formula (I) is a compound represented by Formula (I-1):
wherein R2 to R5 each independently represent a hydrogen atom or a substituent; R7 to R11 each independently represent a hydrogen atom, an alkyl group having 1 to 18 carbon atoms or an alkoxy group having 1 to 18 carbon atoms.
4. The film for a display of claim 1, wherein a sum of Hammett’s \u03c3p values of R7 to R11 is 0 or less.
5. The film for a display of claim 1, wherein the compound represented by Formula (I) is a compound represented by Formula (I-2):
wherein R2 to R5 each independently represent a hydrogen atom or a substituent.
6. The film for a display of claim 1, wherein R5 in Formula (I) is a hydrogen atom.
7. The film for a display of claim 1, wherein the compound represented by Formula (Ia) is a compound represented by Formula (I-3):
wherein R1, R2, R3, R5 and R6 each independently represent a hydrogen atom or a substituent; R2 and R3 may be combined to form a ring; and X represents a divalent linkage group.
8. The film for a display of claim 1 further comprising a compound represented by Formula (A):
wherein R11 to R16 each independently represent a hydrogen atom or a substituent.
9. The film for a display of claim 1 further comprising a phosphonite compound.
10. The film for a display of claim 1, wherein a transmittance of the film for a light flux having a wavelength of 450 nm is 90% or more.
11. The film for a display of claim 1, wherein the cellulose ester is a mixed fatty acids ester.
12. The film for a display of claim 1, wherein a total number of carbon atoms contained in acyl groups in one glucose unit of the cellulose ester is 6.1 to 7.5, wherein the total number of carbon atoms represents a sum of each product of a number of carbon atoms of each acyl group multiplied by a substitution degree of the acyl group, wherein the substitution degree represents an average number of 3 hydroxyl groups replaced with an acyl group in one glucose unit of the cellulose ester.
13. The film for a display of claim 1, wherein the film is a long length film wound in a roll.
14. A polarizing plate protective film for a liquid crystal display comprising the film for a display of claim 1.
15. The polarizing plate protective film of claim 14, wherein the polarizing plate protective film is a long length film wound in a roll.
16. A polarizing plate comprising the polarizing plate protective film of claim 14 provided on at least one surface of a polarizer film.
17. A polarizing plate comprising the polarizing plate protective film of claim 15 provided on at least one surface of a polarizer film.
18. A method to produce the polarizing plate of claim 17 comprising the steps of:
(i) producing the long length polarizing plate protective film;
(ii) winding the long length polarizing plate protective film in a roll; and
(iii) winding back the long length polarizing plate protective film from the roll and laminating the polarizing plate protective film with a polarizer film to form a polarizing plate.
19. A method to produce a polarizing plate comprising the steps of:
(a) melting a mixture of a cellulose ester and a compound represented by a formula selected from the group consisting of Formulas (I), (Ia), (I-1), (I-2) and (I-3);
(b) extruding the melt of the mixture to form a film;
(c) cooling the extruded film on a substrate;
(d) peeling the film from the substrate;
(e) stretching the film; and
(f) laminating the film with a polarizer film to form a polarizing plate:
wherein R2 to R5 each independently represent a hydrogen atom or a substituent; R2 and R3, R3 and R4, and R4 and R5 may be combined to form a ring; R6 represents a hydrogen atom or a substituent; n represents an integer of 1-4; when n equals to 1, R1 represents a substituent; and when n is 2-4, R1 represents a di- to tetra-valent linkage group,
wherein n represents an integer of 2 to 4; m represents an integer of 1-3; R1a and R6a each independently represent a hydrogen atom or a substituent; Rta represents a hydrogen atom or a substituent; a plurality of Rta may be combined to from a ring; and Rka represents a di- to tetra-valent linkage group,
wherein R2 to R5 each independently represent a hydrogen atom or a substituent; R7 to R11 each independently represent a hydrogen atom, an alkyl group having 1 to 18 carbon atoms or an alcokyl group having 1 to 18 carbon atoms,
wherein R2 to R5 each independently represent a hydrogen atom or a substituent,
wherein R1, R2, R3, R5 and R6 each independently represent a hydrogen atom or a substituent; R2 and R3 may be combined to form a ring; and X represents a divalent linkage group.
