1. A light comprising:
a mount assembly removably attachable to a headgear, said mount assembly including a docking base adapted to lockably engage a light body; and
a light body adapted to lockably engage said docking base, said light body including at least one light source.
2. The light of claim 1 wherein the headgear comprises a helmet.
3. The light of claim 1 wherein said mount assembly is adapted to be securely attached to a side of the headgear.
4. The light of claim 1 wherein said mount assembly includes a bracket secured to said docking base and adapted to be attached to the headgear.
5. The light of claim 4 wherein said mount assembly includes a resilient pad secured to said docking base and engaging the headgear when said bracket is attached to the headgear.
6. The light of claim 1 wherein said at least one light source is capable of producing visible light.
7. The light of claim 1 wherein said at least one light source is capable of producing invisible light.
8. The light of claim 1 wherein said at least one light source is capable of producing intermittent light.
9. The light of claim 1 wherein said at least one light source is capable of producing visible light and invisible light.
10. The light of claim 1 wherein said at least one light source is capable of producing visible light and intermittent light.
11. The light of claim 1 wherein said at least one light source is capable of producing invisible light and intermittent light.
12. The light of claim 1 wherein said at least one light source is capable of producing visible light, invisible light and intermittent light.
13. The light of claim 6 wherein said light body includes a control for varying the brightness of the visible light.
14. The light of claim 1 wherein said docking base includes channels and a latch for lockably engaging said light body.
15. The light of claim 14 wherein said light body includes rails and a catch for cooperating with said channels and said latch for effecting the lockable engagement.
16. The light of claim 15 wherein said channels and rails are adapted to be self-centering with respect to one another.
17. The light of claim 15 wherein said channels and said rails are U-shaped.
18. The light of claim 17 wherein said docking base includes a latching lever for automatically locking said light body to said docking base when said rails are fully engaged with said channels.
19. The light of claim 18 wherein said lever is depressible for unlocking the locked engagement of said light body from said docking base.
20. The light of claim 1 wherein said at least one light source is capable of producing IFF signals.
21. The light of claim 6 wherein said at least one light source is capable of producing IFF signals.
22. The light of claim 7 wherein said at least one light source is capable of producing IFF signals.
23. The light of claim 9 wherein said at least one light source is capable of producing IFF signals.
24. The light of claim 1 wherein said at least one light source is capable of producing night vision light.
25. Light apparatus comprising:
a mount assembly removably attachable to a headgear and including a docking base;
a light body including at least one light source;
a first attachment device carried by said docking base and a second attachment device carried by said light body, said first attachment device and said second attachment device adapted for cooperatively attaching said light body to said mount assembly when said light body is applied to said docking base and displaced in a predetermined direction with respect thereto.
26. The light apparatus according to claim 25, wherein:
the headgear comprises a helmet.
27. The light apparatus according to claim 25, wherein:
said mount assembly includes a mounting bracket secured to said docking base and removably securable to the headgear.
28. The light apparatus according to claim 25, wherein:
one of said first attachment device and said second attachment device includes an actuator for releasing said light body from said mount assembly when actuated and said light body is displaced with respect to said docking base in a direction opposite said predetermined direction.
29. The light apparatus according to claim 25, wherein:
one of said first and second attachment devices includes a channel and the other of said first and second attachment devices includes a rail for cooperating with said channel when said light body is applied to said docking base and displaced in said predetermined direction.
30. Light apparatus comprising:
a mount assembly removably attachable to a headgear and including a docking base;
a light body including at least one light source; and
said mount assembly and said light body adapted to be automatically locked to one another when said light body is applied to said docking base and displaced in a predetermined direction along said docking base.
31. The light apparatus according to claim 30, wherein:
the headgear comprises a helmet.
32. The light apparatus according to claim 30, wherein:
one of said mount assembly and said light body includes an actuator for unlocking said light body from said docking base; and
said mount assembly and said light body are adapted to be detached from one another when said actuator is actuated and said light body is displaced in a direction opposite said predetermined direction along said docking base.
33. The light apparatus according to claim 30, wherein:
one of said docking base and said light body includes a channel and the other of said docking base and said light body includes a rail complementary to said channel for slidably engaging said light body along said docking base.
34. Light apparatus comprising:
a headgear;
a docking base secured to said headgear;
a light body including at least one light source; and
said docking base and said light body adapted to be automatically locked to one another when said light body is applied to said docking base and displaced in a predetermined direction along said docking base.
35. The light apparatus according to claim 34, wherein:
said headgear comprises a helmet.
36. The light apparatus according to claim 34, wherein:
one of said docking base and said light body includes an actuator for unlocking said light body from said docking base; and
said docking base and said light body are adapted to be detached from one another when said actuator is actuated and said light body is displaced in a direction opposite said predetermined direction along said docking base.
37. The light apparatus according to claim 34, wherein:
one of said docking base and said light body includes a channel and the other of said docking base and said light body includes a rail complementary to said channel for slidably engaging said light body along said docking base.
38. A method of attaching a light to a headgear, comprising:
providing a headgear with a docking base;
providing a light body including at least one light source;
placing the headgear on a user’s head;
the user grasping the light body with one hand and, in a substantially continuous motion of that one hand,
aligning the light body with the docking base,
sliding the light body onto the docking base, and
releasably locking the light body to the docking base.
39. The method of claim 38, wherein:
during the headgear placing step, the docking base is positioned to a side of the user.
