1. A level shift circuit comprising:
a CMOS inverter circuit that receives an input pulse signal having a crest value of a first potential;
a latch circuit that operates on a power supply of a second potential which is higher than the first potential, the latch circuit having one end thereof connected to an output end of the CMOS inverter circuit and outputting from the other end thereof an output pulse signal having a crest value of the second potential and a same phase as the input pulse signal; and
a power supply circuit that supplies a power supply of not less than the first potential and less than the second potential to the CMOS inverter circuit;
wherein the power supply circuit functions to limit the power supply when the input pulse signal assumes at least a ground level,
wherein the power supply circuit includes a reverse current blocking circuit that operates to block current from flowing from a power supply terminal of the CMOS inverter circuit to a power supply side of the CMOS inverter circuit when the input pulse signal assumes the ground level.
2. The level shift circuit according to claim 1, wherein
the reverse current blocking circuit comprises:
a blocking MOS transistor inserted between the power supply side of the CMOS inverter circuit and the power supply terminal of the CMOS inverter circuit and having a same conductivity type as an MOS transistor that is present on the power supply side of the CMOS inverter circuit; and
a blocking inverter circuit with an input end thereof connected to the output end of the latch circuit and an output end thereof connected to a gate of the blocking MOS transistor.
3. The level shift circuit according to claim 2, wherein
the level shift circuit comprises two resistance elements connected in series between the power supply of the second potential and the ground, and the power supply is effected to the CMOS inverter circuit from a connecting point between the two resistance elements through the blocking MOS transistor.
4. A level shift circuit comprising:
a CMOS inverter circuit that receives an input pulse signal having a crest value of a first potential;
a latch circuit that operates on a power supply of a second potential which is higher than the first potential, the latch circuit having one end thereof connected to an output end of the CMOS inverter circuit and outputting from the other end thereof an output pulse signal having a crest value of the second potential and a same phase as the input pulse signal; and
a power supply circuit that supplies a power supply of not less than the first potential and less than the second potential to the CMOS inverter circuit;
wherein the power supply circuit functions to limit the power supply when the input pulse signal assumes at least a ground level,
wherein the latch circuit comprises:
an output stage inverter circuit having an input end and an output end, the input end being the one end of the latch circuit and the output end being the other end of the latch circuit; and
a latch-stage MOS transistor with a source thereof connected to the power supply of the second potential, a drain thereof connected to the one end of the latch circuit, and a gate thereof connected to the other end of the latch circuit, the latch-stage MOS transistor having a same conductivity type as an MOS transistor that is present on a power supply side of the CMOS inverter circuit,
wherein
the latch circuit further comprises:
a through-current preventing MOS transistor with a gate thereof connected to an input end of the CMOS inverter circuit, a drain thereof connected to the one end of the latch circuit, and a source thereof connected to the drain of the latch-stage MOS transistor, the through-current preventing MOS transistor having a same conductivity type as the latch-stage MOS transistor; and
the drain of the latch-stage MOS transistor is connected to the source of the through-current preventing MOS transistor instead of being connected to the one end of the latch circuit.
5. A level shift circuit comprising:
a CMOS inverter circuit that receives an input pulse signal swinging between a first potential and a second potential;
a power supply circuit that is connected between a first power supply and a power supply terminal of the CMOS inverter circuit;
a latch circuit that operates on a second power supply of a third potential which is higher than the first potential, the latch circuit outputting an output pulse signal in response to an output signal of the CMOS inverter circuit, the output pulse signal having a same phase as the input pulse signal and swinging between the second potential and the third potential;
wherein a potential of the first power supply is lower than the third potential, the power supply circuit supplies the first power supply to the CMOS inverter circuit in response to the output pulse signal.
6. The level shift circuit according to claim 5, wherein the power supply circuit includes a first transistor connected between the first power supply and the power supply terminal of the CMOS inverter circuit, the first transistor becomes non-conductive when a potential of output pulse signal is the second potential.
7. The level shift circuit according to claim 5, wherein the latch circuit comprises:
an output stage inverter receiving the output signal of the CMOS inverter circuit and outputting the output pulse signal;
first and second transistor connected in series between the second power supply and an input terminal of the output stage inverter, the first transistor having a gate connected to an output terminal of the output stage inverter, the second transistor having a gate connected to an input terminal of the CMOS inverter circuit.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method to detect gases, liquids or particles, the method comprising:
providing a sensor, the sensor comprising
a substrate,
at least one recessed region on the substrate,
nanopillars defined in the at least one recessed region,
metallic bulbs on a top end of the nanopillars;
inserting the sensor in an environment; and
illuminating, by a laser, the metallic bulbs on the top end of the nanopillars, thereby detecting presence or absence of a target gas, liquid or particle.
2. The method of claim 1, wherein the sensor further comprises a functionalizing agent on the metallic bulbs on the top end of the nanopillars.
3. The method of claim 1, wherein the sensor further comprises a polymer layer on a top surface of the at least one recessed region in between the nanopillars.
4. The method of claim 1, wherein a distance between the metallic bulbs is between 5 and 50 nanometers.
5. The method of claim 1, wherein the substrate comprises mesas having a height higher than the at least one recessed region on the substrate, and a height of the nanopillars is equal or less than the height of the mesas.
6. The method of claim 1, wherein the at least one recessed region is an array of recessed regions.
7. The method of claim 1, wherein a distance between the metallic bulbs allows electrical insulation between the metallic bulbs.
8. The method of claim 1, wherein the substrate is silicon, the nanopillars are silicon dioxide and the metallic layer is gold.
9. The method of claim 1, further comprising choosing the metallic layer and a thickness of the metallic layer based on the target gas, liquid or particle.
10. The method of claim 9, wherein the substrate is silicon, the nanopillars are silicon dioxide and the metallic layer is gold, copper, aluminum, platinum, nickel or silver.
11. The method of claim 8, wherein the target gas, liquid or particle is hydrogen sulfide.
12. The method of claim 1, further comprising an optical fiber attached to one end of the at least one recessed region, wherein an opposite wall of the at least one recessed region comprises a metallic layer, thereby acting as a reflector for the optical fiber, the optical fiber being configured to shine a laser light on the metallic bulbs and collect a signal reflected from the metallic bulbs.
13. The method of claim 1, further comprising choosing a gap between the metallic bulbs based on a desired resonant wavelength.
14. The method of claim 13, wherein the desired resonant wavelength is 488, 514, 633, 790 or 1050 nm.
15. A method comprising:
providing a sensor, the sensor comprising
a substrate,
at least one recessed region on the substrate,
nanopillars defined in the at least one recessed region, the nanopillars having gaps between each other,
metallic bulbs on a top end of the nanopillars,
a microfluidic chamber around the at least one recessed region;
inserting a solution in the microfluidic chamber, the solution having a concentration of target molecules;
illuminating, by a laser, the metallic bulbs on the top end of the nanopillars;
concentrating, by the illuminating, the target molecules close to the gaps between the metallic bulbs;
removing part of the solution from the microfluidic chamber; and
turning off the laser, thereby allowing the target molecules to diffuse within a remaining part of the solution within the microfluidic chamber, and thereby increasing the concentration of target molecules.