1. A test apparatus for testing a device under test comprising:
a plurality of conversion processing units for converting split patterns recorded respectively on different split pattern recording sections in parallel; and
a test pattern generating unit for providing a test pattern converted by said plurality of conversion processing units to said device under test,
wherein a test pattern file used for testing said device under test comprises a plurality of said split pattern recording sections where a plurality of said split patterns are recorded, and said test pattern for testing said device under test is split into said split patterns,
the test apparatus further comprising a split pattern supplying unit for storing test pattern data comprised in said split pattern decompressed by said plurality of conversion processing unit on a location indicated by a test pattern address corresponding to said test pattern data in said test pattern generating unit,
wherein each of said plurality of decompressed split patterns comprises test pattern data to be provided to said test pattern generating unit and said test pattern address indicating an address where said test pattern data is stored in said test pattern generating unit.
2. The test apparatus as claimed in claim 1, wherein said plurality of split patterns are compressed to be recorded on said plurality of split pattern recording sections, and said plurality of conversion processing units decompress and convert said compressed split patterns respectively recorded on said different split pattern recording sections in parallel.
3. The test apparatus as claimed in claim 2 further comprising: a relaying unit for relaying communication between a storage for storing said test pattern file and said plurality of conversion processing units, wherein communication throughput of each of a plurality of communication links provided between said relaying unit and said plurality of conversion processing units is lower than that of a communication link provided between said storage and said relaying unit.
4. The test apparatus as claimed in claim 2, wherein said test pattern file further comprises a storage location recording section where storage location of each of said plurality of split patterns is recorded, one of said conversion processing units comprises a storage location selecting unit for selecting a storage location of said split pattern which will be decompressed by other one of said conversion processing units according to said storage location recording section, and said other one of said conversion processing units decompresses said split pattern recorded on said storage location in said test pattern file selected by said storage location selecting unit.
5. The test apparatus as claimed in claim 1 further comprising:
one or more of additional test pattern generating units,
wherein each of said plurality of decompressed split patterns further comprises test pattern generating unit identifying information which indicates one out of said test pattern generating units for storing said test pattern data, and
wherein said split pattern supplying unit stores said test pattern data comprised in said split pattern decompressed by said plurality of conversion processing units on a location indicated by said test pattern address in one of said test pattern generating units indicated by test pattern generating unit identifying information corresponding to said test pattern data.
6. A computer readable medium containing a program instructing a test apparatus to test a device under test, the program comprising:
a test pattern file used for testing said device under test comprising:
a plurality of split pattern recording sections where a plurality of split patterns are recorded, wherein a test pattern for testing said device under test is split into said plurality of split patterns; and
a storage location recording section where storage location of each of said plurality of split patterns is recorded;
wherein said program instructs said test apparatus to perform as:
a storage location selecting unit for selecting a plurality of storage locations of said split patterns respectively recorded on said different split pattern recording sections according to said storage location recording section; and
a plurality of conversion processing units for convening in parallel said split pattern recorded on said storage location selected by said storage location selecting unit in said test pattern file,
wherein each of the split patterns comprises test pattern data to be provided to a test pattern generating unit and a test pattern address indicating an address where the test pattern data is stored in the test pattern generating unit.
7. A method for controlling a test apparatus, which tests a device under test, a test pattern file used for testing said device under test comprising a plurality of split pattern recording sections where a plurality of split patterns are recorded, and a test pattern for testing said device under test being split into said split patterns, comprising:
a converting step for convening split patterns recorded respectively on different split pattern recording sections into said test pattern in parallel; and
a test pattern generating step for providing the test pattern to said device under test,
wherein each of the split patterns comprises test pattern data to be provided to a test pattern generating unit and a test pattern address indicating an address where the test pattern data is stored in the test pattern generating unit.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
What is claimed is:
1. A portable X-ray fluorescence analyzer, utilizing principles of an X-ray fluorescence method and having a measurement head and an operating section, wherein X-rays are only generated when
a measurement head side X-ray switch and a safety switch attached to the measurement head, and
an operation section side X-ray switch attached to the operation section, are on at the same time.
2. The portable X-ray fluorescence analyzer of claim 1, wherein
if the safety switch provided on the measurement head is turned off to stop X-rays, even if the safety switch is turned on again, it is not possible to generate X-rays until both the measurement head side X-ray switch and the operating section side X-ray switch are momentarily turned off.
3. The portable X-ray fluorescence analyzer of claim 2, wherein
display means, for indicating that X-rays can not be generated when the safety switch is turned off and the measurement head side X-ray switch and the operating section side X-ray switch both remain on, unless both the measurement head side X-ray switch and the operating section side X-ray switch are turned off, is provided in at least one of the measurement head or the operating section.