1. A glazing clip for fitting about the edge of a glazing unit, the glazing clip comprising means for interengaging with an ancillary element on at least one side of a glazing unit, in use.
2. A glazing clip as claimed in claim 1, wherein the glazing clip comprises means for interengaging with an ancillary element on both sides of a glazing unit.
3. A glazing clip as claimed in claim 1.
4. A glazing clip as claimed in claim 3, wherein the base of the U-shape extends across the edge of the glazing unit, in use, with each arm extending over the respective external face of the glazing panel on opposite sides thereof.
5. A glazing clip as claimed in claim 4, wherein the arms of the glazing clip are inclined from the perpendicular relative to the base, whereby in use the glazing clip is biased to the glazing unit.
6. A glazing clip as claimed in claim 1, wherein the interengaging means comprises an upstanding portion.
7. A glazing clip as claimed in claim 6, wherein the upstanding portion comprises a plurality of rebated portions.
8. A glazing clip as claimed in claim 6, wherein the upstanding portion comprises a mushroom formation.
9. A glazing clip as claimed in claim 1, wherein the glazing clip consists of a thermoplastic material.
10. A kit for the construction of an ancillary element on a glazing unit, the kit comprising a plurality of glazing clips according to claim 1.
11. A glazing clip as claimed in claim 10, the kit further comprises a cross-piece for interengaging with a first ancillary element in a first direction and with a second ancillary element in a second direction.
12. A glazing clip as claimed in claim 11, wherein the cross-piece comprises a first interengaging member for interengaging with a first ancillary element and a second interengaging member for interengaging with a second ancillary element.
13. A glazing clip as claimed in claim 12, wherein the cross-piece further comprises a third interengaging member for interengaging with a third ancillary element.
14. A glazing clip as claimed in claim 13, wherein the cross-piece is configured whereby a first ancillary element will be substantially perpendicular to a second and a third ancillary element.
15. A glazing clip as claimed in claim 13, wherein the first interengaging member is substantially similar in cross-section to the second interengaging member.
16. A glazing clip as claimed in claim 15, wherein the first interengaging member is substantially similar in cross-section to the third interengaging member.
17. A glazing clip as claimed in claim 13, wherein the first interengaging member is substantially perpendicular to the second interengaging member.
18. A glazing clip as claimed in claim 13, wherein the first interengaging member is substantially perpendicular to the third interengaging member.
19. A glazing clip as claimed in claim 10, wherein the glazing clips in the kit are substantially similar.
20. A glazing clip as claimed in claim 10, wherein the kit additionally comprises at least one ancillary element for interengaging with the glazing clips.
21. A glazing clip as claimed in claim 20, wherein the ancillary element is for a Georgian effect glazing assembly.
22. A glazing clip as claimed in claim 20, wherein the ancillary element is of substantially constant cross-section.
23. A glazing clip as claimed in claim 20, wherein the ancillary element comprises a female interengaging member for interengaging with a male interengaging member of a glazing clip.
24. A glazing clip as claimed in claim 20, wherein the ancillary element comprises a male interengaging member for interengaging with a female interengaging member of a glazing clip.
25. A glazing clip as claimed in claim 20, wherein the ancillary element comprises a lower face to be against a glazing panel in use, and the glazing clip is configured to interengage with the ancillary element in the lower face.
26. A glazing clip as claimed in claim 25, wherein the lower face has a longitudinal slot therein for receiving the glazing clip.
27. A glazing clip as claimed in claim 25, wherein the ancillary element and glazing clip interengage by a snap-fit connection.
28. A glazing assembly comprising a glazing unit about the edge of which is at least one glazing clip according to claim 1 and at least one ancillary element engaged with the glazing clip.
29. A glazing clip as claimed in claim 28, wherein the ancillary element is engaged with a first glazing clip and a second glazing clip after each has been placed about the glazing unit.
30. A glazing clip as claimed in claim 28, wherein the glazing assembly comprises a frame about the glazing unit.
31. A method of construction of a glazing assembly, the method comprising the steps of providing a glazing clip according to claim 1 to the edge of a glazing unit and engaging an ancillary element therewith.
32. A method of construction of a glazing assembly as claimed in claim 31 wherein a plurality of glazing clips are provided to support the ancillary element.
