Author: claimsbot

1. A system for providing automated recognition and categorization of product output variations generated by machine processes as a function of variance partition analysis sensor data, the system comprising:
a processing unit in communication with a computer-readable memory and a tangible computer-readable storage medium;
wherein the processing unit, in response to executing program instructions stored on the tangible computer-readable storage medium via the computer readable memory:
determines from a plurality of variance partition analysis data boxes acquired from scan sensor data for a current reel of paper produced by a paper process machinery system, and stores in a variance partition analysis data repository, normalized values of:
an average value of variability of machine direction long-term scan energy over a first time period from an initial time of making two scans of the paper through an end time required to produce the reel of paper (MDL);
an average value of variability of cross direction profile scan energy observed in a spatial domain over a second time period from an initial time based on a width of two of the data boxes through an end time required to scan a width of the reel of paper (CD); and
an average value of variability of energy of a remainder of data points that are averaged out from a total of the machine direction long-term scan average energy variability and the cross direction profile scan average energy variability during a third time period time from an initial time of making two data boxes through an end time required to make two scans (MDS);

determines a total variability value (TOT) as equal to:
2
\xd7
(

MDS
2

)

2

+
(

MDL
2

)

2

+
(

CD
2

)

2
;
determines an MDL percentage as a percentage that the MDL is of the TOT, a CD percentage as a percentage that the CD is of the TOT, and an MDS percentage as a percentage that the MDS is of the TOT;
compares the MDL percentage to an MDL threshold limit value, the CD percentage to a CD threshold limit value, and the MDS percentage to an MDS threshold limit value; and
performs an automated diagnosis and analysis function that is specific to the machine direction long-term scan average energy variability determined for the reel of paper in response to the MDL percentage exceeding the MDL threshold limit value, that is specific to the cross direction profile scan average energy variability determined for the reel of paper in response to the CD percentage exceeding the CD threshold limit value, or that is specific to the data points remainder average energy variability determined for the reel of paper in response to the MDS percentage exceeding the MDS threshold limit value.
2. The system of claim 1, wherein the processing unit, in response to executing the program instructions stored on the tangible computer-readable storage medium via the computer readable memory, further:
determines a trend value that represents a change in value over time of a plurality of the values for the total variability value, the machine direction long-term scan average energy variability, the cross direction profile scan average energy variability or the data points remainder average energy variability that are each stored in the variance partition analysis data repository with respect to variance partition analysis data for each of a plurality of different paper reels and that are acquired consecutively over a trend period of time;
compares the trend value determined for the plurality of reels of paper to a threshold limit of the at least one threshold limit value; and
performs the automated diagnosis and analysis function specific to a one of machine direction long-term scan average energy variability, cross direction profile scan average energy variability and data points remainder average energy variability components of the trend value that is determined for the plurality of reels of paper and that exceeds the at least one threshold limit value.
3. The system of claim 2, wherein the processing unit, in response to executing the program instructions stored on the tangible computer-readable storage medium via the computer readable memory, performs the automated diagnosis and analysis function that is specific to either of the machine direction long-term scan average energy variability determined for the reel of paper or the trend value machine direction long-term scan average energy variability component determined for the plurality of reels of paper exceeding the at least one threshold limit value, by evaluating quality control system data, distributed control system data, open and closed loop bump tests of scan level, and actuator level controls.
4. The system of claim 2, wherein the processing unit, in response to executing the program instructions stored on the tangible computer-readable storage medium via the computer readable memory, performs the automated diagnosis and analysis function that is specific to either of the cross direction profile scan average energy variability determined for the reel of paper or the trend value cross direction profile scan average energy variability component determined for the plurality of reels of paper exceeding the at least one threshold limit value, by evaluating single scan profiles and contour plots.
5. The system of claim 2, wherein the processing unit, in response to executing the program instructions stored on the tangible computer-readable storage medium via the computer readable memory, performs the automated diagnosis and analysis function that is specific to either of the data points remainder average energy variability determined for the reel of paper or the trend value data points remainder average energy variability component determined for the plurality of reels of paper exceeding the at least one threshold limit value, by evaluating single point data collected at high rates of speed, and single scan residual profile contour plots.
6. The system of claim 2, wherein the processing unit, in response to executing the program instructions stored on the tangible computer-readable storage medium via the computer readable memory, determines that the trend value that is determined for the plurality of reels of paper exceeds the at least one threshold limit value if a slope of a trend line over time for the determined trend value is greater than one.
7. The system of claim 2, wherein the processing unit, in response to executing the program instructions stored on the tangible computer-readable storage medium via the computer readable memory, determines that the trend value that is determined for the plurality of reels of paper exceeds the at least one threshold limit value if a trending standard deviation over time for the determined trend value is greater than a threshold value percentage of the mean.
8. A method for providing automated recognition and categorization of product output variations generated by machine processes as a function of variance partition analysis sensor data, the method comprising:
determining from a plurality of variance partition analysis data boxes acquired from scan sensor data for a current reel of paper produced by a paper process machinery system, and stores in a variance partition analysis data repository, normalized values of:
an average value of variability of machine direction long-term scan energy over a first time period from an initial time of making two scans of the paper through an end time required to produce the reel of paper (MDL);
an average value of variability of cross direction profile scan energy observed in a spatial domain over a second time period from an initial time based on a width of two of the data boxes through an end time required to scan a width of the reel of paper (CD); and
an average value of variability of energy of a remainder of data points that are averaged out from a total of the machine direction long-term scan average energy variability and the cross direction profile scan average energy variability during a third time period time from an initial time of making two data boxes through an end time required to make two scans (MDS);

