1. A method in an electronic device, the method comprising:
extracting a pattern and converting the extracted pattern into a first pattern of a binarized grid type;
verifying pixel information of the first pattern; and
determining whether the first pattern is identical to an original pattern in consideration of a similar degree between the pixel information of the first pattern and pixel information of the original pattern.
2. The method of claim 1, wherein the pixel information includes color information of pixels, the number of the pixels, and arrangement information of the pixels included in at least one horizontal row or vertical column.
3. The method of claim 1, wherein the verification of the pixel information comprises expressing the pixel information as a descriptor structure to include \u201c<a color of a first pixel of a horizontal row or vertical column>;0;<a position of a pixel whose color is changed>;<the number of pixels of the horizontal row or vertical column><a delimiter>\u201d.
4. The method of claim 1, wherein the determination whether the extracted pattern is identical to the original pattern comprises comparing pixel information about the reference number of horizontal rows or vertical columns among all horizontal rows or vertical columns of the first pattern with pixel information about the reference number of horizontal rows or vertical columns among all horizontal rows or vertical columns of the original pattern and determining whether the first pattern is identical to the original pattern.
5. The method of claim 1, wherein the determination whether the extracted pattern is identical to the original pattern comprises:
comparing pixel information about each of horizontal rows or vertical columns of the first pattern with pixel information about each of horizontal rows or vertical columns of the original pattern; and
determining that the first pattern is identical to the original pattern when the number of horizontal rows or vertical columns comprising a reference similar degree or more is greater than or equal to the reference number of horizontal rows or vertical columns among each of horizontal rows or vertical columns of the first pattern and the original pattern.
6. The method of claim 1, further comprising verifying whether there is a position determination element in the first pattern in response to a determination that the first pattern is not identical to the original pattern.
7. The method of claim 6, wherein verifying whether there is the position determination element comprises verifying whether there are pixels of a previously defined size in a previously defined position of the first pattern.
8. The method of claim 7, further comprising rotating the first pattern at a previously defined angle in a previously defined direction when the position determination element is not in the first pattern.
9. The method of claim 8, further comprising determining whether the rotated first pattern is identical to the original pattern in consideration of a similar degree between pixel information of the rotated first pattern and the pixel information of the original pattern.
10. An electronic device comprising:
at least one processor; and
at least one memory,
wherein at least the one processor is configured to extract a pattern, convert the extracted pattern into a first pattern of a binarized grid type, verify pixel information of the first pattern, and determine whether the first pattern is identical to an original pattern in consideration of a similar degree between the pixel information of the first pattern and pixel information of the original pattern.
11. The electronic device of claim 10, wherein the pixel information includes color information of pixels, the number of the pixels, and arrangement information of the pixels included in at least one horizontal row or vertical column.
12. The electronic device of claim 10, wherein at least the one processor is further configured to express the pixel information as a descriptor structure to include \u201c<a color of a first pixel of a horizontal row or vertical column>;0;<a position of a pixel whose color is changed>;<the number of pixels of the horizontal row or vertical column><a delimiter>\u201d.
13. The electronic device of claim 10, wherein at least the one processor is further configured to compare pixel information about the reference number of horizontal rows or vertical columns among all horizontal rows or vertical columns of the first pattern with pixel information about the reference number of horizontal rows or vertical columns among all horizontal rows or vertical columns of the original pattern and determines whether the first pattern is identical to the original pattern.
14. The electronic device of claim 10, wherein at least the one processor is further configured to compare pixel information about each of horizontal rows or vertical columns of the first pattern with pixel information about each of horizontal rows or vertical columns of the original pattern and determines that the first pattern is identical to the original pattern when the number of horizontal rows or vertical columns comprising a reference similar degree or more is greater than or equal to the reference number of horizontal rows or vertical columns among each of horizontal rows or vertical columns of the first pattern and the original pattern.
15. The electronic device of claim 10, wherein at least the one processor is further configured to verify whether there is a position determination element in the first pattern in response to a determination that the first pattern is not identical to the original pattern.
16. The electronic device of claim 15, wherein at least the one processor is further configured to verify whether there are pixels of a previously defined size in a previously defined position of the first pattern and verify whether there is the position determination element in the first pattern.
17. The electronic device of claim 16, wherein at least the one processor is further configured to rotate the first pattern at a previously defined angle in a previously defined direction when the position determination element is not in the first pattern.
18. The electronic device of claim 17, wherein at least the one processor is further configured to determine whether the rotated first pattern is identical to the original pattern in consideration of a similar degree between pixel information of the rotated first pattern and the pixel information of the original pattern.
