1. An optical non-destructive inspection apparatus comprising:
a focusing-collimating unit that emits parallel light, which is incident from a first side along an optical axis, from a second side, focuses the parallel light to a measurement spot set on a measurement object as a focal position, converts light, which is emitted and reflected from the measurement spot and incident from the second side, into parallel light along the optical axis, and emits the parallel light from the first side;
a heating laser beam source that emits a heating laser beam for heating the measurement object without destroying the measurement object;
a heating laser beam guide unit that guides the heating laser beam to the first side of the focusing-collimating unit;
a first infrared detector and a second infrared detector that detect infrared light beams emitted from the measurement spot;
a control unit; and
an emitted-infrared selective guide unit that guides infrared light beams with two different wavelengths, out of the parallel light emitted from the measurement spot and emitted from the first side of the focusing-collimating unit, to the first infrared detector and the second infrared detector, respectively, the infrared light beams with the two different wavelengths being selected by the control unit,
wherein the control unit
receives a detection signal from the first infrared detector and a detection signal from the second infrared detector while controlling the heating laser beam source so as to heat the measurement spot with the heating laser beam,
measures a temperature of the measurement spot based on a ratio between a detected value from the first infrared detector and a detected value from the second infrared detector,
measures a temperature rise characteristic that is a temperature rise state of the measurement spot based on a heating time,
determines a state of the measurement object based on the measured temperature rise characteristic, and
controls the emitted-infrared selective guide unit based on the measured temperature during measurement so as to change at least one of the wavelengths of the infrared light beams guided to the first infrared detector and the second infrared detector.
2. The optical non-destructive inspection apparatus according to claim 1, wherein
the emitted-infrared selective guide unit includes:
a first emitted-infrared guide unit that guides one of an infrared light beam with a first infrared wavelength and an infrared light beam with a second infrared wavelength, out of the parallel light emitted from the measurement spot and emitted from the first side of the focusing-collimating unit, to the first infrared detector, the one of the infrared light beam with the first infrared wavelength and the infrared light beam with the second infrared wavelength being selected by the control unit; and
a second emitted-infrared guide unit that guides an infrared light beam with a predetermined infrared wavelength out of the parallel light emitted from the measurement spot and emitted from the first side of the focusing-collimating unit, to the second infrared detector.
3. The optical non-destructive inspection apparatus according to claim 2, wherein
the heating laser beam guide unit includes:
a heating laser beam collimating unit that is disposed in vicinity of the heating laser beam source, and converts the heating laser beam emitted from the heating laser beam source into parallel light; and
a heating-laser selective reflection unit that is disposed on the optical axis of the focusing-collimating unit, reflects the heating laser beam to the first side of the focusing-collimating unit, and transmits a light beam with a wavelength different from a wavelength of the heating laser beam out of the parallel light emitted and reflected from the measurement spot and emitted from the first side of the focusing-collimating unit, or
a heating-laser selective reflection unit that is disposed on the optical axis of the focusing-collimating unit, transmits the heating laser beam to the first side of the focusing-collimating unit, and reflects the light beam with the wavelength different from the wavelength of the heating laser beam out of the parallel light emitted and reflected from the measurement spot and emitted from the first side of the focusing-collimating unit.
