I claim:
1. A wheelchair, comprising:
a collapsible frame including a forward portion hingedly secured to a rearward portion, said frame being selectively movable between an open state and a collapsed state whereby when said frame is in the open state said forward portion is oriented substantially at right angles to said rearward portion and when said frame is in the collapsed state said forward portion is oriented substantially parallel to said rearward portion;
a pair of casters secured to said forward portion;
a pair of drive wheels secured to said rearward portion;
a seat secured to said forward portion; and,
a backrest secured to said rearward portion.
2. The wheelchair according to claim 1 wherein:
said forward portion and said rearward portion of said frame each include a plurality of socket members, each of said socket members having a first transverse aperture;
said seat includes a plurality of posts projecting downwardly therefrom and being adapted for positioning within said socket members, each of said posts having a plurality of second transverse apertures adapted for selective alignment with said first transverse aperture in a respective one of said socket members; and,
said wheelchair further comprises a plurality of locking pins that can be passed through said first and second transverse apertures when brought into registration with one another so that the height of said seat can be selectively fixed.
3. The wheelchair according to claim 1 wherein:
said forward portion is provided with a plurality of first transverse apertures in the opposed sides thereof; and,
said wheelchair further comprises:
an armrest supporting brace movably secured to said forward portion of said collapsible frame, said armrest supporting brace including:
a pair of armrest supporting posts slidably engaging the opposed sides of said forward portion and extending upwardly therefrom, the bottom of each armrest supporting post being provided with a second transverse aperture adapted for selective alignment with one of said first transverse apertures in one of the opposed sides of said forward portion, the top of each armrest supporting post being provided with a third transverse aperture;
a tie bar connecting the bottoms of said armrest supporting posts and slidably engaging the bottom of said forward portion of said collapsible frame;
a pair of first locking pins for positioning within said first and second transverse apertures when such are aligned with one another so that the positioning of said armrest supporting posts relative to said rearward portion of said collapsible frame can be selectively fixed;
a pair of armrests each including a cushioned arm support positioned atop a tubular sleeve adapted for slidable positioning upon one of said armrest supporting posts, each tubular sleeve is provided with a plurality of fourth transverse apertures each being adapted for alignment with one said third transverse aperture; and,
a pair of second locking pins that can be passed through said third and fourth transverse apertures when such are aligned with one another so that the height of said cushioned arm supports above said forward portion can be selectively fixed.
4. The wheelchair according to claim 1 further comprising:
a pair of socket members secured to said forward portion, each of said socket members having a first transverse aperture;
a footrest brace movably secured to said forward portion, said footrest brace including:
a pair of legs adapted for insertion into said socket members; the top of each of said legs being provided with a plurality of second transverse apertures adapted for alignment with said first transverse aperture in a respective one of said socket members,
a tie bar having a longitudinal opening in its center and joining the bottoms of said legs together, said tie bar being provided with a third transverse aperture passing through said longitudinal opening;
a pair of first locking pins for positioning within said first and second transverse apertures when such are aligned with one another so that the height of said tie bar relative to said forward portion of said collapsible frame can be selectively fixed;
a footrest including:
a spar slidably positioned within said longitudinal opening in said tie bar, said spar being provided with a plurality of third transverse apertures positioned along its length and being adapted for alignment with said third transverse aperture;
a cushioned support secured to the front of said spar; and,
a second locking pin for positioning within said third and fourth transverse apertures when such are aligned with one another so that the positioning of said cushioned support relative to said forward portion of said collapsible frame can be selectively fixed.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An apparatus, comprising:
a plurality of capacitive sense elements;
a first capacitance sensor and a second capacitance sensor; and
a switch circuit configured to couple the plurality of capacitive sense elements to the first and second capacitance sensors in different modes,
wherein the switch circuit is configured to couple the first capacitance sensor to a first group of two or more of the plurality of capacitive sense elements in a first mode,
wherein the switch circuit is configured to couple the second capacitance sensor to a second group of two or more of the plurality of capacitive sense elements, and
wherein the switch circuit is configured to couple at least one of the first or second capacitance sensors to individual ones of the two or more of the plurality of capacitive sense elements in one of the first or second groups in a second mode.
2. The apparatus of claim 1, wherein the switch circuit is configured to switch between the first mode and the second mode when a presence of a conductive object is detected in an area corresponding to one of the first or second groups in the first mode.
