1. A method of testing a blocking ability of a photoresist blocking layer for ion implantation, comprising:
forming a photoresist blocking layer on a substrate;
measuring a first thickness of the photoresist blocking layer at an arbitrary position on the substrate, the first thickness being a thickness of the photoresist blocking layer;
implanting a predetermined amount of ions into the photoresist blocking layer;
measuring a second thickness of the photoresist blocking layer at the arbitrary position, the second thickness being a thickness of a hardened portion in the photoresist blocking layer; and
determining blocking ability of the photoresist blocking layer with the first thickness for ion implantation based on the second thickness.
2. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 1, wherein a prebaking process is performed to the substrate; a photoresist layer is formed on the substrate subsequent to the prebaking process; and an exposing and developing process is performed upon the photoresist layer to obtain the photoresist blocking layer.
3. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 2, wherein a prebaking temperature of the prebaking process is 10\u02dc120\xb0 C., and a time period of the prebaking process is 10\u02dc120 s.
4. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 2, wherein a photoresist layer is exposed at different positions using different exposing time periods to obtain photoresist blocking layers with different thicknesses.
5. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 4, wherein thicknesses of the photoresist blocking layers present a gradient change along a length direction or a width direction of the substrate.
6. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 1, wherein determining blocking ability of the photoresist blocking layer with the first thickness for ion implantation based on the second thickness comprises:
calculating a ratio of the second thickness to the first thickness; and
determining whether the ratio is smaller than or equal to a predetermined threshold value, wherein if it is so, the photoresist blocking layer with the first thickness is determined to possess the blocking ability for ion implantation, otherwise, the photoresist blocking layer with the first thickness is determined to not possess the blocking ability for ion implantation.
7. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 6, wherein the threshold value is any value in a range of 0.85 to 0.95.
8. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 2, wherein determining blocking ability of the photoresist blocking layer with the first thickness for ion implantation based on the second thickness comprises:
calculating a ratio of the second thickness to the first thickness; and
determining whether the ratio is smaller than or equal to a predetermined threshold value, wherein if it is so, the photoresist blocking layer with the first thickness is determined to possess the blocking ability for ion implantation, otherwise, the photoresist blocking layer with the first thickness is determined to not possess the blocking ability for ion implantation.
9. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 8, wherein the threshold value is any value in a range of 0.85 to 0.95.
10. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 3, wherein determining blocking ability of the photoresist blocking layer with the first thickness for ion implantation based on the second thickness comprises:
calculating a ratio of the second thickness to the first thickness; and
determining whether the ratio is smaller than or equal to a predetermined threshold value, wherein if it is so, the photoresist blocking layer with the first thickness is determined to possess the blocking ability for ion implantation, otherwise, the photoresist blocking layer with the first thickness is determined to not possess the blocking ability for ion implantation.
11. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 10, wherein the threshold value is any value in a range of 0.85 to 0.95.
12. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 4, wherein determining blocking ability of the photoresist blocking layer with the first thickness for ion implantation based on the second thickness comprises:
calculating a ratio of the second thickness to the first thickness; and
determining whether the ratio is smaller than or equal to a predetermined threshold value, wherein if it is so, the photoresist blocking layer with the first thickness is determined to possess the blocking ability for ion implantation, otherwise, the photoresist blocking layer with the first thickness is determined to not possess the blocking ability for ion implantation.
13. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 12, wherein the threshold value is any value in a range of 0.85 to 0.95.
14. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 5, wherein determining blocking ability of the photoresist blocking layer with the first thickness for ion implantation based on the second thickness comprises:
calculating a ratio of the second thickness to the first thickness; and
determining whether the ratio is smaller than or equal to a predetermined threshold value, wherein if it is so, the photoresist blocking layer with the first thickness is determined to possess the blocking ability for ion implantation, otherwise, the photoresist blocking layer with the first thickness is determined to not possess the blocking ability for ion implantation.
15. The method of testing a blocking ability of a photoresist blocking layer for ion implantation as claimed in claim 14, wherein the threshold value is any value in a range of 0.85 to 0.95.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A head-up display navigation device comprising:
a data generating unit that generates navigation data by comparing current GPS position data with GPS route data provided from an external device; and
a light source unit that projects at least one of a horizontally mirrored image, a horizontally mirrored character, or a horizontally mirrored numeric value corresponding to at least part of the navigation data onto a windshield.
2. The head-up display navigation device according to claim 1, further comprising an output unit that reproduces a sound corresponding to at least part of the navigation data.
3. The head-up display navigation device according to claim 1, wherein the current GPS position data is provided from an external device.
4. The head-up display navigation device according to claim 1, further comprising a GPS receiver that receives the current GPS position data.
5. The head-up display navigation device according to claim 1, wherein the data generating unit compares the GPS route data with the current GPS position data to determine whether or not route deviation has occurred and generates a route re-search message including the current GPS position data upon determining that route deviation has occurred.
6. The head-up display navigation device according to claim 1, wherein the light source unit comprising:
a first light source module that is a dot-matrix type and projects the horizontally mirrored image;
a second light source module that is of a dot-matrix type and projects the horizontally mirrored character; and
a third light source module that is of a 7-segment type and projects the horizontally mirrored numeric value.
7. The head-up display navigation device according to claim 1, further comprising an external display unit that displays at least one of an image, a character, and a numeric value corresponding to at least part of the navigation data.
8. A head-up display navigation system comprising:
a server that generates GPS route data using departure point data, destination data, and previously stored road information data;
a mobile terminal that requests the server to generate the GPS route data and provides the GPS route data transmitted from the server to a head-up display navigation device; and
the head-up display navigation device that compares the GPS route data provided from the mobile terminal with current GPS position data to generate navigation data and projects at least one of a horizontally mirrored image, a horizontally mirrored character, or a horizontally mirrored numeric value corresponding to at least part of the navigation data onto a windshield.
9. The head-up display navigation system according to claim 8, wherein the head-up display navigation device compares the current GPS position data with the GPS route data to determine whether or not route deviation has occurred and provides a route re-search message including the current GPS position data to the mobile terminal upon determining that route deviation has occurred, and
the mobile terminal transmits the current GPS position data included in the re-search message as new departure point data to the server.
10. The head-up display navigation system according to claim 8, wherein the mobile terminal wirelessly receives updated content data from the server, and
the head-up display navigation device projects an image, a numeric value, or text corresponding to at least part of the content data provided from the mobile terminal.
11. The head-up display navigation system according to claim 8, wherein the head-up display navigation device processes at least part of data generated by an Electronic Control Unit (ECU) provided in a vehicle and additionally projects at least one of a horizontally mirrored image, a horizontally mirrored character, or a horizontally mirrored numeric value onto a windshield.
12. The head-up display navigation system according to claim 11, wherein the head-up display navigation device receives ECU data analyzed by an ECU data analyzer and converts the received data into at least one of a horizontally mirrored image, a horizontally mirrored character, or a horizontally mirrored numeric value and projects the converted data onto the windshield.
13. A method for implementing a head-up display navigation service, the method comprising:
comparing current GPS position data with GPS route data provided from an external device to generate navigation data; and
projecting at least one of a horizontally mirrored image, a horizontally mirrored character, or a horizontally mirrored numeric value corresponding to at least part of the navigation data onto a windshield.
14. The head-up display navigation system according to claim 13, further comprising:
comparing the GPS route data with the current GPS position data to determine whether or not route deviation has occurred and providing a route re-search message including the current GPS position data to the external device upon determining that route deviation has occurred.