1. A method for administration of a plurality of virtual filers (vfilers) executing on one or more physical storage systems having at least one processor, the method comprising:
assigning one or more vfilers of the plurality of vfilers to each group of a plurality of groups, wherein a vfiler is a partition of network and storage resources of the one or more physical storage systems allocated to the vfiler;
granting an administrator permissions to a group of the plurality of groups; and
in response to administration requests from the administrator, only displaying attributes associated with the one or more vfilers assigned to the group of the plurality of groups, wherein information associated with the one or more physical storage systems are not displayed.
2. The method of claim 1 wherein the attributes comprise aggregate information.
3. The method of claim 1 wherein the information comprises volume information.
4. The method of claim 1 wherein the information comprises identities of vfilers not associated with the group.
5. The method of claim 1 wherein assigning the one or more vfilers to the group further comprises using management software to create the group.
6. The method of claim 5 wherein the group comprises the one or more vfilers and one or more management objects.
7. The method of claim 6 wherein the one or more management objects comprises volumes.
8. The method of claim 6 wherein the one or more management objects comprise qtrees.
9. A system configured for administration of a plurality of virtual filers (vfilers) executing on one or more physical storage systems having at least one processor, the system comprising:
a management server operatively interconnected with the one or more physical storage systems; and
management software executing on the management server, the management software configured to:
enable an association of one or more vfilers of the plurality of vfilers to each group of a plurality of groups wherein a vfiler is a partition of network and storage resources of the one or more physical storage systems allocated to the plurality of vfilers, and
associate an administrator with each group and limit displays to only first information relating to the one or more vfilers associated with a group of the plurality of groups, without display of second information associated with the one or more physical storage systems.
10. The system of claim 9 wherein the group comprises the one or more vfilers and one or more management objects.
11. The system of claim 10 wherein the one or more management objects comprise volumes.
12. The system of claim 10 wherein the one or more management objects comprise qtrees.
13. The system of claim 9 wherein the management software is further configured to configure objects within the group.
14. The system of claim 9 wherein the management software implements a graphical user interface.
15. The system of claim 9 wherein the management software implements a command line interface.
16. The system of claim 9 wherein the management server comprises a physical storage system.
17. A system configured for administration of a plurality of virtual filers (vfilers) executing on one or more physical computers having at least one processor, the system comprising:
a management server operatively interconnected with the one or more physical computers; and
management software executing on the management server, the management software configured to:
enable an association of one or more vfilers of the plurality of vfilers to each group of a plurality of groups wherein a vfiler is a partition of network and storage resources of the one or more physical storage systems allocated to the vfiler,
associate an administrator with each group and
display first information relating to the one or more vfilers associated with a group of the plurality of groups, whereby the management software does not provide the ability to display second information associated with the one or more physical computers executing the plurality of vfilers.
18. A non-transitory computer readable medium containing executable program instructions executed by a processor, comprising:
program instructions that assign one or more virtual filers (vfilers) of a plurality of vfilers to each group of a plurality of groups, wherein a vfiler is a partition of network and storage resources of one or more physical storage systems allocated to the vfiler;
program instructions that grant an administrator permissions to a group of the plurality of groups; and
program instructions that only display attributes associated with the one or more vfilers assigned to the group, wherein information associated with the one or more physical storage systems, executing the plurality of vfilers, are not displayed, in response to administration requests from the administrator.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A scanning probe microscope, comprising:
a chuck configured to fix an object;
a stacker configured to load one or more cantilevers onto a head module; and
a stacker lifting element configured to move the stacker in an up and down direction.
2. The scanning probe microscope according to claim 1, wherein the stacker lifting element includes a lifting block configured to support the stacker, and a lifting body disposed under the lifting block, wherein the lifting body includes a first lift driving axis configured to move the lifting block in the up and down direction.
3. The scanning probe microscope according to claim 2, wherein the lifting body further includes a second lift driving axis configured to move the lifting block in the up and down direction, wherein the second lift driving axis is parallel to the first lift driving axis.
