1. An equivalent material constant calculation system that calculates an equivalent material constant of a structure constituted by a plurality of materials, comprising:
a shape data input portion that inputs shape data that expresses the shape of each material constituting the structure,
a material data input portion that inputs material constant data that expresses a material constant of at least one of the materials constituting the structure,
a dividing portion that divides the structure into a plurality of small regions,
a representative material determining portion that determines a material positioned in a position that is predefined in each of the plurality of the small regions as a material that represents each of the plurality of the small regions,
a material constant selection portion that selects the material constant of the material that represents the respective small regions from the material constant data, and
a combining portion that calculates an equivalent material constant for a region in which a plurality of the small regions that are adjacent are combined with respect to at least one direction, by combining the material constant of the representative material of the plurality of adjacent small regions in at least one direction.
2. The equivalent material constant calculation system of claim 1, further comprising:
a small region interior calculation portion that calculates constituent ratios of the materials included in the small regions based on the shape data, and calculates equivalent material constants in the small regions based on the constituent ratios and the material constant data.
3. The equivalent material constant calculation system according to claim 2, wherein the combining portion obtains the equivalent material constant for a region in which a plurality of the small regions that are adjacent are combined, by deeming the equivalent material constant for each of the plurality of small regions to be a mutually connected resistance, and obtaining a combined resistance.
4. A design system that includes the equivalent material constant calculation system according to claim 2, comprising:
a storage portion that stores design data of the structure including the shape data and the material constant data,
an analysis portion that analyzes and outputs the flow of heat, stress distribution, electromagnetic fields, or hydrokinetics of the structure, by simulation based on the equivalent material constant of the structure calculated by the equivalent material constant calculation system and the design data, and
a design modification portion that modifies the design data of the storage portion based on a command to modify the design data from a designer.
5. The equivalent material constant calculation system according to claim 1, wherein the combining portion obtains the equivalent material constant by deeming the material constant of the material that represents the respective small regions in the plurality of adjacent small regions to be a mutually connected resistance, and obtaining a combined resistance.
6. The equivalent material constant calculation system according to claim 1, wherein the structure is an electronic circuit board, and the dividing portion divides the structure into small regions whose maximum width is not greater than the minimum width of wire formed on the electronic circuit board.
7. A design system that includes the equivalent material constant calculation system according to claim 1, comprising:
a storage portion that stores design data of the structure including the shape data and the material constant data,
an analysis portion that analyzes and outputs the flow of heat, stress distribution, electromagnetic fields, or hydrokinetics of the structure, by simulation based on the equivalent material constant of the structure calculated by the equivalent material constant calculation system and the design data, and
a design modification portion that modifies the design data of the storage portion based on a command to modify the design data from a designer.
8. An equivalent material constant calculation method that calculates an equivalent material constant of a structure constituted by a plurality of materials using a computer, comprising:
a shape data input step in which a shape data input portion provided by the computer inputs shape data that expresses the shape of each material constituting the structure,
a material data input step in which a material data input portion provided by the computer inputs material constant data that expresses a material constant of at least one of the materials constituting the structure,
a dividing step in which a dividing portion provided by the computer divides the structure into a plurality of small regions,
a representative material determining step in which a representative material determining portion provided by the computer determines a material positioned in a position that is predefined in each of the plurality of the small regions as a material that represents respective small regions for each of the plurality of small regions,
a material constant selection step in which a material constant selection portion provided by the computer selects the material constant of the material that represents the respective small regions from the material constant data, and
a combining step in which a combining portion provided by the computer calculates an equivalent material constant for a region in which a plurality of the small regions that are adjacent are combined with respect to at least one direction, by combining the material constant of the representative material of the plurality of adjacent small regions in at least one direction.
9. The equivalent material constant calculation method according to claim 8, further comprising,
a small region interior calculation step in which a small region interior calculation portion provided by the computer calculates a constituent ratio of the materials included in the small region based on the shape data, and calculates an equivalent material constant for the small region based on the constituent ratio and the material constant data.
10. A structure manufacturing method that, using a computer that can access a storage device in which a plurality of design data of a structure constituted by a plurality of materials is stored, manufactures the structure, comprising:
a calculating step in which the computer calculates an equivalent material constant of the structure by the equivalent material constant calculation method according to claim 9,
an analysis step in which an analysis portion provided by the computer analyzes the flow of heat, stress distribution, electromagnetic field, or hydrokinetics of the structure, by simulation based on the equivalent material constant and the design data,
a design data selection step in which a design data selection portion provided by the computer selects design data from among the plurality of design data based on the analysis results obtained by the analysis step for a structure expressed by the plurality of design data stored in the storage device, and
a manufacturing step in which a CAM, connected such that data communications is possible with the computer, manufactures a structure based on the design data selected by the design data selection portion.
11. A structure manufacturing method that, using a computer that can access a storage device in which a plurality of design data of a structure constituted by a plurality of materials is stored, manufactures the structure, comprising:
a calculating step in which the computer calculates an equivalent material constant of the structure by the equivalent material constant calculation method according to claim 8,
an analysis step in which an analysis portion provided by the computer analyzes the flow of heat, stress distribution, electromagnetic field, or hydrokinetics of the structure, by simulation based on the equivalent material constant and the design data,
a design data selection step in which a design data selection portion provided by the computer selects design data from among the plurality of design data based on the analysis results obtained by the analysis step for a structure expressed by the plurality of design data stored in the storage device, and
a manufacturing step in which a CAM, connected such that data communications are possible with the computer, manufactures a structure based on the design data selected by the design data selection portion.
