1. A method of analyzing physical and optical properties of a textured sample surface comprising:
a) providing a spectroscopic ellipsometer system comprising:
a source of a spectroscopic beam of electromagnetic radiation;
a polarizer;
a stage system comprising:
a stage frame oriented in a stage frame plane, and a stage; said stage being rotatably connected to said stage frame in a manner enabling tilting said stage with respect to said stage frame plane;
an analyzer; and
a detector;
said spectroscopic ellipsometer optionally further comprising at least one beam intensity controller selected from the group consisting of:
a means for controlling beam intensity between the source and detector;
a variable attenuator for controlling beam intensity between the source and detector;
a variable attenuator comprising two polarizers which can be adjusted with respect to one another to control the amount of electromagnetic radiation passing therethrough, between the source and detector;
a sequence of filters for controlling beam intensity between the source and detector; and
said source of a spectroscopic beam of electromagnetic radiation is a plurality of sources for providing a plurality of beam intensities;
b) positioning a sample having a textured surface onto said stage with the texture surface facing away from said stage;
c) causing a spectroscopic beam of electromagnetic radiation, provided by said source of a spectroscopic beam of electromagnetic radiation, to follow a beam locus and pass through said polarizer, impinge on and reflect from said textured sample surface at a location thereupon, pass through said analyzer and enter said detector, said beam of electromagnetic radiation also affected by the at least one selected beam intensity controller;
d) effecting a stage tilt to orient said textured sample surface in a plane oriented at between 10-90 degrees with respect to the plane of said stage frame;
e) collecting data provided by said detector; and
f) analyzing collected detector data to determine physical andor optical properties of said textured sample surface;
said method being characterized in that, at the location on said textured sample at which said beam of electromagnetic radiation impinges, there is identified a perpendicular to said surface,
in which a plane-of-incidence is defined as a plane including both said spectroscopic beam locus and said perpendicular to said textured surface at said location whereat said beam impinges; and
in which an angle-of-incidence is defined as that angle between said spectroscopic beam locus and said normal to said textured surface at said location whereat said beam impinges;
and said method comprises, while substantially maintaining said angle-of-incidence, causing the sample to tilt so that said perpendicular to said textured sample surface at the location on said textured sample at which said spectroscopic beam of electromagnetic radiation impinges is not in said defined plane-of-incidence, while data is collected in step e; and
g) performing at least one selection from the group consisting of:
storing at least some data provided by said data detector in machine readable media;
analyzing at least some of the data provided by said data detector and storing at least some of the results of said analysis in machine readable media;
displaying at least some data provided by said data detector by electronic andor non-electronic means;
analyzing at least some of the data provided by said data detector and displaying at least some of the results of said analysis by electronic andor non-electronic means;
causing at least some data provided by said data detector to produce a signal which is applied to provide a concrete and tangible result; and
analyzing at least some of the data provided by said data detector and causing at least some thereof to produce a signal which is applied to provide a concrete and tangible result.
2. A method as in claim 1, in which the sample tilt is set to a value at which quality of said reflected beam reaching said detector is substantially optimized, wherein \u201cquality\u201d is identified by data magnitude sensitivity to wavelength change.
3. A method as in claim 1, in which the angle-of-incidence at which said spectroscopic beam approaches said textured sample is set to a value at which quality of said reflected spectroscopic beam reaching said detector is substantially optimized, wherein \u201cquality\u201d is identified by data magnitude sensitivity to wavelength change.
