All The Claims

1. An inspection apparatus for a TFT substrate formed with a plurality of pixels, comprising:
a reference substrate spaced apart from the TFT substrate and formed with a plurality of reference patterns corresponding to the pixels;
a power supply to supply power to both a predetermined number of the plurality of pixels and at least one of the reference patterns corresponding to the predetermined number of the plurality of pixels to form an electric field in a space between the TFT substrate and the reference substrate;
an electron beam emitter to emit an electron beam to travel from a first side to a second side of the space;
an electron beam detector to detect the electron beam emitted from the electron beam emitter after passing through the space; and
a controller to determine whether the TFT substrate includes a defective pixel based on a location of the electron beam detected by the electron beam detector.
2. The inspection apparatus according to claim 1, wherein:
the electron beam emitter comprises a plurality of micro electron guns arranged on the first side of the space along a surface of the TFT substrate to respectively emit electron beams, and a plurality of focusing units to focus the electron beams emitted from the corresponding micro electron guns; and the controller controls the focusing units to focus the electron beams emitted from the respective micro electron guns to pass between at least one pixel line formed by a predetermined number of the plurality of pixels of the TFT substrate and at least one reference line of the reference patterns corresponding to the pixel line.
3. The inspection apparatus according to claim 2, wherein the controller controls the power supply to selectively supply power to the at least one reference line of the plurality of reference patterns of the reference substrate.
4. The inspection apparatus according to claim 3, wherein the controller has information about a reference detection location when the TFT substrate includes no defective pixel, and determines whether the TFT substrate includes the defective pixel based on a deviation between the reference detection location and the location of the electron beam detected by the electron beam detector.
5. The inspection apparatus according to claim 1, further comprising:
a substrate stage on which the TFT substrate is placed to be opposite to and spaced from the reference substrate;
a vacuum chamber to accommodate the reference substrate, the electron beam detector and the substrate stage; and
a chamber vacuumizer to vacummize the vacuum chamber according to control of the controller.
6. An inspection apparatus to identify a defect on a TFT substrate, comprising:
an electron beam emitter to emit at least one electron beam toward a space between the TFT substrate and a reference substrate; and
an electron beam detector to detect a location of the at least one electron beam passing through the space and to detect a defective pixel of the TFT substrate according to the detected location of the at least one electron beam.
7. The apparatus according to claim 6, further comprising:
a power supply to supply a power to the TFT substrate and the reference substrate to form an electric field to control the at least one electron beam to pass through a passage in the space.
8. The inspection apparatus according to claim 7, further comprising:
a controller to select first pixels of the TFT substrate as a pixel line and second pixels of the reference substrate as a reference line,
wherein the power supply supplies the power to the first pixels and the second pixels.
9. The inspection apparatus according to claim 7, wherein the electric field causes the at least one electron beam to be deflected in the space, and an amount of deflection varies according to the defective pixel.
10. The inspection apparatus according to claim 6, wherein the TFT substrate comprises pixel lines having pixels, the reference substrate comprises reference lines corresponding to the respective pixel lines, and the electron beam emitter emits the at least one electron beam along the space between one of the pixel lines and one of the reference lines corresponding to the one of the pixel lines.
11. The inspection apparatus according to claim 10, further comprising:
a power supply to supply a power to the one of the pixel lines to form an electric field to control a passage of the at least one electron beam.
12. The inspection apparatus according to claim 11, wherein the location of the at least one electron beam comprises a first location detected when the one of the pixel lines of the TFT substrate does not include the defective pixel, and a second location detected when the one of the pixel lines of the TFT substrate includes the defective pixel.
13. The inspection apparatus according to claim 12, wherein the first location and the second location are different from each other in a direction perpendicular to a surface of the TFT substrate.
14. The inspection apparatus according to claim 12, further comprising:
a controller to select the defective pixel according to a difference between the first location and the second location.
15. The inspection apparatus according to claim 11, wherein the defective pixel comprises a first number of pixels and a second number of pixels, the location of at least one electron beam comprises a first location detected when one of the pixel lines of the TFT substrate does not include the first and second number of pixels, and a second location detected when the one of the pixel lines of the TFT substrate include one of the first number of pixel and the second number of pixels.
16. The inspection apparatus according to claim 15, further comprising:
a controller to detect one of the first number of pixels and the second number of pixels according to a difference between the first location and the second location.
17. The inspection apparatus according to claim 6, further comprising:
at least one focusing unit corresponding to the at least one electron beam to direct the corresponding electron beam in the space.
18. The inspection apparatus according to claim 6, further comprising:
a vacuum chamber enclosing the electron beam detector, the TFT substrate and the reference substrate.
19. The inspection apparatus according to claim 6, wherein two or more defective pixels of the TFT substrate are identified according to the detected location of the at least one electron beam.
20. A method of identifying a defect on a TFT substrate using an electron beam in an inspection apparatus, the method comprising:
supplying an electric field between a pixel line of the TFT substrate and a reference line of a reference substrate;
directing the electron beam along the electric field;
detecting a location of the electron beam after passing along the electric field through a space between the TFT substrate and the reference substrate; and
identifying a defect on the TFT substrate based on a deviation of the detected location from a reference detection location.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. An isolated nucleic acid encoding a polypeptide comprising a sequence of DEDDDR (SEQ ID NO:5) and having no more than about 25 amino acids at the N-terminal or C-terminal of the sequence of DEDDDR (SEQ ID NO:5), wherein the polypeptide inhibits GADD45 activity by at least 10%.
2. The nucleic acid of claim 1, wherein the polypeptide comprises a sequence of DEDDDRD (SEQ ID NO:15).
3. The nucleic acid of claim 1, wherein the polypeptide is a fragment of SEQ ID NO:2.
4. The nucleic acid of claim 1, wherein the polypeptide has no more than about 20 amino acids at the N-terminal or C-terminal of the sequence of DEDDDR (SEQ ID NO:5).
5. The nucleic acid of claim 4, wherein the polypeptide has no more than about 10 amino acids at the N-terminal or C-terminal of the sequence of DEDDDR (SEQ ID NO:5).
6. The nucleic acid of claim 1, wherein the polypeptide consists of a sequence selected from the group consisting of:
EAAKLLNVDPDNVVLCLLAADEDDDRDVALQIHFTL
(SEQ ID NO:16)
IQAFCCENDI;

