1. A method for the differentiation of HBV infection stages which comprises the identification of cell and particle-free full-length HBV transcripts (I) and truncated HBV transcripts (II) extracted from a body fluid sample, wherein the ratio of I:II is indicative of a particular infection stage.
2. The method of claim 1 wherein the body fluid is serum.
3. The method of claim 2 wherein an apparent ratio of I:II>1 is indicative of a highly replicative HBV infection stage.
4. The method of claim 2 wherein an apparent ratio of I:II<1 is indicative of a chronic HBV infection stage.
5. The method of claim 4 wherein an apparent ratio of I:II<1 is indicative of a late stage of such a chronic HBV infection stage.
6. The method of claim 2, 4 or 5 wherein an apparent ratio of I:II<1 is indicative of a risk to develop HCC.
7. The method of claim 2 wherein circulating HBV-RNA found in the absence of other HBV seromarkers is indicative of occult stages of HBV infection.
8. The method of any one of claims 1 to 7 wherein the circulating HBV transcipts are transcripts comprising the X-region of HBV (HBx RNA).
9. The method of any one of claims 1 to 8 wherein identification of full-length transcripts (I) and truncated HBV transcripts (II) in serum is carried out by RTPCR using anchored oligo(dT) downstream primer(s) allowing to discriminate between full-length HBV transcripts (I) and truncated HBV transcripts (II).
10. The method of claim 9 wherein the oligo(dT)anchored primers comprise the nucleotide sequence (T)15 GCT GG, (T)15 GAA GC andor (T)15 AGC TC.
11. The method of any one of claims 9 and 10 wherein the identification of full-length HBV transcripts (I) and truncated HBV transcripts (II) by RTPCR comprises a semi-nested PCR using in the second PCR step an upstream primer which is located downstream of the upstream primer of the first PCR step.
12. The method of any one of claims 8 to 11 wherein the PCR-products are characterized by agarose gel electrophoresis or automatized fluorescence emission spectra.
13. Kit for carrying out the method of any of claims 1-12 comprising at least one of the oligo(dT)anchored primers of claim 10.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
What is claimed is:
1. A method of monitoring apparatuses of manufacturing integrated circuit (IC), while a plurality of lots of wafers are processed by a plurality of apparatuses, used for monitoring a plurality of apparatus events, the method of monitoring apparatuses of manufacturing IC comprising:
providing a database with a plurality of data of the apparatus events;
downloading the data of the apparatus events from the database;
calculating a plurality of achievement indices by using the data of the apparatus events;
establishing a control chart by using the achievement indices;
establishing a knowledge archive of rules by using the data of the apparatus events, the achievement indices, and the control chart, and determining a plurality of limitative rules to detect an abnormal point;
forming a calendar file by sorting the data of the apparatus events with time; and
executing a step of replaying the apparatus events so as to proceed a rectification.
2. The method of monitoring apparatuses of manufacturing IC of claim 1, wherein the data of the apparatus events comprises: an apparatus status, a plurality of transferred out accounts, and a plurality of data of work in process (WIP).
3. The method of monitoring apparatuses of manufacturing IC of claim 1, wherein the achievement indices comprises a production output (move), a productive time (PT), a pieces of hour (POH), a time of waiting for material (loss time; LT), a batch count (batch), a averaged waiting time of WIP (W), and a waiting length of WIP (L).
4. The method of monitoring apparatuses of manufacturing IC of claim 1, wherein the control chart is established by gathering about 60 data in 2 months of the data of the apparatus events, and restricted by 3 standard deviations.
5. The method of monitoring apparatuses of manufacturing IC of claim 1, wherein the calendar file comprises a plurality of changes of the apparatus statuses, transferred out accounts, and WIP.
6. The method of monitoring apparatuses of manufacturing IC of claim 1, wherein the step of replaying apparatus events further comprises establishing a apparatus replaying system by establishing a plurality of graphic interfaces with the calendar file and the knowledge archive of rules.
