1. A method of detecting an affine relation between a first image and a second image, said first and second images each having a line structure with at least four non-parallel straight lines intersecting each other in at least three points on each line, said method comprising the steps of:
selecting two segments of each line, said segments being defined by the at least three intersection points on the line;
determining a first set of ratios from the selected segments of each line of the first image;
determining a second set of ratios from the selected segments of each line of the second image; and
comparing the first set of ratios to the second set ratios so as to at least determine if an affine relation exists between the line structure of the first image and the line structure of the second image wherein the above steps are performed by a processor.
2. A method as claimed in claim 1 comprising a further step of estimating affine distortion parameters using the intersection points of the straight lines of the first and second images.
3. A method as claimed in claim 2 comprising a further step of inverting affine distortions, said affine distortions being defined by said affine distortion parameters.
4. A method as claimed in claim 3 comprising a further step of determining a measure of said relation by normalized correlation.
5. A method as claimed in claim 1 wherein each of said lines of the first image is embedded in said first image by embedding a pattern in said first image, each pattern having been formed substantially from a one-dimensional basis function, said method further comprising the initial steps of:
calculating a -projective transform of said second image;
calculating a 1-D correlation between the projective transform and said basis function for a selection angles; and
finding peaks of said correlation, wherein the position of each of said peaks provides spatial parameters of one of said embedded patterns.
6. An apparatus for detecting an affine relation between a first image and a second image, said first and second images each having a line structure with at least four non-parallel straight lines intersecting each other in at least three points on each line, said apparatus comprising:
means for selecting two segments of each line, said segments being defined by the at least three intersection points on the line;
means for determining a first set of ratios from the selected segments of each line of the first image; means for determining a second set of ratios from the selected segments of each line of the second image; and
means for comparing the first set of ratios to the second set of ratios so as to at least determine if an affine relation exists between the line structure of the first image and the line structure of the second image.
7. An apparatus as claimed in claim 6 further comprising means for estimating affine distortion parameters using the intersection points of the straight lines of the first and second images.
8. An apparatus as claimed in claim 7 further comprising means for inverting affine distortions, said affine distortions being defined by said affine distortion parameters.
9. An apparatus as claimed in claim 8 further comprising means for determining a measure of said relation by normalized correlation.
10. A computer-readable medium having a program stored thereon the program being executable by a computer apparatus to detect affine relation between a first image and a second image, said first and second images each having a line structure with at least four non-parallel straight lines intersecting each other in at least three points on each line, said program comprising:
code for selecting two segments of each line, said segments being defined by the at least three intersection points on the line;
code for determining a first set of ratios from the selected segments of each line of the first image;
code for determining a second set of ratios from the selected segments of each line of the second image; and
code for comparing the first set of ratios to the second set of ratios so as to at least determine if an affine relation exists between the line structure of the first image and the line structure of the second image.
11. A program as claimed in claim 10 further comprising code for estimating affine distortion parameters using the intersection points of the straight lines of the first and second images.
12. A program as claimed in claim 11 further comprising code for inverting affine distortions, said affine distortions being defined by said affine distortion parameters.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An electronic component comprising:
a layer to be protected against moisture; and
a moisture barrier layer arranged at least partly on or above andor below the layer to be protected;
wherein the moisture barrier layer comprises a plurality of layers composed of the same material having different stoichiometric compositions.
2. The electronic component as claimed in claim 1, wherein the moisture barrier layer has a layer thickness in a range of approximately 10 nm to approximately 100 \u03bcm.
3. The electronic component as claimed in claim 1,
wherein the plurality of layers consists of silicon nitride.
4. The electronic component as claimed in claim 3, wherein the silicon nitride is amorphous.
5. The electronic component as claimed in claim 1,
wherein the plurality of layers consists of silicon dioxide.
6. The electronic component as claimed in claim 5, wherein the silicon dioxide is amorphous.
7. The electronic component as claimed in claim 1, further comprising:
a carrier, wherein the layer to be protected against moisture is arranged on or above the carrier; and
an encapsulation, wherein the encapsulation is arranged on or above the moisture barrier layer.
8. The electronic component as claimed in claim 1,
designed as a light-emitting electronic component.
9. The electronic component as claimed in claim 8, designed as a light-emitting diode.
10. The electronic component as claimed in claim 1,
designed as a solar cell.
11. A method for producing an electronic component, the method comprising:
forming a layer to be protected against moisture; and
forming a moisture barrier layer arranged at least partly on or above andor below the layer to be protected;
wherein the moisture barrier layer has a plurality of layers composed of the same material having different stoichiometric compositions.
12. The method as claimed in claim 11,
wherein at least one inert gas is fed to the volume.
13. The method as claimed in claim 12,
wherein the at least one inert gas comprises or is argon andor helium.
14. The electronic component as claimed in claim 8,
designed as an organic light-emitting diode.
15. The electronic component as claimed in claim 8,
designed as a flexible organic light-emitting diode.
16. The electronic component as claimed in claim 1,
designed as an organic solar cell.
17. The electronic component as claimed in claim 1,
designed as a flexible organic solar cell.