1-25. (canceled)
26. In a microfluidic in-vitro diagnostic device comprised of a base having at least one fluid channel within which a fluid sample to be assayed passes from an inlet port to a detection zone, the improvement comprising said at least one fluid channel being enclosed by at least one enclosure surface wherein at least one surface of the fluid channel comprises either a hydrophilic heat-sealable adhesive or a hydrophilic pressure sensitive adhesive, wherein the hydrophilic adhesive increases the surface energy of a fluid flow path through the channel and wherein the hydrophilic adhesive decreases the surface tension of a biological fluid flowing through the channel.
27. The microfluidic device of claim 26, wherein said enclosure surface is heat-sealed to said base to seal said at least one fluid channel by the hydrophilic heat-sealable adhesive.
28. The microfluidic device of claim 26, wherein the surface of said enclosure surface comprises a pressure sensitive adhesive.
29. (canceled)
30. The microfluidic device of claim 26, wherein said enclosure surface is comprised of a low fluorescent material.
31. The microfluidic device of claim 26, wherein said enclosure surface is comprised of a polymeric material with which a surfactant is admixed to provide hydrophilic surface properties.
32. The microfluidic device of claim 26, wherein said enclosure surface is comprised of a polymeric material having a surfactant applied to a surface thereof.
33. The microfluidic device of claim 31, wherein said surfactant is a non-ionic or anionic surfactant.
34. The microfluidic device of claim 33, wherein said surfactant is selected from the group consisting of polyethylene oxide, polypropylene oxide, nonylphenol ethyoxylate and polyalkylene-oxide modified heptamethyltrisiloxane.
35. The microfluidic device of claim 33, wherein said surfactant is selected from the group consisting of sodium or ammonium salts of nonyl phenol ethoxyl sulfonic acid, sodium lauryl sulfate, sodium 2-ethylhexyl sulfate and sodium dioctylsulfo succinate.
36. The microfluidic device of claim 33, wherein said surfactant is selected from the group consisting of the ionic salt of 2-acrylamido-2-methyl propanesulfonic acid, N-vinyl caprolactam, caprolactone acrylate, N-vinyl pyrrolidone, and sulfate and acrylic monomers.
37.-51. (canceled)
52. A biological detection device comprising:
a substrate providing a surface to carry a fluid from a first end of the substrate toward a detection zone along a fluid flow path, a portion of the substrate surface comprising a hydrophilic heat-sealable adhesive or a hydrophilic pressure sensitive adhesive wherein the hydrophilic adhesive increases the surface energy of the fluid flow path across the portion of the substrate surface comprising the hydrophilic adhesive and wherein the hydrophilic adhesive decreases the surface tension of a biological fluid flowing along the fluid flow path across the portion of the substrate surface comprising the hydrophilic adhesive.
53. The device of claim 52, wherein the hydrophilic adhesive comprises a polymeric material and at least one surfactant, wherein the surfactant increases the hydrophilicity of the polymeric material.
54. The device of claim 53, wherein the surfactant is selected from the group consisting of sodium salt of sulfated nonylphenol ethoxylate, ammonium salt of sulfated nonylphenol ethoxylate, sodium 2-ethyl hexyl sulfate, sodium octyl sulfate, sodium nonylphenol sulfate, nonyl phenol ethoxylate, sodium lauryl sulfate, sodium nonylphenol ether sulfate, polyalkylene oxide modified heptamethyl trisiloxane, sodium dioctyl sulfo succinate, and sodium salt of 2-acrylamide-2-methyl-propane sulfonic acid.
55. The microfluidic device of claim 31, wherein said surfactant is selected from the group consisting of sodium salt of sulfated nonylphenol ethoxylate, ammonium salt of sulfated nonylphenol ethoxylate, sodium 2-ethyl hexyl sulfate, sodium octyl sulfate, sodium nonylphenol sulfate, nonyl phenol ethoxylate, sodium lauryl sulfate, sodium nonylphenol ether sulfate, polyalkylene oxide modified heptamethyl trisiloxane, sodium dioctyl sulfo succinate, and sodium salt of 2-acrylamide-2-methyl-propane sulfonic acid.
