1. A word line block select circuit comprising:
a dummy repair logic unit including a dummy logic circuit configured to output a first control signal and having a first delay path for a repair address decision; and
a word line activation unit for activating a word line in response to the first control signal and an active command signal.
2. The circuit of claim 1, wherein the first control signal is activated when an output signal of the dummy logic circuit is activated.
3. The circuit of claim 1, wherein said first delay path of the dummy repair logic unit is a same as a second delay path of a repair address decision circuit for the repair address decision.
4. The circuit of claim 1, wherein the word line activation unit includes:
a repair address decision unit for performing the repair address decision to decide whether an inputted address is a repair address;
a word line block select unit for outputting a word line block select signal in response to the active command signal, the first control signal and an output signal of the repair address decision unit;
a normal word line decoder for outputting a decoding signal to drive a normal word line in response to an output signal of the word line block select unit; and
a redundancy word line decoder for outputting a decoding signal to drive a redundancy word line in response to the output signal of the repair address decision unit.
5. The circuit of claim 4, wherein the word line block select unit includes:
a control unit driven in response to the active command signal and the first control signal; and
an operation unit for performing a logic operation in response to an output signal of the control unit and the output signal of the repair address decision unit.
6. The circuit of claim 5, wherein the control unit includes:
a first driving unit driven in response to the active command signal; and
a second driving unit driven in response to the first control signal.
7. The circuit of claim 6, wherein the first driving unit includes:
a pull-up unit for pull-up driving an output node of the first driving unit in response to the active command signal; and
a pull-down unit for pull-down driving the output node of the first driving unit in response to the active command signal.
8. The circuit of claim 6, wherein the second driving unit includes a pull-down unit for pull-down driving an output node of the first driving unit in response to the first control signal.
9. The circuit of claim 5, wherein the operation unit includes a logic element for performing a NAND operation in response to the output signal of the control unit and the output signal of the repair address decision unit.
10. The circuit of claim 5, further comprising a latch unit for latching the output signal of the control unit.
11. The circuit of claim 5, further comprising a buffer unit for buffering an output signal of the operation unit.
12. A word line block select circuit comprising:
a dummy repair logic unit including a dummy logic circuit to output a first control signal and having a first delay path for a repair address decision;
a repair address decision unit for performing the repair address decision to decide whether an inputted address is a repair address;
a word line block select unit for outputting a word line block select signal in response to an active command signal, the first control signal and an output signal of the repair address decision unit;
a normal word line decoder for outputting a decoding signal to drive a normal word line in response to an output signal of the word line block select unit; and
a redundancy word line decoder for outputting a decoding signal to drive a redundancy word line in response to the output signal of the repair address decision unit.
13. The circuit of claim 12, wherein the first control signal is activated when the output signal of the repair address decision unit is activated.
14. The circuit of claim 12, wherein the first delay path of the dummy repair logic unit is a same as a second delay path of the repair address decision unit.
15. The circuit of claim 12, wherein the word line block select unit includes:
a control unit driven in response to the active command signal and the first control signal; and
an operation unit for performing a logic operation in response to an output signal of the control unit and the output signal of the repair address decision unit.
16. The circuit of claim 15, wherein the control unit includes:
a first driving unit driven in response to the active command signal; and
a second driving unit driven in response to the first control signal.
17. The circuit of claim 16, wherein the first driving unit includes:
a pull-up unit for pull-up driving an output node of the first driving unit in response to the active command signal; and
a pull-down unit for pull-down driving the output node of the first driving unit in response to the active command signal.
18. The circuit of claim 16, wherein the second driving unit includes a pull-down unit for pull-down driving an output node of the first driving unit in response to the first control signal.
19. The circuit of claim 15, wherein the operation unit includes a logic element for performing a NAND operation in response to the output signal of the control unit and the output signal of the repair address decision unit.
20. The circuit of claim 15, further comprising a latch unit for latching the output signal of the control unit.
21. The circuit of claim 15, further comprising a buffer unit for buffering an output signal of the operation unit.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method for machining a workpiece, the method comprising:
guiding a conductor, which carries a time-variable current along its longitudinal axis, by an upper guide and a lower guide, a magnetic field being produced by an external source and applied to the conductor between the guides; and
locating the upper guide at a first distance above the magnetic field and the lower guide at a second distance below the magnetic field;
wherein the magnetic field causes a lateral movement of the conductor between the guides and a corresponding lateral movement of an end of the conductor; and
wherein the magnetic field is rotated.
2. The method of claim 1, wherein a selection of at least one of the first distance and the second distance causes an amplitude of a movement of an end of the conductor to be regulated.
3. The method of claim 1, wherein at least one of the first distance and the second distance is changed.
4. The method of claim 1, wherein an electrical field is present between an end of the conductor and a machining location of the workpiece, and material is removed from the workpiece at the machining location in the presence of a machining fluid.
5. The method of claim 1, wherein a pulsed current is passed through the conductor.
6. The method of claim 1, wherein a direction of the current is changed.
7. The method of claim 1, wherein the rotation of the magnetic field changes a direction of the lateral movement of the conductor between the guides and the corresponding lateral movement of the end of the conductor.
8. The method of claim 7, wherein a plurality of hole shapes are produced in the workpiece via the changing of the direction of the corresponding lateral movement of the end of the conductor in accordance with the rotation of the magnetic field.
9. A device for machining a workpiece comprising:
a guiding arrangement for guiding a conductor, which carries a time-variable current along its longitudinal axis, by an upper guide and a lower guide, a magnetic field being produced by an external source, which includes at least one rotatable magnet., and applied to the conductor between the guides; and
a positioning arrangement for positioning the upper guide at a first distance above the magnetic field and the lower guide at a second distance below the magnetic field;
wherein the magnetic field produced by the external source causes a lateral movement of the conductor between the guides and a corresponding lateral movement of an end of the conductor.
10. The device of claim 9, wherein at least one of the two guides is movable.
11. The device of claim 9, wherein a source produces a time-variable current flowing through the conductor.
12. The device of claim 9, wherein rotation of the magnetic field produced by the external source changes .a direction of the lateral movement of the conductor between the guides and the corresponding lateral movement of the end of the conductor.
13. The device of claim 12, wherein a plurality of hole shapes are produced in the workpiece via the changing of the direction of the corresponding lateral movement of the end of the conductor in accordance with the rotation of the magnetic field produced by the external source.