4. A method as in claim 1 which is characterized by at least one selection from the group consisting of:
a) a thin film is present on the surface of the textured sample which is in a tilted plane oriented at between 10-80 degrees with respect to the plane of said stage frame;
b) the surface of the textured sample is oriented in a tilted plane oriented at an angle with respect to the plane of said stage frame which is other than perpendicular to a plane-of-incidence including both said spectroscopic beam locus and a perpendicular to said textured surface at said location whereat said beam impinges;
c) the angle-of-incidence at which the beam of electromagnetic radiation impinges on a thin film present on said textured sample surface is between 10 and 80 degrees, and surface of the textured sample is in a tilted plane oriented at between 10-90 degrees with respect to the plane of said stage frame;
d) the surface of the textured sample is in a tilted plane oriented at between 0-90 degrees with respect to the plane of said stage frame and said textured sample is rotated about a normal to said tilted plane to optimize a signal which enters said detector, and said beam of electromagnetic radiation is spectroscopic;
e) said ellipsometer further comprises a means for increasing the intensity of the beam of electromagnetic radiation which impinges on and reflects from said surface of said textured sample surface;
f) said surface of said textured sample comprises facets from which electromagnetic radiation incident thereupon is reflected other than into said detector;
g) said surface of said textured samples comprise a non-random effectively \u201cregular\u201d textured surface andor a surface characterized by an irregular array of faceted structures;
h) said surface of said textured sample comprises connector lines thereupon from which electromagnetic radiation incident thereupon is reflected other than into said detector;
i) said ellipsometer further comprises \u201cX\u201d-\u201cY\u201d or R-THETA means for translating said stage and stage rotation means as a unit.
5. A method of analyzing physical and optical properties of a textured sample surface comprising:
a) providing an ellipsometer system comprising:
a source of a beam of electromagnetic radiation;
a polarizer;
a stage system comprising:
a stage frame oriented in a stage frame plane;
a stage rotation means; and
a stage;
said stage rotation means being rotatably connected to said stage frame in a manner enabling tilting said stage and stage rotation means, as a unit, with respect to said stage frame plane and said stage rotation means enabling rotation of said stage in a plane parallel to the surface of said stage;
an analyzer; and
a detector;
said spectroscopic ellipsometer optionally further comprising at least one beam intensity controller selected from the group consisting of:
a means for controlling beam intensity between the source and detector;
a variable attenuator for controlling beam intensity between the source and detector;
a variable attenuator comprising two polarizers which can be adjusted with respect to one another to control the amount of electromagnetic radiation passing therethrough, between the source and detector;
a sequence of filters for controlling beam intensity between the source and detector; and
said source of a spectroscopic beam of electromagnetic radiation is a plurality of sources for providing a plurality of beam intensities;
b) positioning a sample having a textured surface onto said stage with the texture surface facing away from said stage;
c) causing a beam of electromagnetic radiation, provided by said source of a beam of electromagnetic radiation, to follow a beam locus and pass through said polarizer, impinge on and reflect from said textured sample surface, pass through said analyzer and enter said detector, said beam of electromagnetic radiation also being affected by the at least one selected beam intensity controller;
d) effecting a stage tilt to orient said textured sample surface in a plane oriented at between 10-90 degrees with respect to the plane of said stage frame;
e) collecting data provided by said detector; and
f) analyzing collected detector data to determine physical andor optical properties of said textured sample surface;
said method being characterized in that, at the location on said textured sample at which said beam of electromagnetic radiation impinges, there is identified a perpendicular to said surface,
in which a plane-of-incidence is defined as a plane including both said spectroscopic beam locus and said perpendicular to said textured surface at said location whereat said beam impinges; and
in which an angle-of-incidence is defined as that angle between said spectroscopic beam locus and said normal to said textured surface at said location whereat said beam impinges;
and said method comprises, while substantially maintaining said angle-of-incidence, causing the sample to tilt so that said perpendicular to said textured sample surface at the location on said textured sample at which said spectroscopic beam of electromagnetic radiation impinges is not in said defined plane-of-incidence, while data is collected in step e; and
g) performing at least one selection from the group consisting of:
storing at least some data provided by said data detector in machine readable media;
analyzing at least some of the data provided by said data detector and storing at least some of the results of said analysis in machine readable media;
displaying at least some data provided by said data detector by electronic andor non-electronic means;
analyzing at least some of the data provided by said data detector and displaying at least some of the results of said analysis by electronic andor non-electronic means;
causing at least some data provided by said data detector to produce a signal which is applied to provide a concrete and tangible result; and
analyzing at least some of the data provided by said data detector and causing at least some thereof to produce a signal which is applied to provide a concrete and tangible result.
