What is claimed is:
1. A submerged conveyance structure for photosensitive material, the structure comprising:
a main body, the main body including a photosensitive material conveyance path for passage of a photosensitive material, the photosensitive material conveyance path formed in partition walls between processing tanks in which processing solutions are stored;
a sheet-like blade, the blade disposed in the photosensitive material conveyance path and having an elasticity capable of allowing passage of the photosensitive material with respect to the photosensitive material conveyance path while preventing passage of the processing solutions; and
a mounting member for mounting the blade to the photosensitive material conveyance path;
wherein the photosensitive material conveyance path has
a first tilted surface provided at the upstream side of the direction in which the photosensitive material is conveyed, the first tilted surface facing one surface of the photosensitive material and tilted by an acute angle toward the upstream side of the direction in which the photosensitive material is conveyed, with respect to a photosensitive material passage route,
a second tilted surface provided at the upstream side of the direction in which the photosensitive material is conveyed, the second tilted surface facing the other surface of the photosensitive material and tilted by an acute angle toward the upstream side of the direction in which the photosensitive material is conveyed, with respect to the photosensitive material passage route, and
a slit hole provided at the downstream side of the direction in which the photosensitive material is conveyed, the slit hole opening toward one of the first tilted surface and the second tilted surface, the slit hole being formed lengthwise in a direction orthogonal to the direction in which the photosensitive material is conveyed, and
the blade covers the slit hole in a state in which an end edge extending in the longitudinal direction at the side facing the slit hole elastically contacts one of a path upper wall surface and a path lower wall surface of the photosensitive material conveyance path, and a vicinity of the end edges of both sides in the longitudinal direction and a vicinity of the end edge on the opposite side with respect to the side elastically contacting either one of the path upper wall surface and the path lower wall surface are nipped by the mounting member and at least one of the first tilted surface or the second tilted surface having the slit hole.
2. The submerged conveyance structure for photosensitive material of claim 1, wherein longitudinal direction side portions of the end edge of the blade, which end edge elastically contacts the path wall surface, are inserted in a groove formed at an area where the first tilted surface and the second tilted surface intersect.
3. The submerged conveyance structure for photosensitive material of claim 1, wherein the blade is held relatively movably between the main body and the mounting member.
4. The submerged conveyance structure for photosensitive material of claim 2, wherein the blade is held relatively movably between the main body and the mounting member.
5. The submerged conveyance structure for photosensitive material of claim 1, wherein the main body and the mounting member comprise a synthetic resin including glass fiber.
6. The submerged conveyance structure for photosensitive material of claim 1, wherein areas of the main body and the mounting member contacting the photosensitive material are disposed with a low frictional material having a friction coefficient lower than that of the material comprising the main body and the mounting member.
7. The submerged conveyance structure for photosensitive material of claim 1, wherein one of the first tilted surface and the second tilted surface includes screw holes and projections along the longitudinal direction.
8. The submerged conveyance structure for photosensitive material of claim 2, wherein the groove includes a width greater than blade thickness.
9. The submerged conveyance structure for photosensitive material of claim 4, wherein a dimension of the mounting member in the longitudinal direction is set to be substantially the same as a dimension of the blade in the longitudinal direction.
10. The submerged conveyance structure for photosensitive material of claim 7, wherein the mounting member includes a screw hole and a fitting hole at positions corresponding to each of the screw holes and the projections.
11. The submerged conveyance structure for photosensitive material of claim 4, wherein a mounting surface nearest the photosensitive material conveyance path and opposite to a blade nipping surface of the mounting member is a conveyance surface.
12. The submerged conveyance structure for photosensitive material of claim 4, wherein the main body, the blade part and the mounting part are detachable.
13. The submerged conveyance structure for photosensitive material of claim 4, wherein the first tilted surface and the second tilted surface are tilted with respect to the photosensitive material passage route in a range of 10 to 80.
14. The submerged conveyance structure for photosensitive material of claim 4, wherein the dimension of the first tilted surface in the longitudinal direction and the dimension of the second tilted surface in the longitudinal direction are greater than the dimension of the slit hole in the longitudinal direction.
