1. A touch-sensitive device comprising:
a layer of a compressible resilient material;
a flexible membrane disposed on the compressible resilient material; and,
a plurality of deflection sensors formed on the flexible membrane;
wherein each of the deflection sensors comprises one or more electronic components formed on the membrane and wherein the electronic components of each of the deflection sensors comprise a light detector and the touch-sensitive device comprises at least one light source.
2. A touch-sensitive device according to claim 1 wherein the light detectors are formed on an inside face of the membrane at an interface between the membrane and the compressible resilient material.
3. The touch-sensitive device of claim 1 wherein the compressible resilient material is translucent.
4. The touch-sensitive device of claim 3 wherein the compressible resilient material comprises a foam.
5. The touch-sensitive device of claim 4 wherein the compressible resilient material comprises a polyurethane foam.
6. The touch-sensitive device of claim 1 wherein the electronic components of each of the deflection sensors comprise a light source.
7. The touch-sensitive device of claim 6 comprising a reflective layer on a side of the compressible resilient material away from the flexible membrane.
8. The touch-sensitive device of claim 7 wherein the compressible resilient material comprises an aperture underlying each of the deflection sensors.
9. The touch-sensitive device of claim 6 wherein the compressible resilient material is translucent.
10. The touch-sensitive device of claim 9 wherein the compressible resilient material comprises a foam.
11. The touch-sensitive device of claim 10 wherein the compressible resilient material comprises a polyurethane foam.
12. The touch-sensitive device of claim 1 wherein the deflection sensors are arranged in a regular array.
13. The touch-sensitive device of claim 12 wherein the deflection sensors are arranged in a rectangular array.
14. The touch-sensitive device of claim 13 wherein a spacing between adjacent ones of the deflection sensors is in the range of about 0.5 mm to about 25 mm.
15. The touch-sensitive device of claim 14 wherein the spacing between adjacent ones of the deflection sensors is in the range of 5 mm\xb11 mm.
16. The touch-sensitive device of claim 1 comprising a flexible display on the flexible membrane.
17. The touch-sensitive device of claim 16 wherein the flexible display comprises an array of thin film transistors on the flexible membrane.
18. The touch-sensitive device of claim 1 comprising a data processor connected to receive signals from the deflection sensors and configured to determine at least one point at which a force is being applied to the touch-sensitive device from the signals.
19. The touch-sensitive device of claim 18 wherein the data processor comprises at least some flexible electronic devices on the flexible membrane.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for permitting the verification of Built In Self Test (BIST) structures within an integrated circuit of a logical interface group of circuits having an output, comprising:
determining that at least one node of the integrated circuit comprises a point of equivalence wherein the output of the logical interface group comprises at least one fence gating signal and one or more interface signals;
building two ternary models with a first ternary model comprising a wrapper schematic including a Design Under Test (DUT) along with a Model 1 testbench driver and a second ternary model comprising the wrapper schematic, the DUT and a Model 2 testbench driver;
building a composite equivalence model which is a union of the first ternary model and the second ternary model wherein all interfaces specified in the first ternary model are driven using the Model 1 testbench driver and all interfaces specified in the second ternary model are driven using the Model 2 testbench driver and any interface not specified in either the Model 1 testbench or the Model 2 testbench driver is driven identically in both the first ternary model and the second ternary model; and
identifying nodes in the DUT to serve as points of equivalence which are asserted to be mathematically equivalent.
2. The method of claim 1 further comprising the steps of:
employing a formal verification engine to obtain said mathematical proof; and
formally verifying a plurality of logical interface groups in parallel within a single formal verification execution run.
3. The method of claim 1 further comprising the steps of:
identifying the interface signals and corresponding FENCE gating signals for one or more interfaces; and
creating the wrapper schematic which includes the DUT containing logic circuitry common to the interfaces but excludes the elements responsible for driving the interfaces.
4. The method of claim 3 further comprising the steps of:
creating the Model 1 testbench driver wherein the interface signals and the corresponding FENCE gating signals are driven to an inactive state and;
creating the Model 2 testbench driver wherein the interface signals are driven to random or \u201cX\u201d states and the corresponding FENCE signals are driven to an active state.
5. A method for permitting the verification of Built In Self Test (BIST) structures within an integrated circuit of a logical interface group of circuits having an output, comprising the steps of:
determining that at least one node of the integrated circuit comprises a point of equivalence wherein the output of the logical interface group
comprises at least one fence gating signal and one or more interface signals;
employing a formal verification engine to prove that a logical output comprises a point of equivalence providing a successful mathematical proof that a the point of equivalence corresponds to a complete and exhaustive validation of fencing circuitry in a corresponding logical interface group;
formally verifying a plurality of logical interface groups in parallel within a single formal verification execution run;
identifying interface signals and corresponding FENCE gating signals for one or more interfaces;
creating a wrapper schematic which includes a Design Under Test (DUT) containing logic circuitry common to interfaces but excludes elements responsible for driving the interfaces;
creating a Model 1 testbench driver wherein the interface signals and the corresponding FENCE gating signals are driven to an inactive state and;
creating a Model 2 testbench driver wherein the interface signals are driven to random or \u201cX\u201d states and the corresponding FENCE signals are driven to an active state;
building two ternary models with a first ternary model comprising the wrapper schematic including the DUT along with said Model 1
testbench driver and a second ternary model comprising the wrapper schematic, said DUT, and incorporating said Model 2 testbench driver;
building a composite equivalence model which is a union of the first and second ternary models wherein all interfaces specified in the first ternary model are driven using said Model 1 testbench driver and all interfaces specified in the second ternary model are driven using said Model 2 testbench driver and any interface not specified in either of the testbench drivers is driven identically in both of the models; and
identifying nodes in said DUT to serve as points of equivalence which are asserted to be mathematically equivalent.
