1. A method of fabricating a semiconductor device comprising:
providing a semiconductor substrate;
forming a high-k dielectric layer over the substrate;
forming a semiconductor layer over the high-k dielectric layer;
removing a portion of the semiconductor layer such that the semiconductor layer in a first region has a first thickness and the semiconductor layer in a second region has a second thickness less than the first thickness;
forming a hard mask layer over the semiconductor layer;
patterning the hard mask layer, semiconductor layer, and high-k dielectric layer to form a first gate structure in the first region and a second gate structure in the second region;
forming an interlayer dielectric (ILD) over the first and second gate structures;
performing a first chemical mechanical polishing (CMP) on the ILD that substantially stops at the semiconductor layer of the first gate structure;
removing the semiconductor layer from the first gate structure thereby forming a first trench, wherein the hard mask layer of the second gate structure protects the semiconductor layer of the second gate structure;
forming a first metal layer to fill in the first trench;
removing the hard mask layer and semiconductor layer from the second gate structure thereby forming a second trench; and
forming a second metal layer to fill in the second trench.
2. The method of claim 1, wherein the forming the first metal layer includes:
depositing a first metal material over the substrate substantially filling in the first trench; and
performing a second CMP to remove the first metal material outside of the first trench.
3. The method of claim 2, wherein the forming the second metal layer includes:
depositing a second metal material over the substrate substantially filling in the second trench; and
performing a third CMP to remove the second metal material outside of the second trench.
4. The method of claim 1, wherein the first metal layer includes a metal having a first type of work function.
5. The method of claim 4, wherein the second metal layer includes a metal having a second type of work function different from the first type of work function.
6. The method of claim 5, wherein the metal having the first type of work function is an N-metal and the first gate structure is part of an nMOS device; and
wherein the metal having the second type of work function is a P-metal and the second gate structure is part of pMOS device.
7. The method of claim 5, wherein the metal having the first type of work function is an P-metal and the first gate structure is part of an pMOS device; and
wherein the metal having the second type of work function is an N-metal and the second gate structure is part of nMOS device.
8. The method of claim 1, wherein the semiconductor layer includes a polysilicon.
9. The method of claim 1, further comprising:
forming an interfacial layer on the substrate prior to forming the high-k dielectric layer; and
forming a barrier layer on the high-k dielectric layer prior to forming the semiconductor layer;
wherein the high-k dielectric layer is formed on the interfacial layer;
wherein the semiconductor layer is formed on the barrier layer.
10. The method of claim 1, wherein the removing a portion of the semiconductor layer includes:
forming a patterned photoresist layer to protect the semiconductor layer in the first region; and
etching the unprotected semiconductor layer in the second region from the first thickness to the second thickness.
11. A method of fabricating a semiconductor device comprising:
providing a semiconductor substrate;
forming a high-k dielectric layer over the substrate;
forming a barrier layer over the high-k dielectric layer;
forming a silicon layer over the barrier layer;
partially etching the silicon layer such that the silicon layer in a first region has a first thickness and the silicon layer in a second region has a second thickness less than the first thickness;
forming a hard mask layer over the partially etched silicon layer;
forming a first gate structure in the first region and a second gate structure in the second region, the first gate structure including the silicon layer having the first thickness and the second gate structure including the silicon layer having the second thickness;
forming an interlayer dielectric (ILD) over the first and second gate structures;
performing a chemical mechanical polishing (CMP) on the ILD that substantially stops at the silicon layer of the first gate structure, the CMP removing a portion of the hard mask layer of the second gate structure;
removing the silicon layer from the first gate structure thereby forming a first trench;
forming a first metal layer to fill in the first trench;
removing the remaining portion of the hard mask layer and the silicon layer from the second gate structure thereby forming a second trench; and
forming a second metal layer to fill in the second trench.
12. The method of claim 11, wherein the first metal layer is formed of a metal having a first type of work function and the second metal layer is formed of a metal having a second type of work function different from the first type of work function.
13. The method of claim 12, wherein the first gate structure is part of a pMOS device and the second gate structure is part of an nMOS device.
14. The method of claim 12, wherein the first gate structure is part of an nMOS device and the second gate structure is part of a pMOS device.
15. The method of claim 11, wherein a difference between the first thickness and the second thickness ranges from about 300 to about 400 angstrom (A).
