Author: claimsbot

1. A method for imaging biological specimens using an imaging chip having rows and columns, the method comprising:
capturing a pixel image of an object on the specimens;
shifting the pixel image in the columnar direction of the imaging chip;
moving the object in synchronous motion with the pixel image; and
reading out voltage values from the bottom row of the imaging chip until a plurality of the
2. A method for imaging a sample using an imaging device, the method comprising:
moving the position of an image area on the sample along one dimension of the device;
imaging a spot on the image area continuously until the imaged spot is moved out of the detection range of the device; and
adjusting the speed of the movement for adequate exposure time.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A system for automatically generating test patterns for an at-speed structural test of a circuit partition group of an integrated circuit device, said system comprising:
an automatic test pattern generator performing a first test pattern generation pass for said circuit partition group, said first test pattern generation pass comprising generating test patterns from a set of available test patterns; and
an analyzer determining, during said first test pattern generation pass, test coverage with each test pattern generated and communicating said test coverage to said generator,
said test coverage comprising a percentage of simulated faults detected, and
said generator further performing the following:
stopping said first test pattern generation pass, based on at least one predetermined stopping criterion related to said test coverage, such that only a sub-set of test patterns is generated, said sub-set comprising less than all of said available test patterns in said set;
removing at least one test pattern from said sub-set; and
after said removing, performing a second test pattern generation pass for said circuit partition group, said second test pattern generation pass comprising generating test patterns from said sub-set.
2. The system of claim 1, said at least one predetermined stopping criterion comprising at least one of:
a pre-set maximum number of test patterns generated, during a single test pattern generation pass;
a pre-set maximum test coverage achieved, during said single test pattern generation pass; and
a pre-determined minimum slope of a test coverage curve achieved, during said single test pattern generation pass.
3. The system of claim 1, said generator further removing said at least one test pattern based on at least one predetermined removal criterion comprising at least one of:
a pre-set number of test patterns to be removed from said sub-set;
a pre-set number of test patterns to remain in said sub-set;
a pre-defined ratio between said number of test patterns to be removed from said subset and said number of test patterns to remain in said sub-set; and
a number of test patterns corresponding to a location, having a predetermined slope, on a test coverage curve acquired during said first test generation pass.
4. The system of claim 1,
said analyzer further determining, during said second test pattern generation pass, said test coverage with each test pattern generated and communicating said test coverage to said generator; and
said generator further performing the following:
based on at least one second predetermined stopping criterion, stopping said second test pattern generation pass such that only a second sub-set of test patterns is generated, said second sub-set comprising less than all of said test patterns in said sub-set;
removing at least one additional test pattern from said second sub-set; and
iteratively performing additional test pattern generation passes until a predetermined final stopping criterion is met.
5. The system of claim 4, said predetermined final stopping criterion comprising at least one of:
a pre-set maximum sum of all test patterns generated during all test pattern generation passes; and
a pre-set minimum slope of a curve representing total test coverage over total number of test patterns generating during all of said test pattern generation passes.
6. The system of claim 1, said circuit partition group comprising at least one of at least one clock domain and at least one power domain.
7. The system of claim 1, said generator further re-ordering said test patterns in said sub-set, before said removing.
8. The system of claim 7, wherein said re-ordering comprises ranking said test patterns in said sub-set based on a number of detected faults with each test pattern generated and wherein said generator further removes said at least one test pattern from said sub-set based on said ranking.
9. The system of claim 8, said number of detected faults comprising one of an absolute number of detected faults and a cumulative number of detected faults.
10. A method for automatically generating test patterns for an at-speed structural test of a circuit partition group of an integrated circuit device, said method comprising:
performing a first test pattern generation pass for said circuit partition group, said first test pattern generation pass comprising generating test patterns from a set of available test patterns;
during said performing of said first test pattern generation pass, determining test coverage with each test pattern generated, said test coverage comprising a percentage of simulated faults detected;
based on at least one predetermined stopping criterion related to said test coverage, stopping said first test pattern generation pass such that only a sub-set of said available test patterns is generated, said sub-set comprising less than all of said available test patterns in said set;
removing at least one test pattern from said sub-set; and
after said removing, performing a second test pattern generation pass for said circuit partition group comprising generating test patterns from said sub-set.
11. The method of claim 10, said at least one predetermined stopping criterion comprising at least one of:
a pre-set number of test patterns to be removed from said sub-set;
a pre-set number of test patterns to remain in said sub-set;
a pre-defined ratio between said at least one test pattern and a total number of test patterns in said sub-set; and
a number of test patterns corresponding to a location, having a predetermined slope, on a test coverage curve acquired during said first test generation pass.