6. The method of claim 5 further comprising the steps of:
exercising the composite equivalence model using a formal verification engine to determine if the asserted points of equivalence are mathematically equivalent;
examining the output of the formal verification run to determine whether all points of equivalence were proven to be equivalent thereby signifying an exhaustive validation of said logical interface groups; and
further determining whether any points of equivalence are non equivalent thereby signifying a potential design problem.
7. The method of claim 6 further comprising the steps of:
determining whether scan chain inversions exist in the DUT; incorporating additional formal verification rules into the Model 2 testbench driver to test the scan chain inversions for propagation of an \u201cX\u201d state through the DUT and into the points of equivalence, and wherein successful propagation of an \u201cX\u201d state into the points of equivalence denotes a design problem and further comprising the steps as follows:
eliminating potential false fails in the formal verification of the composite model by identifying all latches connected to scan chain inversions and further identifying the signal names of all scan chain input nets associated with the latches and creating an override facility to force the scan chain input signals to an inactive state during the formal verification run of the composite model;
repeating the formal verification run of the composite model incorporating the override facility and determining if any points of equivalence are not equivalent thereby signifying a design problem; and
determining if all points of equivalence are proven equivalent thereby signifying an exhaustive validation of the logical interface groups.
8. The method of claim 7 wherein the method supports the logical interface groups containing one or more scan chain inversions.
9. The method of claim 7 wherein the method supports the logical interface groups containing one or more inverted latches.
10. The method of claim 7 further comprising method steps that permit complete verification of the logical interface groups utilizing simple testbenches thereby obviating the need to exercise complex operational sequences or procedures such as, but not limited, to Logic Built In Self Test (LBIST).
11. The method of claim 10 further comprising the step of utilizing at least one Multiple Input Signature Register (MISR) as at least one point of equivalence for the purpose of verifying the fencing circuitry incorporated in partial good Logical Built In Self Test (LBIST) applications.
12. The method of claim 11 further comprising the step of providing a means of testing for \u201cX\u201d state propagation to at least one point of equivalence using a simple formal verification rule and without requiring any knowledge of design netlist topology.
13. The method of claim 11 further comprising the step of providing a means of detecting over-fencing situations wherein interface FENCE gating signals are erroneously gating non-interface circuitry, thereby potentially reducing test coverage.
14. The method of claim 11 further comprising the step of performing an interface signal audit to ensure the Model 1 and Model 2 testbench drivers have incorporated all required interface signals and to further ensure all the interface signals have been exhaustively verified.
15. The method of claim 11 further comprising the step of providing scalable steps capable of executing against a plurality of design components which may range in size in complexity, but wherein the method scales with the design without requiring additional complexity.
16. A system for verifying Built In Self Test (BIST) structures within an integrated circuit of a logical interface group of circuits having an output, the system comprising a formal verification engine for proving that a chosen reference point in a design is logically equivalent when the design is compared under two modes of operations including a Logic Built-In Self Test (LBIST) controller:
model drivers capable of building two ternary models with a first ternary model comprising a wrapper schematic including a Design Under Test (DUT) along with a Model 1 testbench driver and a second ternary model comprising the wrapper schematic, the DUT, and incorporating a Model 2 testbench driver;
the model drivers capable of building a composite equivalence model which is the union of the ternary models wherein all interfaces specified in the first ternary model are driven using the Model 1 testbench driver and all interfaces specified in the second ternary model are driven using the Model 2 testbench driver and any interface not specified in either of the testbench drivers is driven identically in both models; and
equivalence testing means for identifying nodes in the DUT to serve as points of equivalence which are asserted to be mathematically equivalent, the means for determining that at least one node of said integrated circuit comprises a point of equivalence wherein said output of said logical interface group comprises at least one fence gating signal and one or more interface signals.
17. The system of claim 16 further comprising:
said formal verification engine providing a mathematical proof; and
verification means for verifying a plurality of logical interface groups in parallel within a single formal verification execution run.
18. The system of claim 16 further comprising:
identifying means for identifying the interface signals and corresponding FENCE gating signals for one or more interfaces; and
wrapper means for creating the wrapper schematic which includes the DUT containing logic circuitry common to the interfaces but excludes elements responsible for driving the interfaces.
19. The system of claim 18 further comprising:
first model means for creating the Model 1 testbench driver wherein the interface signals and the corresponding FENCE gating signals are driven to an inactive state, and;
second model means for creating the Model 2 testbench driver wherein the interface signals are driven to random or \u201cX\u201d states and the corresponding FENCE signals are driven to an active state.