What is claimed is:
1. A nickel electrode for alkaline secondary battery including a porous sintered nickel substrate loaded with a nickel hydroxide-based active material, the nickel electrode comprising a first coating layer of cobalt compound laid on a surface portion of the active material loaded into the sintered nickel substrate; and a second coating layer laid on the first coating layer and based on a compound of at least one element selected from the group consisting of nickel, magnesium, calcium, barium, strontium, scandium, yttrium, lanthanide and bismuth.
2. The nickel electrode for alkaline secondary battery as claimed in claim 1, wherein the lanthanide in said second coating layer is comprised of at least one element selected from the group consisting of lanthanum, cerium, praseodymium, neodymium, samarium, europium and ytterbium.
3. The nickel electrode for alkaline secondary battery as claimed in claim 1, wherein the compound in said second coating layer is comprised of a hydroxide, an oxide, or a mixture of these.
4. The nickel electrode for alkaline secondary battery as claimed in claim 1, wherein the compound in the second coating layer contains said element in concentrations of 0.05 to 5 wt % based on the total weight of said active material, and first and second coating layers.
5. The nickel electrode for alkaline secondary battery as claimed in claim 1, wherein the cobalt compound in the first coating layer contains cobalt in concentrations of 0.05 to 5 wt % based on the total weight of said active material, and first and second coating layers.
6. An alkaline secondary battery employing the nickel electrode for alkaline secondary battery of claim 1 as its positive electrode.
7. A nickel electrode for alkaline secondary battery including a porous sintered nickel substrate loaded with a nickel hydroxide-based active material, the nickel electrode comprising a first coating layer of cobalt compound laid on a surface portion of the active material loaded into the sintered nickel substrate; and a second coating layer laid on the first coating layer and based on a complex compound of cobalt and at least one element selected from the group consisting of nickel, magnesium, calcium, barium, strontium, scandium, yttrium, lanthanide and bismuth.
8. The nickel electrode for alkaline secondary battery as claimed in claim 7, wherein the lanthanide in said second coating layer is comprised of at least one element selected from the group consisting of lanthanum, cerium, praseodymium, neodymium, samarium, europium and ytterbium.
9. The nickel electrode for alkaline secondary battery as claimed in claim 7, wherein the complex compound in said second coating layer is comprised of a hydroxide, an oxide or a mixture of these.
10. The nickel electrode for alkaline secondary battery as claimed in claim 7, wherein the complex compound in the second coating layer contains the above elements (including cobalt) in concentrations of 0.05 to 5 wt % based on the total weight of said active material, and first and second coating layers.
11. The nickel electrode for alkaline secondary battery as claimed in claim 7, wherein the cobalt compound in the first coating layer contains, cobalt in concentrations of 0.05 to 5 wt % based on the total weight of said active material, and first and second coating layers.
12. An alkaline secondary battery employing the nickel electrode for alkaline secondary battery of claim 7 as its positive electrode.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A polymorphic Form A of (1-{3-3-(4-cyano-3-methoxy-phenyl)ureido-phenyl}-ethyl)-carbamic acid-2-cyano-1-ethyl-ethyl ester, characterized by one or more peaks at about 5.76, 7.82, 8.10, 10.08, and 15.73 degrees 2\u03b8 in an X-ray powder diffraction pattern obtained using Cu K alpha radiation.
2. The polymorphic Form A according to claim 1, wherein said X-ray diffraction pattern is substantially similar to FIG. 1.
3. The polymorphic Form A according to claim 1, wherein said Form A is characterized by a melting point temperature of between 148\xb0 C. to about 156\xb0 C.
4. A pharmaceutical composition comprising:
(a) a polymorphic Form according to claim 2; and
(b) a pharmaceutically acceptable carrier or adjuvant.
5. A process for preparing a polymorph of Form A according to claim 2, said process comprising at least one of the following steps:
a) dissolving 1-{3-3-(4-cyano-3-methoxy-phenyl)ureido-phenyl}-ethyl)-carbamic acid-2-cyano-1-ethyl-ethyl ester in ethyl acetate with agitation at a temperature of 70-77\xb0 C. to give a solution;
b) filtering said solution through a medium at a temperature of 30-40\xb0 C. to give a filtrate;
c) cooling said filtrate to about room temperature;
d) seeding said filtrate with a quantity of Form A;
e) concentrating said filtrate under a reduced pressure and at a temperature of 20-30\xb0 C. to about one-third the original volume to give a slurry;
f) agitating said slurry for a period of time at a temperature of 20-30\xb0 C.;
g) adding an amount of a solvent at a temperature of 40-50\xb0 C. to generate a solution;
h) adding about one volume of a solvent over a period of about 1 hour, at a temperature of about 20-25\xb0 C. with agitation to generate a slurry;
i) cooling said slurry to about room temperature and agitating for a period of time;
j) isolating the product by filtration or centrifugation;
k) rinsing said product with about a 1:1 mixture of heptane and ethyl acetate; and
l) drying said product at a temperature of about 45-55\xb0 C. under reduced pressure for a period of time to constant weight.
6. A polymorphic Form A, wherein said polymorphic Form A has a peak position at about 5.76 degrees 2\u03b8 in an x-ray powder diffraction pattern obtained using Cu K alpha radiation.
7. A polymorphic Form A, wherein said polymorphic Form A has a peak position at about 7.82 degrees 2\u03b8 in an x-ray powder diffraction pattern obtained using Cu K alpha radiation.
8. A polymorphic Form A, wherein said polymorphic Form A has a peak position at about 8.10 degrees 2\u03b8 in an x-ray powder diffraction pattern obtained using Cu K alpha radiation.
9. A polymorphic Form A, wherein said polymorphic Form A has a peak position at about 10.08 degrees 2\u03b8 in an x-ray powder diffraction pattern obtained using Cu K alpha radiation.
10. A polymorphic Form A, wherein said polymorphic Form A has a peak position at about 15.73 degrees 2\u03b8 in an x-ray powder diffraction pattern obtained using Cu K alpha radiation.
11. A polymorphic Form A, wherein said polymorphic Form A is characterized by an X-ray diffraction pattern substantially similar to FIG. 1.