1. A method for producing laser-induced holograms inside transparent materials by using laser-induced damages comprising:
calculation of an interference pattern, corresponding to a given object;
transformation of the interference pattern into arrangement of points so that laser-induced damages created at the points are able to reconstruct a high quality holographic image;
generating and focusing laser radiation at the points of the transparent material corresponding to the points of the said arrangement so that the marks generated as a result of the interaction of laser radiation with the material are created.
2. The method in accordance with claim 1 further comprising creation of an arrangement of laser-induced damages wherein the coordinates of points, at which the breakdowns should be produced, are determined as a result of independent trials with possible outcomes described by probability density function, which is proportional to the intensity of corresponding interference pattern.
3. The method in accordance with claim 1 further comprising creation of an arrangement of laser-induced damages, which being illuminated, reconstruct the holographic image of the object.
4. The method in accordance with claim 1 further comprising the transformation of the interference pattern into damage arrangement by the division of the transparent material area into several regions and production of laser-induced damages inside the regions so that said damages approximate the interference pattern.
5. The method in accordance with claim 1 including creation of combined arrangement of laser-induced damages, which provide both reproduction of laser-induced images and reconstruction of laser-induced holograms inside transparent materials.
6. The method in accordance with claim 5 further comprising production of an interference pattern on at least one side of a transparent material containing a laser-induced image.
7. The method in accordance with claim 5 further comprising production of iridescent background by creating an arrangement of the damages corresponding to a diffraction grating or an iridescent hologram.
8. Method for production of small laser-induced damages by controlling and transforming wavelength of laser radiation generating breakdowns at the predetermined points of transparent materials, comprising:
determination of functional dependence of damage sizes from sizes of focal point for given transparent material;
determination of focal point sizes corresponding to damage sizes;
transformation of laser radiation so that it has the wavelength corresponding to demanded damage sizes;
generating laser radiation of determined wavelength and focusing the transformed laser radiation at the predetermined points of transparent material to generate laser-induced breakdowns.
9. Laser-computer system for production of laser-induced holograms inside transparent materials comprising:
a first computer system for calculation of an interference pattern, corresponding to a given object;
a second computer system for transformation of the said interference pattern into an arrangement of points, so that laser-induced damages, created at the points, are able to reconstruct a high quality holographic image without internal split of the transparent material;
a laser system for generating laser radiation to create laser-induced damages of demanded sizes;
optical and moving systems for focusing laser radiation at the predetermined points of the transparent material to produce the breakdowns at the points.
10. The controlling system which in accordance with claim 9, controls a laser system for generating radiation with the wavelength corresponding to the needed sizes of laser-induced damages.
11. The system of claim 9 wherein the laser system generates a harmonic of the fundamental wavelength produced by the laser and transforms of the radiation into a second or higher harmonic to create laser-induced damages inside the transparent material.
12. The laser system in accordance with claim 11 further comprising a diode-pumped ND:YAG laser generating radiation for creating laser-induced marks inside transparent materials.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A circuit for testing an inrush current of a power supply, the circuit comprising:
a capacitor module capable of storing electric charge supplied by a power source;
a voltage meter connected to the capacitor module and capable of measuring a voltage across the capacitor module;
a semiconductor switch capable of connecting the capacitor module to the power supply, the semiconductor switch being closed when the voltage across the capacitor module reaches a predetermined value; and
a current meter capable of measuring the inrush current at the time the power supply is powered on.
2. The circuit as described in claim 1, further comprising a first switch capable of connecting capacitor module to the power source, the first switch is closed until the voltage across the capacitor module reaches the predetermined value.
3. The circuit as described in claim 1, further comprising a discharging circuit connected to the capacitor module in parallel, the discharging circuit is capable of discharging remaining electric energy of the capacitor module after the inrush current is measured.
4. The circuit as described in claim 3, wherein the discharge circuit comprises a resistor and a second switch connected in parallel.
5. The circuit as described in claim 1, wherein the semiconductor switch is a thyristor.
6. The circuit as described in claim 5, wherein an anode terminal of the thyristor is connected to a positive terminal of the capacitor module, a cathode terminal of the thyristor is connected to the current meter, and a gate terminal of the thyristor is connected to a capacitor.
7. The circuit as described in claim 6, further comprising a first switch circuit connected between the anode terminal of the thyristor and the capacitor.
8. The circuit as described in claim 7, further comprising a second switch circuit connected between the cathode terminal of the thyristor and the capacitor.
9. The circuit as described in claim 8, wherein each of the first switch circuit and the second switch circuit comprises a switch and a resistor connected in series.
10. The circuit as described in claim 1, wherein the capacitor module comprises a plurality of capacitors connected in parallel.
11. A circuit for testing an inrush current of a power supply, the circuit comprising:
a capacitor module capable of storing electric charge;
a first switch capable of connecting the capacitor module to a power source, the first switch being closed until a voltage across the capacitor module increases to a predetermined value;
a semiconductor switch capable of connecting the capacitor module to the power supply, the semiconductor switch being closed when the voltage across the capacitor module increases to the predetermined value; and
a current meter capable of measuring the inrush current at the time the power supply is powered on.
12. The circuit as described in claim 11, further comprising a voltage meter connected in parallel with the capacitor module and capable of measuring the voltage across the capacitor module.
13. The circuit as described in claim 11, further comprising a discharging circuit connected in parallel with the capacitor module and capable of discharging remaining electric energy of the capacitor module after the inrush current is measured.
14. The circuit as described in claim 13, wherein the discharge circuit comprises a resistor and a second switch connected in parallel.
15. The circuit as described in claim 11, wherein the semiconductor switch is a thyristor.
16. The circuit as described in claim 15, wherein an anode terminal of the thyristor is connected to a positive terminal of the capacitor module, a cathode terminal of the thyristor is connected to the current meter, and a gate terminal of the thyristor is connected to a capacitor.
17. The circuit as described in claim 16, further comprising a first switch circuit connected between the anode terminal of the thyristor and the capacitor.
18. The circuit as described in claim 17, further comprising a second switch circuit connected between the cathode terminal of the thyristor and the capacitor.
19. The circuit as described in claim 18, wherein each of the first switch circuit and the second switch circuit comprises a switch and a resistor connected in series.