1. A composition for topical application, comprising:
in an amount effective as an antimicrobial under visible light, a photocatalyst mixture comprising titanium dioxide, sodium perborate, magnesium silicate, and citric acid.
2. The composition of claim 1 further comprising a pharmaceutically acceptable carrier.
3. The composition of claim 2, wherein the pharmaceutically acceptable carrier comprises water, oil, gel, gum, cream, suspension, or a combination thereof.
4. The composition of claim 2, wherein the photocatalyst mixture comprises titanium dioxide in an amount of about 0.0014% wtv to about 0.0041% wtv.
5. The composition of claim 2, wherein the photocatalyst mixture comprises sodium perborate in an amount of about 0.1347% wtv to about 0.4040% wtv.
6. The composition of claim 2, wherein the photocatalyst mixture comprises magnesium silicate in an amount of about 0.0018% wtv to about 0.0054% wtv.
7. The composition of claim 2, wherein the photocatalyst mixture comprises citric acid in an amount of about 0.1122% wtv to about 0.3366% wtv.
8. The composition of claim 2, wherein the photocatalyst mixture includes:
titanium dioxide in an amount of about 0.0014% wtv to about 0.0041% wtv,
sodium perborate in an amount of about 0.1347% wtv to about 0.4040% wtv,
magnesium silicate in an amount of about 0.0018% wtv to about 0.0054% wtv, and
citric acid in an amount of about 0.1122% wtv to about 0.3366% wtv.
9. The composition of claim 1, wherein the photocatalyst mixture comprises titanium dioxide, sodium perborate, magnesium silicate, and citric acid in a proportion of about 1 to about 100 to about 1.3 to about 83.
10. The composition of claim 1, wherein the photocatalyst mixture comprises titanium dioxide, sodium perborate, magnesium silicate, and citric acid in a proportion of 1:100:1.33:83.3.
11. The composition of claim 1 wherein the composition is a liquid, solid, or semi-solid.
12. A composition for treating acne, comprising:
a photocatalyst mixture in an amount effective for inhibiting growth of Propionibacterium acnes; and
a pharmaceutically acceptable carrier;
wherein the photocatalyst mixture comprises titanium dioxide, sodium perborate, magnesium silicate, and citric acid.
13. The composition of claim 12, wherein the pharmaceutically acceptable carrier comprises gum, gel, water, cream, oil, suspension or a combination thereof.
14. The composition of claim 12, wherein the composition is a liquid, solid, or semi-solid.
15. The composition of claim 12, wherein the photocatalyst mixture comprises titanium dioxide in an amount of about 0.0014% wtv to about 0.0041% wtv.
16. The composition of claim 12, wherein the photocatalyst mixture comprises sodium perborate in an amount of about 0.1347% wtv to about 0.4040% wtv.
17. The composition of claim 12, wherein the photocatalyst mixture comprises magnesium silicate in an amount of about 0.0018% wtv to about 0.0054% wtv.
18. The composition of claim 12, wherein the photocatalyst mixture comprises citric acid in an amount of about 0.1122% wtv to about 0.3366% wtv.
19. The composition of claim 12, wherein the photocatalyst mixture comprises: titanium dioxide in an amount of about 0.0014% wtv to about 0.0041% wtv;
sodium perborate in an amount of about 0.1347% wtv to about 0.4040% wtv;
magnesium silicate in an amount of about 0.0018% wtv to about 0.0054% wtv; and
citric acid in an amount of about 0.1122% wtv to about 0.3366% wtv.
20. The composition of claim 12, wherein the photocatalyst mixture comprises titanium dioxide, sodium perborate, magnesium silicate, and citric acid in a proportion of about 1 to about 100 to about 1.3 to about 83.
21. The composition of claim 12, wherein the photocatalyst mixture comprises titanium dioxide, sodium perborate, magnesium silicate, and citric acid in a proportion of 1:100:1.33:83.3.
22. A method for treating acne, comprising:
(a) applying a photocatalyst mixture to a target skin area; and
(b) exposing the target skin area to visible light;
wherein the photocatalyst mixture comprises titanium dioxide, sodium perborate, magnesium silicate, and citric acid; and
wherein the photocatalyst mixture is in an amount effective as an antimicrobial under visible light.
23. The method of claim 22, wherein the photocatalyst mixture comprises titanium dioxide in an amount of about 0.0014% wtv to about 0.0041% wtv.
24. The method of claim 22, wherein the photocatalyst mixture comprises sodium perborate in an amount of about 0.1347% wtv to about 0.4040% wtv.
25. The method of claim 22, wherein the photocatalyst mixture comprises magnesium silicate in an amount of about 0.0018% wtv to about 0.0054% wtv.
26. The method of claim 22, wherein the photocatalyst mixture comprises citric acid in an amount of about 0.1122% wtv to about 0.3366% wtv.
27. The method of claim 22, wherein the photocatalyst mixture comprises:
titanium dioxide in an amount of about 0.0014% wtv to about 0.0041% wtv; sodium perborate in an amount of about 0.1347% wtv to about 0.4040% wtv;
magnesium silicate in an amount of about 0.0018% wtv to about 0.0054% wtv; and
citric acid in an amount of about 0.1122% wtv to about 0.3366% wtv.
28. The method of claim 22, wherein the photocatalyst mixture further comprises a pharmaceutically acceptable carrier.
29. The method of claim 28, wherein the pharmaceutically acceptable carrier comprises water, cream, oil, gel, gum, suspension, or a combination thereof.
