All The Claims

1. A method for managing pestware on a protected computer comprising:
tracking activities of a user at the protected computer;
monitoring events at the protected computer;
identifying events that are potentially indicative of pestware;
comparing at least one of the events with at least one of the activities of the user; and
initiating, in response to the comparing indicating the activities of the user are unconnected with the events, a user prompt, wherein the user prompt informs the user about at least one of the events so as to enable the user to make a decision relative to managing the at least one of the events.
2. The method of claim 1, wherein the activities include activities selected from the group consisting of selecting a new homepage, adding a new bookmark and selecting a new search page.
3. The method of claim 1, wherein the tracking activities of a user at the protected computer includes tracking websites visited by the user.
4. The method of claim 1, wherein the tracking activities of a user at the protected computer includes tracking at least one of the user interfaces utilized by the user.
5. The method of claim 4, wherein the at least one of the user interfaces is an options window of a web browser.
6. The method of claim 4, wherein comparing at least one of the events with the activities of the user includes determining whether the at least one of the user interfaces is being utilized when the at least one of the events is detected.
7. The method of claim 3, wherein the at least one of the events is a change to a setting of a browser, wherein the change to the setting includes a pointer to a particular website, and wherein comparing the at least one of the events with the activities of the user includes determining whether the particular website is one of the tracked websites visited by the user.
8. The method of claim 1, wherein the events include events selected from the group consisting of a change in a homepage; an addition of a new bookmark; and change in the search page.
9. A method for reducing false-positive indications of pestware comprising:
monitoring an application of a protected computer;
identifying a change in an application setting, wherein the application setting is utilized by the application;
determining whether the change to the setting was initiated via a process unassociated with the user application; and
informing, in response to the change to the setting being initiated by the process unassociated with the user application, a user of the protected computer about the changed setting.
10. The method of claim 9, wherein the application is a web browser and wherein the application setting is selected from the group consisting of a homepage setting, a bookmark setting and a search page setting.
11. A computer readable medium encoded with processor-executable instructions for managing pestware on a protected computer, the instructions including instructions for:
tracking activities of a user at the protected computer;
monitoring events at the protected computer;
identifying events that are potentially indicative of pestware;
comparing at least one of the events with at least one of the activities of the user; and
initiating, in response to the comparing indicating the activities of the user are unconnected with the events, a user prompt, wherein the user prompt informs the user about at least one of the events so as to enable the user to make a decision relative to managing the at least one of the events.
12. The computer readable medium of claim 11, wherein the activities include activities selected from the group consisting of selecting a new homepage, adding a new bookmark and selecting a new search page.
13. The computer readable medium of claim 11, wherein the instructions for tracking activities of a user at the protected computer include instructions for tracking websites visited by the user.
14. The computer readable medium of claim 11, wherein the instructions for tracking activities of a user at the protected computer includes instructions for tracking at least one of the user interfaces utilized by the user.
15. The computer readable medium of claim 14, wherein the at least one of the user interfaces is an options window of a web browser.
16. The computer readable medium of claim 14, wherein the instructions for comparing at least one of the events with the activities of the user includes instructions for determining whether the at least one of the user interfaces is being utilized when the at least one of the events is detected.
17. The computer readable medium of claim 13, wherein the at least one of the events is a change to a setting of a browser, wherein the change to the setting includes a pointer to a particular website, and wherein the instructions for comparing the at least one of the events with the activities of the user includes instructions for determining whether the particular website is one of the tracked websites visited by the user.
18. The computer readable medium of claim 11, wherein the events include events selected from the group consisting of a change in a homepage; an addition of a new bookmark; and change in the search page.

The claims below are in addition to those above.
All refrences to claims which appear below refer to the numbering after this setence.

What is claimed is:

1. An automatic wiring method for a semiconductor integrated circuit used to form a semiconductor integrated circuit for performing a desired operation by laying out and interconnecting a plurality of macrocells, each implementing a given function, on a semiconductor chip, the method comprising:
(a) a step of arranging a macrocell, in which a plurality of power terminals and a plurality of ground terminals are formed, on the semiconductor chip;
(b) a step of forming a loop line group containing a first power line and a first ground line for supplying power to the macrocell along an outer frame of the macrocell; and
(c) a step of connecting a corresponding one of the power terminals with the first power line that constitutes the loop line group via a second power line, and connecting a corresponding one of the ground terminals with the first ground line that constitutes the loop line group via a second ground line; wherein
the power terminals and the ground terminals are arranged in optimum positions inside the macrocell arranged on the semiconductor chip in the step (a), using the same line layer as the corresponding second power line and second ground line.