4. The scanning probe microscope according to claim 2, wherein the lifting block includes a guide region extending along a first side of the lifting body.
5. The scanning probe microscope according to claim 4, wherein a vertical dimension of the guide region of the lifting block is larger than a vertical dimension of the first lift driving axis of the lifting body.
6. The scanning probe microscope according to claim 4, wherein the stacker lifting element further includes a linear moving block configured to move along the first side of the lifting body in the up and down direction, the linear moving block being coupled to the guide region of the lifting block.
7. The scanning probe microscope according to claim 4, wherein the chuck further includes a chuck holding part configured to support the object, a chuck body disposed under the chuck holding part, and a lift fixing block configured to fix the lifting body to the chuck body.
8. The scanning probe microscope according to claim 7, wherein the lift fixing block is disposed opposite to a second side of the lifting body, and a horizontal dimension of the second side of the lifting body is larger than a horizontal dimension of the first side of the lifting body.
9. The scanning probe microscope according to claim 1, wherein when the stacker is lowered by the stacker lifting element, a level of a top surface of the stacker is lower than a level of a top surface of the chuck, and wherein when the stacker is raised by the stacker lifting element, and the level of the top surface of the stacker is higher than the level of the top surface of the chuck.
10. A scanning probe microscope, comprising:
a chuck holding part configured to support an object;
a chuck body disposed under the chuck holding part;
a chuck driving element disposed under the chuck body;
a stacker configured to load one or more cantilevers, the stacker horizontally spaced apart from the chuck holding part;
a stacker lifting element disposed under the stacker, the stacker lifting element including a lift driving axis configured to move the stacker in an up and down direction; and
a lift fixing block configured to couple the stacker lifting element to the chuck body.
11. The scanning probe microscope according to claim 10, wherein the lift fixing block includes a horizontal region extending between the stacker and the stacker lifting element, the horizontal region including a driving hole configured to pass through the lift driving axis and a first guide hole spaced apart from the driving hole.
12. The scanning probe microscope according to claim 11, wherein the stacker is coupled to the lift driving axis, and the stacker includes a first guide pin disposed in the first guide hole.
13. The scanning probe microscope according to claim 12, wherein when the stacker is raised by the stacker lifting element, a vertical dimension between the bottom surface of the stacker and the top surface of the horizontal region is shorter than a vertical dimension of the first guide pin.
14. The scanning probe microscope according to claim 12, wherein a vertical dimension of the first guide pin is shorter than a vertical dimension of the horizontal region.
15. The scanning probe microscope according to claim 14, wherein the horizontal region of the lift fixing block includes a second guide hole spaced apart from the first guide hole, and the stacker includes a second guide pin disposed in the second guide hole, wherein the driving hole is disposed between the first guide hole and the second guide hole.
16. A scanning probe microscope, comprising:
a head module, wherein the head module includes a cantilever fixing element configured to hold a cantilever, and a head vacuum pump coupled to the cantilever fixing element, the head vacuum pump configured to fix the cantilever to the cantilever fixing element;
a stacker, wherein the stacker includes a first loading spot configured to support a first cantilever and a second loading spot configured to support a second cantilever, and a stacker vacuum pump coupled to the stacker, the stacker vacuum pump configured to fix the first cantilever to the first loading spot and the second cantilever to the second loading spot; and
a lifting body, wherein the lifting body includes a lift driving axis, the lift driving axis configured to raise and lower the stacker.
17. The scanning probe microscope of claim 16, further comprising a lifting block configured to prevent the stacker from rotating,
wherein the stacker is disposed on the lifting block, and the lifting block is coupled to a lift driving axis.
18. The scanning probe microscope of claim 16, further comprising a chuck configured to hold an object,
wherein the lifting body is coupled to the chuck, and the lifting body is configured to raise the first and second loading spots to a higher position than a height of a top surface of the chuck.
19. The scanning probe microscope of claim 16, wherein the stacker pump is configured to fix the first and the second cantilever, simultaneously.
20. The scanning probe microscope of claim 16, wherein the head module further comprises a light source element and a light detection element.