1. A hinge assembly coupled between a first plate and a second plate of a portable device, comprising:
a base element;
a first rotation element comprising a first rotational axle, which is coupled to the first plate and is rotatably coupled to the base element, and a first gear coupled to the first rotational axle;
a second rotation element comprising a second rotational axle, which is coupled to the second plate and is rotatably coupled to the base element, and a second gear coupled to the second rotational axle;
a power transfer gear rotatably coupled to the base element and arranged to transfer rotation torque between the first gear and the second gear such that the first gear rotates in a same direction as the second gear; and
an elastic module to restrict rotation of the base element relative to the first rotation element,
wherein rotation of the hinge assembly causes a vertical arrangement between the first plate and the second plate to vary while maintaining a parallel arrangement of the first plate and the second plate.
2. The hinge assembly of claim 1, wherein a rotation ratio between the first gear and the second gear is 1:1.
3. The hinge assembly of claim 1, wherein the elastic module comprises:
a protruding portion arranged on at least one of the first gear and the power transfer gear;
a cam element disposed to contact the protruding portion and having a cam profile formed thereon to enable the first rotation element and the second rotation element to vary the vertical arrangement between the first plate and the second plate semi-automatically, and
an elastic element disposed opposite to the protruding portion with the cam element interposed therebetween and to elastically compress the cam element toward the protruding portion.
4. A portable device, comprising:
a first body element comprising a first thick portion and a first thin portion;
a second body element comprising a second thick portion and a second thin portion, the second thick portion to contact the first thin portion, and the second thin portion to contact the first thick portion if the portable device is in a closed position; and
a hinge assembly comprising a first end rotatably coupled to the first body element and a second end rotatably and slidably coupled to the second body element, the hinge assembly to rotate the portable device between an open position and a closed position, and to vary the vertical arrangement between the first body element and the second body element while maintaining a parallel arrangement of the first body element and the second body element by rotating the first end in a same direction as the second end.
5. The portable device of claim 4, further comprising:
a first plate coupled to the first body element and a second plate slidably coupled to the second body element, the first plate and the second plate to rotate about the hinge assembly while remaining parallel to each other.
6. The portable device of claim 5, wherein the hinge assembly comprises:
a base element;
a first rotation element comprising a first rotational axle, which is coupled to the first plate and is rotatably coupled to the base element, and a first gear coupled to the first rotational axle;
a second rotation element comprising a second rotational axle, which is coupled to the second plate and is rotatably coupled to the base element, and a second gear coupled to the second rotational axle;
a power transfer gear rotatably coupled to the base element and arranged to transfer rotation torque between the first gear and the second gear; and
an elastic module to restrict rotation of the base element relative to the first rotation element,
wherein rotation of the hinge assembly causes a vertical arrangement between the first plate and the second plate to vary while maintaining a parallel arrangement of the first plate and the second plate.
7. The portable device of claim 5, further comprising:
a semi-automatic sliding module to semi-automatically slide the second body element relative to the second plate.
8. The portable device of claim 7, wherein the semi-automatic sliding module comprises a torsion spring.
9. The portable device of claim 8, wherein the torsion spring comprises a first end coupled to the second plate and a second end coupled to the second body element.
10. The portable device of claim 4, wherein the second body element comprises a display unit and the first body element comprises a keypad unit.
11. The portable device of claim 10, wherein the display unit is arranged on a top surface of the second body element, and the keypad unit is arranged on the first thick portion of the first body element.
12. The portable device of claim 4, wherein the first body element comprises a display unit, and the second body element comprises a keypad unit.
13. The portable device of claim 12, wherein the display unit is arranged on a bottom surface of the first body element, and the keypad unit is arranged on the second thick portion of the second body element.
14. The hinge assembly of claim 1, wherein the power transfer gear rotates in an opposite direction from the direction of the first gear and the second gear.
15. The portable device of claim 6, wherein the power transfer gear rotates in an opposite direction from the direction of the first end and the second end.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method of testing a memory array on an integrated circuit with built in self test circuitry that includes test control register circuitry and configurable state machine logic, the method comprising:
loading memory test control settings into the test control register circuitry; and
with the configurable state machine logic, performing memory tests on the memory array based on the loaded memory test control settings, wherein the memory test control settings include march element settings for a march sequence, wherein performing the memory tests comprises performing tests on the memory array with the configurable state machine logic using the march sequence, and wherein the march element settings include march element settings that specify how the configurable state machine logic is to perform a read-during-write memory cell operation when performing the tests on the memory array.
