What is claimed is:
1. A semiconductor device having a lead electrode connected to a lead, a case electrode having a projection part around its periphery, and a semiconductor chip having a rectification function and connected electrically between said lead electrode and said case electrode through connection members, wherein an electrically conductive plate is provided between said semiconductor chip and said lead electrode.
2. A semiconductor device according to claim 1, wherein the coefficient of linear expansion of said electrically conductive plate is smaller than that of said case electrode and also is equal to or larger than 50% of that of said semiconductor chip.
3. A semiconductor according to claim 1, wherein the strength of said electrically conductive plate is larger than that of said case electrode.
4. A semiconductor device according to claim 1, wherein said case electrode has a layer structure having a metal containing copper through a metal containing iron.
5. A semiconductor device according to claim 1, wherein said electrically conductive plate has a layer structure of copper-iron alloy-copper, and the iron alloy containing a 30% to 50% with Ni remainder Fe or a 20% to 40% Ni-50% to 60% with Fe remainder Co.
6. A semiconductor device according to claim 1, wherein said electrically conductive plate is made of an iron alloy containing a 30% to 50% with Ni remainder Fe or a 20% to 40% Ni-50% to 60% with Fe remainder Co.
7. A semiconductor device according to claim 1, wherein said electrically conductive plate is an electrically conductive plate made of Mo as a main constituent element and having a thickness equal to or larger than 100% of that of said semiconductor chip.
8. A semiconductor device according to claim 1, wherein said electrically conductive plate is an electrically conductive plate made of W as a main constituent element and having a thickness equal to or larger than 100% of that of said semiconductor chip.
9. A semiconductor device having a lead electrode connected to a lead, a case electrode having a projection part around its periphery, and a semiconductor chip having a rectification function and connected electrically between said lead electrode and said case electrode through connection members, wherein an electrically conductive plate is provided between said semiconductor chip and said lead electrode, and a width of said electrically conductive plate is equal to or smaller than 90% and equal to or larger than 50% of that of said semiconductor chip.
10. A semiconductor device having a lead electrode connected to a lead, a case electrode having a projection part around its periphery, and a semiconductor chip having a rectification function and connected electrically between said lead electrode and said case electrode through a solder, wherein an electrically conductive plate is provided between said semiconductor chip and said lead electrode, no electrically conductive plate is provided between said semiconductor chip and said case electrode, and each width of said lead electrode and said electrically conductive plate is smaller than that of said semiconductor chip, and the solder between said semiconductor chip and said electrically conductive plate is formed in such a way that a width of the side end of said semiconductor chip is smaller than that of the side end of said electrically conductive plate.
11. A semiconductor device having a lead electrode connected to a lead, a case electrode having a projection part around its periphery, and a semiconductor chip having a rectification function and connected electrically between said lead electrode and said case electrode through a solder, wherein an electrically conductive plate is provided between said semiconductor chip and said lead terminal, no electrically conductive plate is provided between said semiconductor chip and said case electrode, and each width of said lead electrode and said electrically conductive plate is smaller than that of said semiconductor chip, and the solder between said semiconductor chip and said electrically conductive plate is formed in such a way that a width of the side end of said electrically conductive plate is smaller than that of the side end of said semiconductor chip, and the solder between said semiconductor chip and said case electrode is formed in such a way that a width of the side end of said semiconductor chip is smaller than that of the side end of said case electrode.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for assessing the likelihood a human female subject will develop LUTS comprising detecting the level of one or more biomarkers in a sample, wherein the level of the one or more biomarkers is indicative of likelihood of developing LUTS, and wherein the biomarkers are one or more biomarkers selected from the list consisting of: hbegf, IL-6, ngf, IL-10, Gro, SCD40L, MCP-1, IL-3, IP-10, IL-12, MCP 3, and MIP-1b.
2-4. (canceled)
5. The method of claim 1, wherein:
(i) the level of one or more biomarkers is increased in a subject with a higher likelihood of developing LUTS; andor
(ii) the level of one or more biomarkers is decreased in a subject with a higher likelihood of developing LUTS.
6-8. (canceled)
9. The method of claim 8, wherein the subject suffers from pelvic organ prolapse (POP).
10. The method of claim 9, wherein the subject suffers from cystocele, rectocele, enterocele, sigmoidocele, urethrocele, or uterine prolapse.
11. (canceled)
12. The method of claim 11, wherein said treatment comprises surgery.
13. The method of claim 12, wherein said surgery comprises pelvic floor reconstruction.
14. (canceled)
15. The method of claim 1, wherein the biomarkers are one or more of HBEGF, MCP-1 and MIP-1b.
16. The method of claim 1, wherein biomarkers are detected by measuring protein levels.
17. The method of claim 1, wherein the level of the biomarkers are differentially weighted to determine the likelihood of developing LUTS
18. The method of claim 1, wherein LUTS comprises urinary urgency, urinary frequency, andor urinary incontinence.
19. A method of determining a treatment course for a subject suffering from pelvic organ prolapse (POP) with concomitant lower urinary tract symptoms (LUTS):
(a) assessing the likelihood that LUTS will persist after surgical treatment of POP based on the level of one or more biomarkers in a sample from the subject;
(b) selecting a suitable treatment course for the subject, wherein:
(i) surgery alone is indicated if the likelihood that LUTS will persist after surgical treatment of POP is low; and
(ii) medical treatment for LUTS with or without surgery for POP is indicated if the likelihood that LUTS will persist after surgical treatment of POP is high.
20. The method of claim 19, wherein the level of one or more biomarkers in a sample is assessed by providing a testing lab with a sample from the subject and receiving results of a test for the biomarkers from the testing lab.
21. (canceled)
22. The method of claim 20, wherein the results comprise a risk profile calculated based on the level of said biomarkers.
23. The method of claim 19, further comprising obtaining a sample from the subject.
24. The method of claim 19, further comprising implementing the selected treatment course.
25. A method for assessing the likelihood that the subject from which a sample was obtained will develop LUTS, comprising:
(a) receiving the sample obtained from the subject;
(b) quantitating the levels of a plurality of biomarkers indicative of the likelihood that a subject will develop LUTS; and
(c) generating a LUTS risk profile based on the levels of a plurality of biomarkers.
26. (canceled)
27. The method of claim 26, wherein the level of the biomarkers are differentially weighted to determine the LUTS risk profile.
28. (canceled)
29. The method of claim 25, further comprising:
(d) generating a report indicating the likelihood of developing LUTS of the subject from which the sample was obtained.
30. The method of claim 25, wherein the likelihood that the subject from which a sample was obtained will develop LUTS comprises the likelihood that LUTS will persist after surgical treatment of POP.
31. A kit for assessing the likelihood of LUTS comprising reagents for detecting the level of a plurality of biomarkers selected from the list consisting of: hbegf, IL-6, ngf, IL-10, Gro, SCD40L, MCP-1, IL-3, IP-10, IL-12, MCP 3, and MIP-1b.
32-35. (canceled)