30. The method of claim 22, wherein the composition is a liquid, solid, or semi-solid.
31. The method of claim 22, wherein the applying step is performed more than once a day.
32. The method of claim 22, wherein the applying step and the exposing step are performed on an acne area until the acne disappears.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
What is claimed is:
1. An instrument for measuring a magnetic field, comprising:
a source of a charged particle beam;
means for generating a magnetic field to be measured;
means for directing the charged particle beam through a desired position in the magnetic field to be measured, thereby deflecting the beam in first direction;
means for deflecting the charged particle beam in a second direction, wherein said second direction is different from said first direction; and
a two-dimensional sensor for detecting the displacement of beam deflection.
2. An instrument for measuring a magnetic field according to claim 1, further comprising:
means for converging the charged particle beam before directing the beam to said magnetic field to be measured;
means for providing a deflecting signal to the means for deflecting the charged particle beam in the second direction to control the deflection of the charged particle beam;
means for enlarging the displacement of deflection of the charged particle beam after the beam is deflected by the means for deflecting; and
a display for displaying a track of the charged particle beam detected by the sensor.
3. An instrument for measuring a magnetic field according to claim 1, further comprising:
means for switching on and off the irradiation of the charged particle beam into the magnetic field to be measured at a position between the source of the charged particle beam and the means for generating the magnetic field to be measured; and
means for providing a signal to the switching means to control the irradiation and non-irradiation of the charged particle beam into the magnetic field to be measured;
4. An instrument for measuring a magnetic field according to claim 1, wherein the angle between the first direction and the second direction is approximately 90 degrees.
5. An instrument for measuring a magnetic field according to claim 1, wherein the magnetic field to be measured and the deflecting means are disposed such that the charged particle beam passes through the magnetic field to be measured before passing through the deflecting means.
6. An instrument for measuring a magnetic field according to claim 3, wherein the magnetic field to be measured and the deflecting means are disposed such that the charged particle beam passes through the magnetic field to be measured before passing through the deflecting means.
7. An instrument for measuring a magnetic field according to claim 2, wherein the frequency of the deflecting signal fed to the means for deflecting the charged particle beam is set at a value of not higher than the frequency of the magnetic field to be measured.
8. An instrument for measuring a magnetic field according to claim 2, wherein a triangular or sawtooth waveform is used as the waveform of the deflecting signal fed to the means for deflecting the charged particle beam.
9. An instrument for measuring a magnetic field according to claim 1, wherein the second direction of deflection of the charged particle beam deflected by the means for deflecting the charged particle beam is rotatingly adjustable with respect to the first direction.
10. An instrument for measuring a magnetic field according to claim 1, wherein
said means for generating a magnetic field to be measured comprise a wire in which an electric current to be measured flows, and
said means for directing the charged particle beam through a desired position in the magnetic field to be measured directs the particle beam near the wire.
11. An instrument for measuring a magnetic field according to claim 2, wherein
said means for generating a magnetic field to be measured comprise a wire in which an electric current to be measured flows, and
said means for directing the charged particle beam through a desired position in the magnetic field to be measured directs the particle beam near the wire.
12. An instrument for measuring a field, comprising:
a source of a charged particle beam;
means for generating an electric field to be measured;
means for directing the charged particle beam through a desired position in the electric field to be measured, thereby deflecting the beam in first direction;
means for deflecting the charged particle beam in a second direction, wherein said second direction is different from said first direction; and
a two-dimensional sensor for detecting the displacement of beam deflection.
13. An instrument for measuring a field according to claim 12, further comprising:
means for converging the charged particle beam before directing the beam to said electric field to be measured;
means for providing a deflecting signal to the means for deflecting the charged particle beam in the second direction to control the deflection of the charged particle beam;
means for enlarging the displacement of deflection of the charged particle beam after the beam is deflected by the means for deflecting; and
a display for displaying a track of the charged particle beam detected by the sensor.
14. A method for measuring a magnetic field utilizing an interaction with a charged particle beam, comprising the steps of:
generating a charged particle beam from a source of the charged particle beam;
converging the charged particle beam;
generating a magnetic field to be measured using a first signal that varies with a predetermined period;
directing the converged charged particle beam to pass through a predetermined position in the magnetic field to be measured, thereby causing the beam to be deflected in a first direction; and
deflecting the charged particle beam in a second direction using a second control signal which is based on said first signal, wherein said second direction is different from said first direction.
15. A method for measuring a magnetic field according to claim 14, further comprising the steps of:
enlarging the displacement of deflection of the deflected charged particle beam;
detecting the enlarged displacement of deflection using a two-dimensional sensor; and
displaying a detected track of the charged particle beam.
16. A method for measuring a magnetic field according to claim 15, further comprising the steps of:
switching on and off the irradiation of the charged particle beam into the magnetic field to be measured at a position between the source of the charged particle beam and the means for generating the magnetic field to be measured; and
providing a third signal to the switching means to control the irradiation and non-irradiation of the charged particle beam into the magnetic field, wherein said third signal is related to said first signal.
17. A method for measuring a magnetic field according to claim 14, wherein the angle between the first direction and the second direction is approximately 90 degrees.
18. A method for measuring a magnetic field according to claim 14, wherein the frequency of the first signal is at least as high as the frequency of the second control signal.
19. A method for measuring a magnetic field according to claim 15, wherein
said step of generating a magnetic field includes directing an electric current through a wire, and
said step of directing the charged particle beam to pass through the magnetic field to be measured includes directing the particle beam near said wire.
20. A method for measuring a field, comprising the steps of:
generating a charged particle beam from a source of the charged particle beam;
converging the charged particle beam;
generating an electric field to be measured using a first signal that varies with a predetermined period;
directing the converged charged particle beam to pass through a predetermined position in the electric field to be measured, thereby causing the beam to be deflected in a first direction; and
deflecting the charged particle beam in a second direction using a second control signal which is based on said first signal, wherein said second direction is different from said first direction.