1. An imaging apparatus comprising:
imaging means configured to image an image using an imaging device;
image obtaining means configured to obtain a plurality of images equivalent to the time of dark, imaged by said imaging means;
registering means configured to register, with an image obtained by said image obtaining means, the address and change amount of a pixel where the output value of said pixel changes so as to exceed a predetermined threshold; and
correcting means configured to correct, when taking a pixel corresponding to an address registered by said registering means as a processing object pixel, the pixel value of said processing object pixel based on comparison between difference of the output values of said processing object pixel and a peripheral pixel of said processing object pixel, and the change amount of said processing object pixel.
2. The imaging apparatus according to claim 1, wherein said image obtaining means obtain a plurality of images at the time of dark, imaged by said imaging means.
3. The imaging apparatus according to claim 2, further comprising:
generating means configured to generate, with an image obtained by said image obtaining means, the pixel value of a pixel, and a statistical processing value using said pixel value in pixel units; and
detecting means configured to detect a pixel which transmits a peculiar signal based on the pixel value and the statistical processing value, generated by said generating means;
wherein said image obtaining means change a transfer gate of said imaging device to an off state to obtain a plurality of images at the time of dark;
and wherein said registering means register change amount made up of the amplitude of a pixel including said peculiar signal, and a time constant at which said peculiar signal is generated, in a manner correlated with an address for determining said pixel in pixel units where said peculiar signal detected by said detecting means has been detected, as a database.
4. The imaging apparatus according to claim 2, wherein said image obtaining means turn a transfer gate of said imaging device to an off state to obtain a plurality of images at the time of dark;
and wherein said generating means generate, with an image obtained by said image obtaining means, the pixel value of a pixel, and a statistical processing value using said pixel value in column units;
and wherein said detecting means detect a pixel transmitting a peculiar signal based on the pixel value and the statistical processing value in column units, generated by said generating means;
and wherein said registering means register the amplitude of a pixel including said peculiar signal, and a time constant at which said peculiar signal is generated in a manner correlated with an address for determining said pixel in column units where said peculiar signal detected by said detecting means has been detected, as a database.
5. The imaging apparatus according to any one of claims 2 through 4, wherein said image obtaining means obtain a plurality of images equivalent to the time of dark at the time of low temperature by said imaging means.
6. The imaging apparatus according to any one of claims 2 and 3, further comprising:
determining means configured to determine, when taking a pixel corresponding to an address registered in said database as a processing object, based on information registered in a manner correlated with an address in said database, existence of said peculiar signal based on whether or not the pixel value of said processing object pixel exceeds a predetermined threshold set to a statistical processing value, or whether or not difference between the pixel values of said adjacent pixels exceeds the amplitude registered in said database or a predetermined threshold.
7. The imaging apparatus according to claim 6, wherein said determining means determine, when taking a pixel corresponding to an address registered in said database as a processing object, existence of said peculiar signal based on whether or not the difference between the pixel values of said adjacent pixels exceeds a predetermine threshold, whether or not difference between the patterns of pixels having a predetermined positional relation corresponding to the pixel serving as said processing object exceeds a predetermined threshold, or whether or not difference between the pixels of frames or fields exceeds a predetermined threshold at the time of continuous shootings and at the time of a moving image.
8. The imaging apparatus according to claim 4, wherein said determining means determine, when taking a pixel in a column corresponding to an address registered in said database as a processing object, based on information registered in said database in a manner correlated with the address, existence of said peculiar signal based on whether or not the pixel value of the pixel in said processing object column exceed a predetermined threshold set to a statistical processing value, or whether or not the difference between the pixel values of pixels in said adjacent columns exceeds the amplitude registered in said database or a predetermined threshold.
9. The imaging apparatus according to claim 8, wherein said determining means determine, when taking a pixel in a column corresponding to an address registered in said database as a processing object, existence of said peculiar signal based on whether or not difference between the pixel values of pixels in said adjacent columns exceeds a predetermined threshold, whether or not difference between the patterns of pixels in columns having a predetermined positional relation corresponding to the pixel in the column serving as said processing object exceeds a predetermined threshold, whether or not difference between pixels in the columns of frames or fields exceeds a predetermined threshold when shooting in succession or when shooting moving images, whether or not difference between pixels of the same position in adjacent columns exceeds a predetermined threshold, whether or not difference between pixels vertically adjacent to the vertical direction of the pixels in said column exceeds a predetermined threshold, or whether or not the pattern in the vertical direction of the pixel values of the pixels in said columns greatly differs exceeding a predetermined threshold within a predetermined range.
