1461144359-600d531c-41e2-48a5-9318-d5e161030d3d

1. An anti-theft device for a portable device, wherein the portable device includes an aperture, the anti-theft device comprising:
a coupler, including:
a bridge portion including a through hole, wherein a plurality of indentations are distributed around the through hole, the through hole corresponds to the aperture of the portable device; and
a leg extending from the bridge portion;

an engagingdisengaging device including an engaging mechanism, wherein the engaging mechanism passes through the through hole of the coupler to mechanically engage with the aperture and to position the leg and the bridge portion of the coupler on two adjacent sides of the portable device; and
a localizer for coupling the engagingdisengaging device with an immovable object, wherein the localizer limits the engagingdisengaging device to be mechanically engaged with the aperture.
2. The anti-theft device of claim 1, wherein the leg of the coupler has an elongated flat shape or a cylindrical shape.
3. The anti-theft device of claim 1, wherein the engagingdisengaging device has a plurality of matching indentations corresponding to the indentations of the coupler, so that the engagingdisengaging device is fitted into the through hole of the coupler.
4. The anti-theft device of claim 1, wherein the engagingdisengaging device includes a localizer aperture on a side opposite to the engaging mechanism for the localizer to pass through.
5. The anti-theft device of claim 1, wherein the aperture of the portable device includes a security aperture, a threaded aperture, or a USB receptacle, the engaging mechanism has a structure including a hook, a screw, or a USB connector with respect to the aperture of the portable device.
6. The anti-theft device of claim 5, wherein when the aperture of the portable device includes the threaded aperture, the engaging mechanism includes the screw rotatably driven to be engaged with or disengaged from the threaded aperture of the portable device.
7. The anti-theft device of claim 6, wherein the engaging mechanism includes a rotary member for rotatably driving the screw.
8. The anti-theft device of claim 1, wherein the engagingdisengaging device includes a push-pull switch and a casing, a part of the push-pull switch is disposed to selectively be pushed toward the casing to position the engaging mechanism into an engaging position and be pulled away from the casing to position the engaging mechanism into a disengaging position.
9. The anti-theft device of claim 8, wherein the push-pull switch and the casing each has at least a localizer aperture, when the push-pull switch is pushed toward the casing, the localizer aperture of the casing and the localizer aperture of the push-pull switch are aligned to allow the localizer to pass through to position the engaging mechanism into the engaging position.
10. The anti-theft device of claim 8, wherein the engagingdisengaging device includes a combination lock for fixing the position of the push-pull switch.
11. The anti-theft device of claim 1, wherein the localizer includes a cable lock system, a padlock, or a combination thereof.
12. The anti-theft device of claim 1, further comprising a coupling disc for coupling the coupler with the engagingdisengaging device.
13. The anti-theft device of claim 12, wherein the coupler is rotatably coupled with the coupling disc so that the leg of the coupler is rotatably moved to restrain the portable device in a folded configuration.
14. The anti-theft device of claim 13, wherein the coupling disc includes an insertion aperture and at least one wedging member disposed on a side of the coupling disc, the insertion aperture corresponds to the through hole of the coupler, the wedging member is wedged into the through hole so that the engaging mechanism passes through the insertion aperture and the through hole to mechanically engage with the aperture of the portable device.
15. The anti-theft device of claim 14, wherein the at least one wedging member is flexibly disposed around the insertion aperture.
16. The anti-theft device of claim 14, the wedging member includes a convex extending away from a centre axis of the coupling disc, the convex contacts one of the indentations in the through hole when the wedging member is wedged into the through hole.
17. The anti-theft device of claim 16, wherein when the coupler rotates with respect to the coupling disc, the indentation of the coupler pushes the convex toward a centre axis of the coupling disc by bending a part of the wedging member.
18. The anti-theft device of claim 17, wherein the convex moves from the one indentation to a different indentation to position the leg at a desired position so that the portable device is restrained to the folded configuration.
19. The anti-theft device of claim 1, wherein the localizer includes a cable, a padlock, a combination lock, and a combination thereof.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A method of ranking fault-test pairs in a mutation-based test programs evaluation system wherein the test programs are used to verify a design code, the method comprising:
obtaining a first plurality of waveform statistics, wherein each of the first plurality of waveform statistics comprises first value-change information regarding variations in logic HIGH and logic LOW for each bit of each reference output resulting from a test run of the design code;
obtaining a second plurality of waveform statistics, wherein each of the second plurality of waveform statistics comprises second value-change information regarding variations in logic HIGH and logic LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault;
obtaining relative differences between the first plurality of waveform statistics and the second plurality of waveform statistics for each bit of each faulty output with respect to the corresponding reference output;
obtaining waveform differences in response to the relative differences for each signal of each faulty output; and
determining a ranking of fault-test pairs in response to the waveform differences of the faulty outputs.
2. The method as claimed in claim 1, wherein the first value-change information comprises a first value-change count representing a number of value changes for each bit of each reference output, and the second value-change information comprises a second value-change count representing a number of value changes for each bit of each faulty output.
3. The method as claimed in claim 2, wherein the first value-change information further comprises a first mean and a first standard deviation of durations of logic HIGH and logic LOW for each bit of each reference output, and the second value-change information further comprises a second mean and a second standard deviation of durations of logic HIGH and logic LOW for each bit of each faulty output.
4. The method as claimed in claim 3, wherein the first value-change information further comprises a tempo list and a first tempo occurrence ratio of durations of logic HIGH and logic LOW for each bit of each reference output, and the second value-change information further comprises a second tempo occurrence ratio of durations of logic HIGH and logic LOW corresponding to the tempo list of the first value-change information for each bit of each faulty output.
5. The method as claimed in claim 4, wherein the step of obtaining the relative differences between the first plurality of waveform statistics and the second plurality of waveform statistics for each bit of each faulty output with respect to the corresponding reference output further comprises:
obtaining a relative difference in the value-change count according to the first and second value-change counts for each bit in the faulty output with respect to the corresponding bit in the reference output;
obtaining a relative difference in the mean according to the first and second means of durations of logic HIGH and logic LOW for each bit in the faulty output with respect to the corresponding bit in the reference output;
obtaining a relative difference in the standard deviation according to the first and second standard deviations of durations of logic HIGH and logic LOW for each bit in the faulty output with respect to the corresponding bit in the reference output; and
obtaining a relative difference in the tempo occurrence ratio according to the first and second tempo occurrence ratios for each bit in the faulty output with respect to the corresponding bit in the reference output.
6. The method as claimed in claim 5, wherein the relative difference in the value-change count is
\uf603
VC
\ue8a0