2. An automatic wiring method for a semiconductor integrated circuit according to claim 1, wherein the power terminals and the ground terminals are arranged in a plurality of rows along an extending direction of the second power line and the second ground line wired in the step (c), so as to at least partially overlap with the second power line and the second ground line, in the macrocell arranged on the semiconductor chip in the step (a), and only the same type of terminals in the power terminals or the ground terminals of each row are arranged in a straight line along the extending direction.
3. An automatic wiring method for a semiconductor integrated circuit according to claim 2, wherein the second power line and the second ground line are arranged in the step (c) based on information in which at least one of either the power terminals or the ground terminals in corresponding rows is defined.
4. An automatic wiring method for a semiconductor integrated circuit used to form a semiconductor integrated circuit for performing a desired operation by laying out and interconnecting a plurality of macrocells, each implementing a given function, on a semiconductor chip, the method comprising:
(a) a step of arranging a macrocell, in which a plurality of power terminals and a plurality of ground terminals are formed, on the semiconductor chip;
(b) a step of forming a loop line group containing a first power line and a first ground line for supplying power to the macrocell along an outer frame of the macrocell; and
(c) a step of connecting a corresponding one of the power terminals with the first power line that constitutes the loop line group via a second power line, and connecting a corresponding one of the ground terminals with the first ground line that constitutes the loop line group via a second ground line; wherein
a given area, which is set away from the outer frame of the macrocell arranged on the semiconductor chip in the step (a) towards a center of the macrocell, is defined as a wiring limit area in which at least a part of the loop line group can be arranged.
5. An automatic wiring method for a semiconductor integrated circuit according to claim 4, wherein placement of an internal line layer of the macrocell in the same layer as the first power line and the first ground line that constitute the loop line group is prohibited in the wiring limit area.
6. An automatic wiring method for a semiconductor integrated circuit according to claim 1, wherein a part of an internal line layer of the macrocell is formed in the same layer as the power terminals and the ground terminals.
7. An automatic wiring method for a semiconductor integrated circuit according to claim 4, wherein a part of an internal line layer of the macrocell is formed in the same layer as the power terminals and the ground terminals.
8. An automatic wiring method for a semiconductor integrated circuit according to claim 1, wherein the same information that contains positional information about the power terminals and the ground terminals is applied in part of the steps (a), (b), and (c) for macrocell pairs in which arrangement patterns of the power terminals and the ground terminals are in a symmetrical relation with each other.
9. An automatic wiring method for a semiconductor integrated circuit according to claim 4, wherein the same information that contains positional information about the power terminals and the ground terminals is applied in part of the steps (a), (b), and (c) for macrocell pairs in which arrangement patterns of the power terminals and the ground terminals are in a symmetrical relation with each other.
10. An automatic wiring method for a semiconductor integrated circuit according to claim 1, wherein the loop line group contains a chip internal power line located nearest to the outer frame of the macrocell, of chip internal power lines wired at a given interval.
11. An automatic wiring method for a semiconductor integrated circuit according to claim 4, wherein the loop line group contains a chip internal power line located nearest to the outer frame of the macrocell, of chip internal power lines wired at a given interval.
12. An automatic wiring method for a semiconductor integrated circuit according to claim 10, wherein the loop line group is used as a bypass line to connect the chip internal power line with the power terminals and the ground terminals.
13. An automatic wiring method for a semiconductor integrated circuit according to claim 11, wherein the loop line group is used as a bypass line to connect the chip internal power line with the power terminals and the ground terminals.
14. A computer program product, in a computer readable medium, for automatic wiring of a semiconductor integrated circuit used to form a semiconductor integrated circuit for performing a desired operation by laying out and interconnecting a plurality of macrocells, each implementing a given function, on a semiconductor chip, the computer program product comprising:
(a) instruction for arranging a macrocell, in which a plurality of power terminals and a plurality of ground terminals are formed, on the semiconductor chip;
(b) instruction for forming a loop line group containing a first power line and a first ground line for supplying power to the macrocell along an outer frame of the macrocell; and
(c) instruction for connecting a corresponding one of the power terminals with the first power line that constitutes the loop line group via a second power line, and connecting a corresponding one of the ground terminals with the first ground line that constitutes the loop line group via a second ground line; wherein
the power terminals and the ground terminals are arranged in optimum positions inside the macrocell arranged on the semiconductor chip by the instruction (a), using the same line layer as the corresponding second power line and second ground line.
15. A computer program product, in a computer readable medium, for automatic wiring of a semiconductor integrated circuit used to form a semiconductor integrated circuit for performing a desired operation by laying out and interconnecting a plurality of macrocells, each implementing a given function, on a semiconductor chip, the computer program product comprising:
(a) instruction for arranging a macrocell, in which a plurality of power terminals and a plurality of ground terminals are formed, on the semiconductor chip;
(b) instruction for forming a loop line group containing a first power line and a first ground line for supplying power to the macrocell along an outer frame of the macrocell; and
(c) instruction for connecting a corresponding one of the power terminals with the first power line that constitutes the loop line group via a second power line, and connecting a corresponding one of the ground terminals with the first ground line that constitutes the loop line group via a second ground line; wherein
a given area, which is set away from the outer frame of the macrocell arranged on the semiconductor chip by the instruction (a) towards a center of the macrocell, is defined as a wiring limit area in which at least a part of the loop line group can be arranged.
