1. A system comprising:
a clock synchronization component configured to generate a clock signal for the system;
one or more input components configured to receive a signal from an automated testing equipment at a first slew rate configured to test an integrated circuit;
one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment;
a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and
one or more output components configured to convey the test signal to the integrated circuit at a second slew rate faster than the first slew rate, the integrated circuit being separable from the one or more output components.
2. The system of claim 1, further including a command generating component configured to control timing of commands to be sent to the integrated circuit.
3. The system of claim 1, further including an address generating component configured to generate an address to be sent to the integrated circuit.
4. The system of claim 1, further including the integrated circuit.
5. The system of claim 1, wherein the one or more data generating components include a test plan memory component configured to store a test plan for testing a set-up time or a hold time of the integrated circuit.
6. A method comprising:
attaching an automated testing equipment to a test module having a clock adjustment component configured to determine a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
attaching the integrated circuit to be tested to the test module;
receiving, at the test module, a signal from the automated testing equipment at a first slew rate;
testing the integrated circuit according to the steps of:
(a) generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
(b) conveying a test signal to the integrated circuit, at a second slew rate faster than the first slew rate, using the adjustment to the clock synchronization,
(c) receiving data from the integrated circuit responsive to the conveyed test signal, and
(d) comparing the received data to an expected result.
7. The method of claim 6, further comprising repeating steps (a), (b), (c), and (d), using a different adjustment to the clock synchronization.
8. The method of claim 7, wherein the test module is configured to test a minimum set-up time of the integrated circuit.
9. The method of claim 7, wherein the test module is configured to test a minimum hold time of the integrated circuit.
10. The test method of claim 7, further comprising generating the test signal within the test module responsive to the signal received from the automated testing equipment.
11. The method of claim 10, wherein the test signal includes at least one command.
12. The method of claim 10, wherein the test signal includes at least one address.
13. The method of claim 6, wherein the adjustment to the clock synchronization is configured to test the hold time of the integrated circuit.
14. A system comprising:
means for coupling a test module having a clock adjustment component between an automated testing equipment and an integrated circuit to be tested, the clock adjustment component comprising means for determining a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
means for configuring the test module for testing of the integrated circuit;
means for receiving, at the test module, a signal from the automated testing equipment at a first slew rate; and
means for testing a slew rate, minimum set-up time, or minimum hold time of the integrated circuit according to the steps of:
a) means for generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
b) means for conveying a test signal to the integrated circuit, at a second slew rate faster than the first slew rate, using the adjustment to the clock synchronization,
c) means for receiving data from the integrated circuit responsive to the conveyed test signal, and
d) means for comparing the received data to an expected result.
15. A system comprising:
a clock synchronization component configured to generate a clock signal for the system;
one or more input components configured to receive a signal from an automated testing equipment at a first clock frequency configured to test an integrated circuit;
one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment;
a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and
one or more output components configured to convey the test signal to the integrated circuit at a second clock frequency higher than the first clock frequency, the integrated circuit being separable from the one or more output components.
16. The system of claim 15, further including a command generating component configured to control timing of commands to be sent to the integrated circuit.
17. The system of claim 15, further including an address generating component configured to generate an address to be sent to the integrated circuit.
18. The system of claim 15, further including the integrated circuit.
19. The system of claim 15, wherein the one or more data generating components include a test plan memory component configured to store a test plan for testing a set-up time or a hold time of the integrated circuit.
20. A method comprising:
attaching an automated testing equipment to a test module having a clock adjustment component configured to determine a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
attaching the integrated circuit to be tested to the test module;
receiving, at the test module, a signal from the automated testing equipment at a first clock frequency;
testing the integrated circuit according to the steps of:
(a) generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
(b) conveying a test signal to the integrated circuit, at a second clock frequency higher than the first clock frequency, using the adjustment to the clock synchronization,
(c) receiving data from the integrated circuit responsive to the conveyed test signal, and
(d) comparing the received data to an expected result.