3. The apparatus of claim 1, further comprising a processing device comprising the switch circuit and the first and second capacitance sensors, wherein the processing device is configured to control the switch circuit to couple the first and second capacitance sensors to the plurality of capacitive sense elements in the first and second modes.
4. The apparatus of claim 3, wherein:
the processing device is configured to perform a first scan to detect a presence of a conductive object while the switch circuit is in the first mode;
the processing device is configured to perform a second scan when the presence of the conductive object is detected in the first scan; and
the processing device is configured to not perform the second scan when the presence of the conductive object is not detected in the first scan.
5. The apparatus of claim 4, wherein:
in the first scan, the processing device measures, using the first capacitance sensor, a first capacitance on the first group of the two or more capacitive sense elements coupled together;
in the first scan, the processing device measure, using the second capacitance sensor, a second capacitance on the second group of the two or more capacitive sense elements coupled together; and
in the second scan, the processing device measures, using at least one of the first capacitance sensor or the second capacitance sensor, a third capacitance on each individual one of the two or more capacitive sense elements of one of the first or second groups,
wherein the one group corresponds to a first area in which the presence of the conductive object is detected during the first scan, and
wherein the two or more of the plurality of capacitive sense elements in the one group are not coupled together in the second mode.
6. An apparatus, comprising:
a two-dimensional capacitive sense array comprising a plurality of rows of capacitive sense elements and a plurality of columns of capacitive sense elements;
a first capacitance sensor;
a second capacitance sensor; and
a switch circuit configured to couple the first and second capacitance sensors to the two-dimensional capacitive sense array in different modes, wherein:
in a first mode, the switch circuit is configured to couple the first capacitance sensor to a first group of two or more of the plurality of rows, and to couple the second capacitance sensor to a second group of two or more of the plurality of rows;
in a second mode, the switch circuit is configured to couple the second capacitance sensor to a third group of two or more of the plurality of columns, and to couple the second capacitance sensor to a fourth group of two or more of the plurality of columns;
in a third mode, the switch circuit is configured to couple at least one of the first capacitance sensor or the second capacitance sensor to individual ones of the two or more of the plurality of rows in one of the first or second groups of rows; and
in a fourth mode, the switch circuit is configured to couple at least one of the first capacitance sensor or the second capacitance sensor to individual ones of the two or more of the plurality of columns in one of the third or fourth groups of columns.
7. The apparatus of claim 6, wherein:
the switch circuit is configured to switch between the first mode and the third mode when a presence of a conductive object is detected in an area corresponding to the one group of rows in the first mode, and
the switch circuit is configured to switch between the second mode and the fourth mode when the presence of the conductive object is detected in the area corresponding to the one group of columns in the second mode.
8. The apparatus of claim 6, further comprising a processing device comprising the switch circuit and the first and second capacitance sensors, wherein the processing device is configured to control the switch circuit to couple the first and second capacitance sensors to the plurality of rows and plurality of columns in the first, second, third, and fourth modes.
9. The apparatus of claim 6, wherein:
the processing device is configured to perform a first scan of the first and second groups of rows to detect a presence of a conductive object while the switch circuit is in the first mode;
the processing device is configured to perform a second scan of the third and fourth groups of columns to detect a presence of the conductive object while the switch circuit is in the second mode;
the processing device is configured to perform a third scan when the presence of the conductive object is detected in the first scan;
the processing device is configured to perform a fourth scan when the presence of the conductive object is detected in the second scan; and
the processing device is configured to not perform the third and fourth scan when the presence of the conductive object is not detected in the first and second scans.
10. The apparatus of claim 9, wherein:
in the first scan, the processing device measures, using the first capacitance sensor, a first capacitance on the first group of rows having the two or more rows coupled together;
in the first scan, the processing device measures, using the second capacitance sensor, a second capacitance on the second group of rows having the two or more rows coupled together;
in the second scan, the processing device measures, using the first capacitance sensor, a third capacitance on the third group of columns having the two or more columns coupled together;
in the second scan, the processing device measures, using the second capacitance sensor, a fourth capacitance on the fourth group of columns having the two or more columns coupled together;
in the third scan, the processing device measures, using the first and second capacitance sensors, capacitances on each individual one of the two or more rows of the one group of rows,
wherein the one group of rows corresponds to a first area in which the presence of the conductive object is detected during the first scan, and
wherein the two or more of the plurality of rows in the one group of rows are not coupled together in the third scan; and
in the fourth scan, the processing device measures, using the first and second capacitance sensors, capacitances on each individual one of the two or more columns of the one group of columns,
wherein the one group of columns corresponds to the first area in which the presence of the conductive object is detected during the second scan, and
wherein the two or more of the plurality of columns in the one group of columns are not coupled together in the fourth scan.
