1. A computer program product for managing configuration parameters of a computer system, comprising:
a non-transitory computer-readable medium having computer usable program code embodied therewith, the computer usable program code being configured to:
automatically alter at least one configuration parameter of said computer system to generate a plurality of different configurations of said computer system at respective corresponding measurement intervals;
automatically measure at least one workrate metric at each said measurement interval to determine a respective workrate corresponding to each configuration of said plurality of different configurations, each said workrate being an instantaneous value representing an amount of work per unit time being processed by at least a portion of said computer system at a respective particular point in time, each said workrate metric being an actual measurement representing said workrate;
automatically compare the workrates determined by said automatically measuring at least one workrate metric to determine a respective optimum value of each of said at least one configuration parameter according to at least one optimization criterion; and
responsive to automatically comparing the workrates determined by said automatically measuring at least one workrate metric to determine a respective optimum value of each of at least one said configuration parameter according to at least one optimization criterion, automatically set said at least one configuration parameter of said computer system to the respective optimum value of each of said at least one configuration parameter according to said at least one optimization criterion.
2. The computer program product of claim 1, wherein said at least one configuration parameter comprises at least one parameter defining at least one resource allocated to a logical partition of said computer system.
3. The computer program product of claim 1, wherein said at least one configuration parameter comprises at least one parameter defining a respective workload assigned to each of a plurality of logical partitions of said computer system.
4. The computer program product of claim 1, wherein said computer usable program code is further configured to:
receive user input specifying said at least one optimization criterion.
5. The computer program product of claim 1, wherein said at least one workrate metric comprises a measurement of non-idle instructions executed per unit of time.
6. The computer program product of claim 1, wherein said measurement interval is one millisecond or less.
7. The computer program product of claim 1, wherein said computer usable program code is configured to iteratively automatically alter said at least one configuration parameter of said computer system to generate a respective configuration of said computer system, iteratively automatically measure said at least one workrate metric at a corresponding measurement interval to determine a workrate corresponding to the respective configuration of said computer system, and repeat iteratively automatically altering said at least one configuration parameter and iteratively automatically measuring said at least one workrate metric until a respective optimum value of each of said at least one configuration parameter according to said at least one optimization criterion is reached.
8. A computer system, comprising:
a memory;
at least one processor, said at least one processor executing instructions storable in said memory;
a configuration manager capable of automatically altering at least one configuration parameter of said computer system, said configuration manager generating a plurality of different configurations of said computer system at respective corresponding measurement intervals by altering at least one said configuration parameter and, at each said measurement interval, measuring at least one workrate metric to determine a respective workrate corresponding to the configuration of said plurality of different configurations of said computer system at the corresponding measurement interval, each said workrate being an instantaneous value representing an amount of work per unit time being processed by at least a portion of said computer system at a respective particular point in time, each said workrate metric being an actual measurement representing said workrate;
wherein said configuration manager determines a respective optimum value of each of said at least one configuration parameter according to at least one optimization criterion by comparing each said respective workrate corresponding to at least some of said configurations of said computer system; and
wherein said configuration manager automatically sets each of said at least one configuration parameter to its respective optimum value according to said at least one optimization criterion.
9. The computer system method of claim 8, further comprising:
a partition manager which partitions said computer system into a plurality of logical partitions;
wherein said at least one configuration parameter comprises at least one parameter defining at least one resource allocated to a logical partition of said computer system.
10. The computer system of claim 8, further comprising:
a partition manager which partitions said computer system into a plurality of logical partitions;
wherein said at least one configuration parameter comprises at least one parameter defining a respective workload assigned to each of a plurality of logical partitions of said computer system.
11. The computer system claim 8, wherein said at least one workrate metric comprises a measurement of non-idle instructions executed per unit of time.
12. The computer system of claim 8, wherein said measurement interval is one millisecond or less.
13. The computer system of claim 8, wherein said configuration manager iteratively alters said at least one configuration parameter of said computer system to generate a respective configuration of said computer system, iteratively measures said at least one workrate metric at a corresponding measurement interval to determine a workrate corresponding to the respective configuration of said computer system, and repeats iteratively altering said at least one configuration parameter and iteratively measuring said at least one workrate metric until a respective optimum value of each of said at least one configuration parameter according to said at least one optimization criterion is reached.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A GC mass spectrometry system, comprising:
(a) a column for introducing a sample into the GC mass spectrometry system;
(b) a heating source for providing heat to the sample to be separated by the column;
(c) an ion source downstream from the heating source for ionizing the sample separated by the column, the ion source having a sensor for determining the temperature of the ion source;
(d) an interface coupled to the ion source sensor and the heating source wherein the interface provides a feedback loop between the ion source sensor and the heating source and the temperature of the ion source or the heating source can be tracked and altered during data acquisition.