16. A semiconductor integrated circuit for performing a desired operation in which a plurality of interconnected macrocells, each implementing a given function, is laid out on a semiconductor chip, wherein
a plurality of power terminals and a plurality of ground terminals are formed in a macrocell,
a loop line group containing a first power line for supplying power to the macrocell and a first ground line is formed along an outer frame of the macrocell,
a corresponding one of the power terminals is connected with the first power line that constitutes the loop line group via a second power line, and a corresponding one of the ground terminals is connected with the first ground line that constitutes the loop line group via a second ground line, and
the power terminals and the ground terminals are wired using the same line layer as the corresponding second power line and second ground line.
17. A semiconductor integrated circuit according to claim 16, wherein the power terminals and the ground terminals are arranged in a plurality of rows along an extending direction of the second power line and the second ground line, so as to at least partially overlap with the second power line and the second ground line, and only the same type of terminals in the power terminals or the ground terminals are arranged in a straight line along the extending direction.
18. A semiconductor integrated circuit for performing a desired operation in which a plurality of interconnected macrocells, each implementing a given function, is laid out on a semiconductor chip, wherein
a plurality of power terminals and a plurality of ground terminals are formed in a macrocell,
a loop line group containing a first power line for supplying power to the macrocell and a first ground line is formed along an outer frame of the macrocell,
a corresponding one of the power terminals is connected with the first power line that constitutes the loop line group via a second power line, and a corresponding one of the ground terminals is connected with the first ground line that constitutes the loop line group via a second ground line, and
a given area, which is set away from the outer frame of the macrocell towards a center of the macrocell, is defined as a wiring limit area in which at least a part of the loop line group can be arranged.
19. A semiconductor integrated circuit according to claim 18, wherein placement of an internal line layer of the macrocell in the same layer as the first power line and the first ground line that constitute the loop line group is prohibited in the wiring limit area.
20. A semiconductor integrated circuit according to claim 16, wherein a part of an internal line layer of the macrocell is formed in the same layer as the power terminals and the ground terminals.
21. A semiconductor integrated circuit according to claim 18, wherein a part of an internal line layer of the macrocell is formed in the same layer as the power terminals and the ground terminals.
22. A semiconductor integrated circuit according to claim 16, wherein the loop line group contains a chip internal power line located nearest to the outer frame of the macrocell, of chip internal power lines wired at a given interval.
23. A semiconductor integrated circuit according to claim 18, wherein the loop line group contains a chip internal power line located nearest to the outer frame of the macrocell, of chip internal power lines wired at a given interval.
24. A semiconductor integrated circuit according to claim 22, wherein the loop line group is used as a bypass line to connect the chip internal power line with the power terminals and the ground terminals.
25. A semiconductor integrated circuit according to claim 23, wherein the loop line group is used as a bypass line to connect the chip internal power line with the power terminals and the ground terminals.
26. An automatic wiring method for performing a wiring layout using a multilayer line in an electronic computer, comprising:
(a) a step of wiring a first constant potential line for transmitting a constant potential as a power source in an area outside of a macrocell;
(b) a step of acquiring position information for a terminal disposed in the macrocell from a terminal library; and
(c) a step of wiring a second constant potential line for connecting the first constant potential line and the terminal in the same line layer as the terminal based on the acquired position information.
27. An automatic wiring method according to claim 26, wherein the first constant potential line is a ground line.
28. An automatic wiring method according to claim 26, wherein position information for a row of terminals composed of a plurality of terminals lined up in one direction is acquired from the terminal library in the step (b), and the row of terminals and the first constant potential line are connected and the first constant potential line is wired so as to overlap with the row of terminals in the step (c).
29. An automatic wiring method according to claim 28, wherein the position information for the row of terminals is expressed as position information for one terminal contained in the row of terminals.
30. An automatic wiring method according to claim 26, wherein a plurality of terminals arranged in a matrix to which the constant potential is supplied is formed in the macrocell, and the terminal library comprises position information for each of the terminals contained in one terminal line of the matrix, and position information for each of the terminals contained in one terminal row.
31. A semiconductor integrated circuit comprising:
a macrocell;
a first constant potential line formed in an area outside the macrocell for transmitting a constant potential as a power source;
a terminal disposed inside the macrocell and to which the constant potential is supplied; and
a second constant potential line formed in the same line layer as the terminal, for connecting the first constant potential line with the terminal.