determining a total variability value (TOT) as equal to:
2
\xd7
(

MDS
2

)

2

+
(

MDL
2

)

2

+
(

CD
2

)

2
;
comparing the total variability value determined for the reel of paper, the machine direction long-term scan average energy variability determined for the reel of paper, the cross direction profile scan average energy variability determined for the reel of paper, and the data points remainder average energy variability determined for the reel of paper to at least one threshold limit value;
determining an MDL percentage as a percentage that the MDL is of the TOT, a CD percentage as a percentage that the CD is of the TOT and an MDS percentage as a percentage that the MDS is of the TOT; and
executing an automated diagnosis and analysis function on a processing unit, wherein the automated diagnosis and analysis function is specific to the machine direction long-term scan average energy variability determined for the reel of paper in response to the MDL percentage exceeding the MDL threshold limit value, is specific to the cross direction profile scan average energy variability determined for the reel of paper in response to the CD percentage exceeding the CD threshold limit value, or is specific to the data points remainder average energy variability determined for the reel of paper in response to the MDS percentage exceeding the MDS threshold limit value.
9. The method of claim 8, further comprising:
determining a trend value that represents a change in value over time of a plurality of the values for the total variability value, the machine direction long-term scan average energy variability, the cross direction profile scan average energy variability or the data points remainder average energy variability that are each stored in the variance partition analysis data repository with respect to variance partition analysis data for each of a plurality of different paper reels and that are acquired consecutively over a trend period of time;
comparing the trend value determined for the plurality of reels of paper to a threshold limit of the at least one threshold limit value; and
wherein the automated diagnosis and analysis function is specific to one of machine direction long-term scan average energy variability, cross direction profile scan average energy variability and data points remainder average energy variability components of the trend value that is determined for the plurality of reels of paper and that exceeds the at least one threshold limit value.
10. The method of claim 9, wherein the automated diagnosis and analysis function is specific to either of the machine direction long-term scan average energy variability determined for the reel of paper or the trend value machine direction long-term scan average energy variability component determined for the plurality of reels of paper exceeding the at least one threshold limit value; and
the step of executing the automated diagnosis and analysis function on the processing unit further comprises evaluating quality control system data, distributed control system data, open and closed loop bump tests of scan level, and actuator level controls.
11. The method of claim 9, wherein the automated diagnosis and analysis function is specific to either of the cross direction profile scan average energy variability determined for the reel of paper or the trend value cross direction profile scan average energy variability component determined for the plurality of reels of paper exceeding the at least one threshold limit value; and
the step of executing the automated diagnosis and analysis function on the processing unit further comprises evaluating single scan profiles and contour plots.
12. The method of claim 9, wherein the automated diagnosis and analysis function is specific to either of the data points remainder average energy variability determined for the reel of paper or the trend value data points remainder average energy variability component determined for the plurality of reels of paper exceeding the at least one threshold limit value; and
the step of executing the automated diagnosis and analysis function on the processing unit further comprises evaluating single point data collected at high rates of speed, and single scan residual profile contour plots.
13. The method of claim 9, further comprising:
determining that the trend value that is determined for the plurality of reels of paper exceeds the at least one threshold limit value if a slope of a trend line over time for the determined trend value is greater than one.
14. The method of claim 9, further comprising:
determining that the trend value that is determined for the plurality of reels of paper exceeds the at least one threshold limit value if a trending standard deviation over time for the determined trend value is greater than a threshold value percentage of the mean.
15. The method of claim 9, further comprising:
integrating computer-readable program code into a computer system comprising a processing unit, a computer readable memory and a computer readable tangible storage medium, wherein the computer readable program code is embodied on the computer readable tangible storage medium and comprises instructions that cause the processing unit, in response to executing the instructions via the computer readable memory, to perform the steps of determining the normalized values of the average value of variability of machine direction long-term scan energy, the average value of variability of cross direction profile scan energy observed in the spatial domain, the average value of variability of energy of the remainder of data points and the total variability value;
determining the MDL percentage and the CD percentage and the MDS percentage, comparing the MDL percentage to the MDL threshold limit value and the CD percentage to the CD threshold limit value and the MDS percentage to the MDS threshold limit value; and executing the automated diagnosis and analysis function.
16. A computer program product for providing automated recognition and categorization of product output variations generated by machine processes as a function of variance partition analysis sensor data, the computer program product comprising:
a computer readable tangible storage medium having computer readable program code embodied therewith, the computer readable program code comprising instructions that cause a computer processing unit, in response to executing the instructions via a computer readable memory, to:
determine from a plurality of variance partition analysis data boxes acquired from scan sensor data for a current reel of paper produced by a paper process machinery system, and stores in a variance partition analysis data repository, normalized values of:
an average value of variability of machine direction long-term scan energy over a first time period from an initial time of making two scans of the paper through an end time required to produce the reel of paper (MDL);
an average value of variability of cross direction profile scan energy observed in a spatial domain over a second time period from an initial time based on a width of two of the data boxes through an end time required to scan a width of the reel of paper (CD); and
an average value of variability of energy of a remainder of data points that are averaged out from a total of the machine direction long-term scan average energy variability and the cross direction profile scan average energy variability during a third time period time from an initial time of making two data boxes through an end time required to make two scans (MDS);