16. A method for fabricating a semiconductor device, the method comprising:
providing a semiconductor substrate having a first region and a second region;
forming a first gate structure over the first region and a second gate structure over the second region, the first and second gate structures each including a high-k dielectric layer formed over the substrate, a silicon layer formed over the high-k dielectric layer, and a hard mask layer formed over the silicon layer, wherein the silicon layer of the first gate structure has a first thickness and the silicon layer of the second gate structure has a second thickness less than the first thickness;
forming an interlayer dielectric (ILD) over the first and second gate structures;
performing a chemical mechanical polishing (CMP) on the ILD that exposes the silicon layer of the first gate structure;
removing the silicon layer from the first gate structure thereby forming a first trench, wherein the hard mask layer of the second gate structure protects the silicon layer of the second gate structure from being removed;
forming a first metal layer to fill in the first trench;
removing the hard mask layer and the silicon layer from the second gate structure thereby forming a second trench; and
forming a second metal layer to fill in the second trench.
17. The method of claim 16, wherein the forming the first gate structure and the second gate structure includes:
forming the high-k dielectric layer over the substrate;
forming the silicon layer over the high-k dielectric layer;
forming a patterned photoresist layer to protect the silicon layer in the first region;
etching a portion of the silicon layer in the second region;
removing the patterned photoresist layer;
forming the hard mask layer over the silicon layer;
patterning the hard mask layer, silicon layer, and high-k dielectric layer to form the first gate structure in the first region and the second gate structure in the second region;
18. The method of claim 16, wherein a difference between the first thickness and the second thickness ranges from about 300 to about 400 angstrom (A).
19. The method of claim 16, wherein the first metal layer includes a P-type work function metal and the second metal layer includes an N-type work function metal.
20. The method of claim 16, wherein the first metal layer includes an N-type work function metal and the second metal layer includes a P-type work function metal.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A computer implemented method for corporate data analysis, comprising:
receiving a set of data, the set of data including information about a corporation; and
transforming the set of data into a graph representation, the graph representation including nodes whose properties are based on the set of data.
2. The method of claim 1, wherein the graphical representation includes at least one visible organizational anomaly.
3. The method of claim 1, wherein the set of data includes information about employee reporting relationships.
4. The method of claim 3, wherein the graphical representation includes nodes representing employees and the sizes of the nodes are based on the number of direct reports the employees have.
5. The method of claim 1, wherein the set of data includes information about keywords associated with employees.
6. The method of claim 5, wherein the graphical representation includes a set of nodes representing keywords and the sizes of the nodes are based on frequencies of appearances associated with the keywords.
7. The method of claim 1, wherein the graphical representation includes multi-layer corporate information.
8. The method of claim 7, wherein the multi-layer corporate information includes employee reporting information and employee keywords information.
9. The method of claim 1, wherein the set of data may be retrieved from an internal corporate system.
10. The method of claim 1, wherein the graphical representation represents a subset of the set of data.
11. The method of claim 1, further comprising receiving one or more user inputs for a particular graphical representation prior to transforming the set of data into the graphical representation.
12. The method of claim 11, further comprising processing the set of data based on the one or more user inputs.
13. A computer program product, tangibly embodied in a machine-readable storage device, the computer program product being operable to cause data processing apparatus to perform operations comprising:
receiving a set of data, the set of data including information about a corporation; and
transforming the set of data into a graph representation, which can be translated into graphical representation including nodes whose properties are based on the set of data.
14. The product of claim 13, wherein the graphical representation includes at least one visible organizational anomaly.
15. The product of claim 13, wherein the set of data includes information about employee reporting relationships.
16. The product of claim 15, wherein the graphical representation includes nodes representing employees and the sizes of the nodes are based on the number of direct reports the employees have.
17. The product of claim 13, wherein the set of data includes information about keywords associated with employees.
18. The product of claim 17, wherein the graphical representation includes a set of nodes representing keywords and the sizes of the nodes are based on frequencies of appearances associated with the keywords.
19. The product of claim 13, wherein the graphical representation includes multi-layer corporate information.
20. The product of claim 19, wherein the multi-layer corporate information includes employee reporting information and employee keywords information.
21. The product of claim 13, wherein the set of data may be retrieved from an internal corporate system.
22. The product of claim 13, wherein the graphical representation represents a subset of the set of data.
23. The product of claim 13, further comprising receiving one or more user inputs for a particular graphical representation prior to transforming the set of data into the graphical representation.
24. The product of claim 23, further comprising processing the set of data based on the one or more user inputs.