19. A non-transitory computer-readable storage medium encoded with computer-executable instructions that when executed cause a data processing system to perform the steps of:
extracting a pattern and converting the extracted pattern into a first pattern of a binarized grid type;
verifying pixel information of the first pattern; and
determining whether the first pattern is identical to an original pattern in consideration of a similar degree between the pixel information of the first pattern and pixel information of the original pattern.
20. The computer-readable storage medium of claim 19, wherein the pixel information includes color information of pixels, the number of the pixels, and arrangement information of the pixels included in at least one horizontal row or vertical column.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A method comprising:
(i) preparing a 2099 aluminum alloy for artificial aging, the preparing comprising:
a. solution heat treating the 2099 aluminum alloy at a temperature of at least 800\xb0 F.; and
b. quenching the 2099 aluminum alloy; and
(ii) artificially aging the 2099 aluminum alloy, the artificial aging comprising:
c. aging the 2099 aluminum alloy at a temperature of at least 250\xb0 F.; and
d. final aging the 2099 aluminum alloy at a temperature of from 165\xb0 to not greater than 225\xb0 F. and for a duration such that the 2099 aluminum alloy realizes:
(1) at least a 3% increase in tensile yield strength as compared to a similar aluminum alloy; and
(2) better fatigue crack growth resistance as compared to the similar aluminum alloy;
wherein the artificial aging step (ii) is completed such that the volume fraction of delta prime phase within the 2099 aluminum alloy increases during the final aging step, and wherein the claimed tensile yield strength increase and better fatigue crack growth resistance properties are realized due to such increase in the volume fraction of the delta prime phase;
wherein the similar aluminum alloy is of identical composition relative to the 2099 aluminum alloy;
wherein the similar aluminum alloy and the 2099 aluminum alloy are prepared identically for artificial aging; and
wherein the similar aluminum alloy is artificially aged in the same manner as the 2099 aluminum alloy, but in the absence of the final aging step (ii)(d).
2. The method of claim 1, wherein the artificially aging step (ii) comprises:
second aging the 2099 aluminum alloy at a temperature in the range of from 250\xb0 F. to 330\xb0 F. wherein the second aging occurs after the aging step (ii)(c) and before the final aging step (ii)(d).
3. The method of claim 1, wherein the final aging step (ii)(d) is completed at a temperature that is lower than any previous artificial aging step.
4. The method of claim 1, wherein the final aging step (ii)(d) occurs at a temperature of at least 175\xb0 F.
5. The method of claim 1, wherein the duration of the final aging step (ii)(d) is not greater than 1,000 hours.
6. The method of claim 1, wherein the duration of the final aging step (ii)(d) is not greater than 500 hours.
7. The method of claim 1, wherein the duration of the final aging step (ii)(d) is not greater than 150 hours.
9. The method of claim 1, wherein the 2099 aluminum alloy is a first plate product, wherein the similar aluminum alloy is a similar plate product, wherein the fatigue crack growth resistance is constant amplitude fatigue crack growth resistance (CAFCGR), and wherein the first plate product exhibits:
(1) at least a 3% increase in tensile yield strength as compared to the similar plate product; and
(2) better CAFCGR as compared to the similar plate product, wherein the CAFCGR is measured at a \u0394K in the range of from 11 MPa\u221am to 30 MPa\u221am.
10. The method of claim 9, wherein the \u0394K is not greater than 25 MPa\u221am.
11. The method of claim 10, wherein the first plate product has a crack growth rate (dadN) that is at least 5% lower than the similar plate product at an equivalent \u0394K.
12. The method of claim 1, wherein the 2099 aluminum alloy is a first plate product, wherein the similar aluminum alloy is a similar plate product, wherein the fatigue crack growth is spectrum fatigue crack growth resistance (SFCGR), and wherein the first plate product exhibits:
(1) at least a 3% increase in tensile yield strength when compared to a similar plate product; and
(2) better SFCGR when compared to the similar plate product.
13. The method of claim 12, wherein the first plate product realizes at least a 1% increase in spectrum flights between a half crack length of 25 mm (0.98 inch) and 65 mm (2.56 inches) as compared to the similar plate product.
14. The method of claim 1, wherein the 2099 aluminum alloy is a first sheet product, wherein the similar aluminum alloy is a similar sheet product, wherein the fatigue crack growth is constant amplitude fatigue crack growth resistance (CAFCGR), and wherein the first sheet product exhibits:
(1) at least a 3% increase in tensile yield strength as compared to the similar sheet product; and
(2) at least one of:
(A) better L-T CAFCGR as compared to the similar sheet product and at a \u0394K in the range of from 10 MPa\u221am to 45 MPA\u221am; and
better T-L CAFCGR as compared to the similar sheet product and at a \u0394K in the range of front 10 to 45 MPa\u221am.
15. The method of claim 14, wherein the \u0394K is not greater than 25 MPa\u221am.