1. A method to configure a cloud-computing network, comprising:
generating a default route address associated with a selected one of a plurality of candidate transit routers in response to an identification of a virtual private network addition to the cloud-computing network; and
assigning the default route address to a cloud service access router to direct a routing request from the cloud service access router to the selected one of the candidate transit routers via the default route address.
2. A method as described in claim 1, further comprising generating a list of transit routers in response to identifying a geographic distance between each of the transit routers and the cloud service access router.
3. A method as described in claim 2, wherein identifying the geographic distance comprises calculating distances between a street address of the cloud service access router and the transit routers.
4. A method as described in claim 2, wherein identifying the geographic distance comprises calculating distances between global positioning coordinates of the cloud service access router and the transit routers.
5. A method as described in claim 1, further comprising selecting one of a list of candidate transit routers based on a distance between the cloud service access router and the selected one of the candidate transit routers.
6. A method as described in claim 5, wherein the distance comprises a latency effect between the cloud service access router and the selected one of the candidate transit routers.
7. A method as described in claim 6, wherein the latency effect is identified by an open shortest path first network protocol.
8. A method as described in claim 1, further comprising generating a modified virtual routing forwarding table in the cloud service access router to store the default route address.
9. A method as described in claim 1, further comprising generating a transit router virtual routing forwarding table in the selected one of the list of candidate transit routers to store the default route address.
10. A method as described in claim 9, further comprising directing the routing request to a destination based on an address look-up in the transit router virtual routing forwarding table when the selected one of the list of candidate transit routers identifies the default route in the routing request.
11. An apparatus to configure a cloud-computing network, comprising:
a tag generator to generate a default route address associated with a selected one of a plurality of candidate transit routers in response to identifying a virtual private network addition to the cloud-computing network; and
a route reflector manager to assign the default route address to a cloud service access router to direct a routing request from the cloud service access router to the selected one of the candidate transit routers via the default route address.
12. An apparatus as described in claim 11, further comprising a network topology manager to identify a geographic distance between each of the plurality of candidate transit routers and the cloud service access router.
13. An apparatus as described in claim 12, further comprising a network topology database to calculate distances between a street address of the cloud service access router and each of the plurality of candidate transit routers.
14. An apparatus as described in claim 12, further comprising a network topology database to calculate distances between global positioning coordinates of the cloud service access router and each of the plurality of candidate transit routers.
15. An apparatus as described in claim 11, further comprising a provider edge router manager to generate a modified virtual routing forwarding table in the cloud service access router to store the default route address.
16. A tangible machine accessible medium having instructions stored thereon that, when executed, cause a machine to, at least:
identify a virtual private network (VPN) addition to a cloud-computing network;
generate a list of candidate transit routers to receive routing requests associated with the VPN;
generate a default route address associated with a selected one of the candidate transit routers; and
assign the default route address to a cloud service access router to direct a routing request from the cloud service access router to the selected one of the candidate transit routers via the default route address.
17. A tangible machine accessible medium as described in claim 16 having instructions stored thereon that, when executed, cause a machine to identify a geographic distance between each of the transit routers and the cloud service access router.
18. A tangible machine accessible medium as described in claim 17 having instructions stored thereon that, when executed, cause a machine to calculate distances between a street address of the cloud service access router and the transit routers.
19. A tangible machine accessible medium as described in claim 17 having instructions stored thereon that, when executed, cause a machine to calculate distances between global positioning coordinates of the cloud service access router and the transit routers.
20. A tangible machine accessible medium as described in claim 16 having instructions stored thereon that, when executed, cause a machine to select one of the list of candidate transit routers based on a distance between the cloud service access router and the selected one of the candidate transit routers.
21. A tangible machine accessible medium as described in claim 20 having instructions stored thereon that, when executed, cause a machine to calculate a latency effect between the cloud service access router and the selected one of the candidate transit routers.
22. A tangible machine accessible medium as described in claim 21 having instructions stored thereon that, when executed, cause a machine to identify the latency effect by an open shortest path first network protocol.
23. A tangible machine accessible medium as described in claim 16 having instructions stored thereon that, when executed, cause a machine to generate a modified virtual routing forwarding table in the cloud service access router to store the default route address.
24. A tangible machine accessible medium as described in claim 16 having instructions stored thereon that, when executed, cause a machine to generate a transit router virtual routing forwarding table in the selected one of the list of candidate transit routers to store the default route address.
25. A tangible machine accessible medium as described in claim 24 having instructions stored thereon that, when executed, cause a machine to direct the routing request to a destination based on an address look-up in the transit router virtual routing forwarding table when the selected one of the list of candidate transit routers identifies the default route in the routing request.
26-30. (canceled)
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An integrated circuit comprising:
a semiconductor having an internal gate resistor coupling a gate electrode and a control terminal;
a measuring bridge circuit comprising the internal gate resistor and providing a measuring voltage that is dependent on the temperature dependent resistance of the internal gate resistor;
evaluation means for receiving the measuring voltage and for providing an output signal dependent on the junction temperature; and
means for providing a pulse signal comprising pulses for partially charging or discharging the gate electrode via the internal gate resistor.
2. The integrated circuit of claim 1, wherein the measurement bridge circuit has four arms, one of the arms comprising the internal gate resistor.