33. A method of construction of a glazing assembly as claimed in claim 31 or claim 32, wherein a plurality of ancillary elements are provided.
34. A method of construction of a glazing assembly as claimed in claim 33, wherein the ancillary elements are configured to meet and a cross-piece is provided to engage with ancillary elements in the region of the meeting of the ancillary elements.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A test apparatus for testing a device-under-test (DUT), comprising:
a pair of input pins, with the DUT coupled to one of said input pins;
a first conductive wire coupled between said input pins;
a second conductive wire coupled between said input pins;
a driver coupled to said first conductive wire via a third conductive wire, wherein a connecting point of said first conductive wire and said third conductive wire forms a first node for distinguishing said first conductive wire into a first sub conductive wire and a second sub conductive wire respectively coupled to said input pins; and
a terminator coupled to said second conductive wire via a fourth conductive wire.
2. The test apparatus in accordance with claim 1, wherein said third conductive wire and said fourth conductive wire have substantially the same impedance.
3. (canceled)
4. The test apparatus in accordance with claim 1, wherein said first sub conductive wire and said second sub conductive wire have substantially the same impedance.
5. The test apparatus in accordance with claim 1, wherein a connecting point of said second conductive wire and said fourth conductive wire forms a second node for distinguishing said second conductive wire into a third sub conductive wire and a fourth sub conductive wire respectively coupled to said input pins.
6. The test apparatus in accordance with claim 5, wherein said third sub conductive wire and said fourth sub conductive wire have substantially the same impedance.
7. The test apparatus in accordance with claim 1, wherein said terminator has a resistor and a voltage source connected in series.
8. A test method for testing a device-under-test (DUT), comprising steps of:
providing a pair of input pins, with the DUT coupled to one of said input pins;
providing a first conductive wire coupled between said input pins;
providing a second conductive wire coupled between said input pins;
providing a driver coupled to said first conductive wire via a third conductive wire, wherein a connecting point of said first conductive wire and said third conductive wire forms a first node for distinguishing said first conductive wire into a first sub conductive wire and a second sub conductive wire respectively coupled to said input pins; and
providing a terminator coupled to said second conductive wire via a fourth conductive wire.
9. The test method in accordance with claim 8, wherein said third conductive wire and said fourth conductive wire have substantially the same impedance.
10. (canceled)
11. The test method in accordance with claim 8, wherein said first sub conductive wire and said second sub conductive wire have substantially the same impedance.
12. The test method in accordance with claim 8, wherein a connecting point of said second conductive wire and said fourth conductive wire forms a second node for distinguishing said second conductive wire into a third sub conductive wire and a fourth sub conductive wire respectively coupled to said input pins.
13. The test method in accordance with claim 12, wherein said third sub conductive wire and said fourth sub conductive wire have substantially the same impedance.
14. A test apparatus for testing a device-under-test (DUT), comprising:
a first IO pin and a second IO pin, with the DUT coupled to said first IO pin;
a bus having a plurality of conductive wires, one of which is coupled between said first IO pin and said second IO pin;
a driver coupled to said first IO pin under an input mode;
a first terminator coupled to said first IO pin under an output mode;
a comparator coupled to said second IO pin; and
a second terminator coupled to said second IO pin under said output mode.
15. The test apparatus in accordance with claim 14, further comprising a first switch coupled between said first terminator and said first IO pin.
16. The test apparatus in accordance with claim 15, wherein said first terminator has a resistor and a voltage source connected in series.
17. The test apparatus in accordance with claim 14, further comprising a second switch coupled between said second terminator and said second IO pin.
18. The test apparatus in accordance with claim 17, wherein said second terminator has a resistor and a voltage source connected in series.
19. A test method for testing a first DUT and a second DUT, wherein said first DUT has a first effective pin and a first ineffective pin and said second DUT has a second effective pin and a second ineffective pin, the test method comprising the following steps of:
providing a first bus coupled between said first effective pin and said second ineffective pin; and
providing a second bus couple between said first ineffective pin and said second effective pin;
wherein, when said first DUT is being tested, said second ineffective pin is left floating; when said second DUT is being test, said first ineffective pin is left floating.
20. (canceled)