1. A compound scanning probe microscope comprising:
an optical microscope which obtains an optical observation image of a sample through an objective lens;
a scanning probe microscope which has a cantilever scanning the sample, the scanning probe microscope obtaining a scanning probe observation image of the sample by the scan of the cantilever;
a display unit which displays the optical observation image or the scanning probe observation image; and
a cantilever position display processing unit which displays a marker on the optical observation image displayed on the display unit, the marker indicating a position of the cantilever or a scan area of the cantilever.
2. A compound scanning probe microscope according to claim 1, wherein the cantilever position display processing unit displays the marker on the display unit based on an amount of shift between a visual field position of the objective lens and an observation position of the scanning probe microscope.
3. A compound scanning probe microscope according to claim 1, further comprising an image pickup device which takes an image of the cantilever,
wherein the cantilever position display processing unit computes the position of the marker displayed in the optical observation image based on position information of the cantilever obtained by the image pickup device.
4. A compound scanning probe microscope according to claim 1, further comprising:
an alignment mark; and
an image pickup device which takes the image of the alignment mark through the objective lens of the optical microscope,
wherein the cantilever position display processing unit determines the position information of the cantilever in the optical observation image based on the amount of shift between the position information of the alignment mark in the optical observation image obtained by the image pickup device through the objective lens of the optional microscope and the position information of the alignment mark obtained by measurement of the scanning probe microscope, and displays the marker in the optical observation image displayed on the display unit according to the position information of the cantilever.
5. A compound scanning probe microscope according to claim 4, wherein the cantilever position display processing unit previously stores the position information of the alignment mark when the observation is performed through the objective lens.
6. A compound scanning probe microscope according to claim 1, further comprising:
an alignment mark;
a revolver to which the objective lens and a scanning probe microscope unit is attached, the scanning probe microscope unit having the cantilever, the revolver switching between the objective lens and the scanning probe microscope unit;
an image pickup device which takes the image of the alignment mark through the objective lens of the optical microscope or takes the alignment mark through the scanning probe microscope, and
wherein the cantilever position display processing unit computes and determines the position information of the cantilever in the optical observation image displayed on the display unit based on first image data of the alignment mark obtained by the image pickup device through the objective lens and second image data obtained by the image pickup device through the scanning probe microscope unit, and displays the marker in the optical observation image displayed on the display unit.
7. A compound scanning probe microscope according to claim 1, wherein the marker has a shape similar to the cantilever, a circular shape, or the desired shape.
8. A compound scanning probe microscope according to claim 4, wherein the alignment mark is formed by a light-transmission member, and the alignment mark has a cross shape, the circular shape, a plurality of concentric circles, or a shape by which the position can be specified.
9. A compound scanning probe microscope according to claim 6, wherein the alignment mark is formed by the light-transmission member, and the alignment mark has the cross shape, the circular shape, the plurality of concentric circles, or the shape by which the position can be specified.
10. A compound scanning probe microscope according to claim 1, further comprising:
an alignment mark;
a revolver to which the objective lens and a scanning probe microscope unit is attached, the scanning probe microscope unit having the cantilever, the revolver switching between the objective lens and the scanning probe microscope unit;
a first image pickup device which takes the image of the alignment mark through the objective lens switched by the revolver;
an opposed-side objective lens which is arranged while opposed to the scanning probe microscope unit switched by the revolver; and
a second image pickup device which takes the image of the cantilever of the scanning probe microscope unit through the opposed-side objective lens,
wherein the cantilever position display unit computes and determines the position information of the cantilever in the optical observation image based on first image data of the alignment mark obtained by the first image pickup device and second image data of the cantilever obtained by the second image pickup device.
11. A compound scanning probe microscope according to claim 6, wherein the scanning probe microscope unit has:
a unit main body in which the cantilever is attachable to and detachable from a tip portion, the unit main body configured to be attachable to and detachable from the revolver, the unit main body being formed in a cylindrical shape having a hollow portion; and
a lens which is provided in the hollow portion at the tip portion of the unit main body.
12. A compound scanning probe microscope according to claim 10, wherein the scanning probe microscope unit has:
the unit main body in which the cantilever is attachable to and detachable from the tip portion, the unit main body configured to be attachable to and detachable from the revolver, the unit main body being formed in the cylindrical shape having the hollow portion; and
a lens which is provided in the hollow portion at the tip portion of the unit main body.
13. A compound scanning probe microscope according to claim 11, wherein the image pickup device takes the image of the cantilever from the hollow portion of the unit main body through the lens.
14. A compound scanning probe microscope according to claim 12, wherein the image pickup device takes the image of the cantilever from the hollow portion of the unit main body through the lens.
15. A method of displaying a cantilever position of a compound scanning probe microscope, the method comprising:
determining an amount of shift between a visual field area of an objective lens attached to a revolver of the compound scanning probe microscope and a measuring range of a scanning probe microscope having a cantilever attached to the revolver; and
displaying a marker in an optical observation image displayed on display unit based on the amount of shift, the marker indicating a position of the cantilever or a scan area of the cantilever, the optical observation image being obtained through the objective lens.
