1. A gateway for a fax on Internet protocol (FoIP), the gateway comprising:
a first protocol process unit transmitting and receiving an H.323 call setup data;
a second protocol process unit generating status information on a fax data based on the fax data transmitted and received between gateways by using a real-time transport protocol;
a third protocol process unit receiving the status information for analyzing the status of a network and selecting a method for controlling errors; and
a connection unit converting a predetermined protocol data for the FoIP including the H.323 call setup data into a data architecture appropriate to a packet switching network for transmitting and receiving the converted data to and from the packet switching network.
2. The gateway for an FoIP of claim 1, wherein the third protocol process unit further includes a fourth protocol process unit performing conversion between a T.30 data processed by a T.30 protocol and a T.38 data processed by a T.38 protocol.
3. The gateway for an FoIP of claim 1, wherein the connection unit converts a predetermined protocol data for the FoIP into a data architecture formed by at least one protocol of a transmission control protocol (TCP) or a user datagram protocol (UDP).
4. The gateway for an FoIP of claim 3, wherein the connection unit converts the data architecture into a data architecture appropriate to the Internet.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. Device for measuring the reflection factor comprising:
at least one light emitting part from which light with a certain wavelength and directional capacity is emitted to irradiate a surface of a measurement area of a microchip which is to be measured with emitted light, and
at least one light receiving part which receives light reflected from the measurement area for determination of the reflection factor of the measurement area,
wherein a transparent component is located on the measurement area of the microchip,
wherein the light emitting part is located directly above the measurement area,
wherein the surface irradiated by the light emitting part lies within the measurement area, and
wherein the light receiving part is located in an angular region \u03b8 (in \xb0) which is located between angles \u03b8min and \u03b8max, \u03b8min and \u03b8max (in \xb0) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein \u03b8min is 12\u03b1 and \u03b8max corresponds to sin-1(1n), where \u03b1 (\xb0) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component, and in which the relationship (12)\u03b1\u2266\u03b8\u2266 sin-1(1n) is satisfied.
2. Device for measuring the reflection factor as claimed in claim 1, wherein in the microchip there are several areas to be measured and there is a light emitting part per measurement area, which part is located directly above the respective measurement area, and there is one light receiving part which receives light reflected from all of measurement areas and which selectively receives light from one of the measurement areas at a time.
3. Device for measuring the reflection factor as claimed in claim 1; wherein in the microchip there are several measurement areas and there is a light emitting part per measurement area, which part is located directly above the respective measurement area, and a respective light receiving part for receiving light reflected from a respective one of the measurement areas.
4. Device for measuring the reflection factor as claimed in claim 3, wherein there is a focusing lens on a light incidence side of each of the light receiving parts.