6. A method as in claim 5, in which the sample plane-of-incidence tilt is set to a value at which said reflected beam reaching said detector is substantially optimized as defined by a selection from the group of:
wherein said electromagnetic beam is spectroscopic, the \u201cquality\u201d is enhanced, where quality is identified by data magnitude sensitivity to wavelength change; and
the nature of the electromagnetic beam is enhanced as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom.
7. A method as in claim 5, in which the angle-of-incidence at which said beam approaches said textured sample is set to a value at which said reflected beam reaching said detector is substantially optimized as defined by a selection from the group of:
wherein said electromagnetic beam is spectroscopic, the \u201cquality\u201d is enhanced, where quality is identified by data magnitude sensitivity to wavelength change; and
the nature of the electromagnetic beam is enhanced as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom.
8. A method as in claim 7, in which the stage rotation means is applied to cause said stage to rotate in a plane substantially parallel to said textured sample surface to a position at which said reflected beam reaching said detector is substantially optimized as defined by a selection from the group of:
wherein said electromagnetic beam is spectroscopic, the \u201cquality\u201d is enhanced, where quality is identified by data magnitude sensitivity to wavelength change; and
the nature of the electromagnetic beam is enhance as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom.
9. A method as in claim 5 which is characterized by at least one selection from the group consisting of:
a) a thin film is present on the surface of the textured sample which is in a tilted plane oriented at between 10-80 degrees with respect to the plane of said stage frame;
b) the surface of the textured sample is oriented in a tilted plane oriented at an angle with respect to the plane of said stage frame which is other than in a plane-of-incidence including both said spectroscopic beam locus and a perpendicular to said textured surface at said location whereat said beam impinges;
c) the angle-of-incidence at which the beam of electromagnetic radiation impinges on a thin film present on said textured sample surface is between 10 and 80 degrees, and surface of the textured sample is in a tilted plane oriented at between 10-90 degrees with respect to the plane of said stage frame;
d) the surface of the textured sample is in a tilted plane oriented at between 0-90 degrees with respect to the plane of said stage frame and said textured sample is rotated about a normal to said tilted plane to optimize a signal which enters said detector, and said beam of electromagnetic radiation is spectroscopic;
e) said ellipsometer further comprises a means for increasing the intensity of the beam of electromagnetic radiation which impinges on and reflects from said surface of said textured sample surface;
f) said surface of said textured sample comprises facets from which electromagnetic radiation incident thereupon is reflected other than into said detector;
g) said surface of said textured samples comprise a non-random effectively \u201cregular\u201d textured surface andor a surface characterized by an irregular array of faceted structures;
h) said surface of said textured sample comprises connector lines thereupon from which electromagnetic radiation incident thereupon is reflected other than into said detector;
i) said ellipsometer further comprises \u201cX\u201d-\u201cY\u201d or R-THETA means for translating said stage and stage rotation means as a unit.
10. A spectroscopic ellipsometer comprising:
a spectroscopic source of a beam of electromagnetic radiation;
a polarizer;
a stage system comprising:
a stage frame oriented in a stage frame plane;
a stage rotation means; and
a stage;
said stage rotation means being rotatably connected to said stage frame in a manner enabling tilting said stage and stage rotation means, as a unit, with respect to said stage frame plane and said stage rotation means enabling rotation of said stage in a plane parallel to the surface of said stage;
an analyzer; and
a detector;
said spectroscopic ellipsometer further comprising at least one beam intensity controller selected from the group consisting of:
a means for controlling beam intensity between the source and detector;
a variable attenuator for controlling beam intensity between the source and detector;
a variable attenuator comprising two polarizers which can be adjusted with respect to one another to control the amount of electromagnetic radiation passing therethrough, between the source and detector;
a sequence of filters for controlling beam intensity between the source and detector; and
said spectroscopic source of a beam of electromagnetic radiation comprises a plurality of sources for providing a plurality of beam intensities;
said spectroscopic ellipsometer, while being applied to obtain ellipsometric data, being arranged such that said spectroscopic source of a beam of electromagnetic radiation provides a spectroscopic beam which is caused to pass through said polarizer, reflect from a sample on said stage system when it is arranged to tilt said stage and stage rotation means, as a unit, with respect to said stage frame plane so that a plane including including both incident and reflected spectroscopic beams, does not include a perpendicular to the surface of said sample at the point of interaction therewith, then pass through said analyzer and enter said detector, said spectroscopic beam of electromagnetic radiation also being affected by said at least one selected beam intensity controller.