16. A method of displaying a cantilever position of a compound scanning probe microscope, according to claim 15, further comprising:
obtaining position information of an alignment mark in the optical observation image when the alignment mark is observed through the objective lens;
switching from the objective lens to the scanning probe microscope unit by switching the revolver;
obtaining the position information of the alignment mark when the observation is performed through the scanning probe microscope unit;
determining the amount of shift between the position information of the alignment mark obtained through the objective lens and the position information of the alignment mark obtained through the scanning probe microscope unit; and
displaying the marker in the optical observation image according to the amount of shift, the optical observation image being displayed on the display unit, the marker indicating the position of the cantilever or the scan area of the cantilever.
17. A method of displaying a cantilever position of a compound scanning probe microscope, according to claim 16, wherein the position information of the alignment mark is determined by taking an image of the alignment mark through the objective lens with an image pickup device to perform image processing to image data obtained by the image pickup device.
18. A method of displaying a cantilever position of a compound scanning probe microscope, according to claim 16, wherein the position information of the cantilever is determined by taking the image of the cantilever through a lens with the image pickup device to perform the image processing to the image data obtained by the image pickup device, the lens being provided in a cylindrical unit main body included in the scanning probe microscope unit.
19. A method of displaying a cantilever position of a compound scanning probe microscope, according to claim 15, further comprising:
obtaining the position information of the alignment mark in the optical observation image when the alignment mark is observed through the objective lens;
switching from the objective lens to the scanning probe microscope unit by switching the revolver;
obtaining the position information of the alignment mark when measurement is performed by the scanning probe microscope unit;
determining the amount of shift between the position information of the alignment mark obtained through the objective lens and the position information of the alignment mark obtained by the scanning probe microscope unit; and
displaying the marker in the optical observation image according to the amount of shift, the optical observation image being displayed on the display unit, the marker indicating the position of the cantilever or the scan area of the cantilever.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A light cover for protecting recessed lighting fixtures of a type having a baffle which holds a light bulb and a light bulb receptacle and an outer trim surrounding the baffle that is generally flush with the ceiling, the light cover comprising:
a shield sized to fit over the baffle and the outer trim of the recessed lighting fixture;
a mounting flange located on a first side of the shield and sized to fit within the baffle and frictionally engage the light cover to the baffle; and
a handle located on a second side of the shield, wherein the handle is gripped when engaging the mounting flange to the baffle to secure the light cover to the recessed lighting fixture and when disengaging the mounting flange from the baffle to remove the light cover from the recessed lighting fixture.
2. The light cover of claim 1, wherein the shield has a hollow dome portion.
3. The light cover of claim 1, wherein the handle is hollow such that a plurality of light covers can be stacked onto each other.
4. The light cover of claim 1, wherein the shield comprises an outer lip along a periphery of the shield.
5. The light cover of claim 4, wherein the outer lip has a height sufficient to protect an outer edge of the outer trim from exposure to fluids.
6. The light cover of claim 1, wherein the shield, the mounting flange and the handle are made of plastic.
7. The light cover of claim 1, wherein the shield is translucent.
8. The light cover of claim 1, wherein the shield has a diameter of about 7.90 inches and the mounting flange has a diameter of about 5.63 inches.
9. The light cover of claim 1, wherein the mounting flange has a height of about 0.63 inches.
10. The light cover of claim 1, wherein the mounting flange includes protrusions equally spaced around an outside surface of the mounting flange to help engage the light cover to the baffle.
11. A method of applying a fluid to a ceiling, the method comprising: inserting a first portion of alight cover into a recessed lighting fixture to frictionally
engage a baffle of the recessed lighting fixture to hold the light cover in place so that a second portion of the light cover conceals the recessed lighting fixture from exposure to the fluid, wherein the second portion of the light cover comprises a shield sized to fit over the baffle and an outer trim of the recessed lighting fixture, and the first portion of the light cover comprises a mounting flange located on a first side of the shield and sized to fit within the baffle of the recessed lighting fixture and frictionally engage the light cover to the recessed lighting fixture;
applying the fluid onto the ceiling; and
removing the light cover from the recessed lighting fixture by disengaging the first portion of the light cover from the recessed lighting fixture.
12. The method of claim 11, wherein inserting a first portion of the light cover into the recessed lighting fixture comprises gripping a handle located on the second portion of the light cover.
13. The method of claim 11, wherein the light cover comprises a lip along a periphery of the shield.
14. The method of claim 11, wherein the shield is translucent.
15. The method of claim 11, wherein the mounting flange includes a plurality of protrusions equally spaced around an outside surface of the mounting flange to help engage the light cover to the baffle.
16. A method of applying a fluid to a ceiling, the method comprising:
inserting a first portion of a light cover into a recessed lighting fixture by gripping a handle located on a second portion of the light cover to frictionally engage a baffle of the recessed lighting fixture to hold the light cover in place so that the second portion of the light cover conceals the recessed lighting fixture from exposure to the fluid;
applying the fluid onto the ceiling; and
removing the light cover from the recessed lighting fixture by disengaging the first portion of the light cover from the recessed lighting fixture.