32. A computer program product, in a computer readable medium, for automatic wiring to perform a wiring layout using a multilayer line in an electronic computer, comprising:
instruction for wiring a first constant potential line for transmitting a constant potential as a power source in an area outside of a macrocell;
instruction for acquiring position information for a terminal disposed in the macrocell from a terminal library; and
instruction for wiring a second constant potential line for connecting the first constant potential line and the terminal in the same line layer as the terminal based on the acquired position information.
33. An automatic wiring method for performing a wiring layout in an electronic computer, comprising:
a step of acquiring a macrocell from a library and arranging the macrocell;
a step of wiring a loop line group for transmitting a power supply voltage in a vicinity and in a predefined area of the macrocell;
a step of acquiring position information for a terminal disposed in the macrocell from a library; and
a step of wiring a connection line for connecting the loop line group and the terminal based on the acquired position information.
34. A computer program product, in a computer readable medium, for automatic wiring to perform a wiring layout in an electronic computer, comprising:
instruction for acquiring a macrocell from a library and arranging the macrocell;
instruction for wiring a loop line group for transmitting a power supply voltage in a vicinity and in a predefined area of the macrocell;
instruction for acquiring position information for a terminal disposed in the macrocell from a library; and
instruction for wiring a connection line for connecting the loop line group and the terminal based on the acquired position information.
35. A semiconductor integrated circuit comprising:
a macrocell in which a plurality of terminals is formed;
a loop line group for transmitting power supply voltage in a vicinity and in a predefined area of the macrocell; and
a connection line for connecting the loop line group and the plurality of terminals.
36. A semiconductor integrated circuit according to claim 35, wherein the connection line and the plurality of terminals are formed in the same line layer.

1. Apparatus for optimizing a path length of light in a particle dispersion to improve the measurement of light scattered from particles, comprising:
a) an optical system for illuminating a particle dispersion,
b) a detection system comprising at least one detector for quantifying characteristics of light related to light scattered by at least one of said particles,
c) a particle sample volume between two optical windows, which confine said particle dispersion and pass light, from a light source, through said particle dispersion to illuminate at least one of said particles,
d) means for adjusting a separation between said optical windows to change a path length of light in said particle sample volume, and
e) means for performing said adjusting based upon characteristics of light scattered from at least one of said particles.
2. The apparatus of claim 1, further comprising a flexible conduit attached to at least one of said windows, or to a supporting structure of at least one of said windows, to confine said particle dispersion while allowing motion of at least one of said windows.
3. The apparatus of claim 1, further comprising a flexible diaphragm attached to at least one of said windows, or to a supporting structure of at least one of said windows, to confine said particle dispersion while allowing motion of at least one of said windows.
4. The apparatus of claim 1, further comprising an apparatus for adjusting the concentration of particles, comprising:
e) means for introducing a plurality of particles into a first flow loop, the particles being contained in a fluid, and means for circulating the fluid through the first flow loop, and
f) valve means for selectively allowing some of the fluid in the first flow loop to enter a second flow loop, distinct from the first flow loop, the second flow loop including means for counting particles andor analyzing particles andor detecting scattered light from at least one particle flowing in the second flow loop,
wherein the valve means comprises means for transferring fluid from said first flow loop to fluid in said second flow loop, and wherein the valve means transfers an amount of fluid which produces generally a specified value which is related to a number of particles of interest andor a particle concentration, measured from particles in said second flow loop.
5. The apparatus of claim 1, further comprising:
f) illumination means for illuminating at least one particle in a particle dispersion,
g) a detection means comprising at least one detector for quantifying characteristics of light related to light scattered by at least one particle, and
h) a particle sample region wherein said illumination means illuminates at least one particle,
i) a retro-reflector means to reflect light to said detection means,
j) a support means for attaching said illumination means and detection means to a common support structure, wherein the optical axis of said illumination means and the optical axis of said detection means are aligned to utilize the optical characteristics of said retro-reflector means to maintain proper alignment of light, from said illumination means, andor proper alignment of scattered light onto at least one detector in said detection means.
6. The apparatus of claim 1 further comprising:
f) a structure to support at least one of said windows,
g) attachment means for attaching at least one of said optical windows to said structure, wherein said attachment means provides for detachment and reattachment of said window from said structure,
h) means for placing a particle dispersion sample upon at least one of said windows, while at least one of said windows is detached from said structure, and
i) means for reattaching at least one detached window to said structure.
7. The apparatus of claim 1, further comprising a sample cell and the optical windows including optical paths for allowing light to enter the sample cell and to leave the sample cell after interacting with particles, the sample cell also defining a volume within which particles pass through the sample cell, wherein the sample cell includes at least one optically transmitting shaped object, the shaped object being positioned outside of a desired portion of said volume so as to prevent particles from passing through a volume occupied by said object and wherein said occupied volume comprises the portion of illuminated volume in the particle dispersion outside of the desired portion of said volume, and wherein said object is shaped such that particles, which are too large to pass through the desired portion of said volume, pass around said object in the particle dispersion flow, and wherein said object has acceptable optical transmission at the optical wavelength of said scattered light.
