Author: claimsbot

1. A toilet flange comprising:
a body having a toilet-facing surface, a drain-facing surface, and a drain opening therethrough; and
at least two chambers extending from the toilet-facing surface only partially into the body, each chamber having a fastener passageway for receiving a portion of a first fastener for coupling the body to a toilet base.
2. The toilet flange of claim 1, wherein the body has a poly-sided perimeter shape.
3. The toilet flange of claim 1, wherein the toilet-facing surface of the body includes a dam feature configured to prevent a fluid from escaping radially from a periphery of the toilet-facing surface.
4. The toilet flange of claim 3, wherein the dam feature includes a raised edge.
5. The toilet flange of claim 1, wherein the toilet-facing surface includes at least a portion slanted toward the drain opening.
6. The toilet flange of claim 5, wherein a highest point of the toilet-facing surface is substantially adjacent to a dam feature configured to prevent a fluid from escaping radially from a periphery of the toilet-facing surface.
7. The toilet flange of claim 1, further comprising a plurality of mounting apertures extending through the body and configured to receive a second fastener for attaching the body to a fixed surface.
8. The toilet flange of claim 7, further comprising a retaining wall substantially surrounding a respective mounting aperture in the plurality of mounting apertures.
9. The toilet flange of claim 1, further comprising a channel fluidly connecting a respective chamber in the at least two chambers to the drain opening, the channel extending from the toilet-facing surface only partially into the body.
10. The toilet flange of claim 1, further comprising a conduit fluidly connecting a respective chamber in the at least two chambers to the drain opening.
11. The toilet flange of claim 1, further comprising a plurality of sealed mounting apertures extending through the body and configured to receive a fastener for attaching the body to a fixed surface, the sealing mounting apertures being sealed at the drain-facing surface via a polymer layer.
12. A toilet flange comprising:
a body having a toilet-facing surface, a drain-facing surface, and a drain opening therethrough; and
a dam feature configured to prevent a fluid from escaping radially from a periphery of the toilet-facing surface.
13. The toilet flange of claim 12, further comprising at least two chambers extending from the toilet-facing surface only partially into the body, each chamber having a fastener passageway for receiving a portion of a fastener for coupling the body to the toilet base.
14. The toilet flange of claim 12, wherein the body has a poly-sided perimeter shape.
15. The toilet flange of claim 12, further comprising a plurality of mounting apertures extending through the body and configured to receive a fastener for attaching the body to a fixed surface.
16. The toilet flange of claim 15, further comprising a retaining wall substantially surrounding a respective mounting aperture in the plurality of mounting apertures.
17. The toilet flange of claim 12, wherein the toilet-facing surface includes at least a portion slanted toward the drain opening.
18. The toilet flange of claim 13, further comprising a channel fluidly connecting a respective chamber in the at least two chambers to the drain opening, the channel extending from the toilet-facing surface only partially into the body.
19. The toilet flange of claim 13, further comprising a conduit fluidly connecting a respective chamber in the at least two chambers to the drain opening.
20. The toilet flange of claim 12, further comprising a plurality of sealed mounting apertures extending through the body and configured to receive a fastener for attaching the body to a fixed surface, the sealing mounting apertures being sealed at the drain-facing surface via a polymer layer.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A drive control method for at least one light emitting element, comprising the steps of:
measuring temporal change in drive voltage and light amount of said light emitting element while driving said light emitting element by constant current;
creating and storing a drive profile which is used to obtain a target drive voltage corresponding to targeted light amount, according to result of said measuring;
deriving said target drive voltage upon referring to said drive profile; and
controlling current of said light emitting element so as drive voltage of said light emitting element to become said target drive voltage when illuminating said light emitting element.
2. The drive control method as claimed in claim 1, further comprising the steps of:
obtaining a threshold voltage at a point where response of said light amount to variation of said drive voltage changes from linear to nonlinear, according to said result of said measuring;
storing said threshold voltage together with said drive profile; and
controlling said current of said light emitting element so as said drive voltage of said light emitting element not to become below said threshold voltage when illuminating said light emitting element.
3. The drive control method as claimed in claim 2, wherein said drive profile includes a slope and an intercept of a first-order equation representing a linear portion of said response.
4. The drive control method as claimed in claim 2, wherein said light emitting element is driven by a maximum current for maximum light emission, during said measuring of said drive voltage and said light amount.
5. The drive control method as claimed in claim 2, wherein said light emitting element is plural in number, said plural light emitting elements being serially connected to form a plurality of element columns, said measuring step and said controlling step being performed in each element column.
6. The drive control method as claimed in claim 5, wherein said drive profile is created based on normalizing drive voltage of each element column by that of a single element column representative among said element columns.