20. A liquid crystal display comprising the polarizing plate of claim 16 provided on at least one surface of a liquid crystal cell.
21. A liquid crystal display comprising a polarizing plate produced by the method of claim 18 provided on at least one surface of a liquid crystal cell.
22. A liquid crystal display comprising a polarizing plate produced by the method of claim 19 provided on at least one surface of a liquid crystal cell.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A spatial frequency optical measurement instrument (100), comprising:
a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information;
a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material; and
a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.
2. The instrument (100) of claim 1, with interacting the light with the sample material comprising substantially passing the light through the sample material.
3. The instrument (100) of claim 1, with interacting the light with the sample material comprising substantially reflecting the encoded light off of the sample material.
4. The instrument (100) of claim 1, further comprising one or more optical components (150) configured to define a spatial frequency image of the spatial frequency mask (120) at the light receiver (140), with the spatial frequency image substantially including the spatial frequency information.
5. The instrument (100) of claim 1, further comprising a light source (110) configured to emit the light along the light path.
6. The instrument (100) of claim 5, with the light source (110) further comprising a powered light source.
7. The instrument (100) of claim 5, with the light source (110) further comprising an ambient light source.
8. The instrument (100) of claim 1, with the spatial frequency mask (120) being located before the sample material and encoding light that has not interacted with the sample material.
9. The instrument (100) of claim 1, with the spatial frequency mask (120) being located after the sample material and encoding light that has interacted with the sample material.
10. The instrument (100) of claim 1, with the spatial frequency mask (120) comprising light blocking and light transmitting regions that encode the spatial frequency information.
11. The instrument (100) of claim 1, with the spatial frequency mask (120) comprising a series of spatially varying blocking and light transmitting regions that encode the spatial frequency information.
12. The instrument (100) of claim 1, with the spatial frequency mask (120) comprising a series of apertures (123) that encode the spatial frequency information.
13. The instrument (100) of claim 1, with the spatial frequency mask (120) comprising a series of spatially varying apertures (123) that encode the spatial frequency information.
14. The instrument (100) of claim 1, wherein a light path length through the sample material can be varied in order to vary the change in spatial frequency information.
15. The instrument (100) of claim 1, wherein the light path includes one or more excursions through or reflections from the sample material.
16. The instrument (100) of claim 1, wherein the light path includes one or more excursions through or reflections from the sample material and wherein the number of excursions or reflections can be varied in order to vary the spatial frequency information.
17. The instrument (100) of claim 1, with the spatial frequency information being substantially independent of the intensity or composition of the light.
18. The instrument (100) of claim 1, with the change in the spatial frequency information including a change to a content or organization of the spatial frequency information.
19. The instrument (100) of claim 1, with the change in the spatial frequency information including a change to one or more of a line, an edge, a bar pattern, a sinusoidal pattern, or a point function of the spatial frequency information.
20. The instrument (100) of claim 1, with determining the change in the spatial frequency information comprising determining a change in the spatial frequency information from a predetermined standard.
21. The instrument (100) of claim 1, with determining the change in the spatial frequency information comprising determining a change in contrast in the spatial frequency information from a predetermined contrast standard.
22. The instrument (100) of claim 1, with the processing system (180) further determining a particulate concentration in a media of the sample material based on the change in the spatial frequency information.
23. The instrument (100) of claim 22, with determining the particulate concentration further comprising comparing the spatial frequency information to one or more predetermined particulate concentration images and interpolating andor extrapolating a particulate concentration value from the one or more predetermined particulate concentration images.