(
s
)
–

VC
\ue8a0

(
r
)
\uf604
VC
\ue8a0

(
r
)
,
the relative difference in the mean is
\uf603
M
\ue8a0

(
s
)
–

M
\ue8a0

(
r
)
\uf604
M
\ue8a0

(
r
)
,
the relative difference in the standard deviation is
\uf603
SD
\ue8a0

(
s
)
–

SD
\ue8a0

(
r
)
\uf604
SD
\ue8a0

(
r
)
,
and the relative difference in the tempo occurrence ratio is
\uf603
T
\ue8a0

(

s
,
r

)
–

T
\ue8a0

(
r
)
\uf604
T
\ue8a0

(
r
)
,
wherein VC(r) and VC(s) respectively represent the first and second value-change counts, M(r) and M(s) respectively represent the first and second means, SD(r) and SD(s) respectively represent the first and second standard deviations, and T(r) and T(s,r) respectively represent the first and second tempo occurrence ratios.
7. The method as claimed in claim 5, wherein the step of obtaining the relative differences between the first plurality of waveform statistics and the second plurality of waveform statistics for each bit of each faulty output with respect to the corresponding reference output further comprises:
determining a minimum difference and a maximum difference among the relative differences in the value-change count, the mean, the standard deviation and the tempo occurrence ratio, respectively; and
normalizing each of the relative differences according to the minimum difference and the maximum difference of the relative differences in the value-change count, the mean, the standard deviation, and the tempo occurrence ratio, respectively.
8. The method as claimed in claim 7, wherein the relative difference is normalized by the following formula:
V
–
min
max
–
min
,
wherein V represents the relative difference, and min and max represent the minimum difference and the maximum difference of the relative differences in the value-change count, the mean, the standard deviation or the tempo occurrence ratio.
9. The method as claimed in claim 5, wherein the step of obtaining the relative differences according to the first plurality of waveform statistics and the second plurality of waveform statistics for each bit of each faulty output with respect to the corresponding reference output further comprises:
determining a minimum difference and a maximum difference among the relative differences on the same bit in the value-change count, the mean, the standard deviation, and the tempo occurrence ratio, respectively; and
normalizing each of the relative differences according to the minimum difference and the maximum difference of the relative differences on the same bit in the value-change count, the mean, the standard deviation and the tempo occurrence ratio, respectively.
10. The method as claimed in claim 9, wherein the relative difference is normalized by the following expression:
V
–
min
max
–
min
,
wherein V represents the relative difference, and min and max represent the minimum difference and the maximum difference of the relative differences on the same bit in the value-change count, the mean, the standard deviation, or the tempo occurrence ratio.
11. The method as claimed in claim 5, wherein the step of obtaining the waveform difference according to the relative differences for each signal of each faulty output further comprises:
weighting the relative differences in the value-change count, the mean, the standard deviation and the tempo occurrence ratio, respectively;
summing the weighted relative differences for each signal of each faulty output; and
summing the summed relative differences to obtain the waveform difference for each faulty output.
12. The method as claimed in claim 11, wherein the step of weighting the relative differences in the value-change count, the mean, the standard deviation, and the tempo occurrence ratio, respectively, further comprises:
assigning a first weight to the relative differences in the value-change count;
assigning a second weight to the relative differences in the mean and the standard deviation, respectively; and
assigning a third weight to the relative differences in the tempo occurrence ratio,
wherein the third weight is larger than the first weight, and the first weight is larger than the second weight.
13. The method as claimed in claim 1, wherein the step of determining the ranking result according to the waveform differences of the faulty outputs further comprises:
obtaining a maximum waveform difference among the waveform differences for each faulty output; and
sorting the maximum waveform differences of the faulty outputs to determine the ranking result.
14. The method as claimed in claim 1, wherein the step of determining the ranking result according to the waveform differences of the faulty outputs further comprises:
determining the ranking result by sorting a first faulty output and a second faulty output with a comparison function on the waveform differences, wherein the step of determining the ranking result by sorting the first and second faulty outputs further comprises:
comparing the waveform differences for the same signal of the first and second faulty outputs to obtain a larger waveform difference for each signal;
summing the larger waveform differences for the first and the second faulty outputs; and
determining the ranking result of the first and the second faulty outputs based on the summed larger waveform differences.
15. A system for ranking fault-test pairs comprising test programs to verify a design code, the system comprising:
a processing unit configured to run the test programs on the design code to:
obtain a first plurality of waveform statistics for a plurality of reference outputs of the design code;
obtain a second plurality of waveform statistics for a plurality of faulty outputs of the design code being injected with a fault,
obtain relative differences between the first plurality of waveform statistics and the second plurality of waveform statistics for each bit of each faulty output with respect to the corresponding reference output,
obtain a waveform difference between the relative differences for each signal of each faulty output, and
determine a ranking of fault-test pairs in response to the waveform differences of the faulty outputs; and