determine a total variability value (TOT) as equal to:
2
\xd7
(

MDS
2

)

2

+
(

MDL
2

)

2

+
(

CD
2

)

2
;
determine an MDL percentage as a percentage that the MDL is of the TOT, a CD percentage as a percentage that the CD is of the TOT, and an MDS percentage as a percentage that the MDS is of the TOT;
compare the MDL percentage to an MDL threshold limit value, the CD percentage to a CD threshold limit value, and the MDS percentage to an MDS threshold limit value; and
perform an automated diagnosis and analysis function that is specific to the machine direction long-term scan average energy variability determined for the reel of paper in response to the MDL percentage exceeding the MDL threshold limit value, that is specific to the cross direction profile scan average energy variability determined for the reel of paper in response to the CD percentage exceeding the CD threshold limit value, or that is specific to the data points remainder average energy variability determined for the reel of paper in response to the MDS percentage exceeding the MDS threshold limit value.
17. The computer program product of claim 16, wherein the computer readable program code instructions further cause the computer processing unit, in response to executing the instructions via the computer readable memory, to:
determine a trend value that represents a change in value over time of a plurality of the values for the total variability value, the machine direction long-term scan average energy variability, the cross direction profile scan average energy variability or the data points remainder average energy variability that are each stored in the variance partition analysis data repository with respect to variance partition analysis data for each of a plurality of different paper reels and that are acquired consecutively over a trend period of time;
compare the trend value determined for the plurality of reels of paper to a threshold limit of the at least one threshold limit value; and
perform the automated diagnosis and analysis function specific to a one of machine direction long-term scan average energy variability, cross direction profile scan average energy variability and data points remainder average energy variability components of the trend value that is determined for the plurality of reels of paper and that exceeds the at least one threshold limit value.
18. The computer program product of claim 16, wherein the computer readable program code instructions further cause the computer processing unit, in response to executing the instructions via the computer readable memory, to perform the automated diagnosis and analysis function by evaluating quality control system data, distributed control system data, open and closed loop bump tests of scan level, and actuator level controls.
19. The computer program product of claim 16, wherein the computer readable program code instructions further cause the computer processing unit, in response to executing the instructions via the computer readable memory, to perform the automated diagnosis and analysis function by evaluating single scan profiles and contour plots.
20. The computer program product of claim 16, wherein the computer readable program code instructions further cause the computer processing unit, in response to executing the instructions via the computer readable memory, to perform the automated diagnosis and analysis function by evaluating single point data collected at high rates of speed, and single scan residual profile contour plots.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A method for a controller of a memory device to execute a write operation, comprising:
initiating the write operation on a memory array;
transmitting a write command and a write data, via a first bus of the memory device, wherein the first bus comprises a command bus having lines that carry the write command and a byte mask command to the memory array;
transmitting, when the write operation indicates masking, a byte mask command having byte mask information that comprises one bit for every eight bits of write data associated with the write operation, via the first bus, to the memory array, before transmitting the write data, and wherein the byte mask information is transmitted via column address lines of the address lines of the first bus when the column address lines are not utilized in the write operation, wherein the byte mask command is an embedded command that includes byte mask information for the write operation comprising a byte mask wherein the write command is a disparate command from the byte mask command; and
transmitting the write data via a second bus of the memory device, to the memory array.
2. The method of claim 1, wherein transmitting the byte mask command further comprises synchronizing the byte mask command and the write data to a rising edge of a clock cycle.
3. The method of claim 1,
wherein transmitting the byte mask command further comprises synchronizing the byte mask command and the write data to a falling edge of a clock cycle.
4. The method of claim 1, further comprising transmitting an address to the memory array, wherein the address comprises one or more bits and corresponds to an address of the memory array to which the write data is to be written to.
5. The method of claim 4, wherein the transmitting the address further comprises utilizing a third bus of the memory device, the third bus being separate from the first bus and second bus such that separate lines carry the address to the memory array.
6. The method of claim 1, wherein the byte mask includes a bit corresponding to each byte of the write data.
7. The method of claim 6, wherein respective bits of the byte mask indicate whether respective bytes of the write data are to be written or not to be written during the write operation.
8. The method of claim 1, wherein the write data is transmitted to complete the transmission of the write operation.
9. The method of claim 1, wherein the transmitting of the byte mask command is transmitted via the command lines of the first bus.

