1. A metal plate to be heated by radiant heat transfer, wherein a reflectance-reduced region where reflectance for a radiant ray is reduced is formed on part of a surface of the metal plate that is to be heated by radiant heat transfer.
2. The metal plate to be heated by radiant heat transfer according to claim 1, wherein the reflectance of the reflectance-reduced region is 40% or less.
3. The metal plate to be heated by radiant heat transfer according to claim 1, wherein the metal plate is a plated steel plate.
4. A method of manufacturing a metal plate to be heated by radiant heat transfer, wherein part of a surface of the metal plate to be heated by radiant heat transfer is subjected to reflectance reducing treatment so as to have reduced reflectance for a radiant ray.
5. The method of manufacturing the metal plate to be heated by radiant heat transfer according to claim 4, wherein the reflectance reducing treatment reduces the reflectance to 40% or less.
6. The method of manufacturing the metal plate to be heated by radiant heat transfer according to claim 4, wherein the reflectance reducing treatment is one of painting, roughening, metal coating, coloring by immersion in an acid solution, and etching.
7. The method of manufacturing the metal plate to be heated by radiant heat transfer according to claim 4, wherein the reflectance reducing treatment is surface layer quality changing treatment.
8. A metal processed product having a portion with different strength, wherein a portion where reflectance for a radiant ray is reduced is partially formed on a surface of the metal processed product, and a difference in Vickers hardness between the portion where the reflectance for the radiant ray is reduced and the other portion is HV180 or more.
9. The metal processed product having the portion with different strength according to claim 8, wherein the difference in Vickers hardness between the portion where the reflectance for the radiant ray is reduced and the other portion is HV200 or more.
10. A method of manufacturing a metal processed product having a portion with different strength, wherein a region where reflectance for a radiant ray is reduced is formed on part of a surface of a metal plate by metal surface treatment or surface layer quality changing treatment, the metal plate is turned into a heated metal plate partially having a different temperature by being heated by radiant heat transfer, and the heated metal plate is subjected to thermal processing accompanied by cooling.
11. The method of manufacturing the metal processed product having the portion with different strength according to claim 10, wherein the metal surface treatment is one of painting, roughening, metal coating, coloring by immersion in an acid solution, and etching.
12. The method of manufacturing the metal processed product having the portion with different strength according to claim 10, wherein the thermal processing accompanied by the cooling is hot stamping.
13. The method of manufacturing the metal processed product having the portion with different strength according to claim 10, wherein the thermal processing accompanied by the cooling is hardening.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
What is claimed is:
1. A method for measuring light transmittance of a lens undergoing examination comprising the steps of:
(a) supplying light of a predetermined wavelength narrowed along an optical axis;
(b) focusing the light to converge on or near a lens undergoing examination that is disposed on the optical axis so that a portion of the light is transmitted through the lens undergoing examination and subsequently measuring the intensity of the transmitted portion to generate a lens transmission value;
(c) focusing the light to converge along the optical axis when the lens undergoing examination is not disposed on the optical axis and subsequently measuring the intensity of the light to generate a baseline value; and
(d) determining the light transmittance of the lens undergoing examination from the lens transmission value and the baseline value.
2. A method for measuring light transmittance according to claim 1, wherein the light of a predetermined wavelength is supplied by a light source disposed along the optical axis, and wherein in step (b) when the light is focused to converge on or near the lens undergoing examination the light converges on or near a surface portion of the lens undergoing examination, wherein the surface portion is that portion of the lens undergoing examination that is closest to the light source.
3. A method for measuring light transmittance according to claim 1, wherein the light transmittance of the lens undergoing examination is determined from a ratio between the lens transmission value and the baseline value.
4. A method for measuring light transmittance according to claim 1, wherein step (b) further comprises filtering the transmitted portion with an interference filter before measuring the intensity of the transmitted portion, and step (c) further comprises filtering the light with the interference filter before measuring the intensity of the light.
5. A method for measuring light transmittance according to claim 4, wherein step (b) further comprises converging the filtered transmitted portion with a second convergence lens onto a light detector so that the light detector can measure the intensity of the filtered transmitted portion, and step (c) further comprises converging the light with the second convergence lens onto the light detector so that the light detector can measure the intensity of the light.
6. A method for measuring light transmittance according to claim 1, wherein the light is focused in step (b) and in step (c) by a first convergence lens.
7. An apparatus for measuring light transmittance of a lens undergoing examination, the apparatus comprising a first sub-apparatus, wherein the first sub-apparatus comprises:
a first light source emitting light of a predetermined first wavelength, wherein the first light source is disposed on a first optical axis;
a first light detector for detecting the light of the predetermined first wavelength, wherein the first light detector is disposed on the first optical axis and generates output signals in response to detecting light of the predetermined first wavelength;
a first lens holding apparatus disposed to hold a lens undergoing examination, wherein the first lens holding apparatus is disposed between the first light source and the first light detector and is positioned on the first optical axis, wherein the first lens holder releasably holds the lens undergoing examination; and
a first convergence lens for converging rays of the light of the predetermined first wavelength at a first prescribed position, wherein the first prescribed position is on or near the lens undergoing examination when the first lens holder is holding the lens undergoing examination.
8. An apparatus for measuring light transmittance according to claim 7, wherein the first prescribed position is on or near a surface portion of the lens undergoing examination, wherein the surface portion is that portion of the lens undergoing examination that is closest to the first light source.
9. An apparatus for measuring light transmittance according to claim 7, wherein the first sub-apparatus further comprises:
a second convergence lens disposed between the first lens holding apparatus and the first light detector, wherein the second convergence lens serves to converge rays of the light of the first predetermined wavelength into the first light detector.