7. The method of monitoring apparatuses of manufacturing IC of claim 6, wherein the apparatus replaying system is programmed by the language which is selected from a group consisting of visual basic and foxpro.
8. A method of monitoring apparatuses of manufacturing integrated circuit (IC), while a plurality of lot s of wafers are processed by a plurality of apparatuses, used for monitoring a plurality of apparatus events, the method of monitoring apparatuses of manufacturing IC comprising:
providing a database with a plurality of data of the apparatus events;
downloading the data of the apparatus events from the database;
calculating a plurality of achievement indices by using the data of the apparatus events;
establishing a control chart by using the achievement indices;
establishing a knowledge archive of rules by using the data of the apparatus events, the achievement indices, and the control chart;
forming a calendar file by sorting the data of apparatus events with time; and
executing a step of replaying apparatus events by a apparatus replaying system so as to read the apparatus events.
9. The method of monitoring apparatuses of manufacturing IC of claim 8, wherein the data of the apparatus events comprises: an apparatus state, a plurality of transferred out account, and a plurality of data of work in process.
10. The method of monitoring apparatuses of manufacturing IC of claim 8, wherein the achievement indices comprises a production output (move), a productive time (PT), a pieces of hour (POH), a time of waiting for material (loss time; LT), a batch count (batch), an averaged waiting time of WIP (W), and a waiting length of WIP (L).
11. The method of monitoring apparatuses of manufacturing IC of claim 8, wherein the control chart is established by gathering about 60 data in 2 months of the data of the apparatus events, and restricted by 3 standard deviations.
12. The method of monitoring apparatuses of manufacturing IC of claim 8, wherein the calendar files comprises a plurality changes of apparatus statuses, transferred out accounts, and WIP.
13. The method of monitoring apparatuses of manufacturing IC of claim 1, wherein the step of establishing the knowledge archive with rules further comprises determining a plurality of limitative rules to detect an abnorml point.
14. The method of monitoring apparatuses of manufacturing IC of claim 8, wherein the step of replaying apparatus events by an apparatus replaying system further comprises establishing a plurality of graphic interfaces with the calendar file and the knowledge archive of rules.
15. The method of monitoring apparatuses of manufacturing IC of claim 8, wherein the replaying system of apparatuses is programmed by the language which is selected from a group consisting of visual basic and foxpro.
16. A system of monitoring apparatuses of manufacturing IC, to monitor a plurality of the apparatus events, wherein a plurality of apparatuses process a plurality of lots of wafers with a plurality of steps, the system of monitoring apparatuses of manufacturing IC comprising:
a control mainframe for controlling the apparatuses;
a data mainframe with a plurality of operation parameters for recording a plurality of data of the apparatus events and a plurality of process data; and
a control mainframe for executing a process of monitoring the apparatuses by replaying the apparatus events processing the lots of wafers, the process of monitoring apparatuses comprising:
downloading the data of the apparatus events from the data mainframe;
calculating a plurality of achievement indices by using the data of the apparatus events;
establishing a control chart by using the achievement indices;
establishing a knowledge archive of rules by using the data of the apparatus events, the achievement indices, and the control chart, and determining a plurality of limitative rules to detect an abnormal point;
forming a calendar file by sorting the data of apparatus events with time; and
executing a step of replaying apparatus events so as to proceed a rectification.
17. The system of monitoring apparatuses of manufacturing IC of claim 16, wherein the control chart is established by gathering about 60 data in 2 months of the data of apparatus events, and restricted by 3 standard deviations.
18. The system of monitoring apparatuses of manufacturing IC of claim 16, wherein the calendar files comprises a plurality changes of apparatus statuses, transferred out accounts, and WIP.
19. The system of monitoring apparatuses of manufacturing IC of claim 16, wherein the step of replaying the apparatus events further comprises establishing a apparatus replaying system by stablishing a plurality of graphic interfaces with the calendar file and the knowledge archive of rules.
20. The system of monitoring apparatuses of manufacturing IC of claim 19, wherein the apparatus replaying system is programmed by the language which is selected from a group consisting of visual basic and foxpro.