1. A semiconductor device comprising:
an input terminal to receive an input potential, and
a conversion circuit to receive and shift a first signal to output a second signal based on said input potential as a reference, wherein said conversion circuit includes:
a capacitor connected between a first node to which said first signal is input and a second node from which said second signal is output,
a first switch provided between said second node and an intermediate node, and
a second switch provided between said intermediate node and said input terminal, rendered conductive together with said first switch.
2. The semiconductor device according to claim 1, wherein said conversion circuit holds the reference of said second signal at said input potential.
3. The semiconductor device according to claim 1, further comprising a photoelectric converter to convert incident light into an electrical signal to output said first signal.
4. The semiconductor device according to claim 1, wherein said first switch includes a first MOS transistor connected between said second node and said intermediate node,
said second switch includes a second MOS transistor connected between said input terminal and said intermediate node, receiving a constant potential at a backgate, and
said second MOS transistor has a gate width larger than the gate width of said first MOS transistor.
5. The semiconductor device according to claim 4, further comprising a control circuit to control said first and second MOS transistors,
wherein said control circuit is arranged to set said second MOS transistor to a non-conductive state after setting said first MOS transistor to a non-conductive state.
6. The semiconductor device according to claim 5, wherein said control circuit is arranged to set said first MOS transistor to a conductive state after setting said second MOS transistor to a conductive state.
7. A module, comprising:
a plurality of semiconductor devices, each of said plurality of semiconductor devices including:
an input terminal to receive an input potential, and
a conversion circuit to receive and shift a first signal to output a second signal based on said input potential as a reference, wherein said conversion circuit includes:
a capacitor connected between a first node to which said first signal is input and a second node from which said second signal is output,
a first switch provided between said second node and an intermediate node, and
a second switch provided between said intermediate node and said input terminal, rendered conductive together with said first switch.
8. The module according to claim 7, wherein said conversion circuit holds the reference of said second signal at said input potential.
9. The module according to claim 7, each of said plurality of semiconductor devices further including a photoelectric converter to convert incident light into an electrical signal to output said first signal.
10. The module according to claim 7, wherein said first switch includes a first MOS transistor connected between said second node and said intermediate node,
said second switch includes a second MOS transistor connected between said input terminal and said intermediate node, receiving a constant potential at a backgate, and
said second MOS transistor has a gate width larger than the gate width of said first MOS transistor.
11. The module according to claim 10, each of said plurality of semiconductor devices further including a control circuit to control said first and second MOS transistors,
wherein said control circuit is arranged to set said second MOS transistor to a non-conductive state after setting said first MOS transistor to a non-conductive state.
12. The module according to claim 11, wherein said control circuit is arranged to set said first MOS transistor to a conductive state after setting said second MOS transistor to a conductive state.
13. An electronic device, comprising:
a module including a plurality of semiconductor devices, each of said plurality of semiconductor devices including:
an input terminal to receive an input potential, and
a conversion circuit to receive and shift a first signal to output a second signal based on said input potential as a reference, wherein said conversion circuit includes:
a capacitor connected between a first node to which said first signal is input and a second node from which said second signal is output,
a first switch provided between said second node and an intermediate node, and
a second switch provided between said intermediate node and said input terminal, rendered conductive together with said first switch.
14. The electronic device according to claim 13, wherein said conversion circuit holds the reference of said second signal at said input potential.
15. The electronic device according to claim 13, each of said plurality of semiconductor devices further including a photoelectric converter to convert incident light into an electrical signal to output said first signal.
16. The electronic device according to claim 13, wherein
said first switch includes a first MOS transistor connected between said second node and said intermediate node,
said second switch includes a second MOS transistor connected between said input terminal and said intermediate node, receiving a constant potential at a backgate, and
said second MOS transistor has a gate width larger than the gate width of said first MOS transistor.
17. The electronic device according to claim 16, each of said plurality of semiconductor devices further including a control circuit to control said first and second MOS transistors,
wherein said control circuit is arranged to set said second MOS transistor to a non-conductive state after setting said first MOS transistor to a non-conductive state.
