1. A wear resistant coating for protecting a surface, the wear resistant coating applied by high velocity oxygen-fuel deposition of a powder, the powder comprising a blend of:
about 18 13 wt. % to about 35 43 wt. % of a nickel-chromium alloy;
about 35 25 wt. % to about 53 64 wt. % chromium carbide; and
about 15 wt. % to about 50 wt. % molybdenum,
wherein chromium from the nickel-chromium alloy is at least 7.2 wt. % of the blend.
2. The wear resistant coating of claim 1, wherein the powder comprises a blend of:
about 28 wt. % of the nickel-chromium alloy;
about 42 wt. % chromium carbide; and
about 30 wt. % molybdenum.
3. The wear resistant coating of claim 1, wherein the powder comprises a pre-alloyed blend of nickel-chromium alloy and chromium carbide.
4. The wear resistant coating of claim 1, wherein the chromium carbide component of the powder comprises Cr7C3 and Cr23C6.
5. A piston ring comprising an annular body having an outer radial periphery, the outer radial periphery having a wear resistant coating applied by high velocity oxygen-fuel deposition of a powder, the powder comprising a blend of:
about 18 wt. % to about 35 wt. % of a nickel-chromium alloy;
about 35 wt. % to about 53 wt. % chromium carbide; and about 15 wt. % to about 50 wt. % molybdenum,
wherein chromium from the nickel-chromium alloy is at least 7.2 wt. % of the blend.
6. The piston ring of claim 5, wherein the powder comprises a blend of:
about 28 wt. % of the nickel-chromium alloy;
about 42 wt. % chromium carbide; and
about 30 wt. % molybdenum.
7. The piston ring of claim 5, wherein the powder comprises a pre-alloyed blend of nickel-chromium alloy and chromium carbide.
8. The piston ring of claim 5, wherein the chromium carbide component of the powder comprises Cr7C3 and Cr23C6.
9. A wear resistant coating for protecting a surface, the wear resistant coating applied by high velocity oxygen-fuel deposition of a powder, the powder comprising a blend of:
about 28 wt. % of a nickel-chromium alloy;
about 42 wt. % chromium carbide; and
about 30 wt. % molybdenum.
10. A piston ring comprising an annular body having an outer radial periphery, the outer radial periphery having a wear resistant coating applied by high velocity oxygen-fuel deposition of a powder, the powder comprising a blend of:
about 28 wt. % of a nickel-chromium alloy;
about 42 wt. % chromium carbide; and
about 30 wt. % molybdenum.
11. The piston ring of claim 1, wherein there is about 18 wt % to about 35 wt. % of a nickel-chromium alloy.
12. The piston ring of claim 1, wherein there is about 35 wt % to about 53 wt. % of a chromium carbide.
13. The piston ring of claim 1, wherein there is about 18 wt % to about 35 wt. % of a nickel-chromium alloy and about 35 wt % to about 53 wt. % of a chromium carbide.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An apparatus for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system in which substantially divergent x-rays produced by an x-ray source are focused toward a sample using a focusing x-ray optic, comprising:
a semiconductor-type x-ray detector having an uncooled detector active area, said active area for directly detecting said fluorescent x-rays; and
means for focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector.
2. The apparatus of claim 1, wherein the means for focusing the at least some of the x-ray fluorescence includes a capillary-type x-ray optic or a curved optic.
3. The apparatus of claim 1, adapted to operate the detector active area at a temperature greater than about 0 degrees centigrade.
4. The apparatus of claim 3, adapted to operate the detector active area at a temperature between about 10 degrees centigrade and about 30 degrees centigrade.
5. The apparatus of claim 1, wherein the x-ray detector active area is air-cooled.
6. The apparatus of claim 1 in combination with an apparatus for analyzing a fluid using x-rays, the apparatus comprising:
means for exposing the fluid to focused x-rays to cause at least one component of the fluid to x-ray fluoresce; and
means for analyzing the x-ray fluorescence from the fluid to determine at least one characteristic of the fluid.
7. The combination of claim 6, wherein the at least one characteristic of the fluid comprises a concentration of at least one component in the fluid.
8. The combination of claim 7, wherein the fluid is fuel, and the at least one characteristic is the concentration of sulfur in the fuel.
9. The combination of claim 6, further comprising means for delivering a substantially continuous fluid stream to the means for exposing, and wherein the means for analyzing operates in a substantially continuous manner.
10. The apparatus of claim 1, wherein the means for focusing includes a focusing monochromator.
11. The apparatus of claim 10, wherein the focusing monoebromator is a point-focusing monochromator.
12. The apparatus of claim 1, wherein the detector has no protective window.
13. The apparatus of claim 1, in combination with:
a means for exposing the sample to focused x-rays, comprising the x-ray optic for focusing x-rays onto the sample.
