1. A method of debugging an executable computer application comprising instructions of a first computer architecture instruction set and instructions of a second computer architecture instruction set, the method comprising:
determining whether an instruction being debugged is from the second architecture instruction set;
obtaining debug information from an emulator of a second architecture in a first architecture environment when the instruction being debugged is from the second architecture instruction set, wherein the debug information results from emulation of the instruction being debugged.
2. The method of claim 1, further comprising running a debugger in the first architecture environment.
3. The method of claim 2, wherein the debugger determines whether the instruction being debugged is from the second architecture instruction set according to the value of an instruction pointer.
4. The method of claim 2, wherein the emulator is controlled by the debugger in such a way that the emulator is stoppable when an event occurs and the debugger is notified of the stop.
5. The method of claim 2, wherein the instruction being debugged is obtained from a core dump.
6. The method of claim 5, wherein the core dump comprises instructions that are from the second instruction set, the instructions from the second instruction set are loaded into the emulator.
7. The method of claim 6, wherein the debugger reads emulated debug information from a data area of the emulator.
8. The method of claim 2, wherein the debugger is arranged to control the emulator to single step through the emulated instructions of the non-native library.
9. The method of claim 2, wherein the debugger signals to the emulator to stop emulation after emulating a single instruction.
10. The method of claim 9, wherein the debugger signals to the emulator to stop emulation after each instruction by setting a flag of the emulator.
11. The method of claim 2, wherein a breakpoint is set to stop execution of the computer application at the instruction being debugged.
12. The method of claim 11, wherein when the instruction being debugged is from the instruction set of the second architecture the emulator finishes emulating the instruction before stopping.
13. The method of claim 12, wherein the emulator signals to the debugger that it is safe to stop the emulator when it has finished emulating the instruction
14. The method of claim 12, wherein the debugger signals to the emulator that it should notify the debugger when it has finished emulating the instruction.
15. The method of claim 2, wherein the debugger is arranged to differentiate events that arise from execution of the emulator from events that arise from the computer program, so as to signal that an event has occurred in the execution of the computer program.
16. The method of claim 2, wherein the emulator stores a representation of an emulated register set in a data area, wherein the debugger is arranged to read from and write to the register set in the data area.
17. A debugger for debugging an executable computer application comprising instructions of a first computer architecture instruction set and instructions of a second computer architecture instruction set, the debugger comprising:
a detector for determining whether an instruction being debugged is from the second architecture instruction set;
a reader for obtaining debug information from an emulator of the second architecture in a first architecture environment when the instruction being debugged is from the second architecture instruction set, wherein the debug information results from emulation of the instruction being debugged.
18. An emulator configured for debugging an executable computer application comprising instructions of a first computer architecture instruction set and instructions of a second computer architecture instruction set, the emulator comprising:
an interface to a debugger that can determine whether an instruction being debugged is from the second architecture instruction set, wherein the interface receives from the debugger instructions of the computer program that are from the second architecture instruction set;
an emulation module for emulating the instructions that are from the second architecture instruction set in a first architecture environment and producing debug information from the emulation.
19. An debugging tool set for debugging an executable computer application comprising instructions of a first computer architecture instruction set and instructions of a second computer architecture instruction set, the tool set comprising:
a debugger for determining whether an instruction being debugged is from the second architecture instruction set;
an emulator for emulating the instruction from the second architecture instruction set in a first architecture environment and producing debug information from the emulation.
20. A debugging computer program embodied on a computer readable medium for debugging a target executable computer application comprising instructions of a first computer architecture instruction set and instructions of a second computer architecture instruction set, said debugging computer program comprising instructions for causing a computer processor to:
determine whether an instruction being debugged is from the second architecture instruction set;
obtain debug information from an emulator of the second architecture in a first architecture environment when the instruction being debugged is from the second architecture instruction set, wherein the debug information results from emulation of the instruction being debugged.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A near-field exposure mask comprising:
a substrate;
a concave-convex structure comprising convexities and concavities formed on one surface of the substrate;
a near-field light generating film arranged at least on a tip portion of each of the convexities, the near-field light generating film being a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C, or a film stack formed with layers made of some of those materials; and
a resin filled in each of the concavities.
2. The mask according to claim 1, wherein the convexities are formed of the near-field light generating film.
3. The mask according to claim 2, wherein a height of at least one of the convexities formed of the near-field light generating film is 50 nm or less.
4. The mask according to claim 3, wherein the near-field light generating film is a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C.
5. The mask according to claim 2, wherein the near-field light generating film is a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C.
6. The mask according to claim 1, wherein the convexities are formed of the substrate, and the near-field light generating film covers a top surface of each of the convexities, and at least part of sides connecting to the top surface of each of the convexities.
7. The mask according to claim 6, wherein the near-field light generating film is a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C.
8. The mask according to claim 1, wherein the substrate is a transparent substrate.
9. The mask according to claim 8, wherein the near-field light generating film is a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C.
10. The mask according to claim 1, wherein the resin filled in each of the concavities is a silicon resin or epoxy resin.
11. The mask according to claim 10, wherein the near-field light generating film is a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C.
12. The mask according to claim 1, wherein the near-field light generating film is a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C.
13. A pattern forming method for forming a pattern using a near-field exposure mask including:
a first substrate;
a concave-convex structure comprising convexities and concavities formed on one surface of the first substrate; and
a near-field light generating film arranged at least on a tip portion of each of the convexities, the near-field light generating film being a layer comprising at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C, or a film stack formed with layers made of some of those materials,
the method comprising:
applying a light-curable resin onto a second substrate;
positioning the near-field exposure mask so that the near-field light generating film arranged to the tip portion of each of the convexities is in contact with a surface of the light-curable resin applied onto the second substrate;
emitting light from either a side of the first substrate or a side of the second substrate; and
detaching the near-field exposure mask from the second substrate.
14. The method according to claim 13, wherein in the near-field exposure mask, a resin is filled in each of the concavities of the concave-convex structure.
15. The method according to claim 13, wherein the convexities of the near-field exposure mask are formed of the near-field light generating film.
16. The method according to claim 13, wherein the convexities of the near-field exposure mask are formed of the first substrate, and the near-field light generating film covers a top surface of each of the convexities and at least part of sides connecting to the top surface of each of the convexities.
17. The method according to claim 13, wherein the first substrate is a transparent substrate, and light is emitted from a side of the first substrate.