1. A method comprising the steps of:
analyzing a printed circuit board design to identify at least one untestable circuit on the printed circuit board;
identifying at least one access point on a surface of the printed circuit board that provides access to the at least one untestable circuit on the board; and
creating at least one new test point by selectively depositing procoat on the surface of the printed circuit board such that no procoat is deposited over the identified at least one access point.
2. The method of claim 1 further comprising the step of providing a test fixture adapted to contact the at least one new test point.
3. The method of claim 1 wherein the at least one new test point is a point on a circuit trace.
4. The method of claim 1 wherein the location of the at least one test point is selected based on its proximity to other circuit components.
5. The method of claim 1 wherein the step of analyzing the printed circuit board design to identify at least one untestable circuit on the board comprises the step of using a gerber tool to analyze the printed circuit board.
6. The method of claim 1 further comprising the step of contacting the at least one new test point using a spring-loaded test probe, the test probe having a substantially planar probe head and a spring force less than four ounces.
7. The method of claim 6 wherein the step of contacting the at least one new test point comprises the step of contacting the at least one new test point with a substantially planar probe head coated with a plurality of dendritic particles.
8. A method for testing circuits, the method comprising the steps of:
analyzing a printed circuit board design to identify at least one circuit on the board as an untestable circuit;
identifying at least one location on the surface of the printed circuit board suitable for providing an access point to the at least one untestable circuit;
providing a printed circuit board constructed according to the printed circuit board design, the printed circuit board having a surface; and
creating at least one new test point on the surface of the printed circuit board by selectively masking the surface of the printed circuit board to prevent the at least one location from being covered by procoat.
9. The method of claim 8 wherein the step of analyzing the printed circuit board to identify at least one circuit on the board as an untestable circuit comprises the step of using visualization software to analyze the printed circuit board.
10. The method of claim 8 further comprising the step of using a test fixture to contact the at least one new test point.
11. The method of claim 8 wherein the step of identifying at least one location on the surface of the printed circuit board further comprises the step of using the location of at least one circuit component to identify the at least one location on the surface of the printed circuit board.
12. The method of claim 8 wherein the at least one additional test point on the surface of the printed circuit board is a point on a circuit trace located on the surface of the circuit board.
13. The method of claim 8 further comprising the step of contacting the at least one new test point using a spring-loaded test probe, the test probe having a substantially planar probe head and a spring force less than four ounces.
14. The method of claim 13 wherein the step of contacting the at least one new test point comprises the step of contacting the at least one new test point with a substantially planar probe head coated with a plurality of dendritic particles.
15. A method for identifying and probing circuit traces comprising:
providing a printed circuit board design, the printed circuit board comprising a plurality of nets and a plurality of existing test points suitable for testing at least one of the plurality of nets;
using a visualization program to locate at least one of the plurality of nets that cannot be tested using the plurality of existing test points;
identifying at least one new test point, suitable for testing the at least one of the plurality of nets that cannot be tested using the plurality of existing test points;
providing a printed circuit board constructed according to the printed circuit board design;
selectively masking the printed circuit board with a protective covering to cover the at least one new test point;
coating the printed circuit board with a coating;
removing the protective covering; and
adjusting a probe in a test fixture to contact the at least one new test point.
16. A method for creating a testing apparatus, the method comprising the steps of:
providing a spring loaded test probe, the test probe comprising:
a substantially planar probe head;
a spring for biasing the probe head, the spring having a spring force of no more than four ounces; and
coating the probe head with dendrites.
17. A test probe comprising:
a probe head with a substantially planar surface;
a spring for biasing the probe head, the spring having a spring force of no more than four ounces; and
a plurality of dendritic protrusions on the substantially planar surface of the probe head.
18. A spring loaded test probe for use in circuit testing, the spring loaded test probe comprising:
a probe head to engage at least one of a plurality of test points, wherein the probe head is substantially planar and covered with dendrites; and
a spring in contact with the probe head, the spring biasing the probe head toward the plurality of test points, the spring having a spring force of less than four ounces.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An antisense compound 8 to 30 nucleobases in length targeted to a nucleic acid molecule encoding human Survivin, wherein said antisense compound inhibits the expression of human Survivin.
2. The antisense compound of claim 1 which is an antisense oligonucleotide.
3. The antisense compound of claim 2 comprising at least an 8-nucleobase portion of SEQ ID NO: 19, 21, 23, 24, 25, 27, 29, 30, 32, 37, 40, 41, 43, 48, 49, 50, 51, 52, 56, 60, 65, 68, 70, 72, 76, 80, 83, 87, 88, 91, 92, 101, 106, 107, 113, 138, 141, 152 or 156.
4. The antisense compound of claim 3 comprising SEQ ID NO: 25, 30, 40, 43, 48, 65, 70, 80, 83 or 88.
5. The antisense compound of claim 2 which comprises at least one modified internucleoside linkage.
6. The antisense compound of claim 5 wherein the modified internucleoside linkage is a phosphorothioate linkage.
7. The antisense compound of claim 2 which comprises at least one modified sugar moiety.
8. The antisense compound of claim 7 wherein the modified sugar moiety is a 2-O-methoxyethyl sugar moiety.
9. The antisense compound of claim 2 which comprises at least one modified nucleobase.
10. The antisense compound of claim 9 wherein the modified nucleobase is a 5-methylcytosine.
11. The antisense compound of claim 2 which is a chimeric oligonucleotide.
12. A composition comprising the antisense compound of claim 1 and a pharmaceutically acceptable carrier or diluent.
13. The composition of claim 12 further comprising a colloidal dispersion system.
14. The composition of claim 12 wherein the antisense compound is an antisense oligonucleotide.
15. A method of inhibiting the expression of Survivin in human cells or tissues comprising contacting human cells or tissues with the antisense compound of claim 1 so that expression of Survivin is inhibited.
16. A method of treating an animal having a disease or condition associated with Survivin comprising administering to an animal having a disease or condition associated with Survivin a therapeutically or prophylactically effective amount of the antisense compound of claim 1 so that expression of Survivin is inhibited.
17. The method of claim 16 wherein the disease or condition is a hyperproliferative condition.
18. The method of claim 17 wherein the hyperproliferative condition is cancer.
19. A method of treating a human having a disease or condition characterized by a reduction in apoptosis comprising administering to a human having a disease or condition characterized by a reduction in apoptosis a prophylactically or therapeutically effective amount of the antisense compound of claim 1.
20. A method of modulating apoptosis in a cell comprising contacting a cell with the antisense compound of claim 1 so that apoptosis is modulated.
21. A method of modulating cytokinesis in a cell comprising contacting a cell with the antisense compound of claim 1 so that cytokinesis is modulated.
22. A method of modulating the cell cycle in a cell comprising contacting a cell with the antisense compound of claim 1 so that the cell cycle is modulated.
23. A method of inhibiting the proliferation of cells comprising contacting cells with an effective amount of the antisense compound of claim 1, so that proliferation of the cells is inhibited.
24. The method of claim 23 wherein said cells are cancer cells.
25. The composition of claim 12 further comprising a chemotherapeutic agent.
26. The method of claim 19 further comprising administering to the patient a chemotherapeutic agent.
27. The method of claim 20 wherein said modulation of apoptosis is sensitization to an apoptotic stimulus.
28. The method of claim 27 wherein said apoptotic stimulus is a cytotoxic chemotherapeutic agent.
29. The method of claim 23 further comprising contacting said cells with a chemotherapeutic agent.
30. The method of claim 29 wherein said chemotherapeutic agent is taxol or cisplatin.