12. The method of claim 10, said removing being based on at least one predetermined removal criterion comprising at least one of:
a pre-set number of test patterns to be removed from said sub-set;
a pre-set number of test patterns to remain in said sub-set;
a pre-defined ratio between said number of test patterns to be removed from said subset and said number of test patterns to remain in said sub-set; and
a number of test patterns corresponding to a location, having a predetermined slope, on a test coverage curve acquired during said first test generation pass.
13. The method of claim 10, further comprising, before said removing, re-ordering said test patterns in said sub-set.
14. The method of claim 10, further comprising:
during said performing of said second test pattern generation pass, again determining said test coverage with each test pattern generated;
based on at least one second predetermined stopping criterion, stopping said second test pattern generation pass such that only a second sub-set of test patterns is generated, said second sub-set comprising less than all of said test patterns in said sub-set;
removing at least one additional test pattern from said second sub-set; and
iteratively performing additional test pattern generation passes until a predetermined final stopping criterion is met.
15. The method of claim 14, said predetermined final stopping criterion comprising at least one of:
a pre-set maximum sum of all test patterns generated during all test pattern generation passes; and
a pre-set minimum slope of a curve representing total test coverage over total number of test patterns generating during all of said test pattern generation passes.
16. The method of claim 10, said circuit partition group comprising at least one of at least one clock domain and at least one power domain.
17. A method for automatically generating test patterns for an at-speed structural test of a single circuit partition of an integrated circuit device, said method comprising:
performing a first test pattern generation pass for said circuit partition, said first test pattern generation pass comprising generating test patterns from a set of available test patterns;
during said performing of said first test pattern generation pass, determining test coverage with each test pattern generated, said test coverage comprising a percentage of simulated faults detected;
based on at least one predetermined stopping criterion related to said test coverage, stopping said first test pattern generation pass such that only a sub-set of said available test patterns is generated, said sub-set comprising less than all of said available test patterns in said set;
ranking said test patterns in said sub-set based on a number of detected faults with each test pattern generated;
based on said ranking and according to at least one predetermined removal criterion, removing at least one test pattern from said sub-set; and
after said removing, performing a second test pattern generation pass comprising generating test patterns from said sub-set.
18. The method of claim 17, said percentage being based on one of an absolute number of detected faults and a cumulative number of detected faults.
19. The method of claim 17,
said ranking further comprising reordering said test patterns from said sub-set according to usefulness with a test pattern having a greatest number of said detected faults being most useful and a test pattern having a least number of said detected faults being least useful; and
said removing further comprising removing at least said test pattern having said least number of said detected faults.
20. The method of claim 17, said at least one predetermined stopping criterion comprising at least one of:
a pre-set number of test patterns to be removed from said sub-set;
a pre-set number of test patterns to remain in said sub-set;
a pre-defined ratio between said number of test patterns to be removed from said subset and said number of test patterns to remain in said sub-set; and
a number of test patterns corresponding to a location, having a predetermined slope, on a test coverage curve acquired during said first test generation pass.
21. The method of claim 17, said at least one predetermined removal criterion comprising at least one of:
a pre-set number of test patterns to be removed from said sub-set;
a pre-set number of test patterns to remain in said sub-set;
a pre-defined ratio between said at least one test pattern and a total number of test patterns in said sub-set; and
a number of test patterns corresponding to a location, having a predetermined slope, on a test coverage curve acquired during said first test generation pass.
22. The method of claim 17, further comprising:
during said performing of said second test pattern generation pass, again determining said incremental amount of total test coverage with each test pattern generated;
based on at least one second predetermined stopping criterion, stopping said second test pattern generation pass such that only a second sub-set of test patterns is generated, said second sub-set comprising less than all of said test patterns in said sub-set;
removing at least one additional test pattern from said second sub-set; and
iteratively performing additional test pattern generation passes until a predetermined final stopping criterion is met.
23. The method of claim 22, said predetermined final stopping criterion comprising at least one of:
a pre-set maximum sum of all test patterns generated during all test pattern generation passes; and
a pre-set minimum slope of a curve representing total test coverage over total number of test patterns generating during all of said test pattern generation passes.