18. The electronic device according to claim 17, wherein said control circuit is arranged to set said first MOS transistor to a conductive state after setting said second MOS transistor to a conductive state.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for detecting a location of a pulse-type mechanical effect on a system part, which comprises the steps of:
detecting an operating noise present in the system part continuously by a plurality of sensors disposed on the system part and being converted by the sensors into measurement signals;
storing the measurement signals in time intervals for a time range;
determining a first magnitude of a transform of each of the measurement signals with an aid of prescribed first parameters of a mathematical transformation rule in first time windows that are temporally sequential in first time steps and lie within the time range;
deriving a first evaluation function for each of the first time steps from the first magnitudes determined for each of the prescribed first parameters resulting in a plurality of first evaluation functions;
comparing the first evaluation functions respectively with a first threshold value, and an overshooting of the first threshold value by at least one of the first evaluation functions at a triggering instant is valued as an index for a presence of a pulse-type signal component indicating the mechanical effect;
determining second evaluation functions with an aid of prescribed second parameters of the mathematical transformation rule and with the same algorithms in second time windows that are temporally sequential in second time steps and lie within the time range, and which are smaller than the first time windows; and
determining the location of an effect from instants at which the second evaluation functions respectively fulfill a prescribed criterion, and from propagation time differences resulting therefrom.
2. The method according to claim 1, which further comprises setting the second time steps to be shorter than the first time steps.
3. The method according to claim 1, which further comprises determining for each of the first time steps and each of the prescribed first parameters, a deviation of the first magnitudes from a first mean magnitude, and a mean deviation assigned to this from which the first evaluation function is derived for each of the prescribed first parameters and for each of the first time steps, and in which a calculation of the second evaluation function is based both on a second mean magnitude valid for the triggering instant for the prescribed second parameters and on the mean deviation assigned to said second mean magnitude.
4. The method according to claim 1, wherein the prescribed criterion is fulfilled with the second evaluation functions respectively overshooting a second threshold value.
5. The method according to claim 1, wherein the prescribed criterion is fulfilled when a first derivative of the second evaluation function overshoots a difference threshold value.
6. The method according to claim 5, which further comprises deriving the difference threshold value from a maximum gradient of a rising edge of the second evaluation function.
7. The method according to claim 6, which further comprises determining the difference threshold value with an aid of relationship DK0,s=\u03b2DKmax,s, in which case 0.05\u2266\u03b2\u22660.2.
8. A device for detecting a location of a pulse-type mechanical effect on a system part, the device comprising:
a plurality of sensors disposed on the system part, for continuously detecting and measuring an operating noise present in the system part;
at least one AD converter, connected downstream of said sensors, for digitizing measurement signals detected by said sensors; and
an arithmetic unit connected to and receiving the digitized measurement signals from said AD converter, said arithmetic unit programmed to:
store the measurement signals respectively in time intervals for a time range;
determine a first magnitude of a transform of each of the measurement signals with an aid of said of prescribed first parameters of a mathematical transformation rule in first time windows that are temporally sequential in first time steps and lie within the time range;
derive a first evaluation function respectively for each of the first time step from the first magnitude determined for each of the prescribed first parameters resulting in first evaluation functions;
compare the first evaluation functions respectively with a first threshold value, and an overshooting of the first threshold value by at least one of the first evaluation functions at a triggering instant is valued as an index for a presence of a pulse-type signal component indicating the mechanical effect;
determine second evaluation functions with an aid of prescribed second parameters of the mathematical transformation rule and with the same algorithms in second time windows that are temporally sequential in second time steps and lie within the time range, and which are smaller than the first time windows; and
determine the location of an effect from instants at which the second evaluation functions respectively fulfill a prescribed criterion, and from propagation time differences resulting therefrom.
9. The device according to claim 8, wherein said arithmetic unit is further programmed to set the second time steps to be shorter than the first time steps.
10. The device according to claim 8, wherein said arithmetic unit is further programmed to determine for each of the first time steps and each of the prescribed first parameters a deviation of the first magnitudes from a first mean magnitude, and a mean deviation assigned to this from which the first evaluation function is derived for each of the prescribed first parameters and for each of the first time steps, and in which a calculation of the second evaluation function is based both on a second mean magnitude valid for the triggering instant for the prescribed second parameters and on the mean deviation assigned to said second mean magnitude.
11. The device according to claim 8, wherein the prescribed criterion is fulfilled with the second evaluation functions respectively overshooting a second threshold value.
12. The device according to claim 8, wherein the prescribed criterion is fulfilled when a first derivative of the second evaluation function overshoots a difference threshold value.
13. The device according to claim 12, wherein said arithmetic unit is further programmed to derive the difference threshold value from a maximum gradient of a rising edge of the second evaluation function.
14. The device according to claim 8, wherein said arithmetic unit is further programmed to determine the difference threshold value with an aid of relationship DK0,s=\u03b2DKmax,s, in which case 0.05\u2266\u03b2\u22660.2.