10. The imaging apparatus according to claim 1, wherein said correcting means correct the pixel value of a pixel determined to have said peculiar signal by additionsubtraction processing using a correction value obtained by being corrected with luminance using the value of the amplitude registered in said database, replacement with the pixel value of an adjacent pixel, additionsubtraction of the output of an adjacent pixel, spatial averaging, temporal averaging, or clip processing to a predetermined value.
11. The imaging apparatus according to claim 1, wherein said correcting means correct the pixel value of a pixel in said column units determined to have said peculiar signal, or the pixel of a location where said peculiar signal occurs within said column.
12. The imaging apparatus according to claim 11, wherein said correcting means correct, based on the information registered in said database, a pixel value by complementing the pixel of said column unit determined to have said peculiar signal with an adjacent column, or by performing additionsubtraction processing using the amplitude registered in said database.
13. The imaging apparatus according to claim 11, wherein said correcting means correct, with correction as to a location where a peculiar signal occurs within said column, the pixel value of a pixel determined to have said peculiar signal by complementation with the same location as an adjacent column, additionsubtraction of the output of the same location as an adjacent column, spatial averaging, temporal averaging, clip processing to a particular value.
14. An information processing device comprising:
a database in which, in a manner correlated with an address determining a pixel where a peculiar signal has been detected, the amplitude of a pixel including said peculiar signal, and a time constant where said peculiar signal occurs are registered by said registering means according to claim 1;
determining means configured to determine, when taking a pixel corresponding to an address registered in said database as a processing object regarding an imaged image imaged by said imaging means according to claim 1, existence of said peculiar signal based on the distribution of the pixel value of a pixel having a predetermined positional relation corresponding to said processing object pixel, or difference between the pixel values of adjacent pixels; and
correcting means configured to correct the pixel value of a pixel determined to have a particular signal by said determining means.
15. An imaging method comprising the steps of:
imaging of an image using an imaging device;
obtaining of a plurality of images equivalent to the time of dark, imaged in said imaging;
registering, with an image obtained in said obtaining, of the address and change amount of a pixel where the output value of said pixel changes so as to exceed a predetermined threshold; and
correcting, when taking a pixel corresponding to an address registered in said registering as a processing object pixel, of the pixel value of said processing object pixel based on comparison between difference of the output values of said processing object pixel and a peripheral pixel of said processing object pixel, and the change amount of said processing object pixel.
16. A program causing a computer to execute processing comprising the steps of:
imaging of an image using an imaging device;
obtaining of a plurality of images equivalent to the time of dark, imaged in said imaging;
registering, with an image obtained in said obtaining, of the address and change amount of a pixel where the output value of said pixel changes so as to exceed a predetermined threshold; and
correcting, when taking a pixel corresponding to an address registered in said registering as a processing object pixel, of the pixel value of said processing object pixel based on comparison between difference of the output values of said processing object pixel and a peripheral pixel of said processing object pixel, and the change amount of said processing object pixel.
17. An electronic device comprising:
imaging means configured to image an image using an imaging device;
image obtaining means configured to obtain a plurality of images equivalent to the time of dark, imaged by said imaging means;
registering means configured to register, with an image obtained by said image obtaining means, the address and change amount of a pixel where the output value of said pixel changes so as to exceed a predetermined threshold; and
correcting means configured to correct, when taking a pixel corresponding to an address registered by said registering means as a processing object pixel, the pixel value of said processing object pixel based on comparison between difference of the output values of said processing object pixel and a peripheral pixel of said processing object pixel, and the change amount of said processing object pixel.
18. An imaging apparatus comprising:
an imaging unit configured to image an image using an imaging device;
an image obtaining unit configured to obtain a plurality of images equivalent to the time of dark, imaged by said imaging unit;
a registering unit configured to register, with an image obtained by said image obtaining unit, the address and change amount of a pixel where the output value of said pixel changes so as to exceed a predetermined threshold; and
a correcting unit configured to correct, when taking a pixel corresponding to an address registered by said registering unit as a processing object pixel, the pixel value of said processing object pixel based on comparison between difference of the output values of said processing object pixel and a peripheral pixel of said processing object pixel, and the change amount of said processing object pixel.