7. A drive control device for at least one light emitting element, comprising:
a data processing means for creating a drive profile which is used to obtain a target drive voltage corresponding to targeted light amount, according to a measurement result of temporal change in drive voltage and light amount of said light emitting element while driving said light emitting element with constant current;
a memory means for storing said drive profile; and
a current control means for controlling current of said light emitting element so as drive voltage of said light emitting element to become said target drive voltage when illuminating said light emitting element, after obtaining said target drive voltage upon referring to said drive profile stored in said memory means.
8. The drive control device as claimed in claim 7, wherein said data processing means obtains a threshold voltage at a point where response of said light amount to variation of said drive voltage changes from linear to nonlinear, according to said measurement result, said memory means storing said threshold voltage together with said drive profile, said current control means controlling said current of said light emitting element so as said drive voltage of said light emitting element not to become below said threshold voltage.
9. The drive control device as claimed in claim 8, wherein said drive profile includes a slope and an intercept of a first-order equation representing a liner portion of said response.
10. The drive control device as claimed in claim 8, wherein said light emitting element is plural in number, said plural light emitting elements being serially connected to form a plurality of element columns, said data processing and said current controlling being performed in each element column.
11. The drive control device as claimed in claim 10, wherein said drive profile is created based on normalizing drive voltage of each element column by that of a single element column representative among said element columns.
12. An electronic apparatus using at least one light emitting element as a light source, comprising:
a data processing means for creating a drive profile which is used to obtain a target drive voltage corresponding to targeted light amount, according to a measurement result of temporal change in drive voltage and light amount of said light emitting element while driving said light emitting element with constant current;
a memory means for storing said drive profile; and
a current control means for controlling current of said light emitting element so as drive voltage of said light emitting element to become said target drive voltage when illuminating said light emitting element, after obtaining said target drive voltage upon referring to said drive profile stored in said memory means.
13. The electronic apparatus as claimed in claim 12, wherein said data processing means obtains a threshold voltage at a point where response of said light amount to variation of said drive voltage changes from linear to nonlinear, according to said measurement result, said memory means storing said threshold voltage together with said drive profile, said current control means controlling said current of said light emitting element so as drive voltage of said light emitting element not to become below said threshold voltage.
14. The electronic apparatus as claimed in claim 13, wherein said drive profile includes a slope and an intercept of a first-order equation representing a linear portion of said response.
15. The electronic apparatus as claimed in claim 13, wherein said light emitting element is plural in number, said plural light emitting elements being serially connected to form a plurality of element columns, said data processing and said current controlling being performed in each element column.
16. The electronic apparatus as claimed in claim 15, wherein said drive profile is created based on normalizing drive voltage of each element column by that of a single element column representative among said element columns.

1. A jamb and frame combination for window or door casings, comprising an elongated jamb member formed to fit snugly against the interior surface of a window or door casing, and having a tongue portion on each opposite side extending the length thereof; a first frame member formed to fit snugly against a respective inner or outer surface of said window or door casing, wherein said first frame member includes a groove portion extending the length thereof on one distal end that is snugly receives and mates with a respective tongue portion of said jamb member, and includes a tongue portion extending the lengths thereof on an opposite distal end that snugly receives and mates with a respective grooves of a trim member, and at least one removable fastener passing through said respective frame member in an area adjacent to each said tongue portion and passing into said window or door casing to thereby hold said first frame member snugly thereto; an elongated first trim member including a groove portion extending the length thereof and interlocking with said tongue portion of said first frame member, such that when said first frame members is installed upon a window or door casing, said first trim member groove portion is pushed upon said first frame member tongue portion and frictionally held in place and covering said at least one removable fastener; a second frame member formed to fit snugly against an opposite inner or outer surface of said window or door casing, wherein said second frame member includes a groove portion extending the length thereof on one distal end that snugly receives and mates with the opposite respective tongue portion of said jamb member, and includes a second groove portion extending the length thereof on an outside surface, and at least one removable fastener passing through said second frame member at a point that is within said second groove portion and passing into said window or door casing to thereby hold said second frame member snugly thereto; and an elongated second trim member snugly fitting within and covering said second groove portion and said at least one removable fastener; wherein said first frame member, said second frame member, and said jamb member together form a shape having a cross-section that includes an interior portion that flares in a direction along the widths of said first and second frame members, such that said first and second frame members can connect with a portion of said window or door casing without contacting the distal edge portions of said window or door casing.
2. The combination of claim 1, wherein each of said at least one removable fasteners for each respective frame member includes a series of removable fasteners extending the length of each said respective frame member.
3. The combination of claim 1, wherein said first frame member and said first trim member have interdigitating shapes, such that said first trim member fits snugly around the tongue portion and a front surface of said first frame member, thereby covering said at least one removable fastener.
