What is claimed is:
1. An isolated nucleic acid molecule selected from the group consisting of:
a) a nucleic acid comprising the nucleotide sequence of SEQ ID NO: 1, 3, 4, 6, 9, 11, 13, 15, 19, 21, 25, 27, 32, 34, 38, 40, 42, 44, 48, 50, 57, 59, 62, 64, 72, 74, 77, 79, 83, or 85; and
b) a nucleic acid molecule which encodes a polypeptide comprising the amino acid sequence of SEQ ID NO: 2, 5, 10, 14, 20, 26, 33, 39, 43, 49, 58, 63, 73, 78, or 84.
2. The nucleic acid molecule of claim 1, further comprising vector nucleic acid sequences.
3. The nucleic acid molecule of claim 1, further comprising nucleic acid sequences encoding a heterologous polypeptide.
4. A host cell which contains the nucleic acid molecule of claim 1.
5. An isolated polypeptide comprising the amino acid sequence of SEQ ID NO: 2, 5, 10, 14, 20, 26, 33, 39, 43, 49, 58, 63, 73, 78, or 84.
6. The polypeptide of claim 5 further comprising heterologous amino acid sequences.
7. An antibody or antigen-binding fragment thereof that selectively binds to a polypeptide of claim 5.
8. A method for producing a polypeptide comprising the amino acid sequence of SEQ ID NO: 2, 5, 10, 14, 20, 26, 33, 39, 43, 49, 58, 63, 73, 78, or 84, the method comprising culturing the host cell of claim 4 under conditions in which the nucleic acid molecule is expressed.
9. A method for detecting the presence of a polypeptide of claim 5 in a sample, comprising:
a) contacting the sample with a compound which selectively binds to the polypeptide; and
b) determining whether the compound binds to the polypeptide in the sample.
10. The method of claim 9, wherein the compound which binds to the polypeptide is an antibody.
11. A kit comprising a compound which selectively binds to a polypeptide of claim 5 and instructions for use.
12. A method for detecting the presence of a nucleic acid molecule of claim 1 in a sample, comprising the steps of:
a) contacting the sample with a nucleic acid probe or primer which selectively hybridizes to the nucleic acid molecule; and
b) determining whether the nucleic acid probe or primer binds to a nucleic acid molecule in the sample.
13. The method of claim 12, wherein the sample comprises mRNA molecules and is contacted with a nucleic acid probe.
14. A kit comprising a compound which selectively hybridizes to a nucleic acid molecule of claim 1 and instructions for use.
15. A method for identifying a compound which binds to a polypeptide of claim 5 comprising the steps of:
a) contacting a polypeptide, or a cell expressing a polypeptide of claim 5 with a test compound; and
b) determining whether the polypeptide binds to the test compound.
16. A method for modulating the activity of a polypeptide of claim 5, comprising contacting a polypeptide or a cell expressing a polypeptide of claim 5 with a compound which binds to the polypeptide in a sufficient concentration to modulate the activity of the polypeptide.
17. A method of inhibiting aberrant activity of a 33877, 47179, 26886, 25552, 32132, 32244, 23680, 32624, 47174, 60491, 46743, 27417, 27960, 32252, or 53320-expressing cell, comprising contacting a 33877, 47179, 26886, 25552, 32132, 32244, 23680, 32624, 47174, 60491, 46743, 27417, 27960, 32252, or 53320-expressing cell with a compound that modulates the activity or expression of a polypeptide of claim 5, in an amount which is effective to reduce or inhibit the aberrant activity of the cell.
18. The method of claim 17, wherein the compound is selected from the group consisting of a peptide, a phosphopeptide, a small organic molecule, and an antibody.
19. A method of treating or preventing a disorder characterized by aberrant activity of a 33877, 47179, 26886, 25552, 32132, 32244, 23680, 32624, 47174, 60491, 46743, 27417, 27960, 32252, or 53320-expressing cell, in a subject, comprising:
administering to the subject an effective amount of a compound that modulates the activity or expression of a nucleic acid molecule of claim 1, such that the aberrant activity of the 33877, 47179, 26886, 25552, 32132, 32244, 23680, 32624, 47174, 60491, 46743, 27417, 27960, 32252, or 53320-expressing cell is reduced or inhibited.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An apparatus for measuring surface features in machined parts comprising:
a) a fixture to hold an impressionable material in fixed position against a surface feature for the period needed for the impressionable material to conform to the surface feature and register the shape of the surface feature;
b) said fixture removable such that the profile created in the impressionable material remains substantially unchanged by removal; and
c) said fixture mountable in a profiling device repeatably from measurement to measurement.