1. A semiconductor integrated circuit, comprising:
a memory;
a target circuit forming a scan chain including at least one register and performing a normal operation and a saving operation, the target circuit saving a data stored in the register to the memory during the saving operation through the scan chain; and
a clock switching circuit supplying a saverecover clock signal to the scan chain when the target circuit performs the saving operation, the saverecover clock signal being slower than a system clock signal being used for the normal operation,
wherein the memory is configured to operate based on the saverecover clock signal.
2. The semiconductor integrated circuit according to claim 1, wherein the target circuit further performs a recovering operation, the target circuit rewriting the data saved in the memory into the register during the recovering operation, and
wherein the clock switching circuit supplies the saverecover clock signal to the scan chain when the target circuit performs the recovering operation.
3. The semiconductor integrated circuit according to claim 2, wherein the clock switching circuit comprises a frequency dividing circuit generating the saverecover clock signal by performing frequency dividing of the system clock signal.
4. The semiconductor integrated circuit according to claim 3, wherein the frequency dividing circuit comprises a first circuit including:
a flip-flop receiving and outputting an input signal based on the system clock signal; and
a first inverter receiving a signal which the flip-flop has output, inverting a value of the received signal and inputting the inverted signal into the flip-flop.
5. The semiconductor integrated circuit according to claim 4, wherein the frequency dividing circuit further comprises a second circuit being different from said first circuit and a second inverter, the second circuit including a plurality of flip-flops connected in series, the second inverter receiving a signal which a final stage flip-flop in the second circuit has output, inverting the received signal and inputting the inverted signal into a first stage flip-flop in the second circuit.
6. The semiconductor integrated circuit according to claim 5, wherein the frequency dividing circuit further comprises a first selector outputting selected one of the output signal of the flip-flop included in the first circuit and the output signal of the final stage flip-flop included in the second circuit.
7. The semiconductor integrated circuit according to claim 1, wherein the target circuit further performs a scan path test using the scan chain, and
wherein the clock switching circuit supplies a test clock signal to the scan chain when said target circuit performs the scan path test, the test clock signal being different from the saverecover clock signal and being slower than the system clock signal.
8. The semiconductor integrated circuit according to claim 7, wherein the clock switching circuit comprises a second selector outputting selected one of the system clock signal and the test clock signal.
9. The semiconductor integrated circuit according to claim 8, wherein the clock switching circuit further comprises a third selector outputting selected one of the output signal of the second selector and the saverecover clock signal generated by frequency dividing of the system clock signal.
10. The semiconductor integrated circuit according to claim 7, wherein the clock switching circuit comprises a frequency dividing circuit receiving selected one of the system clock signal and the test clock signal, performing frequency dividing of the received system clock signal, and outputting the received test clock signal without performing frequency dividing of the test clock signal.
11. The semiconductor integrated circuit according to claim 10, wherein the frequency dividing circuit comprises:
an enable signal generating circuit outputting an enable signal, the enable signal being a clock signal generated by performing frequency dividing of the system clock signal when the target circuit performs the normal operation, the enable signal being a signal having a constant clock frequency when the target circuit performs the scan path test; and
a clock gating cell outputting a signal being based on the enable signal and the system clock signal or the test clock signal.
12. A semiconductor integrated circuit, comprising:
a target circuit configured to perform a normal operation based on a first clock signal and to perform a saving operation based on a second clock signal, a clock frequency of the second clock signal being lower than that of the first clock signal;
a plurality of scan flip-flops provided within the target circuit and configured to form an internal register of the target circuit in the normal operation and to form a plurality of sub-scan chains in the saving operation, each of the sub-scan chains comprising a same number of the scan flip-flops and being configured to operate in parallel;
a backup memory coupled to the target circuit and configured to operate based on the second clock signal; and