LLNVDPDNVVLCLLAADEDDDRDVALQIHFTLIQAF
(SEQ ID NO:17)
CC;

DNVVLCLLAADEDDDRDVALQIHFTL;
(SEQ ID NO:18)

CLLAADEDDDRDVALQIHFTL;
(SEQ ID NO:19)

DNVVLCLLAADEDDDRDVALQ;
(SEQ ID NO:20)

EAAKLLNVDPDNVVLCLLAADEDDDR;
(SEQ ID NO:21)

DEDDDRDVALQIHFTLIQAFCCENDI;
(SEQ ID NO:22)

ADEDDDRDVALQIHFTLIQAFCCENDI;
(SEQ ID NO:23)

ADEDDDRDVALQIHFTL;
(SEQ ID NO:24)

ADEDDDRDVALQ;
(SEQ ID NO:25)

DEDDDR;
(SEQ ID NO:5)

ADEDDDR;
(SEQ ID NO:26)

DNVVLCLLAADEDDDR;
(SEQ ID NO:27)

CLLAADEDDDR;
(SEQ ID NO:28)

CLLAADEDDDRD;
(SEQ ID NO:29)

CLLAADEDDDRDVAL;
(SEQ ID NO:30)

DNVVLCLLAADEDDDRDVALQIHFTLIQAFCCEND
(SEQ ID NO:31)
I; and

LNVDPDNVVLCLLAADEDDDRDVALQIHFTLIQAFC
(SEQ ID NO:32)
CENDI.