15. The submerged conveyance structure for photosensitive material of claim 4, wherein the dimension of the first tilted surface in the longitudinal direction and the dimension of the second tilted surface in the longitudinal direction are greater than the dimension of the blade in the longitudinal direction.
16. The submerged conveyance structure for photosensitive material of claim 8, wherein the blade comprises a substantially rectangular shape with a fixed thickness.
17. The submerged conveyance structure for photosensitive material of claim 16, wherein the blade thickness is in a range of 0.3 to 0.7 mm.
18. The submerged conveyance structure for photosensitive material of claim 7, wherein the blade includes circular or elongated holes at a position corresponding to the screw holes and the projections.
19. The submerged conveyance structure for photosensitive material of claim 4, wherein the blade comprises a polyurethane resin.
20. The submerged conveyance structure for photosensitive material of claim 19, wherein the blade has a hardness of 80 to 99.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
What is claimed is:
1. A method for diagnosing a memory array including a plurality of memory banks which can independently readwrite data, comprising:
writing identical write-data in the plurality of memory banks, when diagnosing the plurality of memory banks;
storing the write-data;
parallelly reading storage data from the plurality of memory banks; and
comparing the storage data read out from the plurality of memory banks with the write-data, discriminating that the plurality of memory banks are in a normal state when the storage data and the write-data coincide with each other, and discriminating that a defect exists in either one of the plurality of memory banks when the storage data and the write-data do not coincide with each other.
2. A memory diagnostic circuit for diagnosing a memory array including a plurality of memory banks which can independently readwrite data, said circuit comprising:
a diagnostic controlling section which writes predetermined common data into the plurality of memory banks, and parallelly reads out storage data from the plurality of memory banks;
a memory which stores the predetermined common data written into the plurality of memory banks; and
a comparison circuit which compares the data read out from the plurality of memory banks with the write-data stored in said memory, and outputs a comparison result.
3. A memory diagnostic circuit for diagnosing a memory array including plurality of memory banks which can independently readwrite data, said circuit comprising;
a diagnostic controlling section which simultaneously sets the plurality of memory banks in an accessibleenable state, writes predetermined common data into the plurality of memory banks, and parallelly reads out storage data from the plurality of memory banks;
a memory which stores data written into the plurality of memory banks; and
a comparison circuit which compares the data read out from the plurality of memory banks with write-data stored in said memory, and outputs a comparison result.
4. The memory diagnostic circuit according to claim 3, wherein said diagnostic controller includes:
a controlling circuit which outputs a plurality of select-signals for setting the plurality of memory banks into an enable state, in a normal operational mode;
a circuit which outputs an ALL-select signal for setting an ALL-memory bank into an enable state, in a test mode; and
means for performing a logical operation on each of the plurality of select-signals and the ALL-select signal; and
wherein either one of the plurality of memory banks is set into an enable state in a normal operational mode, and the plurality of memory banks are simultaneously set into an enable state in a test mode.
5. The memory diagnostic circuit according to claim 2, further comprising a discrimination circuit which discriminates that the plurality of memory banks are in a normal state when an output of said comparison circuit indicates coincidence, and discriminates that a defect exists in either one of the plurality of memory banks when the output of said comparison circuit indicates non-coincidence.
6. The memory diagnostic circuit according to claim 2, further comprising a data buffer which temporarily retains the write-data during a memory diagnostic process.
7. The memory diagnostic circuit according to claim 2, further comprising an error information memory for storing error information indicating that a defect exists in either one of the plurality of memory banks, when said comparison circuit discriminates that a defect exists in the either one of the plurality of memory banks.
8. A semiconductor memory device which includes the memory diagnostic circuit of claim 2 inside said semiconductor memory device.
9. A semiconductor memory device which includes the memory diagnostic circuit of claim 3 inside said semiconductor memory device.
10. A semiconductor memory device to which the memory diagnostic circuit of claim 2 is externally connected.
11. A semiconductor memory device to which the memory diagnostic circuit of claim 3 is externally connected.