19. An electronic device comprising:
an imaging unit configured to image an image using an imaging device;
an image obtaining unit configured to obtain a plurality of images equivalent to the time of dark, imaged by said imaging unit;
a registering unit configured to register, with an image obtained by said image obtaining unit, the address and change amount of a pixel where the output value of said pixel changes so as to exceed a predetermined threshold; and
a correcting unit configured to correct, when taking a pixel corresponding to an address registered by said registering unit as a processing object pixel, the pixel value of said processing object pixel based on comparison between difference of the output values of said processing object pixel and a peripheral pixel of said processing object pixel, and the change amount of said processing object pixel.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method of forming a common carrier comprising the steps of:
adhering an unprocessed, integrateable form of a plurality of chips on the upper surface of a carrier substrate according to a first placement alignment precision;
lithographically processing the unprocessed, integrateable form of the plurality of chips to form a plurality of integrated chips on the upper surface, wherein the integrated chips are aligned with each other and the substrate with a second alignment precision having lithographic processing tolerances.
2. The method of forming the common carrier as described in claim 1 wherein the first alignment precision has a greater tolerance range than the lithographic processing tolerances.
3. The method of forming the common carrier as described in claim 1 wherein the first alignment precision has a tolerance in the range of +\u22121 milimeter and the second alignment precision has a tolerance in the range of less than 1 micron.
4. The method of forming the common carrier as described in claim 1 further comprising the steps of:
forming a plurality of slots within the upper surface of the carrier substrate according to the first alignment precision; and
adhering the unprocessed, integrateable form of the integrated chips within the plurality of slots.
5. The method of forming the common carrier as described in claim 4 further comprising the step of depositing a filler so as to fill a peripheral gap between the interior edges of each of the slots and the peripheral edges of each of the unprocessed, integrateable form of the integrated chips when each unprocessed chip is adhered within each slot.
6. The method of forming the common carrier as described in claim 5 further comprising the step of polishing the upper surface of the plurality of chips to be in essentially the same parallel plane as the upper surface of the carrier substrate.
7. The method of forming the common carrier as described in claim 1 further comprising the step of adhering the unprocessed, integrateable form of the integrated chips directly on the upper surface of the carrier substrate such that the upper surface of the unprocessed, integrateable chips is in a parallel, but different, plane than the upper surface of the substrate camer.
8. The method of forming the common carrier as described in claim 7 further comprising the step of lithographically processing using curtain coating deposition.
9. A method of forming a common carrier, comprising:
providing a carrier substrate;
adhering chip substrates to the carrier substrate at different respective locations across the carrier substrate, wherein alignment between the adhered chip substrates is within a first alignment tolerance range; and
lithographically processing the adhered chip substrates to form respective integrated structures on the adhered chip substrates, wherein alignment between the integrated structures respectively supported by different ones of the adhered chip substrates is within a second alignment tolerance range smaller than the first alignment tolerance range.
10. The method of claim 9, wherein the adhering comprises adhering the chip substrates to the carrier substrate with respective adhesive bonds.
11. The method of claim 9, wherein the carrier substrate, the adhesive bonds, and the integrated chips have substantially the same coefficients of thermal expansion (CTE).
12. The method of claim 11, wherein the carrier substrate and the adhesive bonds comprise the same material composition selected from polysilicon, glass, metal, and ceramic.
13. The method of claim 9, wherein the carrier substrate includes a plurality of slots, and the adhering comprises adhering ones of the chip substrates in respective ones of the slots.
14. The method of claim 13, further comprising disposing filler material in peripheral gaps between interior edges of the slots and peripheral edges of the response ones of the chip substrates in the slots.
15. The method of claim 14, wherein the filler material comprises glass frit.
16. The method of claim 14, wherein the filler material in each gap has a polished upper surface substantially coplanar with an upper surface of the carrier substrate.
17. The method of claim 13, wherein alignment between the slots of the carrier substrate is within the first alignment tolerance range.
18. The method of claim 13, wherein an upper surface of the carrier substrate and respective upper surfaces of the chip substrates are substantially coplanar.
19. The method of claim 18, wherein the integrated structures on the chip substrates are substantially non-coplanar with the upper surface of the carrier substrate.
20. The method of claim 9, wherein the integrated structure on each chip substrate comprises an electrically conductive node, and further comprising forming an interconnect electrically interconnecting ones of the electrically conductive nodes of the integrated structures.
21. The method of claim 9, wherein ones of the integrated structures are components of an inkjet printhead.
22. The method of claim 9, wherein the adhering comprises using a semiconductor chip placement tool to adhere the chip substrates to the carrier substrate with the first alignment tolerance range, and the second alignment tolerance range corresponds to a semiconductor lithographic process alignment tolerance range.
23. The method of claim 9, wherein the first alignment tolerance range is \xb11 millimeter, and the second alignment tolerance range is smaller than 1 micrometer.