24. A computer program product comprising a computer usable medium having computer useable program code embodied therewith, said computer usable program code being configured to perform a method for automatically generating test patterns for at-speed structural test of a circuit partition group of an integrated circuit device, said method:
performing a first test pattern generation pass for said circuit partition group, said first test pattern generation pass comprising generating test patterns from a set of available test patterns;
during said performing of said first test pattern generation pass, determining test coverage with each test pattern generated, said test coverage comprising a percentage of detected faults over simulated faults;
based on at least one predetermined stopping criterion related to said test coverage, stopping said first test pattern generation pass such that only a sub-set of said available test patterns is generated, said sub-set comprising less than all of said available test patterns in said set;
removing at least one test pattern from said sub-set; and
after said removing, performing a second test pattern generation pass for said circuit partition group comprising generating test patterns from said sub-set.
25. The computer program product of claim 24, said method further comprising, before said removing, ranking said test patterns in said sub-set based on a number of detected faults with each test pattern generated, said number of detected faults comprising one of an absolute number of detected faults and a cumulative number of detected faults.

1. A television receiver comprising:
a receiving section to receive a broadcast signal associated with predetermined broadcasting;
a video display section to display received video based on the broadcast signal received by the receiving section in a predetermined display region;
a judgment region setting section to set a judgment region for judging whether or not the broadcasting has ended, at a center of the display region of the video display section;
an off-timer control section to count a predetermined set time, and to switch the power source of the television receiver from ON to OFF when the set time lapses;
a judging section to judge whether or not the broadcasting has ended, on a basis that a ratio of chronological fluctuation of received video in the judgment region of the received videos corresponding to the broadcast signal is within a predetermined range, while the off timer control section counts the set time; and
a video stop control section to switch off the power source of the television receiver, on a basis that the judging section judges that the broadcasting has ended.
2. A television receiver comprising:
a receiving section to receive a broadcast signal associated with predetermined broadcasting;
a video display section to display received video based on the broadcast signal received by the receiving section in a predetermined display region;
a judgment region setting section to set a judgment region for judging whether or not the broadcasting has ended, the judgment region being in the display region of the video display section;
a judging section to judge whether or not the broadcasting has ended, based on a received video in the judgment region of the received video corresponding to the broadcast signals; and
a video stop control section to switch off the power source of the television receiver, on a basis that the judging section judges that the broadcasting has ended.
3. The television receiver according to claim 2, wherein the judging section judges end of the broadcasting on a basis that the ratio of chronological fluctuation of the received video is within a predetermined range.
4. The television receiver according to claim 2, further comprising: an off-timer control section to count a predetermined set time, and to switch the power source of the television receiver from ON to OFF when the set time lapses,
wherein a judging section judges whether or not the broadcasting has ended, while the off-timer control section counts the set time.
5. The television receiver according to claim 3, further comprising: an off timer control section to count a predetermined set time, and to switch the power source of the television receiver from ON to OFF when the set time lapses,
wherein a judging section judges whether or not the broadcasting has ended, while the off timer control section counts the set time.
6. The television receiver according to claim 2, wherein the judging region is set at a center of the display region.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

What is claimed is:

1. A method for reducing the contamination of at least one optical component that is contained inside a beam guidance space and that is held by a frame defining the beam guidance space, comprising:
coating the surfaces of the frame neighboring the beam guidance space at least partially with a degassing barrier layer.
2. A method according to claim 1, wherein the degassing barrier layer is chosen such that it does not increase reflectivity.
3. A method according to claim 1, wherein the degassing barrier layer is designed such that it does not increase reflectivity for UV light with wavelengths of 157 nm, 193 nm, 248 nm, and 365 nm.
4. A method according to claim 1, wherein the degassing barrier layer is a chemically deposited nickel layer, or silver, gold, or tantalum layer.
5. A method according to claim 4, wherein the degassing barrier layer is a chemically deposited nickel layer in form of a NiP alloy layer applied in a chemical depositing process in an electrolyte that contains sodium hypophosphite as a reducing agent.
6. An optical beam guidance system for UV light comprising:
a frame defining a beam guidance space and containing at least one optical component inside the beam guidance space; and
a degassing barrier layer that at least partially coats the surfaces of the frame neighboring the beam guidance space.
7. An optical beam guidance system according to claim 6, wherein the degassing barrier layer does not increase reflectivity.
8. An optical beam guidance system according to claim 6, wherein the degassing barrier layer does not increase reflectivity for UV light with wavelengths of 157 nm, 193 nm, 248 nm, and 365 nm.
9. An optical beam guidance system according to claim 6, wherein the degassing barrier layer is a chemically deposited nickel layer, or silver, gold, or tantalum layer.
10. An optical beam guidance system according to claim 9, wherein the chemically deposited nickel layer is a NiP alloy layer deposited chemically in an electrolyte that contains sodium hypophosphite as a reducing agent.
11. An optical beam guidance system according to claim 6, wherein the optical beam guidance system is configured as a lithography illumination system.