2. A GC mass spectrometry system as recited in claim 1, further comprising a detector for detecting the ions.
3. A GC mass spectrometry system as recited in claim 1, wherein the column is disposed in the heating source.
4. A GC mass spectrometry system as recited in claim 1, wherein the ion source further comprises a housing.
5. A GC mass spectrometry system as recited in claim 1, wherein the heating source comprises an oven.
6. A GC mass spectrometry system as recited in claim 1, wherein the sensor comprises a thermal sensor.
7. A GC mass spectrometry system as recited in claim 1, wherein the ion source sensor comprises a thermocouple.
8. A GC mass spectrometry system as recited in claim 1, wherein the heat source comprises an IR source.
9. A GC mass spectrometry system as recited in claim 3, wherein the housing comprises a metal.
10. A GC mass spectrometry system as recited in claim 3, wherein the housing comprises an inert material.
11. A GC mass spectrometry system as recited in claim 3, wherein the housing comprises a low mass material.
12. A GC mass spectrometry system as recited in claim 1, wherein the interface comprises system software.
13. A GC mass spectrometry system as recited in claim 11, wherein the interface comprises a user interface for inputting data.
14. A GC mass spectrometry system as recited in claim 1, wherein the heating source can be temperature ramped.
15. A GC mass spectrometry system as recited in claim 1, wherein when the heating source is at a high temperature the ion source is at a high relative temperature.
16. A GC mass spectrometry system as recited in claim 1, wherein when the heating source is at a low temperature the ion source is at a low temperature.
17. An apparatus for GC mass spectrometry, comprising:
(a) a heating source for providing heat to a column for volatizing molecules to be separated by the column;
(b) an ion source downstream from the heating source for ionizing the sample separated by the column, the ion source having a sensor for determining the temperature of the ion source; and
(c) an interface for coupling the ion source sensor to the heating source wherein the interface provides a feedback loop between the sensor of the ion source and the heating source and the temperature of the ion source and the heating source can be altered during data acquisition.
18. An apparatus for GC mass spectrometry as recited in claim 17, further comprising a detector for detecting the ions.
19. An apparatus for GC mass spectrometry as recited in claim 17, wherein the ion source further comprises a housing.
20. An apparatus for GC mass spectrometry as recited in claim 17, wherein the heating source comprises an oven.
21. An apparatus for GC mass spectrometry as recited in claim 17, wherein the sensor comprises a thermal sensor.
22. An apparatus for GC mass spectrometry as recited in claim 17, wherein the ion source sensor comprises a thermocouple.
23. An apparatus for GC mass spectrometry as recited in claim 17, wherein the heat source comprises an IR source.
24. An apparatus for GC mass spectrometry as recited in claim 19, wherein the housing comprises a metal.
25. An apparatus for GC mass spectrometry as recited in claim 19, wherein the housing comprises an inert material.
26. An apparatus for GC mass spectrometry as recited in claim 19, wherein the housing comprises a low mass material.
27. An apparatus GC mass spectrometry as recited in claim 17, wherein the interface comprises system software.
28. An apparatus for GC mass spectrometry as recited in claim 17, wherein the interface comprises a user interface for inputting data.
29. An apparatus for GC mass spectrometry as recited in claim 17, wherein the heating source can be temperature ramped.
30. An apparatus for GC mass spectrometry as recited in claim 17, wherein when the heating source is at a high temperature the ion source is at a high relative temperature.
31. An apparatus for GC mass spectrometry as recited in claim 17, wherein when the heating source is at a low temperature the ion source is at a low temperature.
32. A method for GC mass spectrometry, comprising:
(a) inputting a sample into a GC mass spectrometry system;
(b) heating the sample to a first temperature using a heating source; and
(c) introducing the sample into an ion source having a sensor that is coupled to an interface and the heating source for altering the temperature of the ion source to a second temperature.