1. A method of controlling test data with a boundary latch module having a plurality of latches to facilitate testing an external signal path of an integrated circuit concurrently with logic built-in self testing of the integrated circuit, the method comprising:
(i) providing a plurality of selection devices coupled to a plurality latches of a boundary latch module, the plurality of selection devices for selecting initialization data to store in the plurality of latches of the boundary latch module of the integrated circuit;
(ii) utilizing the plurality of selection devices to select the initialization data from a plurality of scan paths of the integrated circuit;
(iii) providing the initialization data from at least one of the plurality of latches as at least one output of the integrated circuit for testing at least one external signal path of the integrated circuit;
(iv) providing another selection device in the another boundary latch module, the another selection device for selecting an external datum provided by an external input to the integrated circuit or a test-pattern datum from test-pattern generator logic of the integrated circuit;
(v) utilizing the another selection device to select the external datum or the test-pattern datum as a datum for capture in at least one of the plurality of latches of the another boundary latch module; and
(vi) providing the datum captured by the at least one of the plurality of latches of the another boundary latch module as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.
2. The method of claim 1, wherein test-pattern generator logic of the integrated circuit provides the initialization data to the plurality of scan paths.
3. The method of claim 1, further comprising providing a drive-enable control signal to the boundary latch module, the drive-enable control signal enabling the boundary latch module to drive an output pin of the integrated circuit.
4. The method of claim 3, further comprising:
(iv) capturing the drive-enable control signal in at least one of the plurality of latches; and
(v) providing the drive-enable control signal as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.
5. The method of claim 1, wherein the plurality of selection devices comprises a plurality of multiplexers.
6. The method of claim 1, further comprising providing a switching device for controlling when the boundary latch module drives an output pin of the integrated circuit.
7. The method of claim 6, wherein the switching device comprises a tri-state buffer.
8. A system for controlling test data with a boundary latch module having a plurality of latches to facilitate testing an external signal path of an integrated circuit concurrently with logic built-in self testing of the integrated circuit, the system comprising:
(i) a plurality of selection devices coupled to a plurality latches of a boundary latch module, the plurality of selection devices for selecting initialization data to store in the plurality of latches of the boundary latch module of the integrated circuit;
(ii) means for utilizing the plurality of selection devices to select the initialization data from a plurality of scan paths of the integrated circuit;
(iii) means for providing the initialization data from at least one of the plurality of latches as at least one output of the integrated circuit for testing at least one external signal path of the integrated circuit;
(iv) another selection device in the another boundary latch module, the another selection device for selecting an external datum provided by an external input to the integrated circuit or a test-pattern datum from test-pattern generator logic of the integrated circuit;
(v) means for utilizing the another selection device to select the external datum or the test-pattern datum as a datum for capture in at least one of the plurality of latches of the another boundary latch module; and
(vi) means for providing the datum captured by the at least one of the plurality of latches of the another boundary latch module as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.
9. The system of claim 8, wherein test-pattern generator logic of the integrated circuit provides the initialization data to the plurality of scan paths.
10. The system of claim 8, further comprising means for providing a drive-enable control signal to the boundary latch module, the drive-enable control signal enabling the boundary latch module to drive an output pin of the integrated circuit.
11. The system of claim 10, further comprising:
(iv) means for capturing the drive-enable control signal in at least one of the plurality of latches; and
(v) means for providing the drive-enable control signal as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.
12. The system of claim 8, wherein the plurality of selection devices comprises a plurality of multiplexers.
13. The system of claim 8, further comprising a switching device for controlling when the boundary latch module drives an output pin of the integrated circuit.
14. The system of claim 13, wherein the switching device comprises a tri-state buffer.
15. At least one program storage device readable by a machine embodying at least one program of instructions executable by the machine to perform a method of controlling test data with a boundary latch module having a plurality of latches to facilitate testing an external signal path of an integrated circuit concurrently with logic built-in self testing of the integrated circuit, the method comprising:
(i) providing a plurality of selection devices coupled to a plurality latches of a boundary latch module, the plurality of selection devices for selecting initialization data to store in the plurality of latches of the boundary latch module of the integrated circuit;
(ii) utilizing the plurality of selection devices to select the initialization data from a plurality of scan paths of the integrated circuit;
(iii) providing the initialization data from at least one of the plurality of latches as at least one output of the integrated circuit for testing at least one external signal path of the integrated circuit;
(iv) providing another selection device in the another boundary latch module, the another selection device for selecting an external datum provided by an external input to the integrated circuit or a test-pattern datum from test-pattern generator logic of the integrated circuit;
(v) utilizing the another selection device to select the external datum or the test-pattern datum as a datum for capture in at least one of the plurality of latches of the another boundary latch module; and
(vi) providing the datum captured by the at least one of the plurality of latches of the another boundary latch module as at least one input to a multiple-input signature register, the multiple-input signature register storing a signature of the integrated circuit resulting from the logic built-in self-testing.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A hybrid golf club head comprising:
a body comprising a crown section, a sole section and a face section;
an exterior heel weight positioned on the sole section, the exterior heel weight having a mass ranging from 5 to 10 grams;
an exterior toe weight positioned on the sole section, the exterior toe weight having a mass ranging from 5 to 10 grams;
an interior weight chip positioned near the face section, the interior weight chip having a mass ranging from 4 to 8 grams;
wherein the hybrid golf club head has a moment of inertia Izz about a center of gravity ranging from 2000 to 3000 grams-centimeters squared;
wherein the hybrid golf club head has a moment of inertia Ixx about a center of gravity ranging from 1900 to 2500 grams-centimeters squared;
wherein the hybrid golf club head has a loft angle ranging from 18 degrees to 28 degrees;
wherein the hybrid golf club head has a volume ranging from 100 to 150 cubic centimeters;
wherein the hybrid golf club head has a mass ranging from 210 grams to 240 grams.
2. The hybrid golf club head according to claim 1 wherein the body is composed of a stainless steel material.
3. The hybrid golf club head according to claim 1 wherein the body is composed of a titanium alloy material.
4. The hybrid golf club head according to claim 1 wherein the hybrid golf club head has a moment of inertia Izz about a center of gravity ranging from 2300 to 2700 grams-centimeters squared.
5. The hybrid golf club head according to claim 1 wherein the hybrid golf club head has a moment of inertia Ixx about a center of gravity ranging from 2100 to 2300 grams-centimeters squared.