1. A method for optimizing a communication system comprising:
remote control of slicing level of a receiver in a smart transceiver in the communication system, said communication system comprising an operating system with Operation, Administration, and Maintenance (OAM) and Proprietary Protocol (PP) functions, an OAM, PP & Payload Processor, a transceiver, Bit Error Rate Test (BERT) equipment, and an optical link.
2. The method of claim 1, wherein the smart transceiver comprises a smart duplex small form-factor pluggable (SFP) transceiver.
3. The method of claim 1, wherein the smart transceiver comprises a smart bidirectional small form-factor pluggable (BiDi SFP) transceiver.
4. The method of claim 1, wherein the smart transceiver comprises a smart single wavelength bidirectional small form-factor pluggable (SWBiDi SFP) transceiver.
5. The method of claim 1, wherein the smart transceiver comprises a smart duplex small form-factor pluggable plus (SFP+) transceiver.
6. The method of claim 1, wherein the smart transceiver comprises a smart bidirectional small form-factor pluggable plus (BiDi SFP+) transceiver.
7. The method of claim 1, wherein the smart transceiver comprises a smart single wavelength bidirectional small form-factor pluggable plus (SWBiDi SFP+) transceiver.
8. The method of claim 1, wherein the smart transceiver comprises a smart duplex 10 gigabit small form-factor pluggable (XFP) transceiver.
9. The method of claim 1, wherein the smart transceiver comprises a smart bidirectional 10 gigabit small form-factor pluggable (BiDi XFP) transceiver.
10. The method of claim 1, wherein the smart transceiver comprises a smart single wavelength bidirectional 10 gigabit small form-factor pluggable (SWBiDi XFP) transceiver.
11. The method of claim 1, wherein the optical link comprises an optical link without optical amplifiers.
12. The method of claim 1, wherein the optical link comprises an optically amplified optical link.
13. The method of claim 1 wherein the OAM, PP & Payload Processor comprises an application specific integrated circuit (ASIC).
14. The method of claim 1, wherein the OAM. PP & Payload Processor comprises an integration of a plurality of integrated circuits.
15. The method of claim 14, wherein the integration of the plurality of integrated circuits comprises of a micro-controller.
16. The method of claim 14, wherein the integration of the plurality of integrated circuits comprises of a field programmable gate array (FPGA).
17. The method of claim 14, wherein the integration of the plurality of integrated circuits comprises of a micro-controller and a field programmable gate array (FPGA).
18. The method of claim 1, wherein the BERT equipment measures the Bit Error Rate (BER) of a signal.
19. The method of claim 1, wherein remote control of slicing level of the receiver in the smart transceiver comprises:
a first operation comprising configuring the smart transceiver to be in a loopback mode;
a second operation comprising enabling the BERT equipment to transmit a pseudo-random (PRN) bit stream to the smart transceiver, the smart transceiver transmitting the PRN back to the BERT for bit error rate (BER) measurement, and recording of the measured BER;
a third operation comprising the transceiver transmitting a slicing level adjustment PP message to the smart transceiver, and the smart transceiver adjusting its slicing level according to the slicing level adjustment PP message;
a fourth operation comprising enabling the BERT equipment to transmit a pseudo-random (PRN) bit stream to the smart transceiver, the smart transceiver transmitting the PRN back to the BERT for measuring the BER;
a fifth operation comprising repeating the third and fourth operations until an optimum slicing level based on the measured BER recordings is found;
a sixth operation comprising transmitting a slicing level adjustment PP messaging containing the optimum slicing level to the smart transceiver, and the smart transceiver adjusting its slicing level based on the optimum slicing level.
20. A method for optimizing a communication system comprising:
remote control of slicing level of a receiver in a smart transceiver in the communication system, said communication system comprising an operating system with Operation, Administration, and Maintenance (OAM) and Proprietary Protocol (PP) functions, an OAM, PP & Payload Processor, a built-in-system-test (BIST) procedure executed by the OAM, PP & Payload processor, a transceiver, and an optical link.
21. The method of claim 20, wherein the OAM, PP & Payload Processor comprises an application specific integrated circuit (ASIC).
22. The method of claim 20, wherein the OAM, PP & Payload Processor comprises an integration of a plurality of integrated circuits.
23. The method of claim 20, wherein remote control of slicing level of the receiver in the smart transceiver comprises:
a first operation comprising configuring the smart transceiver to be in a loopback mode;
a second operation comprising enabling the BERT equipment to transmit a pseudo-random (PRN) bit stream to the smart transceiver, the smart transceiver transmitting the PRN back to the BERT for bit error rate (BER) measurement, and recording of the measured BER;
a third operation comprising the transceiver transmitting a slicing level adjustment PP message to the smart transceiver, and the smart transceiver adjusting its slicing level according to the slicing level adjustment PP message;
a fourth operation comprising enabling the BERT equipment to transmit a pseudo-random (PRN) bit stream to the smart transceiver, the smart transceiver transmitting the PRN back to the BERT for measuring the BER;
a fifth operation comprising repeating the third and fourth operations until an optimum slicing level based on the measured BER recordings is found;
a sixth operation comprising transmitting a slicing level adjustment PP messaging containing the optimum slicing level to the smart transceiver, and the smart transceiver adjusting its slicing level based on the optimum slicing level.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method of evaluating a measuring electron microscope, comprising the steps of setting such modes of operation of a microscope, that will be used for subsequent measurements of sizes and line edge roughness; introducing a test-object which has a known straight edge into a chamber of objects of the microscope; orienting the test object on a stage of the microscope; scanning the test object with an electron beam; obtaining an image of the edge of the test object and saving the image in a digital form; localizing the edge of the test object and saving the image in a digital form; localizing the edge of the test object on the image on each line of scanning; producing and storing a set of values of a coordinate X(i) which correspond to a position of the edge of an i-th line of scanning; approximating the sets of values X(i) with a straight line; calculating deviations \u0394(i) of coordinates X(i) from a straight line on each line of scanning; analyzing a set of values of the deviations \u0394(i); calculating an \u0394ave and a maximal deviation \u0394max and if a maximum value of deviation \u0394max exceeds an acceptable tolerance of measurement, making a conclusion whether or not the microscope can be used for measurements and whether or not an adjustment is needed.
2. A method as defined in claim 1; and further comprising using as a test object a cleavage surface of an electrically conductive monocrystal having a straight edge.
3. A method as defined in claim 2, wherein said monocrystal is a crystal of a material selected from the group consisting of silicon, copper and zinc sulfide ZnS.
4. A method as defined in claim 1; and further comprising using as the test object a relief ledge, which is formed in a surface layer of a monocrystal by methods of selective chemical etching and has atom-smooth surfaces and straight edges.
5. A method as defined in claim 1, wherein said approximating with a straight line includes using a method of least squares.
6. A method as defined in claim 1; and further comprising the steps of suppressing video signal noises before localizing the edges of the test object.