1) A system for conveying andor selecting fruit andor vegetable products, comprising:
a plurality of buckets presenting respective resting surfaces for one or more fruit andor vegetable products;
a conveying line of said buckets along a horizontal axis (X);
at least one discharge station arranged by the side of said conveying line; and
an assembly for controlling the rotation of the buckets between a conveying position and a discharge position of the product towards said station;
respective resting surfaces of the buckets being upwardly concave, and at least one part of the resting surfaces of the bucket defined by a plurality of rollers turning about their longitudinal axis, which is parallel to the horizontal axis (X).
2) The system of claim 1, at least one of the rollers being driven.
3) The system of claim 1, comprising:
means for determining at least one feature of the fruit andor vegetable products accommodated in the buckets;
a plurality of stations and corresponding assemblies, for the respective stations; and
an electronic control unit (7) configured to control the respective operations of the assemblies based upon the at least one feature determined by the determining means.
4) The system of claim 3, the stations comprising respective conveyor belts on whose surfaces are provided seats in which the products of the buckets are transferred.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A backlight unit comprising:
a lamp for emitting light;
a light guide plate for guiding light emitted from the lamp;
an optical sheet for reflecting totally reflect light incident from the light guide plate, the optical sheet including a first base film, a plurality of prism patterns extending from one side of the first base film to another side thereof, and refraction layers each formed between the neighboring prism patterns; and
a light blocking unit formed along at least one side of an upper surface of the optical sheet to block the light transmitted through the corresponding region,
wherein a refractive index of the refraction layer is higher than that of the prism pattern such that the light transmitted through the refraction layer is totally reflected at an interface with the prism pattern.
2. The backlight unit of claim 1, wherein a difference between the refraction index of the refraction layer and that of the prism pattern is more than 0.1.
3. The backlight unit of claim 2, wherein the refraction index of the refraction layer is more than 1.51, and the refraction index of the prism pattern is less than 1.50.
4. The backlight unit of claim 1, wherein the light blocking unit is formed of one of a black ink, gray ink, and a white ink.
5. The backlight unit of claim 1, wherein the light blocking unit is made of a light blocking tape.
6. The backlight unit of claim 1, further comprising a diffusion material for diffusing input light which is dispersed into the first base film.
7. The backlight unit of claim 1, further comprising a second base film formed on the prism patterns and the light blocking unit.
8. The backlight unit of claim 7, wherein the second base film contains a diffusion material.
9. The backlight unit of claim 1, further comprising formless spot patterns formed on at least one of upper and lower surfaces of the light guide plate.
10. The backlight unit of claim 1, further comprising prisms formed on at least one of upper and lower surfaces of the light guide plate.
11. The backlight unit of claim 1, further comprising:
prisms formed on at least one of an upper surface or a lower surface of the light guide plate; and
formless spot patterns formed on another surface of the light guide plate.
12. A liquid crystal display device comprising:
a liquid crystal display panel displaying an image thereon;
a lamp for emitting light;
a light guide plate for guiding the light emitted from the lamp;
an optical sheet for reflecting totally reflect light incident from the light guide plate to the liquid crystal display panel, the optical sheet including a first base film, a plurality of prism patterns extending from one side of the first base film to another side thereof, and refraction layers each formed between the neighboring prism patterns; and
a light blocking unit formed on an upper surface of the optical sheet along an edge region of the liquid crystal display panel to block light transmitted through the corresponding region,
wherein a refractive index of the refraction layer is higher than that of the prism pattern such that the light transmitted through the refraction layer is totally reflected at an interface with the prism pattern.
13. An optical sheet suitable to a backlight of a display device, comprising:
a first base;
a plurality of prism patterns on the first base film, the prism patterns being extended from one side end to the other side end of the base film;
refraction layers between the prism patterns to reflect totally the incident light, a refractive index of the refraction layer being higher than that of the prism pattern to reflect totally the light transmitting through the refraction layer at the boundaries of the prism patterns and the refraction layers; and
a light blocking unit along at least one side of an upper surface of the optical sheet to block the light transmitted through the corresponding region
14. The optical sheet of claim 13, wherein a difference between the refraction index of the refraction layer and that of the prism pattern is more than 0.1.
15. The optical sheet of claim 13, wherein the refraction index of the refraction layer is more than 1.51, and the refraction index of the prism pattern is less than 1.50.
16. The optical sheet of claim 13, further comprising a diffusion material for diffusing input light which is dispersed into the first base film.
17. The optical sheet of claim 13, further comprising a second base film formed on the prism patterns and the light blocking unit.
18. The optical sheet of claim 17, wherein the second base film contains a diffusion material.
19. A method of fabricating an optical sheet, comprising:
providing a first base;
forming a plurality of prism patterns on the first base film, the prism patterns being extended from one side end to the other side end of the base film;
forming refraction layers between the prism patterns to reflect totally the incident light, a refractive index of the refraction layer being higher than that of the prism pattern to reflect totally the light transmitting through the refraction layer at the boundaries of the prism patterns and the refraction layers; and
introducing a light blocking unit along at least one side of an upper surface of the optical sheet to block the light transmitted through the corresponding region
20. The method of claim 19, further comprising dispersing a diffusion material to the first base film to diffuse the incident light.
21. The method of claim 19, further comprising forming a second base film on the prism patterns and the light blocking unit.
22. The backlight unit of claim 21, wherein the second base film contains a diffusion material.