a display unit coupled to the processing unit and configured to display the ranking,
wherein each of the first plurality of waveform statistics comprises first value-change information regarding variations in logic HIGH and logic LOW for each bit of each reference output resulting from a test run of the design code, and each of the second plurality of waveform statistics comprises second value-change information regarding variations in logic HIGH and logic LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault.
16. The system as claimed in claim 15, wherein the first value-change information comprises a first value-change count representing the number of the value changes for each bit of each reference output, and the second value-change information comprises a second value-change count representing the number of the value changes for each bit of each faulty output.
17. The system as claimed in claim 16, wherein the first value-change information further comprises a first mean and a first standard deviation of durations of logic HIGH and logic LOW for each bit of each reference output, and the second value-change information further comprises a second mean and a second standard deviation of durations of logic HIGH and logic LOW for each bit of each faulty output.
18. The system as claimed in claim 17, wherein the first value-change information further comprises a tempo list and a first tempo occurrence ratio of durations of logic HIGH and logic LOW for each bit of each reference output, and the second value-change information further comprises a second tempo occurrence ratio of durations of logic HIGH and logic LOW corresponding to the tempo list of the first value-change information for each bit of each faulty output.
19. The system as claimed in claim 18, wherein a relative difference in the value-change count is obtained by the processing unit according to the first and second value-change counts for each bit in the faulty output with respect to the corresponding bit in the reference output; a relative difference in the mean is obtained by the processing unit according to the first and second means of durations of logic HIGH and logic LOW for each bit in the faulty output with respect to the corresponding bit in the reference output; a relative difference in the standard deviation is obtained by the processing unit according to the first and second standard deviations of durations of logic HIGH and logic LOW for each bit in the faulty output with respect to the corresponding bit in the reference output; and a relative difference in the tempo occurrence ratio is obtained by the processing unit according to the first and second tempo occurrence ratios for each bit in the faulty output with respect to the corresponding bit in the reference output.
20. The system as claimed in claim 19, wherein the relative difference in the value-change count is
\uf603
VC
\ue8a0

(
s
)
–

VC
\ue8a0

(
r
)
\uf604
VC
\ue8a0

(
r
)
,
the relative difference in the mean is
\uf603
M
\ue8a0

(
s
)
–

M
\ue8a0

(
r
)
\uf604
M
\ue8a0

(
r
)
,
the relative difference in the standard deviation is
\uf603
SD
\ue8a0

(
s
)
–

SD
\ue8a0

(
r
)
\uf604
SD
\ue8a0

(
r
)
,
and the relative difference in the tempo occurrence ratio is
\uf603
T
\ue8a0

(

s
,
r

)
–

T
\ue8a0

(
r
)
\uf604
T
\ue8a0