21. The method of claim 20, further comprising repeating steps (a), (b), (c), and (d), using a different adjustment to the clock synchronization.
22. The method of claim 21, wherein the test module is configured to test a minimum set-up time of the integrated circuit.
23. The method of claim 21, wherein the test module is configured to test a minimum hold time of the integrated circuit.
24. The test method of claim 21, further comprising generating the test signal within the test module responsive to the signal received from the automated testing equipment.
25. The method of claim 24, wherein the test signal includes at least one command.
26. The method of claim 24, wherein the test signal includes at least one address.
27. The method of claim 20, wherein the adjustment to the clock synchronization is configured to test the hold time of the integrated circuit.
28. A system comprising:
means for coupling a test module having a clock adjustment component between an automated testing equipment and an integrated circuit to be tested, the clock adjustment component comprising means for determining a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
means for configuring the test module for testing of the integrated circuit;
means for receiving, at the test module, a signal from the automated testing equipment at a first clock frequency; and
means for testing a slew rate, minimum set-up time, or minimum hold time of the integrated circuit according to the steps of:
(a) means for generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
(b) means for conveying a test signal to the integrated circuit, at a second clock frequency higher than the first clock frequency, using the adjustment to the clock synchronization,
(c) means for receiving data from the integrated circuit responsive to the conveyed test signal, and
(d) means for comparing the received data to an expected result.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A waterproofing structure for a drive device including: a power supply unit; and a drive unit formed to protrude from one end of said power supply unit and to be activated with an electric power supplied from said power supply unit, comprising:
a power supply unit cover formed to have an opening at its one end and to cover said power supply unit in a water-tight state; and
a drive unit cover formed to have an opening at its one end and to cover said drive unit in a water-tight state,
wherein said power supply unit includes at its one end:
a supporting cylinder unit formed to protrude to the side of said drive unit; and
a protecting cylinder unit formed outside of the diameter of and at a predetermined spacing size from said supporting cylinder unit, and
wherein said drive unit cover has its opening edge portion fitted in a water-tight state between said supporting cylinder unit and said protecting cylinder unit so that the opening circumferential edge portion of said drive unit cover and said protecting cylinder unit in a water-tight state with the opening edge portion of said power supply unit cover.
2. A waterproofing structure according to claim 1,
wherein the opening edge portion of said drive unit cover has a ridge portion formed along the outside of the side edge of said opening edge portion for holding the water-tight state inside of said drive unit cover when press-fitted between said supporting cylinder unit and said protecting cylinder unit.
3. A waterproofing structure according to claim 2,
wherein said drive unit cover is made of a waterproof material having an extensibility and has an internal diameter size substantially equal to the external diameter size of said supporting cylinder unit, and
wherein said ridge portion has an external diameter size substantially equal to the internal diameter size of said protecting cylinder unit.
4. A waterproofing structure according to claim 2,
wherein said power supply unit cover is made of a waterproof material having an extensibility and has an internal diameter size slightly larger than the external diameter size of said power supply unit, and
wherein the opening edge portion of said power supply unit cover has an engaging ridge portion formed smaller than the internal diameter size of said protecting cylinder unit.
5. A waterproofing structure according to claim 1,
wherein said power supply unit cover is made of a soft material and disposed at said power supply unit for operating a switch unit disposed to control said drive unit.
6. A waterproofing structure according to claim 1,
wherein said power supply unit is formed of a battery box, and
wherein said power supply unit cover can be removed, if necessary.
7. A waterproofing structure according to claim 3,
wherein said drive unit includes a prime mover, and a vibrator formed to vibrate in association with said prime mover, and
wherein said switch unit is configured with push buttons.
8. A waterproofing structure according to claim 5,
wherein said switch unit is configured with a dial.
9. A waterproofing structure according to claim 5,
wherein said switch unit is configured with a slider.