1. A method for wireless data transmission between a base station and a transponder, the method comprising the steps of:
transmitting data between the base station and the transponder in the form of data packets that include at least a header section with at least one symbol for setting one or more transmission parameters and include at least one additional section;
monitoring in the transponder during data transmission to determine whether a time period between two successive symbol delimiters, which are transmitted by the base station, exceeds a maximum time; and
resetting a receiver unit of the transponder if the maximum time is exceeded,
wherein the maximum time can be determined in the transponder using the at least one symbol of the header section.
2. The method according to claim 1, wherein the maximum time is determined by multiplying a value of the at least one symbol by a factor.
3. The method according to claim 1, wherein the maximum time determined is compared in the transponder to a maximum permissible value, and if this maximum permissible value is exceeded, the maximum time is limited to the maximum permissible value.
4. The method according to claim 1, wherein the maximum time is initialized using a first symbol in the header section and is tracked as a function of one or more subsequent symbols in the header section.
5. The method according to claim 1, wherein the at least one symbol is encoded using a period between the two successive symbol delimiters of the header section.
6. The method according to claim 1, wherein the monitoring of whether the maximum time is exceeded by the time period between the two successive symbol delimiters transmitted by the base station can be deactivated during specifiable operating phases of the base station andor transponder, in particular during an asynchronous data transmission.
7. The method according to claim 1, wherein a value of the at least one symbol is stored in the transponder.
8. The method according to claim 7, wherein the value of the at least one symbol is stored in the form of a voltage level of a storage capacitor andor in the form of a count state of a digital counter.
9. The method according to claim 1, wherein the transponder is a passive andor a backscatter-based transponder
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A testing apparatus for testing a semiconductor device according to a test sequence, comprising:
a tester configured to determine expected input demand at a power terminal of the semiconductor device individually for each cycle of the test sequence for the semiconductor device; and
a power supply coupled to the power terminal of the semiconductor device to supply power to the semiconductor device; and
an adjustment circuit configured to vary the supplied power to the semiconductor device in accordance with the expected input demand during testing of the semiconductor device.
2. The apparatus of claim 1, wherein the expected input demand is different at a first cycle within the test sequence as compared to a second cycle within the test sequence.
3. The apparatus of claim 1, wherein the power supply comprises:
a primary power supply configured to provide a steady supply of power to the power terminal; and
an auxiliary power supply configured to provide a varying supply of power to the power terminal.
4. The apparatus of claim 3, wherein at least part of the adjustment circuit is disposed on a probe card remotely from each of the primary power supply and the auxiliary power supply.
5. The apparatus of claim 3, wherein the adjustment circuit comprises a switch connected at an output of the auxiliary power supply to enable selective connection and disconnection of the auxiliary power supply to the power terminal.
6. The apparatus of claim 1, wherein the power supply further comprises a second adjustment circuit configured to further adjust the supplied power in accordance with an actual input demand at the power terminal.
7. The apparatus of claim 1, wherein the input demand is any one or more of a voltage, a current, and a power.
8. A testing apparatus for testing a semiconductor device according to a test sequence provided by a tester, comprising:
a means for determining expected input demand at a power terminal of the semiconductor device individually for each cycle of a test sequence for the semiconductor device;
a means for testing the semiconductor device in accordance with the test sequence; and
a means for providing varying power to the semiconductor device in accordance with the expected input demand during the testing.
9. The apparatus of claim 8, wherein the expected input demand is different at a first cycle within the test sequence as compared to a second cycle within the test sequence.
10. The apparatus of claim 8, wherein the means for determining determines the expected input demand based on a measurement of an actual power demand of a reference semiconductor for an individual cycle of the test sequence.
11. The apparatus of claim 8, wherein the means for determining determines the expected input demand based on a simulation of a power demand of the semiconductor device for an individual cycle of the test sequence.
12. The apparatus of claim 8, wherein the means for providing varying power comprises:
means for generating a first supply of power to the power terminal; and
means for selectively generating a second supply of power to the power terminal in accordance with the expected input demand.
13. The apparatus of claim 12, further comprising means for controlling the amount of the second supply of power as a function of a cycle of the test sequence.
14. The apparatus of claim 12, further comprising means for controlling the timing of the second supply of power as a function of a cycle of the test sequence.
15. A method of testing a semiconductor device using a test apparatus, comprising:
determining expected input demand at a power terminal of the semiconductor device individually for each cycle of a test sequence for the semiconductor device;
testing the semiconductor device in accordance with the test sequence; and
providing varying power to the semiconductor device in accordance with the expected input demand during the testing.
16. The method of claim 15, wherein the expected input demand is different at a first cycle within the test sequence as compared to a second cycle within the test sequence.
17. The method of claim 15, wherein the determining expected input demand comprises applying signals to a reference semiconductor device in accordance with the test sequence and measuring a power demand of the reference semiconductor for an individual cycle of the test sequence.
18. The method of claim 17, wherein the determining expected input demand comprises applying signals to a reference semiconductor device in accordance with the test sequence and measuring a power demand of the reference semiconductor for each cycle of the test sequence.
19. The method of claim 15, wherein the determining expected input demand comprises simulating a power demand of the semiconductor device for an individual cycle of the test sequence.
20. The method of claim 19, wherein the determining expected input demand comprises simulating a power demand of the semiconductor device for each cycle of the test sequence.
21. The method of claim 15, wherein the providing varying power comprises:
generating a first supply of power to the power terminal; and
selectively generating a second supply of power to the power terminal in accordance with the expected input demand.
22. The method of claim 21, wherein the second supply of power is provided substantially concurrently with an expected increase in demand for current at the power terminal.
23. The method of claim 21, wherein the providing power comprises generating a signal to regulate an amount of the second supply of power provided to the power terminal.
24. The method of claim 21, wherein the providing power comprises generating a signal to regulate a timing of the second supply of power provided to the power terminal.
25. The method of claim 21, wherein the generating a first supply of power is performed by a tester and selectively generating a second supply of power is performed by a probe card.
26. The method of claim 15, wherein the input demand is any one or more of a voltage, a current, and a power.
27. The method of claim 15, further comprising adjusting the power to the semiconductor device based on measurements of actual input demand at the power terminal of the semiconductor device.