11. A method of analyzing physical and optical properties of a thin film on a textured sample front side surface of a sample having front and back sides, comprising:
a) providing an ellipsometer system comprising:
a source of a beam of electromagnetic radiation;
a polarizer;
a stage system comprising:
a stage frame oriented in a stage frame plane;
a stage rotation means; and
a stage;
said stage rotation means being rotatably connected to said stage frame in a manner enabling tilting said stage and stage rotation means as a unit, with respect to said stage frame plane, and said stage rotation means enabling rotation of said stage in a plane parallel to the surface of said stage;
an analyzer; and
a detector;
said ellipsometer optionally further comprising at least one beam intensity controller selected from the group consisting of:
a means for controlling beam intensity between the source and detector;
a variable attenuator for controlling beam intensity between the source and detector;
a variable attenuator comprising two polarizers which can be adjusted with respect to one another to control the amount of electromagnetic radiation passing therethrough;
a sequence of filters for controlling beam intensity between the source and detector; and
said spectroscopic source of a beam of electromagnetic radiation comprises a plurality of sources for providing a plurality of beam intensities,
b) positioning a textured sample having a thin film on a front surface thereof onto said stage with the thin film on the surface of said textured sample facing away from said stage;
c) causing a beam of electromagnetic radiation, provided by said source of a beam of electromagnetic radiation, to pass through said polarizer, impinge on and reflect from said thin film on said textured sample surface, pass through said analyzer and enter said detector, said beam of electromagnetic radiation also being affected by said at least one selected beam intensity controller;
monitoring detector data output while performing steps d) and e);
d) effecting a stage and stage rotation means tilt to orient said thin film on said textured sample surface having a thin film thereupon in a plane oriented at between 0-90 degrees with respect to the plane of said stage frame;
e) causing said stage rotation means to rotate the textured sample in the plane parallel to the surface of said stage until said data output is of a nature to allow beneficial analysis thereof, as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom;
f) optionally repeating steps d and e using different stage and stage rotation means tilts to orient said textured sample front surface having a thin film thereupon in a different plane oriented at between 0-90 degrees with respect to the plane of said stage frame, until a best combination of stage and stage rotation means tilt, and stage rotation in the plane parallel to the surface of said stage is determined based on data output is of a nature to allow beneficial analysis thereof, as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom;
g) analyzing detector data collected to determine physical andor optical properties of said thin film on said textured sample front side surface; and
h) performing at least one selection from the group consisting of:
storing at least some data provided by said data detector in machine readable media;
analyzing at least some of the data provided by said data detector and storing at least some of the results of said analysis in machine readable media;
displaying at least some data provided by said data detector by electronic andor non-electronic means;
analyzing at least some of the data provided by said data detector and displaying at least some of the results of said analysis by electronic andor non-electronic means;
causing at least some data provided by said data detector to produce a signal which is applied to provide a concrete and tangible result; and
analyzing at least some of the data provided by said data detector and causing at least some thereof to produce a signal which is applied to provide a concrete and tangible result.
12. A method as in claim 11 which further comprises placing said textured sample onto said stage with the thin film on surface of said textured sample facing toward said stage and causing a beam of electromagnetic radiation, provided by said source of a beam of electromagnetic radiation, to pass through said polarizer, impinge on and reflect from said backside of said textured sample, pass through said analyzer and enter said detector, followed by analyzing data provided by said detector to evaluate parameters corresponding to the non-thin film substrate component of said textured sample per se, and using the results in the procedure to aide with evaluating the physical andor optical properties of the thin film in step g.