8. A method for improving measurement of light scattered from at least one particle, comprising: at least one set of steps from the group consisting of path length adjustment steps and concentration adjustment steps, wherein said path length adjustment steps comprise:
a) illuminating a particle dispersion,
b) detecting characteristics of light related to light scattered by at least one particle,
c) confining said particle dispersion between two optical windows,
d) passing light, from a light source, through said particle dispersion to illuminate at least one particle,
e) adjusting a separation between said optical windows to change a path length of light in said dispersion,
wherein said adjusting is based upon characteristics of light scattered from at least one particle, and wherein said concentration adjustment steps comprise:
1) introducing a plurality of particles into a first flow loop, the particles being contained in a fluid, and circulating the fluid through the first flow loop,
2) utilizing a valve to selectively allow some of the fluid in the first flow loop to enter a second flow loop, distinct from the first flow loop, the second flow loop including counting particles andor analyzing particles andor detecting scattered light from at least one particle flowing in the second flow loop,
wherein the valve transfers fluid from said first flow loop to fluid in said second flow loop, and wherein the valve transfers an amount of fluid which produces generally a specified value which is related to a number of particles of interest andor a particle concentration, measured from particles in said second flow loop.
9. The method of claim 8 wherein said adjusting is determined to reduce coincidence counts of particles of interest andor to obtain a desired particle count rate of particles of interest in a particle counting scatter measurement, further comprising:
a) determining a desired value of average number of particles of interest per interaction volume for said particle dispersion to provide acceptable coincidence counts,
b) adjusting said separation between said optical windows to a first separation value,
c) measuring a first particle dispersion average number of particles of interest per interaction volume value at said first separation value,
d) calculating a desired separation between said optical windows to obtain said desired value of average number of particles of interest per interaction volume utilizing information comprising said desired value of average number of particles of interest per interaction volume, said first separation value, and said first particle dispersion average number of particles of interest per interaction volume value,
e) adjusting said separation between said optical windows to the desired separation value, and
f) measuring scattered light from at least one particle of the particle dispersion within said desired separation between said optical windows and using said measured scattered light to determine information about at least one particle.
10. The method of claim 8 wherein said adjusting is determined by determining a difference in shape between functions, wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, and particle size distribution.
11. The method of claim 8 further comprising the steps of:
a) adjusting said separation between said optical windows to provide desired coincidence counts of particles of interest, and
b) scanning a portion of the particle dispersion between said optical windows wherein said scanning comprises illuminating and detecting characteristics of light related to scattered light at a plurality of regions in the particle dispersion between said optical windows.
12. The method of claim 11 adapted to measure light scattering from particles with significant settling velocity, further comprising the steps of:
a) adjusting said separation between said optical windows while the window surfaces are generally parallel to gravitational force, and
b) scanning a portion of the particle dispersion between said optical windows while the window surfaces are generally perpendicular to gravitational force.
13. The method of claim 8 adapted to provide control of coincidence counts, further comprising the steps of:
a) adjusting said separation between said optical windows to a first separation which allows flowing of particle dispersion between said optical windows,
b) determining a desired particle concentration, at said first separation, to provide desired coincidence counts for a desired second separation between said optical windows,
c) determining a desired scattering characteristic which is expected from said desired particle concentration at said first separation,
d) adjusting the particle concentration of particle dispersion between said optical windows at said first separation,
e) monitoring at least one characteristic of scattered light of the particle dispersion between said optical windows while adjusting said particle concentration to obtain said desired scattering characteristic,
f) adjusting said separation between said optical windows to said desired second separation, and
g) measuring scattered light from at least one particle in said particle dispersion between said optical windows at said desired second separation.
14. The method of claim 8 further comprising:
a) determining a desired value of transmission for said particle dispersion to provide acceptable multiple scattering,
b) adjusting said separation between said optical windows to a first separation value,
c) measuring a first particle dispersion transmission value at said first separation value,
d) calculating the desired separation between said optical windows to obtain said desired value of transmission utilizing information comprising said desired value of transmission, first particle dispersion transmission value, and said first separation value,
e) adjusting said separation between said optical windows to the desired separation value, and
f) measuring scattered light from at least one particle within said desired separation between said optical windows.