3. A circuit arrangement for measuring a junction temperature of a semiconductor component that has a gate electrode and a control terminal being connected to the gate electrode and receiving a control signal for charging and discharging the gate electrode, the gate electrode being internally connected to the control terminal via an internal gate resistor, the circuit arrangement comprising:
a measuring bridge circuit comprising the internal gate resistor and providing a measuring voltage which is dependent on the temperature dependent resistance of the internal gate resistor;
an evaluation circuit receiving the measuring voltage and providing an output signal dependent on the junction temperature; and
a pulse generator providing a pulse signal comprising pulses for partially charging or discharging the gate electrode via the internal gate resistor.
4. The circuit arrangement of claim 3, further comprising:
a driver output stage for providing the control signal to the control terminal for charging and discharging the gate electrode.
5. The circuit arrangement of claim 4, where the driver output stage receives an input signal and where the circuit arrangement further comprises a gate circuit configured to blank the input signal in response to the pulses of the pulse signal.
6. The circuit arrangement of claim 3, where the measurement bridge circuit has four arms, one of the arms comprising the internal gate resistor.
7. The circuit arrangement of claim 3, wherein the measurement bridge circuit has four arms, one of the arms comprising the internal gate resistor and an intrinsic gate capacitor of the semiconductor component connected in series to the internal gate resistor, wherein the intrinsic gate capacitor couples the gate electrode and the emitter electrode.
8. The circuit arrangement of claim 3, where measurement bridge circuit is connected between the driver output stage and the control terminal, such that the control signal is provided to the control terminal via the measurement bridge circuit.
9. The circuit arrangement of claim 3, where the driver output stage provides a control signal depending on an input signal.
10. The circuit arrangement of claim 8, where the driver output stage is adapted for providing a control signal representing a logic combination of the input signal and the pulse signal and where gate circuit comprising two inputs receiving the input signal and the pulse signal respectively.
11. The circuit arrangement claim 3, where the evaluation circuit is adapted for processing the measuring voltage only at points in time defined by the discharge pulses.
12. The circuit arrangement of claim 11, where the evaluation circuit comprises a latch being connected to the measurement bridge circuit and providing the output signal, the latch being triggered by the discharge pulses for updating the output signal.
13. The circuit arrangement of claim 11, where the evaluation circuit comprises a sample-and hold-circuit receiving the measuring voltage and providing a temperature signal, where the sample-and hold-circuit is triggered by the discharge pulses, and where an analog-to-digital converter is connected downstream of the sample-and hold-circuit.
14. The circuit arrangement of claim 12, where a memory is connected downstream of the analog-to-digital converter.
15. The circuit arrangement of claim 3, where the measurement bridge circuit is a Wheatstone-Bridge having a first and a second supply terminal, and a first and a second measurement terminal, the measuring terminals providing the measuring voltage, the first supply terminal being connected to the driver circuit, and the second supply terminal being connected to the control electrode of the semiconductor component.
16. The circuit arrangement of claim 15, where a first reference resistor is connected between the first supply terminal and the first measuring terminal, a second comparison resistor is connected between the first measuring terminal and the second supply terminal, the line resistance is connected between the second supply terminal and the second measuring terminal, and a measuring resistor is connected between the second measuring terminal and the first supply terminal.
17. The circuit arrangement of claim 3, where the measurement bridge circuit has a first and a second supply terminal, and a first and a second measurement terminal, the measuring terminals providing the measuring voltage.
18. The circuit arrangement of claim 17, wherein a first reference resistor is connected between the first supply terminal and the first measuring terminal, a series circuit of a second comparison resistor and a reference capacitor is connected between the first measuring terminal and the second supply terminal, the a series circuit of the line resistance and a parasitic capacitance of the semiconductor component is connected between the second supply terminal and the second measuring terminal, and
a measuring resistor is connected between the second measuring terminal and the first supply terminal.
19. A method for measuring the junction temperature of a semiconductor component having a control electrode being internally connected to a control terminal via an internal gate resistor, the method comprising:
partially charging or discharging the control electrode of the semiconductor component via the gate resistor, thereby effecting a voltage drop across the gate resistor; and
evaluating a measuring voltage dependent on the voltage drop during the discharging of the control electrode.
20. A method for measuring the junction temperature of a semiconductor component having a control electrode being internally connected to a control terminal via an internal gate resistor, the method comprising:
partially charging or discharging the control electrode of the semiconductor component via the gate resistor, thereby effecting a voltage drop across the series circuit comprising the internal gate resistor and the intrinsic gate capacitor; and
evaluating a measuring voltage dependent on the voltage drop during the discharging of the control electrode.
21. The method of claim 20, further comprising:
generating discharge pulses of a given pulse width and with a given repetition rate for triggering the discharging of the control electrode of the semiconductor component and for triggering the evaluating process.
22. The method of claim 21, further comprising:
sampling the measuring voltage at rising or falling edges of the discharge pulses; and
digital-to-analog converting the sampled values of the measuring voltage for providing a digital temperature signal.
23. The method of claim 21, further comprising:
comparing the measuring voltage with a threshold value thereby generating an over-temperature signal;
latching the over-temperature signal to an output at rising or falling edges of the discharge pulses; and
deactivating the semiconductor component if an over-temperature is detected.
24. The method of claim 21, where the pulse width is within a range from 20 to 100 nanoseconds.
25. The method of claim 21, where the pulse repetition rate is up to 20 kilohertzs.