1. A system, comprising:
a ceramic lamp, comprising:
a ceramic arc envelope;
an end structure graded both axially and radially into a plurality of regions comprising a first ceramic region, a second cermet region, and a third cermet region extending about one another in both axial and radial directions relative to an axis and are generally diffused with one another at interfaces between the plurality of regions;
the first ceramic layer diffusion bonded to the ceramic arc envelope;
a lead wire extending entirely through the third cermet region and diffusion bonded to the second cermet region; and
an arc electrode extending entirely through the first ceramic region and diffusion bonded to the second cermet region, wherein
the lead wire and the arc electrodes penetrate the end structure without extending entirely through the end structure; and
at least two of the plurality of regions have non-uniform thicknesses.
2. The system of claim 1, wherein the plurality of regions comprise different materials having different coefficients of thermal expansion, Poisson’s ratios, or elastic moduli, or a combination thereof.
3. The system of claim 1, wherein the end structure comprises a cermet-ceramic, wherein a volume fraction of metal is changed from a low to a high either continuously or in steps from the inside to the outside of the end structure.
4. The system of claim 3, wherein the number of regions is selected such that the thermal stress generated within the end structure is not significant to cause cracking.
5. The system of claim 1, wherein the end structure comprises a passage compressively fit about a dosing tube.
6. The system of claim 1, wherein the ceramic arc envelope comprises a ceramic arc tube having first and second ends, the end structure comprises a first end plug disposed into the first end, a second end plug is disposed into the second end, the arc electrode is coupled to the first end plug and disposed as a first arc electrode, a further, second arc electrode is coupled to the second end plug, and both the first and second end plugs comprise a plurality of different materials disposed axially and radially about one another.
7. The system of claim 1, comprising a video projector, a vehicle light, a vehicle, or a street light having the ceramic lamp.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A workpiece de-chucking device of a plasma reactor, the device comprising:
a lifting unit for, in response to a lift control signal, lifting a workpiece mounted on a top surface of an ElectroStatic Chuck (ESC) and, when the workpiece is lifted, supporting the workpiece such that a gap between a central part of a bottom surface of the workpiece and the top surface of the ESC is maintained in the same state as a gap between an edge part of the bottom surface of the workpiece and the top surface of the ESC;
an Inductively Coupled Plasma (ICP) source power unit comprising an inductive coil and a Radio Frequency (RF) power source supply unit, the inductive coil being arranged outside a dielectric window installed at a top of a reaction chamber having the ESC, and forming a magnetic field when an RF power source is supplied, and the RF power source supply unit supplying the RF power source to the inductive coil in response to a source power control signal; and
a controller for controlling an operation of the plasma reactor comprising the reaction chamber and, for the sake of de-chucking the workpiece, outputting the source power control signal, the lift control signal, and a de-chucking control signal, and controlling a mass flow of a de-chuck gas injected into the reaction chamber during the de-chucking of the workpiece and a pressure of the reaction chamber, wherein, as the de-chuck gas is injected into the reaction chamber and the inductive coil forms the magnetic field, antistatic and cleaning plasma is generated in the reaction chamber, in response to the de-chucking control signal, a chucking power source supply unit stops supplying a chucking power source to an electrode of the ESC and connects the electrode of the ESC to the ground, and when the workpiece is lifted by the lifting unit, the antistatic and cleaning plasma permeates into a space between the workpiece and the ESC, promotes discharge of charges existing between the workpiece and the ESC, dry-cleans a surface of the ESC and the inside of the reaction chamber, and eliminates fine dust generated while the workpiece is de-chucked from the ESC by the lifting unit.
2. The device of claim 1, wherein, for the sake of a workpiece etching process, the controller outputs the source power control signal and a chucking control signal, and controls a mass flow of an etching gas injected into the reaction chamber during the etching process and the pressure of the reaction chamber, as the etching gas is injected into the reaction chamber and the inductive coil forms the magnetic field, etching plasma is generated within the reaction chamber, and in response to the chucking control signal, the chucking power source supply unit supplies the chucking power source to the electrode of the ESC.
3. The device of claim 1, wherein, when the workpiece is de-chucked, the controller outputs the source power control signal to the RF power source supply unit, outputs the de-chucking control signal to a chucking power source supply unit, and then outputs the lift control signal to the lifting unit, and in response to the source power control signal, the RF power source supply unit supplies the RF power source of a reference power value to the inductive coil.
4. The device of claim 3, wherein the controller comprises a storage space for storing the reference power value and a de-chucking power value and, when the reference power value is not the same as the de-chucking power value, further outputs a power control signal to the RF power source supply unit before outputting the lift control signal to the lifting unit, and in response to the power control signal, the RF power source supply unit changes a power value of the RF power source supplied to the inductive coil into the de-chucking power value.
5. The device of claim 1, wherein the controller further outputs a fall control signal to the lifting unit, in response to the fall control signal, the lifting unit gets the workpiece to descend until the workpiece gets in contact with the top surface of the ESC, after executing at least once an operation of alternatively outputting the lift control signal and the fall control signal with a set delay time difference, the controller again outputs the lift control signal, and under control of the controller, after executing at least once an ascent and descent operation of the workpiece, the lifting unit lifts the workpiece in response to the lift control signal that the controller again outputs.
6. The device of claim 5, wherein the set delay time is a time (T) meeting the condition of 0<T\u22660.6 seconds.
7. The device of claim 5, wherein the lifting unit gets the workpiece to ascend or descend at a speed of a range of X(3.125 mms\u2266X\u226612.5 mms).
8. The device of claim 1, wherein the lifting unit comprises:
a plurality of lift pins installed passing through the ESC and, when the workpiece is lifted, supporting the bottom surface of the workpiece at their one ends;
a lift pin support installed below the ESC, and coupled to the other ends of the plurality of lift pins and supporting the plurality of lift pins;
a cylinder comprising a piston coupled to the lift pin support, and moving the piston by a pressure of air injected from the external and lifting the lift pin support; and
a cylinder driver for injecting air into the cylinder in response to the lift control signal, wherein, as the cylinder lifts the lift pin support, the plurality of lift pins ascend.
9. The device of claim 8, wherein, on the basis of sense information of a lift sensor installed at an upper part of one side of the cylinder and sensing the piston within the cylinder, the controller recognizes a time point at which the ascending of the lift pin is completed and, after the ascending of the lift pin is completed and a set delay time, the controller outputs a source power off signal to the RF power source supply unit, in response to the source power off signal, the RF power source supply unit stops supplying the RF power source to the inductive coil, and during the set delay time, the antistatic and cleaning plasma keeps dry-cleaning the surface of the ESC.
10. The device of claim 1, wherein the de-chuck gas comprises argon (Ar), oxygen (O2), or a mixture of argon (Ar) and oxygen (O2).