15. The method of claim 8, further comprising:
a) adjusting a parameter to a first value,
b) determining a first function with parameter set at said first value,
c) adjusting said parameter to a second value, which is less than said first value,
d) determining a second function with parameter set at said second value,
e) determining a difference in shape between said first function and said second function,
f) comparing said shape difference to a specified limit,
g) if said shape difference is greater than said specified limit, repeating steps (c) through (h), after setting said first function to said second function and after setting said first value of parameter to said second value of parameter, and
h) if said shape difference is less than or equal to said specified limit, using the function corresponding to the lowest value of the two parameter values, which produced said shape difference, to determine particle characteristics, wherein said parameter comprises a member of the group consisting of separation between said optical windows, particle concentration, and a product of particle concentration and separation between said optical windows, and wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size and particle size distribution.
16. The method of claim 8 further comprising the steps of:
a) adjusting said separation between said optical windows to allow flow of particle dispersion between said optical windows,
b) flowing particle dispersion between said optical windows,
c) adjusting particle concentration to an acceptable value, if required to obtain acceptable coincidence counts in step (e),
d) stopping flow of particle dispersion,
e) adjusting said separation between said optical windows to provide acceptable coincidence counts of particles of interest,
f) scanning the particle dispersion between said optical windows wherein said scanning comprises illuminating and detecting characteristics of light related to scattered light at a plurality of regions in the particle dispersion between said optical windows, and
g) performing steps (a), (b), (c), (d), (e) and (f) at least one time, combining the measurements from said performances to produce information from a sufficient number of particles.
17. The method of claim 8 further comprising:
a) determining an optimum particle dispersion transmission,
b) first transferring a first volume of particle dispersion into said second flow loop from said first flow loop,
c) determining a first transmission of said particle dispersion in said second flow loop after said first transferring,
d) determining a second volume of particle dispersion for a second transferring into said second flow loop to produce said optimum particle dispersion transmission, wherein said determining utilizes information comprising values of said optimum particle dispersion transmission, said first volume of particle dispersion, and said first transmission of said particle dispersion,
e) second transferring said second volume of particle dispersion into said second flow loop from said first flow loop, and
f) measuring scattered light from at least one particle in said second flow loop.
18. The method of claim 8 further comprising:
a) determining an optimum particle parameter,
b) first transferring a first volume of particle dispersion into said second flow loop from said first loop,
c) determining a first particle parameter in said second flow loop after said first transferring,
d) determining a second volume of particle dispersion for a second transferring into said second flow loop to produce said optimum particle parameter, wherein said determining utilizes information comprising values of said optimum particle parameter, said first volume of particle dispersion, and said first particle parameter, wherein said particle parameter comprises a member of the group consisting of average number of particles per interaction volume, particle concentration, particle coincidence counts, and multiple scattering,
e) second transferring said second volume of particle dispersion into said second flow loop from said first loop, and
f) measuring scattered light from at least one particle in said second flow loop.
19. The method of claim 8 further comprising adjusting a product of particle concentration and separation between said optical windows to obtain at least one member of the group consisting of desired particle concentration, desired particle coincidence counts, desired particle count rate, desired scatter signal, and desired multiple scattering.
20. The method of claim 8, further comprising a method for determining an optimum path length of light in a particle dispersion, so as to reduce inaccuracies in particle analysis caused by multiple scattering of light from particles, the method comprising the steps of:
a) determining a specified value of a path length which produces unacceptable multiple scattering,
b) adjusting said path length to said specified value,
c) measuring first function values at said specified value of path length,
d) changing said path length to a second value, which is less than said specified value,
e) measuring second function values at said second value of said path length,
f) determining a difference between said second function values and said first function values,
g) if said difference is greater than a specified limit, repeating steps (d) through (h), while after setting said specified value of path length to said second value of said path length, and after setting said first function values to said second function values,
h) if said difference is less than or equal to a specified limit, using said second function values to determine particle characteristics, further comprising selecting said difference between said second function values and first function values to be a difference in functional shape, and wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, and particle size distribution.
21. The method of claim 8, further comprising:
a) adjusting a parameter to a first value, wherein said first value provides a generally low acceptable scatter signal and low acceptable multiple scattering,
b) measuring a first function of scattered light with parameter at said first value,
c) adjusting said parameter to a value which is greater than the current value,
d) measuring a new function of scattered light with parameter at said greater value,
e) determining a difference in shape between said first function and said new function,
f) comparing said shape difference to a specified limit,
g) if said shape difference is less than said specified limit, repeating steps (c) through (h),
h) if said shape difference is greater than or equal to said specified limit, using the scatter function corresponding to the lowest value of the two parameter values, which produced said shape difference, to determine particle characteristics, wherein said parameter comprises a member of the group consisting of separation between said optical windows, particle concentration, and a product of particle concentration and separation between said optical windows, and wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, and particle size distribution.