40. The method of claim 38, wherein the aligning step is performed without visual reference by the user.
41. The method of claim 38, wherein the sliding and locking steps are performed without visual reference by the user.
42. The method of claim 38, wherein the light body includes a battery housing, and the aligning step includes the user tactually using the battery housing to orient the light body with respect to the docking base.
43. The method of claim 38, further including:
the user grasping the light body with one hand and, in a substantially continuous motion of that one hand,
unlocking the light body from the docking base, and
sliding the light body off the docking base.
44. The method of claim 43, wherein the unlocking and sliding steps are performed without visual reference by the user.
45. The method according to claim 38, wherein the step of providing a headgear with a docking base includes:
providing a headgear;
providing a mount assembly including the docking base; and
securing the mount assembly to a side of the headgear.
46. The method according to claim 45, wherein:
during the headgear providing step, the headgear comprises a helmet.
47. The method according to claim 46, wherein:
during the helmet placing step, the docking base is positioned to a side of the user.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A test system comprising:
a semiconductor device comprising a first winding, at least a portion of the first winding extending proximate a perimeter of the semiconductor device, the semiconductor device further comprising a separate magnetic sensor;
a magnetic field generator configured to produce a magnetic field, the magnetic field generator being different than the semiconductor device;
an instrument adapted to measure an effect of the magnetic field on the semiconductor device, wherein the effect of the magnetic field is measurable across the first winding; and
a probe card adapted to calibrate the magnetic sensor based on the measured magnetic field.
2. The test system according to claim 1, wherein the magnetic field generator comprises a second winding, and wherein the magnetic field is producible by applying a current through the second winding.
3. The test system according to claim 1, wherein the first winding comprises a first end and a second end, and wherein the semiconductor device includes a first test pad coupled to the first end of the first winding and a second test pad coupled to the second end of the first winding.
4. The test system according to claim 3, wherein the probe card is coupled to the magnetic field generator, and wherein the probe card includes at least two probe needles.
5. The test system according to claim 4, wherein the effect of the magnetic field is measurable by coupling a first probe needle of the probe card to the first test pad and coupling a second probe needle of the probe card to the second test pad.
6. The test system according to claim 1, wherein the instrument comprises at least one of a current meter adapted to measure a current of the first winding and a voltmeter adapted to measure a voltage of the first winding.
7. The test system according to claim 1, wherein the test system is adapted to be used for on-line monitoring of magnetic fields during wafer tests of the semiconductor device.
8. The test system according to claim 1, wherein the first winding comprises a plurality of loops.
9. The test system according to claim 1, wherein the semiconductor device comprises an active region in a central region, and wherein the first winding is not formed over the active region.
10. A method of testing a semiconductor device comprising:
providing the semiconductor device comprising a magnetic sensor and a separate winding, at least a portion of the winding extending proximate a perimeter of the semiconductor device;
providing a test device comprising a magnetic field generator;
generating a magnetic field proximate the semiconductor device using the magnetic field generator of the test device;
measuring an effect of the magnetic field on the winding of the semiconductor device; and
calibrating the semiconductor device based on the measured magnetic field.
11. The method according to claim 10, wherein measuring the effect of the magnetic field on the winding of the semiconductor device comprises measuring at least one of a current through the winding and a voltage across the winding.
12. The method according to claim 10, wherein providing the test device comprises providing the test device wherein the magnetic field generator comprises a conductive winding, and wherein generating the magnetic field comprises causing an alternating current to flow through the conductive winding of the magnetic field generator.
13. The method according to claim 10, wherein measuring the effect of the magnetic field on the winding of the semiconductor device comprises determining at least one electromagnetic parameter of the semiconductor device.
14. A method of fabricating a semiconductor device, the method comprising:
forming a magnetic sensor in or on a semiconductor substrate;
forming at least one conductive material layer on the semiconductor substrate;
forming a test structure in the at least one conductive material layer, the test structure comprising a winding, at least a portion of the winding extending proximate a perimeter of the semiconductor device, the winding having a first end and a second end;
coupling a first test pad to the first end of the winding; and
coupling a second test pad to the second end of the winding.
15. The method according to claim 14, wherein forming the at least one conductive material layer comprises forming Al, Cu, or combinations or multiple layers thereof.
16. The method according to claim 14, wherein fabricating the semiconductor device comprises fabricating the semiconductor device for an automotive, industrial, or power application.
17. The method according to claim 14, wherein the semiconductor substrate comprises a die, the die having a width, and wherein forming the test structure comprises forming the winding wherein at least the portion of the winding comprises a loop having a width that is about 10 to 50 \u03bcm less than the width of the die.
18. The method according to claim 14, wherein the winding comprises at least one continuous loop.
19. The method according to claim 14, wherein the winding comprises a plurality of loops.
20. The method according to claim 14, wherein the test structure is not formed over the magnetic sensor.
21. A method of testing a wafer comprising:
providing the wafer, the wafer comprises a test die and a separate device die, the test die comprising a winding and the device die not comprising the winding;
providing a probe card comprising a magnetic field generator;
generating a magnetic field proximate the wafer using the magnetic field generator; and
measuring an effect of the magnetic field on the winding of the test die.
22. The method according to claim 21, wherein the device die comprises a magnetic sensor.
23. The method according to claim 22, wherein the magnetic sensor is calibrated based on the measurement of the magnetic field on the winding of the test die.
24. The method according to claim 14, wherein the test structure is distinct from the winding.