10. An apparatus for measuring light transmittance according to claim 8, wherein the first sub-apparatus further comprises:
a second convergence lens disposed between the first lens holding apparatus and the first light detector, wherein the second convergence lens serves to converge rays of the light of the first predetermined wavelength into the first light detector.
11. An apparatus for measuring light transmittance according to claim 7, wherein the first sub-apparatus further comprises:
a first interference filter disposed along the first optical axis and on a path of the rays of the light of the predetermined first wavelength, wherein the first interference filter transmits mostly light having a wavelength within a range about the first wavelength.
12. An apparatus for measuring light transmittance according to claim 8, wherein the first sub-apparatus further comprises:
a first interference filter disposed along the first optical axis and on a path of the rays of the light of the predetermined first wavelength, wherein the first interference filter transmits mostly light having a wavelength within a range about the first wavelength.
13. An apparatus for measuring light transmittance according to claim 9, wherein the first sub-apparatus further comprises:
a first interference filter disposed along the first optical axis and on a path of the rays of the light of the predetermined first wavelength, wherein the first interference filter transmits mostly light having a wavelength within a range about the first wavelength.
14. An apparatus for measuring light transmittance according to claim 11, the apparatus further comprising a second sub-apparatus and a microprocessor electronically connected to receive signals from the first sub-apparatus and the second sub-apparatus, wherein the second sub-apparatus comprises:
a second light source emitting light of a predetermined second wavelength, wherein the second light source is disposed on a second optical axis and the predetermined second wavelength is different from the predetermined first wavelength;
a second light detector for detecting the light of the predetermined second wavelength, wherein the second light detector is disposed on the second optical axis and generates output signals in response to detecting light of the predetermined second wavelength, and wherein the first lens holding apparatus is disposed between the second light source and the second light detector and is positioned on the second optical axis;
an additional first convergence lens for converging rays of the light of the predetermined second wavelength at a second prescribed position, wherein the second prescribed position is on or near the lens undergoing examination when the first lens holder is holding the lens undergoing examination;
an additional second convergence lens disposed between the first lens holding apparatus and the second light detector, wherein the additional second convergence lens serves to converge rays of the light of the second predetermined wavelength into the second light detector; and
a second interference filter disposed along the second optical axis and on a path of the rays of the light of the predetermined second wavelength, wherein the second interference filter transmits mostly light having a wavelength within a range about the predetermined second wavelength, wherein the microprocessor receives signals from the first light detector of the first sub-apparatus and receives signals from the second light detector of the second sub-apparatus, and the microprocessor determines the light transmittance of the lens undergoing examination based upon the signals received from the first light detector and the second light detector.
15. An apparatus for measuring light transmittance according to claim 12, the apparatus further comprising a second sub-apparatus and a microprocessor electronically connected to receive signals from the first sub-apparatus and the second sub-apparatus, wherein the second sub-apparatus comprises:
a second light source emitting light of a predetermined second wavelength, wherein the second light source is disposed on a second optical axis and the predetermined second wavelength is different from the predetermined first wavelength;
a second light detector for detecting the light of the predetermined second wavelength, wherein the second light detector is disposed on the second optical axis and generates output signals in response to detecting light of the predetermined second wavelength, and wherein the first lens holding apparatus is disposed between the second light source and the second light detector and is positioned on the second optical axis;
an additional first convergence lens for converging rays of the light of the predetermined second wavelength at a second prescribed position, wherein the second prescribed position is on or near the lens undergoing examination when the first lens holder is holding the lens undergoing examination;
an additional second convergence lens disposed between the first lens holding apparatus and the second light detector, wherein the additional second convergence lens serves to converge rays of the light of the second predetermined wavelength into the second light detector; and
a second interference filter disposed along the second optical axis and on a path of the rays of the light of the predetermined second wavelength, wherein the second interference filter transmits mostly light having a wavelength within a range about the predetermined second wavelength, wherein the microprocessor receives signals from the first light detector of the first sub-apparatus and receives signals from the second light detector of the second sub-apparatus, and the microprocessor determines the light transmittance of the lens undergoing examination based upon the signals received from the first light detector and the second light detector.
16. An apparatus for measuring light transmittance according to claim 13, the apparatus further comprising a second sub-apparatus and a microprocessor electronically connected to receive signals from the first sub-apparatus and the second sub-apparatus, wherein the second sub-apparatus comprises:
a second light source emitting light of a predetermined second wavelength, wherein the second light source is disposed on a second optical axis and the predetermined second wavelength is different from the predetermined first wavelength;
a second light detector for detecting the light of the predetermined second wavelength, wherein the second light detector is disposed on the second optical axis and generates output signals in response to detecting light of the predetermined second wavelength, and wherein the first lens holding apparatus is disposed between the second light source and the second light detector and is positioned on the second optical axis;
an additional first convergence lens for converging rays of the light of the predetermined second wavelength at a second prescribed position, wherein the second prescribed position is on or near the lens undergoing examination when the first lens holder is holding the lens undergoing examination;
an additional second convergence lens disposed between the first lens holding apparatus and the second light detector, wherein the additional second convergence lens serves to converge rays of the light of the second predetermined wavelength into the second light detector; and
a second interference filter disposed along the second optical axis and on a path of the rays of the light of the predetermined second wavelength, wherein the second interference filter transmits mostly light having a wavelength within a range about the predetermined second wavelength, wherein the microprocessor receives signals from the first light detector of the first sub-apparatus and receives signals from the second light detector of the second sub-apparatus, and the microprocessor determines the light transmittance of the lens undergoing examination based upon the signals received from the first light detector and the second light detector.