22. The method of claim 8, further comprising:
a) adjusting a parameter to a first value,
b) measuring a first function with parameter at said first value,
c) adjusting said parameter to a second value, which is greater than said first value,
d) measuring a second function with parameter at said second value,
e) determining a difference in shape between said first function and said second function,
f) comparing said shape difference to a specified limit,
g) if said shape difference is less than said specified limit, repeating steps (c) through (h), after setting said first function to said second function and after setting said first value of parameter to said second value of parameter, and
h) if said shape difference is greater than or equal to said specified limit, using the function corresponding to the lowest value of the two parameter values, which produced said shape difference, to determine particle characteristics, wherein said parameter comprises a member of the group consisting of separation between said optical windows, particle concentration, and a product of particle concentration and separation between said optical windows, and wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, and particle size distribution.
23. The method of claim 8, further comprising,
a) adjusting a parameter to a first value,
b) measuring a first function with parameter at said first value,
c) adjusting said parameter to a second value, which is greater than said first value,
d) measuring a second function with parameter at said second value,
e) determining a difference in shape between said first function and said second function,
f) comparing said shape difference to a specified limit,
g) if said shape difference is less than said specified limit, repeating steps (c) through (h), after setting said first function to said second function and after setting said first value of parameter to said second value of parameter, and
h) if said shape difference is greater than or equal to said specified limit, using the function corresponding to the lowest value of the two parameter values, which produced said shape difference, to determine particle characteristics, wherein said parameter comprises particle concentration, and wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, particle size distribution, autocorrelation function of a scatter signal, and power spectrum of a scatter signal.
24. The method of claim 8, further comprising:
a) adjusting a parameter to a first value,
b) measuring a first function with parameter at said first value,
c) adjusting said parameter to a second value, which is less than said first value,
d) measuring a second function with parameter at said second value,
e) determining a difference in shape between said first function and said second function,
f) comparing said shape difference to a specified limit,
g) if said shape difference is greater than said specified limit, repeating steps (c) through (h), after setting said first function to said second function and after setting said first value of parameter to said second value of parameter, and
h) if said shape difference is less than or equal to said specified limit, using the function corresponding to the lowest value of the two parameter values, which produced said shape difference, to determine particle characteristics, wherein said parameter comprises particle concentration, and wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, particle size distribution, autocorrelation function of a scatter signal, and power spectrum of a scatter signal.
25. The method of claim 8 wherein said transferred amount of fluid is determined by determining a difference in shape between functions, wherein said function comprises a member of the group consisting of scattered light intensity as a function of scattering angle, scattered light flux as a function of different ranges of scattering angle, particle number, or particle volume, as a function of different ranges of particle size, particle size distribution, autocorrelation function of a scatter signal, and power spectrum of a scatter signal.

The claims below are in addition to those above.
All refrences to claims which appear below refer to the numbering after this setence.

1. An imaging apparatus, comprising:
an imaging device which has an imaging plane and which is configured to generate an image signal from light that is incident on the imaging plane;
a lens optical system including a focus lens for condensing light toward the imaging device;
a driving section configured to drive one of the imaging device and the focus lens so as to change a position to which a focus is adjusted on an object side;
a shutter provided at at least one of the imaging device or a position between the lens optical system and the imaging device; and
a control unit configured to control the shutter and the driving section,
wherein the control unit drives the imaging device or the focus lens such that a focus is adjusted to each of first, second and third focusing positions of different object distances and controls the shutter and the driving section such that image signals of first, second and third object images at the first, second and third focusing positions are obtained by the imaging device,
the first focusing position is present between the second focusing position and the third focusing position, and
the control unit controls the shutter and the driving section such that the first object image is photographed in every other frame, and the second object image and the third object image are alternately photographed in every other frame.
2. The imaging apparatus of claim 1, wherein the control unit controls the shutter and the driving section such that the imaging device produces any of the first object image, the second object image, or the third object image in every image frame of the imaging device.
3. The imaging apparatus of claim 1, wherein
the control unit controls opening and closing of the shutter such that the first object image, the second object image, or the third object image is obtained in a portion of each image frame, and
the control unit controls the driving section such that a focusing position changes between the first focusing position and the second focusing position or between the second focusing position and the third focusing position in another portion of the each image frame.
4. The imaging apparatus of claim 1, wherein
when the focus lens is focused on the first, second and third focusing positions, the driven imaging device or focus lens is at the first, second and third driving positions, respectively, and
the control unit determines the second and third driving positions such that the distance between the first driving position and the second driving position and the distance between the first driving position and the third driving position are equal to each other.
5. The imaging apparatus of claim 1, wherein
when the focus lens is focused on the first and third focusing positions, the driven imaging device or focus lens is at the first and third driving positions, respectively,
when the focus lens is focused at a minimum focus distance, the driven imaging device or focus lens is at a fourth driving position, and
when the distance between the first driving position and the fourth driving position is shorter than the distance between the first driving position and the third driving position, the control unit controls the driving section such that the driven imaging device or focus lens is moved to the fourth driving position, and an image signal of the second object image is obtained by the imaging device.
