1. Apparatus for providing strain relief between an electrical connector and a wiring harness having one or more wires or cables joined to contacts of the connector, comprising:
a solid plate having a length and width respectively corresponding to a length and width of the connector;
a pair of opposing, oppositely facing U-shaped structures respectively disposed at opposite sides of the plate, the structures depending from a front edge of the plate and perpendicularly to a plane thereof, each of the U-shaped structures including a pair of parallel, inwardly directed, front and rear flanges spaced apart so as to receive a corresponding mounting flange of the connector therebetween; and,
an elongated member coplanar with and extending rearward from a rear edge of the plate, the member being located so as to overlie a potion of the harness extending rearward from the connector in a generally parallel relationship.
2. The apparatus of claim 1, wherein an intersection between the plate and the elongated member defines a radius on opposite sides of the member.
3. The apparatus of claim 1, wherein the connector is a D-sub connector.
4. The apparatus of claim 1, wherein each connector mounting flange contains an aperture for a fastener, and wherein each of the front and rear flanges of each U-shaped structure includes a slot that is aligned with a corresponding one of the apertures when the corresponding connector flange is disposed therebetween.
5. The apparatus of claim 4, wherein the slot of the front flange of each U-shaped structure is larger than the slot of the rear flange thereof.
6. The apparatus of claim 1, wherein at least one of the plate, the U-shaped structures and the elongated member is stamped from a metal sheet.
7. The apparatus of claim 4, wherein the plate, the U-shaped structures and the elongated member are formed integral to each other.
8. The apparatus of claim 7, wherein the plate, the U-shaped structures and the elongated member are die stamped from a metal sheet.
9. The apparatus of claim 1, wherein the elongated member includes a pair of notches in opposite sides and adjacent to a distal end thereof.
10. The apparatus of claim 1, further comprising a protective coating on an exterior surface thereof.
11. A method for providing strain relief between an electrical connector and a wiring harness having one or more wires or cables joined to contacts of the connector, the method comprising:
providing a strain relief apparatus in accordance with claim 1;
disposing the apparatus on the connector such that the plate of the apparatus overlies the connector, the front and rear flanges of each U-shaped structure are respectively disposed in front of and behind a corresponding mounting flange of the connector, and the elongated member overlies a portion of the harness extending rearward from the connector in a generally parallel relationship;
holding a front surface of the rear flange of each U-shaped structure against a rear surface of the corresponding connector mounting flange; and,
cinching a portion of the harness extending rearward from the connector to a distal end portion of the elongated member of the apparatus.
12. A wiring harness, comprising:
an electrical connector having a pair of mounting flanges disposed on opposite sides thereof;
a bundle of wires respectively connected to contacts of the connector;
a strain relief apparatus comprising a solid plate having an elongated member extending rear-ward from the plate and two-U shaped structures disposed on opposite sides thereof, each opposing, oppositely facing U-shaped structure having a front flange and a rear flange, the apparatus being disposed on the connector such that the plate overlies the connector, the front and rear flanges of each U-shaped structure are respectively disposed in front of and behind a corresponding one of the connector mounting flanges, and the elongated member overlies a portion of the harness extending rearward from the connector in a generally parallel relationship;
means for holding a front surface of the rear flange of each U-shaped structure to a rear surface of the corresponding connector mounting flange; and,
means for cinching a portion of the bundle of wires extending rearward from the connector to a distal end portion of the elongated member of the apparatus.
13. Apparatus for providing strain relief between an electrical connector having mounting flanges on opposite sides thereof and a wiring harness having one or more wires or cables joined to contacts of the connector, comprising:
a solid T-shaped plate having an axial member and a transverse member; and,
a pair of inwardly facing, U-shaped structures disposed in opposition to each other at opposite ends of the transverse portion and extending at a right angle to the plate from a front edge thereof, each of the U-shaped structures including a pair of parallel front and rear flanges spaced apart so as to straddle a corresponding mounting flange of the connector.
14. The apparatus of claim 13, wherein the connector is a D-sub connector.
15. The apparatus of claim 13, wherein:
each connector mounting flange contains an aperture for a fastener;
each of the front and rear flanges of each of the U-shaped structures includes a U-shaped slot that is aligned with a corresponding one of the apertures when a corresponding connector flange is disposed between the flanges; and,
the slot of the front flange of each of the U-shaped structures is larger than the slot of the rear flange thereof.
16. The apparatus of claim 15, further comprising a fastener extending through a connector flange aperture and a corresponding apparatus rear flange slot and captivated therein so as to hold a front surface of the rear flange against a rear surface of the connector flange.
17. The apparatus of claim 13, wherein an intersection between the axial and the transverse members of the plate forms a radius on opposite sides of the axial member.
18. The apparatus of claim 13, wherein the elongated member includes a pair of notches in opposite sides and adjacent to a distal end thereof.