4. The combination of claim 1, wherein said second trim member includes two deformable arms extending the length thereof, and are adapted to be pushed into and deformed within said second groove portion to thereby create a strong friction hold between said second trim member and said second groove portion.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A semiconductor-processing apparatus comprising:
a wafer handling chamber;
at least one wafer processing chamber, each connected to the wafer handling chamber;
a wafer handling device disposed in the wafer handling chamber for loading a wafer in the wafer processing chamber, said wafer handling device comprising an end effector for placing a wafer thereon, said end effector being movable from a ready-to-load position to the wafer processing chamber in an x-axis direction which is a wafer loading direction and in a y-axis which is perpendicular to the x-axis direction on a wafer loading plane;
at least one first photosensor disposed in the wafer handling chamber in front of the wafer processing chamber at a position where the wafer placed on the end effector partially blocks light received by the first photosensor at the ready-to-load position and entirely blocks light received by the first photosensor when the wafer moves from the ready-to-load position toward the wafer processing chamber in the x-axis direction; and
at least one second photosensor disposed in the wafer handling chamber in front of the wafer processing chamber at a position where the wafer placed on the end effector does not block light received by the second photosensor at the ready-to-load position and partially blocks but never entirely blocks light received by the second photosensor when the wafer moves from the ready-to-load position toward the wafer processing chamber in the x-axis direction,
wherein the first photosensor is adapted to output a first analogue signal indicative of quantity of light sensed by the first photosensor at the ready-to-load position, and the second photosensor is adapted to output a second analogue signal indicative of lowest quantity of light sensed by the second photosensor when the wafer moves from the ready-to-load position toward the wafer processing chamber,
wherein the first and second photosensors are disposed at positions such that an amount of a wafer deviation, a, in the x-axis direction is determinable by the equation
a=a\u2032+(R\u2212\u221a{square root over ((R2\u2212b2))})
wherein a\u2032 is an amount of a wafer deviation detected by the first photosensor, b is an amount of a wafer deviation detected by the second photosensor, and R is a radius of the wafer.
2. The semiconductor-processing apparatus according to claim 1, further comprising a control unit which stores a standard first signal and a standard second signal which are indicative of no deviation of the wafer placed on the end effector either in the x-axis direction or the y-axis direction, wherein the control unit receives the first and second signals from the first and second photosensors, and compares the first and second signals with the standard first and second signals to determine a deviation of the wafer on the end effector in the x-axis direction and a deviation of the wafer on the end effector in the y-axis direction.
3. The semiconductor-processing apparatus according to claim 2, wherein the control unit controls the wafer handling device based on the determined deviations of the wafer to move the end effector by compensating for the deviations to the wafer processing chamber.
4. The semiconductor-processing apparatus according to claim 1, wherein the first photosensor is disposed in alignment with an x-axis drawn from an axis of the wafer handing device to a center of the wafer processing chamber as viewed above the end effector, and the second photosensor is disposed next to the first photosensor along a track of an outer periphery edge of the wafer when the wafer handling device turns.
5. The semiconductor-processing apparatus according to claim 4, wherein the first and second photosensors are disposed in the vicinity of the wafer processing chamber.
6. The semiconductor-processing apparatus according to claim 1, wherein the first photosensor has a shape elongated in the x-axis direction.
7. The semiconductor-processing apparatus according to claim 1, wherein the second photosensor has a shape elongated in the y-axis direction.
8. The semiconductor-processing apparatus according to claim 1, wherein the first photosensor functions also as a sensor for detecting an obstacle in front of the wafer processing chamber.
9. The semiconductor-processing apparatus according to claim 1, wherein the wafer handling device is adapted to rotate the end effector around an axis of the wafer handling device to position the end effector at the ready-to-load position.
10. The semiconductor-processing apparatus according to claim 1, wherein the at least one wafer processing chamber is comprised of two or more wafer processing chambers disposed around the wafer handling chamber.
11. The semiconductor-processing apparatus according to claim 10, wherein the wafer handling device comprises double arms, each having an end effector.
12. The semiconductor-processing apparatus according to claim 1, wherein the wafer handling device further comprises a wafer clumper for clumping the wafer.
13. The semiconductor-processing apparatus according to claim 1, wherein each of the first and second photosensors is comprised of a light emitter disposed under the end effector in an axial direction of the wafer handling device, and a light sensor disposed above the end effector in the axial direction.
14. The semiconductor-processing apparatus according to claim 13, wherein the light sensor is constituted by a CCD element.
15. The semiconductor-processing apparatus according to claim 1, wherein the first and second photosensors are the only photosensors used for detecting the deviations in the x-axis and y-axis directions for each wafer processing chamber.
16. The semiconductor-processing apparatus according to claim 1, wherein the second photosensor is connected to a peak hold circuit designed for temporarily holding the second signal which is a signal of lowest quantity of light outputted from the second photosensor.