14. The combination of claim 13, wherein the means for exposing the sample to x-rays comprises at least one x-ray exposure chamber having an aperture.
15. The combination of claim 14, wherein the x-ray exposure aperture is less than about 10 mm in diameter.
16. The combination of claim 15, wherein the x-ray exposure aperture is less than about 5 mm in diameter.
17. The combination of claim 16 wherein the sample is a continuous fluid flow under pressure.
18. The combination of claims 15 wherein the sample is a continuous fluid flow under pressure.
19. The apparatus of claim 14, wherein the means for exposing the sample to x-rays is enclosed in a chamber held under vacuum.
20. The combination of claim 13, wherein the detector has no protective window.
21. The apparatus of claim 1, in combination with:
an x-ray source including an x-ray tube for generating the x-rays; and
a thermally-conductive, dielectric material thermally coupled to the x-ray tube for removing heat generated by the x-ray tube.
22. The apparatus of claim 1, in combination with:
an x-ray tube having an anode for generating x-rays;
an optic for collecting x-rays generated by the anode; and
a control system for controlling x-ray output intensity of the optic, wherein the control system maintains x-ray output intensity notwithstanding a change in at least one operating condition of the apparatus.
23. The combination of claim 22, wherein the control system further includes a sensor for monitoring x-ray output intensity of the optic and a controller for controlling position of at least one of the anode and the optic using monitored x-ray output intensity.
24. The apparatus of claim 1, wherein the means for focusing comprises a polycapillary focusing optic.
25. The apparatus of claim 1, wherein the means for focusing comprises a curved crystal monochromating optic.
26. The apparatus of claim 25, wherein the means for focusing comprises a doubly curved crystal monochromating optic.
27. The apparatus of claim 1, wherein the detector comprises a silicon x-ray detector.
28. The apparatus of claim 27, wherein the detector comprises a silicon-PIN-diode x-ray detector.
29. An apparatus for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system in which source x-rays are directed toward a sample, comprising:
a semiconductor-type x-ray detector having an uncooled detector active area, said active area for directly detecting said fluorescent x-rays; and
means for focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector,
wherein the detector comprises a PIN-diode type x-ray detector, the detector active area having an area less than about 10 square millimeters.
30. The apparatus of claim 29, wherein the detector active area has an area less than about 6 square millimeters.
31. A method for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system, comprising:
generating substantially divergent x-rays from an x-ray source;
focusing said substantially divergent x-rays from the source toward a sample using a focusing x-ray optic;
using a semiconductor-type x-ray detector having an uncooled detector active area, said active area for directly detecting said fluorescent x-rays; and
focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector.
32. The method of claim 31, further comprising:
operating the detector active area at a temperature greater than about 0 degrees centigrade.
33. The method of claim 32, further comprising:
operating the detector active area at a temperature between about 10 degrees centigrade and about 30 degrees centigrade.
34. The method of claim 31, wherein the detector has no protective window.
35. The method of claim 31, wherein said focusing comprises using a curved crystal monochromating optic.
36. The method of claim 35, wherein said optic is a doubly curved crystal monochromating optic.
37. The method of claim 31, wherein the detector comprises a silicon x-ray detector.
38. The method of claim 37, wherein the detector comprises a silicon-PIN-diode x-ray detector.
39. A method for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system, comprising:
directing source energy toward a sample;
using semiconductor-type x-ray detector having an uncooled detector active area, said active area for directly said fluorescent x-rays; and
focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector,
wherein the detector comprises a PIN-diode type x-ray detector, the detector active area having an area less than about 10 square millimeters.
40. The method of claim 39, wherein the detector active area has an area less than about 6 square millimeters.
41. An apparatus for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system, comprising:
means for focusing substantially divergent x-rays from a source toward a sample using an x-ray optic;
a semiconductor-type x-ray detector having an uncooled detector active area, said active area for directly detecting said fluorescent x-rays; and
means for focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector.
42. The apparatus of claim 41, wherein at least one of the means for directing and means for focusing comprises a monochromating optic.
43. The apparatus of claim 42, wherein the monochromating optic comprises a curved crystal optic.
44. The apparatus of claim 43, wherein the monochromating optic comprises a doubly curved crystal optic.
45. The apparatus of claim 41, adapted to operate the detector active area at a temperature greater than about 0 degrees centigrade.
46. The apparatus of claim 45, adapted to operate the detector active area at a temperature between about 10 degrees centigrade and about 30 degrees centigrade.
47. The apparatus of claim 41, wherein the detector comprises a silicon x-ray detector.
48. The apparatus of claim 47, wherein the detector comprises a silicon-PIN-diode x-ray detector.