19. A method for providing strain relief between an electrical connector having mounting flanges with a fastening aperture on opposite sides thereof and a wiring harness having one or more wires or cables joined to contacts of the connector, the method comprising:
providing a strain relief apparatus, comprising
a solid T-shaped plate having an axial member, a transverse member, and a pair of inwardly facing, U-shaped structures disposed in opposition to each other at opposite ends of the transverse member and extending at a right angle to the plate from a front edge thereof,
each of the U-shaped structures including a pair of parallel front and rear flanges spaced apart so as to straddle a corresponding mounting flange of the connector,
each of the front and rear flanges including a U-shaped slot that is aligned with a corresponding fastening aperture when a corresponding connector flange is disposed between the flanges, and
the slot of the front flange of each of the U-shaped structures being larger than the slot of the rear flange thereof;
disposing the apparatus on the connector such that:
the transverse member of the apparatus overlies the connector,
the U-shaped structures respectively straddle a corresponding mounting flange of the connector, and
a distal end portion of the axial member of the plate overlies a portion of the harness extending rearward from the connector in a generally parallel relationship;
inserting a fastener through each of the connector flange apertures and corresponding apparatus rear flange slots;
captivating the fasteners in the respective connector flange apertures and corresponding apparatus rear flange slots such that a front surface of the rear flange is held against a rear surface of the corresponding connector flange; and,
cinching the portion of the harness extending rearward from the connector to the distal end portion of the axial member of the apparatus.
20. A wiring harness having strain relief provided between an electrical connector and one or more wires or cables joined to contacts of the connector in accordance with the method of claim 19.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for analyzing a film structure, the method comprising:
fitting a simulated X-ray scattering curve obtained by simulation calculation to a measured X-ray scattering intensity curve obtained by emitting X-rays onto a surface of a film specimen having a single layer or multi-layer structure at an angle in a vicinity of a critical angle to the surface, by varying at least one parameter characterizing a physical property of the film specimen; and
obtaining optimum values of parameters providing a minimum difference between the measured X-ray scattering intensity curve and the simulated X-ray scattering curve, so as to determine the structure of the film specimen, wherein
plurality of combinations of incident angle and outgoing angle to the surface of the film specimen are set such that there is no correlation between the incident angle and the outgoing angle, and the measured X-ray scattering intensity curve is obtained by measuring an X-ray intensity for each of the respective combinations of incident angle and outgoing angle.
2. A method for analyzing a film structure, the method comprising:
fitting a simulated X-ray scattering curve obtained by simulation calculation to a measured X-ray scattering intensity curve obtained by emitting X-rays onto a surface of a film specimen having a single layer or multi-layer structure at an angle in a vicinity of a critical angle to the surface, by varying at least one parameter characterizing a physical property of the film specimen; and
obtaining optimum values of parameters providing a minimum difference between the measured X-ray scattering intensity curve and the simulated X-ray scattering curve, so as to determine the structure of the film specimen, wherein
the measured X-ray scattering intensity curve is obtained by at least two kinds of measurements selected from among offset scan measurement, rocking scan measurement and detector scan measurement.
3. The method for analyzing a film structure as claimed in claim 2, wherein the simulated X-ray scattering curve is obtained by simulation calculation and by varying parameters relating to interface roughness of the surface of the film specimen and pore size inside the film specimen and is fitted to the measured X-ray scattering intensity curve that is obtained by the offset scan measurement, and the optimum values of the parameters providing the minimum difference between the measured X-ray scattering intensity curve and the simulated X-ray scattering curve are obtained, so as to determine the structure of the film specimen.
4. An apparatus for analyzing a film structure, the apparatus comprising:
means for fitting a simulated X-ray scattering curve obtained by simulation calculation to a measured X-ray scattering intensity curve obtained by emitting an X-ray onto a surface of a film specimen having a single layer or multi-layer structure at an angle in a vicinity of a critical angle to the surface, by varying at least one parameter characterizing a physical property of the film specimen; and
means for obtaining optimum values of parameters providing a minimum difference between the measured X-ray scattering intensity curve and the simulated X-ray scattering curve, so as to determine the structure of the film specimen, wherein
plurality of combinations of incident angle and outgoing angle to the surface of the film specimen are set such that there is no correlation between the incident angle and the outgoing angle, and the measured X-ray scattering intensity curve is obtained by measuring an X-ray intensity for each of the respective combinations of incident angle and outgoing angle.
5. An apparatus for analyzing a film structure, the apparatus comprising:
means for fitting a simulated X-ray scattering curve obtained by simulation calculation to a measured X-ray scattering intensity curve obtained by emitting an X-ray onto a surface of a film specimen having a single layer or multi-layer structure at an angle in a vicinity of a critical angle to the surface, by varying at least one parameter characterizing a physical property of the film specimen; and
means for obtaining optimum values of parameters providing a minimum difference between the measured X-ray scattering intensity curve and the simulated X-ray scattering curve, so as to determine the structure of the film specimen, wherein
the measured X-ray scattering intensity curve is obtained by at least two kinds of measurements selected from offset scan measurement, rocking scan measurement and detector scan measurement.
6. The apparatus for analyzing a film structure as claimed in claim 5, wherein the simulated X-ray scattering curve is obtained by simulation calculation and by varying parameters relating to interface roughness of the surface of the film specimen and pore size inside the film specimen and is fitted to the measured X-ray scattering intensity curve that is obtained by the offset scan measurement, and the optimum values of the parameters providing the minimum difference between the measured X-ray scattering intensity curve and the simulated X-ray scattering curve are obtained, so as to determine the structure of the film specimen.