4. The optical non-destructive inspection apparatus according to claim 3, wherein
the first emitted-infrared guide unit includes:
the heating-laser selective reflection unit;
a predetermined-infrared selective reflection unit disposed in a path of parallel light that is emitted from the first side of the focusing-collimating unit and transmitted or reflected by the heating-laser selective reflection unit and has a wavelength different from the wavelength of the heating laser beam, the predetermined-infrared selective reflection unit transmitting the infrared light beam with the predetermined infrared wavelength out of the parallel light to the second infrared detector, and reflecting the parallel light with a wavelength different from the predetermined infrared wavelength to the first infrared detector, or
a predetermined-infrared selective reflection unit disposed in the path of the parallel light that is emitted from the first side of the focusing-collimating unit and transmitted or reflected by the heating-laser selective reflection unit and has the wavelength different from the wavelength of the heating laser beam, the predetermined-infrared selective reflection unit reflecting the infrared light beam with the predetermined infrared wavelength out of the parallel light to the second infrared detector, and transmitting the parallel light with the wavelength different from the predetermined infrared wavelength to the first infrared detector;
a first infrared selective reflection unit that, when disposed in a path of parallel light reflected or transmitted in a direction different from a direction toward the second infrared detector by the predetermined-infrared selective reflection unit, transmits or reflects the infrared light beam with the first infrared wavelength out of the parallel light;
a second infrared selective reflection unit that, when disposed in the path of the parallel light reflected or transmitted in the direction different from the direction toward the second infrared detector by the predetermined-infrared selective reflection unit, transmits or reflects the infrared light beam with the second infrared wavelength out of the parallel light;
a position moving unit that allows a position of one of the first infrared selective reflection unit and the second infrared selective reflection unit to move onto the path of the parallel light reflected or transmitted in the direction different from the direction toward the second infrared detector by the predetermined-infrared selective reflection unit, the position moving unit being controlled by the control unit; and
a first infrared focusing unit that is disposed in vicinity of the first infrared detector, and focuses the infrared light beam with the first infrared wavelength or the second infrared wavelength, which is reflected or transmitted by the first infrared selective reflection unit or the second infrared selective reflection unit, to the first infrared detector, the infrared light beam with the first infrared wavelength or the second infrared wavelength being parallel light.
5. The optical non-destructive inspection apparatus according to claim 4, wherein
the second emitted-infrared guide unit includes:
the heating-laser selective reflection unit;
the predetermined-infrared selective reflection unit; and
a second infrared focusing unit that is disposed in vicinity of the second infrared detector, and focuses the infrared light beam with the predetermined infrared wavelength, which is transmitted or reflected by the predetermined-infrared selective reflection unit, to the second infrared detector, the infrared light beam with the predetermined infrared wavelength being parallel light.
6. The optical non-destructive inspection apparatus according to claim 4, wherein
the control unit
controls the position moving unit so that the infrared light beam with the first infrared wavelength transmitted or reflected by the first infrared selective reflection unit is guided to the first infrared detector when the temperature of the measurement spot is lower than a predetermined temperature during measurement,
controls the position moving unit so that the infrared light beam with the second infrared wavelength transmitted or reflected by the second infrared selective reflection unit is guided to the first infrared detector when the temperature of the measurement spot is equal to or higher than the predetermined temperature during measurement, and
determines the state of the measurement object based on the temperature rise characteristic that is based on the measured temperature and the heating time.
7. The optical non-destructive inspection apparatus according to claim 5, wherein
the control unit
controls the position moving unit so that the infrared light beam with the first infrared wavelength transmitted or reflected by the first infrared selective reflection unit is guided to the first infrared detector when the temperature of the measurement spot is lower than a predetermined temperature during measurement,
controls the position moving unit so that the infrared light beam with the second infrared wavelength transmitted or reflected by the second infrared selective reflection unit is guided to the first infrared detector when the temperature of the measurement spot is equal to or higher than the predetermined temperature during measurement, and
determines the state of the measurement object based on the temperature rise characteristic that is based on the measured temperature and the heating time.
8. The optical non-destructive inspection apparatus according to claim 2,
wherein the first infrared wavelength is set to a wavelength longer than the predetermined infrared wavelength, and
wherein the second infrared wavelength is set to a wavelength shorter than the predetermined infrared wavelength.
9. The optical non-destructive inspection apparatus according to claim 1,
wherein the measurement object is a bonding structure including a bonding part in which two members are bonded,
wherein the measurement spot is set on a surface of one of the two members, and
wherein the control unit determines a bonding state of the two members based on the temperature rise characteristic.
10. The optical non-destructive inspection apparatus according to claim 9,
wherein the bonding state of the two members to be determined is a magnitude of an area of the bonding part of the two members, and
wherein the control unit determines whether the area of the bonding part of the two members is in an allowable range, based on the temperature rise characteristic.
