1. Scanning microscope with a first and at least one other detection channel, whereby the first detection channel comprises at least one first detector and the other detection channel at least one other detector to detect detection light coming from a sample, characterized in that a switching mechanism is provided that selectively directs the detection light into the first andor into the other detection channel.
2. Scanning microscope according to claim 1, characterized in that the scanning microscope comprises a scanning device and in that the switching mechanism directs the detection light into the first or into the other detection channel, depending on the particular scanning position.
3. Scanning microscope according to claim 1, characterized in that a sample can be scanned pixel by pixel with the scanning microscope, and in that the switching mechanism directs the detection light coming from adjacent pixels into different detection channels.
4. Scanning microscope according to claim 1, characterized in that a sample can be scanned line by line with the scanning microscope, and in that the switching mechanism directs the detection light coming from adjacent scanned lines into different detection channels.
5. Scanning microscope according to claim 1, characterized in that an adjustable beam deflector is provided, and in that the switching mechanism directs the detection light into the first or into the other detection channel, depending on the deflecting position of the beam deflector.
6. Scanning microscope according to claim 1, characterized in that the first detector andor the other detector comprise a photomultiplier, andor a photodiode, andor a CCD, andor an EMCCD, andor an avalanche photo diode, andor a spectrometer, andor a multiband detector.
7. Scanning microscope according to claim 1, characterized in that the first detector and the other detector are of different detector types.
8. Scanning microscope according to claim 1, characterized in that a mechanism to generate an overview image is provided.
9. Scanning microscope according to claim 1, characterized in that the switching mechanism comprises an optical shutter.
10. Scanning microscope according to claim 1, characterized in that the switching mechanism operates according to the principle of frustrated total reflection.
11. Scanning microscope according to claim 1, characterized in that the switching mechanism exhibits a first optical body and a second optical body, whose relative distance is adjustable.
12. Scanning microscope according to claim 11, characterized in that the first optical body exhibits an interface off of which the detection light can be totally reflected.
13. Scanning microscope according to claims 11, characterized in that the first optical body exhibits an interface off of which the detection light can be totally reflected, whereby the degree of reflection is adjustable by varying the relative distance between the first and the second optical body.
14. Scanning microscope according to claims 11, characterized in that an adjustment mechanism is provided to adjust the relative distance.
15. Scanning microscope according to claim 14, characterized in that the adjustment mechanism comprises a piezoelectric element.
16. Scanning microscope according to claim 11, characterized in that the first optical body andor the second optical body are formed as prisms.
17. Scanning microscope according to claim 1, characterized in that the switching mechanism comprises a swing mirror andor a rotating mirror.
18. Scanning microscope according to claim 1, characterized in that the switching mechanism comprises an acoustical optical component, in particular an AOM.
19. Scanning microscope according to claim 1, characterized in that scanning microscope is a confocal scanning microscope.
20. Scanning microscope according to claim 1, characterized by the use of sample dyes, particularly of fluorescent dyes, for lifetime measurements.
21. Method for examining a sample with a scanning microscope, characterized by the following steps:
generating an overview image of a sample;
determining at least one region within the overview image;
illuminating the sample with an illumination light;
detecting the detection light coming from the sample, whereby the detection light given off by the region is directed into a first detection channel, and at least one portion of the remaining detection light is directed into another detection channel.
22. Method according to claim 21, characterized in that the first detection channel comprises at least one first detector and the other detection channel comprises at least one other detector to detect detection light given off by a sample.
23. Method according to claim 21, characterized in that a switching mechanism is provided that selectively directs the detection light into the first or into the other detection channel.
24. Method according to claim 21, characterized in that a scanning device is provided, and in that the detection light is directed into the first or into the other detection channel, depending upon the particular scanning position.
25. Method according to claim 21, characterized in that a sample is scanned pixel by pixel, and in that the detection light given off by adjacent pixels is deflected into different detection channels.
26. Method according to claim 21, characterized in that a sample is scanned line by line, and in that the detection light given off by adjacent scanned lines is directed into different detection channels.
27. Method according to claim 21, characterized in that an adjustable beam deflector is provided, and in that the detection light is directed into the first or into the other detection channel, depending upon the deflection position of the deflector.
28. Method according to claim 21, characterized in that the first detector andor the other detector comprise a photomultiplier, andor a photodiode, andor a CCD, andor an EMCCD, andor an avalanche photo diode.
29. Method according to claim 21, characterized in that the first detector and the other detector are of different types.
30. Method according to claim 21, characterized in that the switching mechanism comprises an optical shutter.
31. Method according to claim 21, characterized in that the switching mechanism operates according to the principle of frustrated total reflection.
32. Method according to claim 21, characterized in that the switching mechanism exhibits a first optical body and a second optical body, whose relative distance is adjustable.
33. Method according to claim 32, characterized in that the first optical body exhibits an interface off of which the detection light may be totally reflected.
34. Method according to claim 32, characterized in that the first optical body exhibits an interface off of which the detection light may be totally reflected, whereby the degree of reflection is adjusted by varying the relative distance between the first and the second optical body.