a control circuit coupled to both the target circuit and the backup memory to backup data stored in the internal register to the backup memory through the plurality of sub-scan chains in the saving operation.
13. The semiconductor integrated circuit according to claim 12, wherein the target circuit is further configured to perform a recovering operation based on the second clock signal, and
wherein the control circuit restores the data stored in the backup memory to the internal register through the plurality of sub-scan chains in the recovering operation.
14. The semiconductor integrated circuit according to claim 13, wherein the control circuit includes a clock switching circuit configured to supply the first clock signal in the normal operation and to supply the second clock signal in both the saving and recovering operation, and
wherein the second clock signal comprises a divided clock signal of the first clock signal.
15. The semiconductor integrated circuit according to claim 14, further comprising a plurality of selectors provided within the target circuit,
wherein the target circuit is further configured to perform a test operation based on an external clock signal, and
wherein the plurality of sub-scan chains is connected in series using the plurality of selectors in the test operation to perform the test operation as a test scan chain.
16. The semiconductor integrated circuit according to claim 15, further comprising a switching circuit connected to the target circuit to control a power supply to the target circuit in response to a control signal output from the control circuit.
17. The semiconductor integrated circuit according to claim 12, wherein said sub-scan chains operate in parallel based on said saverecover clock signal, in said saving operation, and said internal state data is stored in said memory through said of sub-scan chains.
18. The semiconductor integrated circuit according to claim 17, wherein said internal state data which has been stored in said memory are set to an internal circuit through said plurality of sub-scan chains based on said saverecover clock signal again.
19. The semiconductor integrated circuit according to claim 17, wherein each of said plurality of sub-scan chains comprise an equal numbers of flip-flops.
20. The semiconductor integrated circuit according to claim 17, wherein, when a number of flip-flops contained in said plurality of sub-scan chains are not equal to each other, the clock gating does not supply a clock signal to one of the dummy flip-flops in said normal operation, is inserted into at least one of said plurality of sub-scan chains such that the numbers of flip-flops contained in said plurality of sub-scan chains are equal to each other.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A method for authenticating a client to multiple server resources each with a standalone authentication system, the method comprising:
initiating a login session with a first standalone authentication system of a primary one of the multiple server resources;
transmitting a first set of login credentials from the client to the first standalone authentication system of the primary one of the multiple server resources;
validating the client by the first standalone authentication system of the primary one of the multiple server resources based upon the first set of login credentials;
storing on the client a token received from the first standalone authentication system of the primary one of the multiple resources, the token being generated by the first standalone authentication system;
transmitting the token and a second set of login credentials different from the first set of login credentials to a secondary one of the multiple server resources, the second set of login credentials being retrieved from the client, wherein the second set of login credentials is transmitted outside of the token and exists on the client prior to the client transmitting the first set of login credentials to the first standalone authentication system; and
validating the client by a second standalone authentication system of the secondary one of the multiple server resources based upon the transmitted token and the second set of login credentials.
2. The method of claim 1, wherein the token and the second set of login credentials are transmitted in separate transmissions.
3. The method of claim 1, wherein the token includes an account identifier associated with a user account on the primary one and the secondary one of the multiple server resources.
4. The method of claim 1, wherein the second set of login credentials is a digital certificate.
5. The method of claim 4, wherein the digital certificate is stored on the client.
6. The method of claim 4, wherein the digital certificate is stored on an external hardware device readable by the client.
7. The method of claim 4, wherein the digital certificate is associated with a complementary client application of the second standalone authentication system of the secondary one of the multiple server resources.
