In the claims:
1. A method for analyzing a backup image of a component of a data center for use in support tasks, said method comprising steps of:
acquiring an initial backup image as a baseline for each of a plurality of components in a data center;
acquiring a next backup image for each of the plurality of components in the data center on a periodic basis;
storing the next backup images in a storage device; and
scanning each of the next backup images for viruses to ensure integrity of each of the plurality of components in the data center, wherein the scanning is performed on a system external to the imaged systems for each of a plurality of components in the data center.
2. The method as recited in claim 1, further comprising steps of:
determining a configuration for each of the plurality of components in the data center from the next backup image, wherein the determining is performed on a system external to the imaged systems for each of a plurality of components in the data center;
automatically retrieving information related to required updates for the elements in the configuration; and
notifying a user of a recommendation for updates based on the configuration and information related to required updates.
3. The method as recited in claim 2, wherein the determined configuration comprises information about hardware, software, firmware and operating system versions and installed patches.
4. The method as recited in claim 3, wherein the determined configuration further comprises performance information.
5. A method for automatically upgrading a master image of components in a data center, said method comprising steps of:
acquiring an initial image as a baseline for each of a plurality of components in a data center;
acquiring a next backup image for each of the plurality of components in the data center on a periodic basis;
storing the next backup image in a storage device;
determining a configuration for each of the plurality of components in the data center from the next backup image, wherein the determining is performed on a system external to the imaged systems for each of a plurality of components in the data center;
retrieving information related to required updates for the elements in the configuration; and
automatically updating affected components in the backup image, wherein the updates are recommended based on the determined configuration and information related to required updates, thereby generating a new master image.
6. The method as recited in claim 5, further comprising steps of:
saving an audit trail, the audit trail outlining changes between the new master image and the updated next backup image.
7. The method as recited in claim 5, further comprising steps of:
deploying a component in the data center using a new master image.
8. A method for analyzing a backup image of a component of a data center for use in support tasks, said method comprising steps of:
acquiring an initial backup image as a baseline for each of a plurality of components in a data center;
acquiring a next backup image for each of the plurality of components in the data center on a periodic basis;
storing the next backup images in a storage device;
determining a configuration for each of the plurality of components in the data center from the next backup image, wherein the determining is performed on a system external to the imaged systems for each of a plurality of components in the data center;
automatically retrieving information related to required updates for the elements in the configuration; and
notifying a user of a recommendation for updates based on the configuration and information related to required updates.
9. The method as recited in claim 8, wherein the determined configuration comprises information about hardware, software, firmware and operating system versions and installed patches.
10. The method as recited in claim 9, wherein the determined configuration further comprises performance information.
11. A method for analyzing a backup image of a component of a data center for use in support tasks, said method comprising steps of:
acquiring an initial backup image as a baseline for each of a plurality of components in a data center;
acquiring a next backup image for each of the plurality of components in the data center on a periodic basis;
storing the next backup images in a storage device;
determining a configuration for each of the plurality of components in the data center from the next backup image, wherein the determining is performed on a system external to the imaged systems for each of a plurality of components in the data center;
comparing the determined configuration with a known configuration, resulting in a set of differences; and
performing a comparative analysis based on the set of differences.
12. The method as recited in claim 11, wherein the determined configuration comprises information about hardware, software, firmware and operating system versions and installed patches.
13. The method as recited in claim 12, wherein the determined configuration further comprises performance information.
14. The method as recited in claim 10, wherein the known configuration is a known good configuration model for a selected enterprise type.
15. A system for analyzing and maintaining data center enterprise information via backup images, comprising:
a plurality of components in a data center managed by at least one control plane means for high availability purposes;
at least one network operation center (NOC) for monitoring and maintaining a plurality of virtual local area networks (VLANs) controlled by at least one control plane;
a storage device for storing a plurality of image backups for each component in the data center, wherein each image backup comprises information needed to determine a configuration of a corresponding component; and
analysis means for comparing a component configuration to a master configuration, wherein a comparison is made using image backups and an external system, and without impacting performance of the corresponding component in the data center.
16. The system as recited in claim 15, wherein the external system used for analysis is centralized and allows an external support node to analyze a plurality of enterprises.
17. The system as recited in claim 15, wherein the information needed to determine a configuration comprises information about hardware, software, firmware and operating system versions and installed patches.
18. The system as recited in claim 17, wherein the information needed to determine a configuration further comprises performance information.
19. A system for analyzing and maintaining data center enterprise information via backup images, comprising:
a plurality of components in a data center managed by at least one control plane means for high availability purposes, wherein components are either dedicated to a virtual local area network (VLAN) as part of an enterprise, or as spares;
at least one network operation center (NOC) for monitoring and maintaining a plurality of virtual local area networks (VLANs) controlled by at least one control plane, the NOC communicating with the control plane and enterprise components through at least on firewall;
a storage device for storing a plurality of image backups for each component in the data center, wherein each image backup comprises information needed to determine a configuration of a corresponding component; and
an analysis system for comparing a component configuration to a master configuration, wherein a comparison is made using image backups and an external system, and without impacting performance of the corresponding component in the data center.