11. The apparatus of claim 10, wherein the processing device is configured to perform the first, second, third, and fourth scans in the following order: the first scan, the second scan, the third scan, and the fourth scan.
12. The apparatus of claim 11, wherein the processing device is configured to perform the first, second, third, and fourth scans in the following order: the first scan, the third scan, the second scan, and the fourth scan.
13. A method, comprising
coupling a plurality of capacitance capacitive sense elements to a first capacitance sensor and a second capacitance sensor in different modes, wherein said coupling comprises:
coupling, using a switch circuit, the first capacitance sensor to a first group of two or more of the plurality of capacitive sense elements in a first mode;
coupling, using the switch circuit, the second capacitance sensor to a second group of two or more of the plurality of capacitive sense elements in the first mode; and
coupling, using the switch circuit, at least one of the first capacitance sensor or the second capacitance sensor to individual ones of the two or more of the plurality of capacitive sense elements in one of the first group or second group in a second mode.
14. The method of claim 13, further comprising switching between the first mode and the second mode when a presence of a conductive object is detected in an area corresponding to the one group in the first mode.
15. The method of claim 13, further comprising:
performing a first scan to detect a presence of a conductive object while the switch circuit is in the first mode; and
performing a second scan when the presence of the conductive object is detected in the first scan,
wherein the second scan is not performed when the presence of the conductive object is not detected in the first scan.
16. The method of claim 15, further comprising:
in the first scan, measuring a first capacitance on each of the first and second groups, each of the groups having the two or more capacitive sense elements coupled together; and
in the second scan, measuring a second capacitance on each individual one of the two or more capacitive sense elements of one of the groups,
wherein the one group corresponds to a first area in which the presence of the conductive object is detected during the first scan, and
wherein the two or more of the plurality of capacitive sense elements in the one group are not coupled together in the second mode.
17. The method of claim 13, wherein the plurality of capacitive sense elements are arranged as a plurality of rows and a plurality of columns of a two-dimensional capacitive sense array, and wherein the method further comprises:
in the first mode,
coupling the first capacitance sensor to a first group of two or more of the plurality of rows,
coupling the second capacitance sensor to a second group of two or more of the plurality of rows;
coupling the first capacitance sensor to a third group of two or more of the plurality of columns;
coupling the second capacitance sensor to a fourth group of two or more of the plurality of columns; and
in the second mode,
coupling at least one of the first capacitance sensor or second capacitance sensor to individual ones of the two or more of the plurality of rows in one of the first and second groups of rows, and
coupling at least one of the first capacitance sensor or second capacitance sensor to individual ones of the two or more of the plurality of columns in one of the third and fourth groups of columns.
18. The method of claim 17, further comprising:
performing a first scan of the first and second groups of rows to detect a presence of a conductive object while the switch circuit is in the first mode;
performing a second scan of the third and fourth groups of columns to detect a presence of the conductive object while the switch circuit is in the first mode;
performing a third scan when the presence of the conductive object is detected in the first scan; and
performing a fourth scan when the presence of the conductive object is detected in the second scan.
19. The method of claim 18, further comprising:
in the first scan, measuring a first capacitance on each of the first and second groups of rows, each of the groups of rows having the two or more rows coupled together;
in the second scan, measuring a second capacitance on each of the third and fourth groups of columns, each of the groups of columns having the two or more columns coupled together; and
in the third scan, measuring a third capacitance on each individual one of the two or more rows of the one group of rows,
wherein the one group of rows corresponds to a first area in which the presence of the conductive object is detected during the first scan, and
wherein the two or more of the plurality of rows in the one group of rows are not coupled together in the third scan; and
in the fourth scan, measuring a fourth capacitance on each individual one of the two or more columns of the one group of columns,
wherein the one group of columns corresponds to the first area in which the presence of the conductive object is detected during the second scan, and
wherein the two or more of the plurality of columns in the one group of columns are not coupled together in the fourth scan.
20. The method of claim 18, wherein said performing the third scan is performed before said performing the second scan.