24. The instrument (100) of claim 1, with the processing system (180) further determining one or more surface characteristics of the sample material.
25. The instrument (100) of claim 24, with determining the one or more surface characteristics further comprising comparing the spatial frequency information to one or more predetermined surface images and interpolating andor extrapolating the one or more surface characteristics from the one or more predetermined surface images.
26. The instrument (100) of claim 1, wherein a first portion of the encoded light is reflected onto a first light receiver (140) without interacting with the sample material and wherein a second portion of the encoded light is interacted with the sample material and wherein the second portion of the encoded light is compared to the first portion.
27. The instrument (100) of claim 1, with the light comprising a first light portion interacting with the spatial frequency mask (120) and the sample material to form a spatial frequency image and with the light further comprising a second light portion interacting with a predetermined standard material to form a predetermined standard image, wherein the change in the spatial frequency information comprising a difference between the spatial frequency image and the predetermined standard image.
28. A spatial frequency optical measurement method, comprising:
encoding light with spatial frequency information;
interacting the light with a sample material; and
determining a change in the spatial frequency information due to the interaction of the light with the sample material.
29. The method of claim 28, with encoding the light comprising interacting the light with a spatial frequency mask positioned in a light path.
30. The method of claim 28, with encoding the light comprising interacting the light with a spatial frequency mask positioned in a light path, with the spatial frequency mask comprising light blocking and light transmitting regions that encode the spatial frequency information.
31. The method of claim 28, with encoding the light comprising interacting the light with a spatial frequency mask positioned in a light path, with the spatial frequency mask comprising a series of spatially varying light blocking and light transmitting regions that encode the spatial frequency information.
32. The method of claim 28, with encoding the light comprising interacting the light with a spatial frequency mask positioned in a light path, with the spatial frequency mask comprising a series of apertures that encode the spatial frequency information.
33. The method of claim 28, with encoding the light comprising interacting the light with a spatial frequency mask positioned in a light path, with the spatial frequency mask comprising a series of spatially varying apertures that encode the spatial frequency information.
34. The method of claim 28, with interacting the light with the sample material comprising substantially passing the light through the sample material.
35. The method of claim 28, with interacting the light with the sample material comprising substantially reflecting the encoded light off of the sample material.
36. The method of claim 28, wherein a light path length through the sample material can be varied in order to vary the change in spatial frequency information.
37. The method of claim 28, wherein a light path includes one or more excursions through or reflections from the sample material.
38. The method of claim 28, wherein a light path includes one or more excursions through or reflections from the sample material and wherein a number of excursions or reflections can be varied in order to vary the change in spatial frequency information.
39. The method of claim 28, with spatial frequency information being substantially independent of the intensity or composition of the light.
40. The method of claim 28, with the change in the spatial frequency information including a change to a content or organization of the spatial frequency information.
41. The method of claim 28, with the change in the spatial frequency information including a change to one or more of a line, an edge, a bar pattern, a sinusoidal pattern, or a point function of the spatial frequency information.
42. The method of claim 28, with determining the change in the spatial frequency information comprising determining a change in the spatial frequency information from a predetermined standard.
43. The method of claim 28, with determining the change in the spatial frequency information comprising determining a change in contrast in the spatial frequency information from a predetermined contrast standard.
44. The method of claim 28, with the processing system further determining a particulate concentration in a media of the sample material based on the change in the spatial frequency information.
45. The method of claim 44, with determining the particulate concentration further comprising:
comparing the spatial frequency information to one or more predetermined particulate concentration images; and
interpolating andor extrapolating a particulate concentration value from the one or more predetermined particulate concentration images.
46. The method of claim 28, with the processing system further determining one or more surface characteristics of the sample material based on the change in the spatial frequency information.
47. The method of claim 46, with determining the one or more surface characteristics further comprising:
comparing the spatial frequency information to one or more predetermined surface images; and
interpolating andor extrapolating the one or more surface characteristics from the one or more predetermined surface images.