6. The imaging apparatus of claim 1, wherein
when the focus lens is focused on the first and second focusing positions, the driven imaging device or focus lens is at the first and second driving positions, respectively, and
when the focus lens is focused on an infinity, the driven imaging device or focus lens is at the fifth driving position, and
when the distance between the first driving position and the fifth driving position is shorter than the distance between the first driving position and the second driving position, the control unit controls the driving section such that the driven imaging device or focus lens is moved to the fifth driving position, and an image signal of the third object image is obtained by the imaging device.
7. The imaging apparatus of claim 1, wherein
when the focus lens is focused on the first, second and third focusing positions, the driven imaging device or focus lens is at the first, second and third driving positions, respectively, and
the control unit determines the second and third driving positions based on an instruction from a user such that the distance between the first driving position and the second driving position and the distance between the first driving position and the third driving position are in a ratio between 1:1 to 8:2 or between 1:1 to 2:8.
8. The imaging apparatus of claim 1, further comprising a signal processing section which is configured to generate a signal of a movie image which is formed by the first object image photographed in every other frame and generate a signal of distance information in the first object image photographed in every other frame based on the first, second and third object images.
9. The imaging apparatus of claim 1, wherein the control unit sets the second and third focusing positions according to a variation in the first focusing position which is based on an instruction from a user or an autofocus function.
10. A semiconductor integrated circuit of an imaging apparatus including an imaging device which has an imaging plane and which is configured to generate an image signal from light that is incident on the imaging plane, a lens optical system including a focus lens for condensing light toward the imaging device, a driving section configured to driving one of the imaging device and the focus lens so as to change a position to which a focus is adjusted on an object side, and a shutter provided at at least one of the imaging device or a position between the lens optical system and the imaging device,
wherein the semiconductor integrated circuit drives the imaging device or the focus lens such that a focus is adjusted to each of first, second and third focusing positions of different object distances, and
the semiconductor integrated circuit controls the shutter and the driving section such that image signals of first, second and third object images at the first, second and third focusing positions are obtained by the imaging device,
the first focusing position is present between the second focusing position and the third focusing position, and
the semiconductor integrated circuit controls the shutter and the driving section such that the first object image is photographed in every other frame, and the second object image and the third object image are alternately photographed in every other frame.
11. The semiconductor integrated circuit of claim 10, wherein the semiconductor integrated circuit controls the shutter and the driving section such that the imaging device produces any of the first object image, the second object image, or the third object image in every image frame of the imaging device.
12. The semiconductor integrated circuit of claim 10, wherein
the semiconductor integrated circuit controls opening and closing of the shutter such that the first object image, the second object image, or the third object image is obtained in a portion of each image frame, and
the semiconductor integrated circuit controls the driving section such that a focusing position changes between the first focusing position and the second focusing position or between the second focusing position and the third focusing position in another portion of the each image frame.
13. The semiconductor integrated circuit of claim 10, wherein
when the focus lens is focused on the first, second and third focusing positions, the driven imaging device or focus lens is at the first, second and third driving positions, respectively, and
the semiconductor integrated circuit determines the second and third driving positions such that the distance between the first driving position and the second driving position and the distance between the first driving position and the third driving position are equal to each other.
14. An imaging method, comprising forming an image of an image capturing scene by exposing an imaging plane of an imaging device, which is configured to generate an image signal from incident light, to light incoming through a lens optical system which includes a focus lens at a timing of a shutter which is provided at at least one of the imaging device or a position between the lens optical system and the imaging device,
wherein the imaging device or the focus lens is driven such that a focus is adjusted to each of first, second and third focusing positions of different object distances, and one of the imaging device and the focus lens is driven such that image signals of first, second and third object images at the first, second and third focusing positions are obtained by the imaging device,
the first focusing position is present between the second focusing position and the third focusing position, and
the shutter is controlled, and one of the imaging device and the focus lens is driven, such that the first object image is photographed in every other frame, and the second object image and the third object image are alternately photographed in every other frame.
15. The imaging method of claim 14, wherein the shutter is controlled, and one of the imaging device and the focus lens is driven, such that the imaging device produces any of the first object image, the second object image, or the third object image in every image frame of the imaging device.
16. The imaging method of claim 14, wherein
opening and closing of the shutter is controlled such that the first object image, the second object image, or the third object image is obtained in a portion of each image frame, and
one of the imaging device and the focus lens is driven such that a focusing position changes between the first focusing position and the second focusing position or between the second focusing position and the third focusing position in another portion of the each image frame.
17. The imaging method of claim 14, wherein
when the focus lens is focused on the first, second and third focusing positions, the driven imaging device or focus lens is at the first, second and third driving positions, respectively, and
the second and third driving positions are determined such that the distance between the first driving position and the second driving position and the distance between the first driving position and the third driving position are equal to each other.