13. A method as in claim 11 which is characterized by at least one selection from the group consisting of:
a) the thin film on the surface of the textured sample is in a tilted plane oriented at between 10-80 degrees with respect to the plane of said stage frame, and said beam of electromagnetic radiation is spectroscopic;
b) the thin film on the surface of the textured sample is oriented in a tilted plane oriented at an angle with respect to the plane of said stage frame which is other than perpendicular to a plane-of-incidence including both said spectroscopic beam locus and a perpendicular to said textured surface at said location whereat said beam impinges, and said beam of electromagnetic radiation is spectroscopic;
c) the angle-of-incidence at which the beam of electromagnetic radiation impinges on said thin film on said textured sample surface is between 10 and 80 degrees, and the thin film on the surface of the textured sample is in a tilted plane oriented at between 10-90 degrees with respect to the plane of said stage frame, and said beam of electromagnetic radiation is spectroscopic;
d) the thin film on the surface of the textured sample is in a tilted plane oriented at between 10-90 degrees with respect to the plane of said stage frame and said textured sample is rotated about a normal to said tilted plane to optimize a signal which enters said detector, and said beam of electromagnetic radiation is spectroscopic;
e) said ellipsometer further comprises a means for increasing the intensity of the beam of electromagnetic radiation which impinges on and reflects from said surface of said textured sample surface;
f) said surface of said textured sample comprises facets from which electromagnetic radiation incident thereupon is reflected other than into said detector;
g) said surface of said textured samples comprise a non-random effectively \u201cregular\u201d textured surface andor a surface characterized by an irregular array of faceted structures;
h) said surface of said textured sample comprises connector lines thereupon from which electromagnetic radiation incident thereupon is reflected other than into said detector;
i) said ellipsometer further comprises \u201cX\u201d-\u201cY\u201d or R-THETA means for translating said stage and stage rotation means as a unit.
14. A method of analyzing physical and optical properties of a backside of a sample having front and back side surfaces, comprising:
a) providing an ellipsometer system comprising:
a source of a beam of electromagnetic radiation;
a polarizer;
a stage system comprising:
a stage frame oriented in a stage frame plane;
a stage rotation means; and
a stage;
said stage rotation means being rotatably connected to said stage frame in a manner enabling tilting said stage and stage rotation means as a unit, with respect to said stage frame plane, and said stage rotation means enabling rotation of said stage in a plane parallel to the surface of said stage;
an analyzer; and
a detector;
said ellipsometer optionally further comprising at least one beam intensity controller selected from the group consisting of:
a means for controlling beam intensity between the source and detector;
a variable attenuator for controlling beam intensity between the source and detector;
a variable attenuator comprising two polarizers which can be adjusted with respect to one another to control the amount of electromagnetic radiation passing therethrough;
a sequence of filters for controlling beam intensity between the source and detector; and
said source of a beam of electromagnetic radiation is a plurality of sources for providing a plurality of beam intensities;
b) positioning a sample characterized by a selection from the group consisting of having:
a smooth; and
a textured;
backside onto said stage with the back surface of said sample facing away from said stage;
c) causing a beam of electromagnetic radiation, provided by said source of a beam of electromagnetic radiation, to pass through said polarizer, impinge on and reflect from said back side of said sample, pass through said analyzer and enter said detector, said beam of electromagnetic radiation also being affected by said at least one selected beam intensity controller;
monitoring detector data output while performing steps d) and e);
d) effecting a stage and stage rotation means tilt to orient said back side of said sample in a plane oriented at between 0-90 degrees with respect to the plane of said stage frame;
e) causing said stage rotation means to rotate the sample in the plane parallel to the surface of said stage until said data output is of a nature to allow beneficial analysis thereof, as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom;
f) optionally repeating steps d and e using different stage and stage rotation means tilts to orient said back sample surface in a different plane oriented at between 10-90 degrees with respect to the plane of said stage frame, until a best combination of stage and stage rotation means tilt, and stage rotation in the plane parallel to the surface of said stage is determined based on data output being of a nature to allow beneficial analysis thereof, as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom;
g) analyzing detector data collected to determine physical andor optical properties of said backside textured sample backside surface; and
f) performing at least one selection from the group consisting of:
storing at least some data provided by said data detector in machine readable media;
analyzing at least some of the data provided by said data detector and storing at least some of the results of said analysis in machine readable media;
displaying at least some data provided by said data detector by electronic andor non-electronic means;
analyzing at least some of the data provided by said data detector and displaying at least some of the results of said analysis by electronic andor non-electronic means;
causing at least some data provided by said data detector to produce a signal which is applied to provide a concrete and tangible result; and
analyzing at least some of the data provided by said data detector and causing at least some thereof to produce a signal which is applied to provide a concrete and tangible result.