2. The method defined in claim 1 wherein the march element settings include march element settings that define a march address direction for the configurable state machine logic to use in performing the tests on the memory array.
3. The method defined in claim 1 wherein the march element settings include march element settings that define a memory array background data pattern for the configurable state machine logic to use in performing the tests on the memory array.
4. The method defined in claim 1 wherein the march element settings include march element settings that define the number of memory cell operations in each of the march elements.
5. The method defined in claim 1 wherein the march element settings include march element settings that define a march address direction for the configurable state machine logic to use in performing the tests on the memory array, and wherein the march element settings include march element settings that define a memory array background data pattern for the configurable state machine logic to use in performing the tests on the memory array.
6. The method defined in claim 1, wherein the march element settings include march element settings that define an addressing scheme for the configurable state machine logic to use in performing the tests on the memory array, and wherein the addressing scheme includes at least one of a fast-X addressing scheme and a fast-Y addressing scheme.
7. The method defined in claim 1 wherein the integrated circuit comprises a programmable integrated circuit, the method further comprising loading configuration data into programmable elements on the programmable integrated circuit to configure programmable logic on the programmable integrated circuit to implement the configurable state machine logic.
8. The method defined in claim 1 wherein the memory test control settings include march element settings that define a march LR sequence, wherein performing the memory tests comprises using the march LR sequence to perform the memory tests.
9. The method defined in claim 1 wherein performing the memory tests comprises performing at-speed memory tests at a normal clock speed.
10. The method defined in claim 1 wherein the memory array comprises a dual port memory array and wherein performing the memory tests comprises performing the memory tests on the dual port memory array.
11. The method defined in claim 1 wherein the march element settings include march element settings that define an addressing scheme for the configurable state machine logic to use in performing the memory tests on the memory array, wherein the addressing scheme includes at least one of a fast-X addressing scheme and a fast-Y addressing scheme, and wherein the march element settings define a data background pattern for the memory array that is selected from the group consisting of: a solid background, a checkerboard background, a row striped background, and a column striped background.
12. A programmable logic device integrated circuit comprising:
programmable logic;
at least one memory array; and
a built in self test circuit that tests the memory array, wherein the built in self test circuit comprises test control register circuitry and configurable state machine logic, wherein march element settings for a memory test are loaded into the test control register circuitry, wherein the configurable state machine logic receives the march element settings from the test control register circuitry and tests the memory array based on the march element settings, and wherein the march element settings include march element settings that specify how the configurable state machine logic is to perform a read-during-write memory cell operation when performing the tests on the memory array.
13. The programmable logic device integrated circuit defined in claim 12 wherein the built in self test circuit is at least partly implemented in the programmable logic.
14. The programmable logic device integrated circuit defined in claim 12 further comprising multiplexer circuitry that selectively connects the configurable state machine logic to the memory array, wherein the multiplexer circuitry receives a control signal from a tester.
15. The programmable logic device integrated circuit defined in claim 12 wherein the memory array comprises a dual port memory array having first and second ports and wherein the configurable state machine logic comprises a first configurable state machine that produces test signals for a first port based on the march element settings and second configurable state machine that produces test signals for the second port based on the march element settings.
16. Built in self test circuitry for testing a memory array on an integrated circuit comprising:
test control register circuitry that is loaded with march element settings; and
configurable state machine logic that applies test signals to the memory array in a march sequence based on the march element settings loaded into the test control register circuitry, wherein the march element settings include march element settings that specify how the configurable state machine logic is to perform a read-during-write memory cell operation when performing tests on the memory array.
17. The built in self test circuitry defined in claim 16 further comprising a scan input and a scan enable input, wherein the march element settings are loaded into the test control register circuitry over the scan input when a scan enable signal is asserted on the scan enable input.
18. The built in self test circuitry defined in claim 16, wherein the built in self test circuitry is part of a programmable logic device integrated circuit comprising programmable logic and wherein the built in self test circuitry further comprises circuitry formed from the programmable logic.