48. The method of claim 28, wherein a first portion of the encoded light is reflected onto a first light receiver without interacting with the sample material and wherein a second portion of the encoded light is interacted with the sample material and wherein the second portion of the encoded light is compared to the first portion.
49. The method of claim 28, with the light comprising a first light portion interacting with the spatial frequency mask and the sample material to form a spatial frequency image and with the light further comprising a second light portion interacting with a predetermined standard material to form a predetermined standard image, wherein the change in the spatial frequency information comprising a difference between the spatial frequency image and the predetermined standard image.
50. A spatial frequency optical measurement method, comprising:
interacting light with a sample material;
reflecting and encoding the light with spatial frequency information; and
determining a change in the spatial frequency information due to the interaction of the light with the sample material.
51. The method of claim 50, with reflecting and encoding the light comprising interacting the light with a reflective spatial frequency mask positioned in a light path.
52. The method of claim 50, with reflecting and encoding the light comprising interacting the light with a reflective spatial frequency mask positioned in a light path, with the reflective spatial frequency mask comprising light reflecting and non-reflecting regions that encode the spatial frequency information.
53. The method of claim 50, with reflecting and encoding the light comprising interacting the light with a reflective spatial frequency mask positioned in a light path, with the reflective spatial frequency mask comprising a series of spatially varying light reflecting and non-reflecting regions that encode the spatial frequency information.
54. The method of claim 50, with reflecting and encoding the light comprising interacting the light with a reflective spatial frequency mask positioned in a light path, with the reflective spatial frequency mask comprising a series of apertures that encode the spatial frequency information.
55. The method of claim 50, with reflecting and encoding the light comprising interacting the light with a reflective spatial frequency mask positioned in a light path, with the reflective spatial frequency mask comprising a series of spatially varying apertures that encode the spatial frequency information.
56. The method of claim 50, with interacting the light with the sample material comprising substantially passing the light through the sample material.
57. The method of claim 50, wherein a light path length through the sample material can be varied in order to vary the change in spatial frequency information.
58. The method of claim 50, wherein a light path includes one or more excursions through the sample material.
59. The method of claim 50, wherein a light path includes one or more excursions through the sample material and wherein a number of excursions can be varied in order to vary the spatial frequency information.
60. The method of claim 50, with spatial frequency information being substantially independent of the intensity or composition of the light.
61. The method of claim 50, with the change in the spatial frequency information including a change to a content or organization of the spatial frequency information.
62. The method of claim 50, with the change in the spatial frequency information including a change to one or more of a line, an edge, a bar pattern, a sinusoidal pattern, or a point function of the spatial frequency information.
63. The method of claim 50, with determining the change in the spatial frequency information comprising determining a change in the spatial frequency information from a predetermined standard.
64. The method of claim 50, with determining the change in the spatial frequency information comprising determining a change in contrast in the spatial frequency information from a predetermined contrast standard.
65. The method of claim 50, with the processing system further determining a particulate concentration in a media of the sample material based on the change in the spatial frequency information.
66. The method of claim 65, with determining the particulate concentration further comprising:
comparing the spatial frequency information to one or more predetermined particulate concentration images; and
interpolating andor extrapolating a particulate concentration value from the one or more predetermined particulate concentration images.
67. The method of claim 50, with the processing system further determining one or more surface characteristics of the sample material based on the change in the spatial frequency information.
68. The method of claim 67, with determining the one or more surface characteristics further comprising:
comparing the spatial frequency information to one or more predetermined surface images; and
interpolating andor extrapolating the one or more surface characteristics from the one or more predetermined surface images.
69. The method of claim 50, with the light comprising a first light portion interacting with the spatial frequency mask and the sample material to form a spatial frequency image and with the light further comprising a second light portion interacting with a predetermined standard material to form a predetermined standard image, wherein the change in the spatial frequency information comprising a difference between the spatial frequency image and the predetermined standard image.