35. Method according to claim 32, characterized in that an adjustment mechanism is provided to adjust the relative distance.
36. Method according to claim 35, characterized in that the adjustment mechanism comprises a piezoelectric element.
37. Method according to claim 32, characterized in that the first optical body andor the second optical body is formed as a prism.
38. Method according to claim 23, characterized in that the switching mechanism comprises a swing mirror andor a rotating mirror.
39. Method according to claim 23, characterized in that the switching mechanism comprises an acoustical optical component, in particular an AOM.
40. Method according to claim 21, characterized by implementation with a confocal scanning microscope.
41. Method according to claim 21, characterized by the use of sample dyes, in particular fluorescent dyes, for lifetime measurements.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for detecting damage to silicone implants in an object region of a human body using a computed tomography device, the method comprising:
taking at least two computed tomography recordings of the object region, each at different X-ray spectra or different mono-energies of the X-ray radiation;
reconstructing the at least two computed tomography recordings to form 3D data sets which contain X-ray attenuation values or equivalent material densities in terms of a basic material decomposition of voxels of the object region;
determining a data point in a diagram for each voxel of interest, the X-ray attenuation values for different X-ray energies being plotted against one another;
comparing the data point, or another value for each voxel of interest determined from the X-ray attenuation values, with known data points or values of body tissue and known data points or values of silicone;
determining if the data point or other value for each voxel of interest deviates from the known data points or values for body tissue by at least a first threshold value;
determining if the data point or other value for each voxel of interest deviates from the known data point or value for silicone by less than a second threshold value; and
outputting a warning if the data point or other value for each voxel of interest deviates from the known data points or values for body tissue by the first threshold value while the data point or other value for each voxel of interest simultaneously deviates from the known data points or values for silicone by less than the second threshold value.
2. The method of claim 1, wherein the comparing plots X-ray attenuation coefficients or CT values for each voxel of interest in a diagram and compares the data points with known values.
3. The method of claim 2, wherein the CT values of the different X-ray energies are mapped to a measured variable by interpolation of precalculated table values.
4. The method of claim 1, wherein the comparing includes,
determining at least one effective atomic number or an equivalent material density from the X-ray attenuation values, and
comparing each voxel of interest to known effective atomic numbers or equivalent material densities of body tissue and silicone.
5. The method of claim 1, wherein any combination of soft tissue and fat are used as comparison values for the body tissue.
6. The method of claim 5, wherein a note or warning is output if at least one of
a perpendicular distance of the data point from a connecting straight line between the known data points of soft tissue and fat exceeds the first threshold value, and
a second threshold value for the known data point for silicone is simultaneously exceeded.
7. The method of claim 1, wherein three or more computed tomography recordings of the object region are taken at different radiation spectra or different mono-energies of the X-ray radiation.
8. A computed tomography device, comprising:
a dual-energy recording unit configured to record at least two computed tomography recordings of the object region at different radiation spectra or different mono-energies of the X-ray radiation; and
a system controller including a computing unit, configured to reconstruct the computed tomography recordings to form 3D data sets which contain X-ray attenuation values or equivalent material densities in terms of a basic material decomposition of voxels of the object region and configured to:
determine a data point in a diagram for each voxel of interest, the X-ray attenuation values for different X-ray energies being plotted against one another,
compare the data point, or another value for each voxel of interest determined from the X-ray attenuation values, with known data points or values of body tissue and known data points or values of silicone,
determine if the data point or other value for each voxel of interest deviates from the known data points or values for body tissue by at least a first threshold value,
determine if the data point or other value for each voxel of interest deviates from the known data point or value for silicone by less than a second threshold value, and
output a warning if the data point or other value for each voxel of interest deviates from the known data points or values for body tissue by the first threshold value while the data point or other value for each voxel of interest simultaneously deviates from the known data points or values for silicone by less than the second threshold value.
9. The computed tomography device of claim 8, wherein the system controller is configured to,
plot X-ray attenuation coefficients or CT values for each voxel of interest in a diagram, and
the data points are compared with known values.
10. The computed tomography device of claim 9, wherein the CT values of the different X-ray energies are mapped to a measured variable by interpolation of precalculated table values.
11. The computed tomography device of claim 8, wherein, the system controller is configured to,
determine at least one effective atomic number or an equivalent material density from the X-ray attenuation values, and
compare each voxel of interest to known effective atomic numbers or equivalent material densities of body tissue and silicone.
12. The computed tomography device of claim 8, wherein any combination of soft tissue and fat are used as comparison values for the body tissue.
13. The computed tomography device of claim 12, wherein a note or warning is output if at least one of
a perpendicular distance of the data point from a connecting straight line between the known data points of soft tissue and fat exceeds the first threshold value, and
a second threshold value for the known data point for silicone is simultaneously exceeded.
14. The computed tomography device of claim 8, wherein three or more computed tomography recordings of the object region are taken at different radiation spectra or different mono-energies of the X-ray radiation.