20. The system as recited in claim 19, wherein the analysis system further comprises an image loader for loading backup images, and at least one of a compatible computing device or an emulation computing device, wherein the compatible computing device executes the image backups and the emulation computing device emulates the system for executing the image backups.
21. The system as recited in claim 20, wherein the analysis system further comprises a comparator and an analyzer, the comparator comparing information in a first backup image to information in a second backup image.
22. The system as recited in claim 21, wherein the analyzer produces are report of differences between the first and second backup images and a recommendation for modifications.
23. The system as recited in claim 21, wherein the second backup images is taken from a known good configuration.
24. The system as recited in claim 21, wherein the second backup image is a prior backup image for a component to the first backup image for the component.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for measuring an integrated circuit temperature T, comprising the steps of:
detecting a first difference in output voltage values (\u0394V1) between a first transistor and a second transistor by providing a first current through said first transistor and a second current through said second transistor;
detecting a second difference in output voltage values (\u0394V2) between said first transistor and said second transistor by providing said second current through said first transistor and said first current through said second transistor;
obtaining an average value (Vavg) by averaging said first difference \u0394V1 and said second difference \u0394V2; and
determining said temperature T by multiplying said average value Vavg with a default value M.
2. The method according to claim 1, wherein said default value M is calculated by the following equation:
M
=
T
ref
\xf7
(
\u0394
\u2062
\u2062
V
ref
\u2062
\u2062
1
+
\u0394
\u2062
\u2062
V
ref
\u2062
\u2062
2
2
)
where:
Tref is a reference temperature in Kevin;
\u0394Vref1 is the first difference at the reference temperature Tref; and
\u0394Vref2 is the second difference at the reference temperature Tref.
3. The method according to claim 1, wherein said first current and said second current have different values.
4. The method according to claim 1, wherein said first difference \u0394V1 and second difference \u0394V2 are detected by an analog-to-digital converter.
5. The method according to claim 1, wherein said first transistor and said second transistor are bipolar junction transistors.
6. The method according to claim 5, wherein said first transistor and said second transistor are PNP bipolar junction transistors.
7. The method according to claim 5, wherein said first transistor and said second transistor are NPN bipolar junction transistors.
8. A temperature measuring system for measuring a temperature T of an integrated circuit, comprising:
a first transistor coupled to said integrated circuit having a first output voltage while a first current is provided therethrough and a second output voltage while a second current is provided therethrough;
a second transistor coupled to said integrated circuit having a third output voltage while said first current is provided therethrough and a fourth output voltage while said second current is provided therethrough;
a comparator for calculating a first difference (\u0394V1) between said first output voltage and said fourth output voltage, and calculating a second difference (\u0394V2) between said second output voltage and said third output voltage; and
a processor for obtaining an average value (Vavg) by averaging said first difference \u0394V1 and second difference \u0394V2, and determining said temperature T of said integrated circuit by multiplying said average value Vavg with a default value M.
9. The temperature measuring system according to claim 8, wherein said default value M is calculated by the following equation:
M
=
T
ref
\xf7
(
\u0394
\u2062
\u2062
V
ref
\u2062
\u2062
1
+
\u0394
\u2062
\u2062
V
ref
\u2062
\u2062
2
2
)
where:
Tref is a reference temperature in Kevin;
\u0394Vref1 is the first difference at the reference temperature Tref; and
\u0394Vref2 is the second difference at the reference temperature Tref.
10. The temperature measuring system according to claim 8, wherein said first output voltage and said second output voltage have different values, said third output voltage and said fourth output voltage have different values, said first output voltage and said fourth output voltage have different values, and said second output voltage and said third output voltage have different values.
11. The temperature measuring system according to claim 8, further comprising an analog-to-digital converter for generating digitized voltage values of said first output voltage, said second output voltage, said third output voltage, and said fourth output voltage.
12. The temperature measuring system according to claim 11, wherein said processor performs mapping of said digitized voltage values to temperature values.
13. The temperature measuring system according to claim 8, further comprising a current source coupled to said first transistor and said second transistor for providing said first current and said second current.
14. The temperature measuring system according to claim 13, wherein said first current and said second current have different values.
15. The temperature measuring system according to claim 8, wherein said first transistor and said second transistor are bipolar junction transistors.
16. The temperature measuring system according to claim 15, wherein said first transistor and said second transistor are PNP bipolar junction transistors.
17. The temperature measuring system according to claim 15, wherein said first transistor and said second transistor are NPN bipolar junction transistors.