11. An optical non-destructive inspection method,
wherein the optical non-destructive inspection apparatus according to claim 1 is used, and
wherein the state of the measurement object is determined by the control unit.
12. An optical non-destructive inspection method,
wherein the optical non-destructive inspection apparatus according to claim 9 is used, and
wherein the bonding state of the two members is determined by the control unit.
13. An optical non-destructive inspection method,
wherein the optical non-destructive inspection apparatus according to claim 10 is used, and
wherein whether the area of the bonding part of the two members is in an allowable range is determined by the control unit.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A stapler and detachable accessory combination comprising:
a stapler having a base with an accessory storage chamber, the storage chamber having an open end; and
a detachable accessory defining an operating end, a non-operating end, and a grasping portion intermediate and aligned with the operating and non-operating ends, the grasping portion defining a location where a user both applies force while operating the detachable accessory and grasps the accessory for insertion into and removal from the storage chamber, the detachable accessory being removably positioned in the storage chamber with the non-operating end near the open end, the operating end further from the open end in the storage chamber, and the grasping portion exposed outside of the storage chamber.
2. The stapler and detachable accessory combination of claim 1, wherein the accessory is a jaw-type staple remover, wherein the operating end is an end of the remover defining staple grasping claws, and wherein the non-operating end is a pivot end.
3. The stapler and detachable accessory combination of claim 1, wherein the accessory is a hole punch, wherein the operating end is an end of the punch having a punch pin, and wherein the non-operating end is a pivot end.
4. The stapler and detachable accessory combination of claim 1, wherein the accessory is a pencil sharpener, and wherein the operating end is an end of the sharpener defining a pencil-insertion opening.
5. The stapler and detachable accessory combination of claim 1, wherein the base further comprises an aperture communicating with the storage chamber, and wherein the grasping portion is at least partially received in the aperture.
6. The stapler and detachable accessory combination of claim 5, wherein the grasping portion includes a raised portion that extends at least partially into the aperture.
7. The stapler and detachable accessory combination of claim 5, wherein the aperture is a slot in the base extending from the open end of the storage chamber, and wherein the grasping portion is slidably received in the slot during insertion of the accessory into the storage chamber.
8. The stapler and detachable accessory combination of claim 7, wherein the slot defines a terminal end and wherein the grasping portion engages the terminal end to substantially prevent further insertion of the accessory into the storage chamber.
9. The stapler and detachable accessory combination of claim 7, wherein the base includes a recessed area adjacent the slot to facilitate a user grasping the grasping portion.
10. The stapler and detachable accessory combination of claim 1, wherein the accessory includes a locking member removably securing the accessory in the storage chamber.
11. The stapler and detachable accessory combination of claim 10, wherein the locking member is a rib on an outer surface of the grasping portion, the rib engaging with a shoulder on an interior surface of the base.
12. The stapler and detachable accessory combination of claim 10, wherein the locking member is biased into engagement with the stapler to removably secure the accessory in the storage chamber.
13. The stapler and detachable accessory combination of claim 1, wherein the stapler is a manual stapler having a magazine pivotally attached to the base at a pivot point, and wherein the storage chamber is located between a bottom of the base and the pivot point.
14. The stapler and detachable accessory combination of claim 1, wherein the base defines a footprint, and wherein the accessory is positioned substantially entirely within the footprint when stored in the storage chamber.
15. The stapler and detachable accessory combination of claim 1, wherein the detachable accessory is one of a staple remover, a hole punch, a pencil sharpener, an adhesive flag dispenser, a tape dispenser, a mini-stapler, a USB memory stick, a marking device, a laser pointer, a letter opener, and a scissors.
16. The stapler and detachable accessory combination of claim 1, wherein each of the operating end, the non-operating end, and the grasping portion are substantially the same width.
17. The stapler and detachable accessory combination of claim 1, wherein the grasping portion is defined by oppositely facing surfaces, and wherein each of the oppositely facing surfaces is exposed outside of the storage chamber when the detachable accessory is removably positioned in the storage chamber.