2. The apparatus of claim 1 wherein said fixture is further comprised of a positioning element and a measuring element:
a) said positioning element locating features on parts to be measured by reference to at least one datum for each measurement location;
b) said measuring element being removably fitted to said positioning element to hold said measuring element in alignment with said positioning element; and
c) said measuring element removable from said positioning element and configured to be mountable in a profiling device repeatably from measurement to measurement.
3. The apparatus of claim 2 wherein said measuring element has a free axis of movement such that the impressionable material may be moved toward or away from the surface feature being profiled.
4. The apparatus of claim 3 further comprising an adjustable stepped gage block to regulate the position of the impressionable material in relation to the surface feature being measured.
5. The apparatus of claim 1 wherein said fixture contacts at least one datum of the part being measured to provide reference location.
6. The apparatus of claim 2 wherein said positioning element contacts at least one datum of the part being measured to provide reference location.
7. The apparatus of claim 1 wherein said fixture is fitted to hold said positioning element in contact with at least one datum of the part being measured to provide reference location.
8. The apparatus of claim 2 wherein said positioning element is fitted to hold said positioning element in contact with at least one datum surface of the part being measured to provide reference location.
9. The apparatus of claim 1 wherein said fixture is spring loaded to hold said fixture in contact with at least one datum surface of the part being measured to provide reference location.
10. The apparatus of claim 2 wherein said positioning element is spring loaded to hold said positioning element in contact with at least one datum surface of the part being measured to provide reference location.
11. The apparatus of claim 1 wherein the impressionable material is supplied in cylindrical form and is positioned in a V shaped block which is a part of said fixture.
12. The apparatus of claim 2 wherein the impressionable material is supplied in cylindrical form and is positioned in a V shaped block which is a part of said measuring element.
13. The apparatus of claim 1 wherein the impressionable material is a wax.
14. The apparatus of claim 2 wherein the impressionable material is a wax.
15. An apparatus for measuring edges in machined parts comprising:
a) a fixture to hold an impressionable material in fixed position against an edge for the period needed for the impressionable material to conform to the edge and register the shape of the edge;
b) said fixture having a positioning element and a measuring element;
c) said measuring element removably fitted to said positioning element in a manner to hold said measuring element in alignment with said positioning element;
d) said measuring element removable from said positioning element such that the profile created in the impressionable material remains substantially unchanged during removal; and
e) said measuring element configured to be mountable in a profiling device repeatably from measurement to measurement.
16. The apparatus of claim 15 wherein said measuring element has a free axis of movement such that the impressionable material may be moved toward or away from the edge being profiled.
17. The apparatus of claim 16 further comprising an adjustable stepped gage block to regulate the position of the impressionable material in relation to the edge being measured.
18. A method for measuring surface features in machined parts comprising:
a) holding an impressionable material with a fixture in fixed position against a surface feature for a period of time sufficient for the impressionable material to conform to the surface feature and register the shape of the surface feature;
b) removing the fixture from the surface feature while maintaining the profile of the surface feature substantially unchanged by removal; and
c) mounting the fixture in a profiling device repeatably from measurement to measurement.
19. The method of claim 18 comprising using a stepped gage block to regulate the position of the impressionable material in relation to the surface feature being measured.
20. The method of claim 18 comprising using at least one datum of the part being measured to provide reference location.
21. The method of claim 18 comprising using a spring loaded fixture to hold the fixture in contact with at least one datum surface of the part being measured to provide reference location.
22. A method for measuring edges in machined parts comprising:
a) holding an impressionable material in fixed position against an edge using a fixture having a positioning element and a measuring element;
b) holding the impressionable material in fixed position for a period of time sufficient for the impressionable material to conform to the edge and register the shape of the edge;
c) holding the measuring element in alignment with the positioning element, the measuring element being removably fitted to the positioning element;
d) removing the measuring element from the positioning element while maintaining the profile created in the impressionable material substantially unchanged during removal; and
e) configuring the measuring element to be mountable in a profiling device repeatably from measurement to measurement.
23. The method of claim 22 comprising using a stepped gage block to regulate the position of the impressionable material in relation to the surface feature being measured.
24. The method of claim 22 comprising using at least one datum of the part being measured to provide reference location.
25. The method of claim 22 comprising using a spring loaded part registration plate to hold the positioning element in contact with at least one datum of the part being measured to provide reference location.