15. A method as in claim 14, in which said sample has a textured frontside with a thin film on the surface thereof and in which said method further comprises placing said sample onto said stage with the thin film on surface of said textured sample facing away from said stage and causing a beam of electromagnetic radiation, provided by said source of a beam of electromagnetic radiation, to pass through said polarizer, impinge on and reflect from said frontside of said textured sample, pass through said analyzer and enter said detector, followed by analyzing data provided by said detector to evaluate parameters corresponding to the thin film substrate component of said textured sample, in combination with use of using the results from steps a-g in the procedure to aide with evaluating the physical and optical properties of the thin film on the frontside textured surface.
16. A method of improving results achieved by investigating a sample having a textured, or an irregular array of faceted structures, on a surface thereof with electromagnetic radiation, involving orientating a monitored location on said sample, said method comprising the steps of:
a) providing a stage for supporting a sample, said stage having means for effecting rotation about said \u201cX\u201d or \u201cY\u201d, and \u201cZ\u201d axes, wherein said \u201cZ\u201d axis is substantially perpendicular to said surface having a textured surface or an irregular array of faceted structures;
b) placing a sample with a textured surface or an irregular array of faceted structures onto said stage with the textured surface or an irregular array of faceted structures facing away from said stage;
c) causing a beam of electromagnetic radiation to impinge on a monitored location on said textured surface or irregular array of faceted structures and enter a detector;
d) rotating said sample about the \u201cX\u201d andor \u201cY\u201d axis and about said \u201cZ\u201d axis while monitoring detector output to identify sample orientation that enables acquisition of data that is characterized by at least one selection selection from the group of:
where the electromagnetic beam is spectroscopic, a quality to allow beneficial analysis thereof, wherein \u201cquality\u201d is identified by data magnitude sensitivity to wavelength change; and
of a nature to allow beneficial analysis thereof, as evidenced by the enabling of determination of at least one selection from the group of ellipsometric PSI and ellipsomtric DELTA therefrom.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for a power circuit including a plurality of alternating current half-cycles having a plurality of zero crossings, said method comprising:
detecting said zero crossings, a consecutive pair of said zero crossings defining a corresponding one of said half-cycles and a first variable frequency;
employing a first timer to determine a first time of the corresponding one of said half-cycles, the first time being inversely related to the first variable frequency;
employing a processor including a clock having a second variable frequency;
employing a second timer to determine a second time of the clock, the second time being inversely related to the second variable frequency;
determining a ratio of said first and second variable frequencies from the second time divided by the first time; and
determining whether the ratio of said first and second variable frequencies exceeds a number of predetermined values for a plurality of said half-cycles and responsively interrupting said power circuit.
2. The method of claim 1 further comprising:
repetitively sensing an electrical characteristic associated with said power circuit; and
determining, for each of said half-cycles and responsive to said first timer, a number of samples of said electrical characteristic in a phase synchronized relationship to a corresponding one of said zero crossings.