8. The method of claim 4, wherein the digital certificate is associated with a client application independent of the second standalone authentication system of the secondary one of the multiple server resources.
9. The method of claim 1, further comprising:
transmitting the second set of login credentials from the client to the first standalone authentication system of the primary one of the multiple server resources;
wherein validating the client to the primary one of the multiple server resources is further based upon the second set of login credentials.
10. A method for authenticating a client to multiple server resources each with a standalone authentication system, comprising;
receiving a first set of login credentials from the client to a first standalone authentication system of a primary one of the multiple server resources;
validating the client to the primary one of the multiple server resources based upon the first set of login credentials;
transmitting to the client a token generated by the first standalone authentication system of the primary one of the multiple resources in response to a successful validation of the first set of login credentials, the token being generated by the first standalone authentication system;
receiving on a secondary one of the multiple server resources the token and a second set of login credentials different from the first set of login credentials, the second set of login credentials being retrieved from the client, wherein the second set of login credentials is transmitted outside of the token and exists on the client prior to the client transmitting the first set of login credentials to the first standalone authentication system; and
validating the client by a second standalone authentication system of the secondary one of the multiple server resources based upon the received token and the second set of login credentials.
11. The method of claim 10, wherein the token and the second set of login credentials are received by the secondary one of the multiple server resources through separate transmissions.
12. The method of claim 10, wherein the token includes an account identifier associated with a user account on the primary one and the secondary one of the multiple server resources.
13. The method of claim 10, wherein the second set of login credentials is a digital certificate.
14. The method of claim 13, wherein the digital certificate is stored on the client.
15. The method of claim 13, wherein the digital certificate is stored on an external hardware device readable by the client.
16. The method of claim 13, wherein the digital certificate is associated with a complementary client application of the second standalone authentication system of the secondary one of the multiple server resources.
17. The method of claim 13, wherein the digital certificate is associated with a client application independent of the second standalone authentication system of the secondary one of the multiple server resources.
18. The method of claim 10, further comprising:
receiving the second set of login credentials on the primary one of the multiple server resources;
wherein:
validating the client to the primary one of the multiple server resources is further based upon the second set of login credentials; and
transmitting the token is in response to a successful validation of the second set of login credentials.
19. An article of manufacture comprising a non-transitory program storage medium readable by a computer, the non-transitory program storage medium tangibly embodying one or more programs of instructions executable by the computer to perform a method for authenticating a client to multiple server resources each with a standalone authentication system, the method comprising;
receiving a first set of login credentials from the client to a first standalone authentication system of a primary one of the multiple server resources;
validating the client to the primary one of the multiple server resources based upon the first set of login credentials;
transmitting to the client a token generated by the first standalone authentication system of the primary one of the multiple resources;
receiving on a secondary one of the multiple server resources the token and a second set of login credentials different from the first set of login credentials, the second set of login credentials being retrieved from the client, wherein the second set of login credentials is transmitted outside of the token and exists on the client prior to the client transmitting the first set of login credentials to the first standalone authentication system; and
validating the client by a second standalone authentication system of the secondary one of the multiple server resources based upon the received token and the second set of login credentials.
20. The article of manufacture of claim 19, wherein the token and the second set of login credentials are received by the secondary one of the multiple server resources through separate transmissions.