56. The microfluidic device of claim 32, wherein said surfactant is selected from the group consisting of sodium salt of sulfated nonylphenol ethoxylate, ammonium salt of sulfated nonylphenol ethoxylate, sodium 2-ethyl hexyl sulfate, sodium octyl sulfate, sodium nonylphenol sulfate, nonyl phenol ethoxylate, sodium lauryl sulfate, sodium nonylphenol ether sulfate, polyalkylene oxide modified heptamethyl trisiloxane, sodium dioctyl sulfo succinate, and sodium salt of 2-acrylamide-2-methyl-propane sulfonic acid.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
Now, therefore, the following is claimed:
1. A system for detecting defects within circuits, the system comprising:
a circuit;
a power supply unit, said power supply unit configured to transmit supply current to said circuit;
a current meter configured to receive said supply current and to transmit a first signal and a second signal respectively indicating a first value and a second value of said supply current; and
an analyzer configured to receive said first and second signals, to determine a threshold value based on said first signal, to compare said second signal to said threshold value, and to determine whether said circuit is defective based on a comparison of said second signal to said threshold value.
2. The system of claim 1, wherein said threshold value is unique to said circuit.
3. The system of claim 1, wherein said analyzer is further configured to detect a defect in said circuit when said second signal is greater than said threshold value, to determine a lower threshold value based on said first signal, to compare said second signal to said lower threshold value, and to determine that said circuit is defective when said second signal is less than said lower threshold value.
4. The system of claim 1, wherein said analyzer is further configured to detect a defect in said circuit when said second signal is less than said threshold value, to determine an upper threshold value based on said first signal, to compare said second signal to said upper threshold value, and to determine that said circuit is defective when said second signal is greater than said upper threshold value.
5. The system of claim 1, wherein said first signal indicates a minimum value of said supply current when said circuit is in defect free states.
6. The system of claim 5, wherein said analyzer is further configured to determine, based on said first signal, a signal value indicating a maximum value of said supply current when said circuit is in said defect free states.
7. A method for detecting defects within circuits, the method comprising the steps of:
providing a circuit;
measuring a value of a supply current associated with said circuit when said circuit is in a first state;
determining a threshold value based on said value of said supply current measured in said measuring step;
receiving a signal indicating another value of said supply current when said circuit is in a second state;
comparing said signal to said threshold value; and
detecting a defect in said circuit based on said comparing step.
8. The method of claim 7, further comprising the steps of:
determining a second threshold value based on said value of said supply current measured in said measuring step; and
comparing said signal to said second threshold value.
9. The method of claim 7, further comprising the step of refraining from determining a value of said signal.
10. The method of claim 7, further comprising the steps of:
receiving signals indicating values of said supply current when said circuit is in a plurality of states;
analyzing values of said received signals;
determining which of said values analyzed in said analyzing step is a minimum value; and
selecting said first state in response to a determination that said first state is associated with said minimum value.
11. The method of claim 7, further comprising the steps of:
providing a plurality of circuits;
receiving signals indicating values of supply currents associated with said plurality of circuits for a plurality of states;
selecting ones of said received signals;
determining constant values based on values of said selected ones; and
utilizing said constant values to determine said threshold value in said determining step.
12. The method of claim 7, further comprising the steps of:
receiving signals indicating values of supply currents for a plurality of circuits at a plurality of states;
selecting a respective first signal and a respective second signal for each of said circuits; and
determining said threshold value based on values of said signals selected in said selecting step.
13. The method of claim 11, further comprising the steps of:
determining a new respective threshold value for each of said plurality of circuits; and
utilizing said constant values to determine said new respective threshold values.
14. The method of claim 11, further comprising the step of:
removing outliers of said values of said selected ones via regression techniques.
15. The method of claim 11, further comprising the steps of:
plotting said values of said selected ones; and
fitting a curve to said values plotted in said plotting step.
16. The method of claim 12, wherein said first signal is associated with a maximum supply current value for a respective one of said circuits and said second signal is associated with a minimum supply current value for said respective one of said circuits.
17. The method of claim 12, further comprising the steps of:
plotting a value of said first respective signal versus a value of said second respective signal for each of said circuits in a graph;
performing a regression of said graph; and
removing outliers from said graph.
18. A method for detecting defects within circuits, the method comprising the steps of:
providing a plurality of circuits;
producing signals indicating values of supply currents associated with said circuits;
analyzing values of said signals;
determining a constant value based on said analyzing step;
selecting a circuit;
placing said circuit into a first state subsequent to said determining step;
producing a first signal indicating a first value of a supply current of said circuit when said circuit is in said first state;
determining a threshold value based on said constant value and said first signal;
placing said first circuit into another state;
producing a second signal indicating a second value of said supply current when said circuit is in said other state; and
determining whether a value of said second signal exceeds said first threshold value.
19. The method of claim 18, further comprising the steps of:
determining a second threshold value for said circuit based on said first signal; and
determining whether said value of said second signal exceeds said second threshold value.
20. The method of claim 18, further comprising the steps of:
selecting a first respective value and a second respective value of said signals analyzed in said analyzing step for each of said plurality of circuits;
plotting said first respective value versus said second respective value; and
performing a regression of said values plotted in said plotting step.