12. A storage medium storing an equivalent material constant calculation program that allows a computer to execute processing that calculates an equivalent material constant of a structure constituted by a plurality of materials, the processing comprising:
shape data input processing that inputs shape data that expresses the shape of each material constituting the structure,
material data input processing that inputs material constant data that expresses a material constant of at least one of the materials constituting the structure,
dividing processing that divides the structure expressed by the shape data into a plurality of small regions,
representative material determining processing that determines a material positioned in a position that is predefined in each of the plurality of the small regions as a material that represents respective small regions for each of the plurality of small regions,
material constant selection processing that selects the material constant of the material that represents the respective small regions from the material constant data, and
combining processing that calculates an equivalent material constant for a region in which a plurality of the small regions that are adjacent are combined with respect to at least one direction, by combining the material constant of the representative material of the plurality of adjacent small regions in at least one direction.
13. The storage medium storing an equivalent material constant calculation program that allows a computer to execute processing that calculates an equivalent material constant of a structure constituted by a plurality of materials according to claim 12, the processing further comprising:
small region interior calculation processing that calculates constituent ratios of the materials included in the small region based on the shape data, and calculates an equivalent material constant for the small region based on the constituent ratio and the material constant data.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An unevenness inspection system comprising:
an image pickup section configured to acquire a picked-up image of an inspection target;
an image generation section configured to generate a color-unevenness inspection image and a luminance-unevenness inspection image, based on the picked-up image;
a calculation section configured to use both of the color-unevenness inspection image and the luminance-unevenness inspection image to calculate an evaluation parameter; and
an inspection section configured to use the calculated evaluation parameter to perform unevenness inspection, wherein
the image generation section performs image separation processing to separate a color component and a luminance component on the picked-up image, to generate a color-component image and a luminance-component image, and individually performs filter processing taking account of visual spatial frequency characteristics on the color-component image and the luminance-component image to respectively generate the color-unevenness inspection image and the luminance-unevenness inspection image, based on the filter-processed color-component image and the filter-processed luminance-component image, and
the calculation section calculates the evaluation parameter in consideration of unevenness visibility with respect to both of color and luminance.
2. The unevenness inspection system according to claim 1, wherein
the calculation section uses the color-unevenness inspection image to calculate a color-unevenness evaluation parameter and uses the luminance-unevenness inspection image to calculate a luminance-unevenness evaluation parameter, and weights and adds the color-unevenness evaluation parameter and the luminance-unevenness evaluation parameter to calculate an integrated evaluation parameter as the evaluation parameter.
3. The unevenness inspection system according to claim 2, wherein
the integrated evaluation parameter E is represented by following expression (1), and weighting coefficients A and B are determined in consideration of the unevenness visibility,
E=A\xd7Ec+B\xd7El\u2003\u2003(1)
where Ec represents the color-unevenness evaluation parameter, El represents the luminance-unevenness evaluation parameter, and A and B represent the weighting coefficients.
4. The unevenness inspection system according to claim 2, wherein
the inspection section determines that a degree of unevenness in the inspection target is large, based on increase of the integrated evaluation parameter, and determines that the degree of unevenness in the inspection target is small, based on decrease of the integrated evaluation parameter.
5. The unevenness inspection system according to claim 1, wherein
the image generation section performs correction processing taking account of difference of color-unevenness visibility depending on colors, on the filter-processed color-component image, and then generates the color-unevenness inspection image.
6. The unevenness inspection system according to claim 5, wherein
the image generation section calculates chroma after performing the correction processing, in each unit region of the filter-processed color-component image, and uses the calculated chroma to generate the color-unevenness inspection image.
7. The unevenness inspection system according to claim 6, wherein
the image generation section calculates values (a*, b*) in CIELAB color space in each unit region of the filter-processed color-component image, and performs gain correction processing that is represented by following expression (2) as the correction processing, on the calculated value a*, and then calculates chroma C with use of following expression (3),
a*\u2032=(\u03b1\xd7a*) (for a*>0: gain \u03b1>1, f or a*\u22660: gain \u03b1=1)\u2003\u2003(2)
C={(a*\u2032)2+(b*)2}12\u2003\u2003(3)
8. The unevenness inspection system according to claim 2, wherein
as the color-unevenness evaluation parameter, at least a chroma edge area ratio that is an area ratio of a chroma edge region to entire region of the inspection target and a color-unevenness area ratio that is an area ratio of a color-unevenness region to the entire region of the inspection target are used.
9. The unevenness inspection system according to claim 8, wherein
as the color-unevenness evaluation parameter, the chroma edge area ratio, the color-unevenness area ratio, and a maximum chroma in the entire color-unevenness region are used.
10. The unevenness inspection system according to claim 9, wherein
the calculation section uses the color-unevenness inspection image to calculate the chroma edge area ratio, the color-unevenness area ratio, and the maximum chroma, and weights and adds the chroma edge area ratio, the color-unevenness area ratio, and the maximum chroma to calculate the color-unevenness evaluation parameter.
11. The unevenness inspection system according to claim 2, wherein
as the luminance-unevenness evaluation parameter, at least a luminance edge area ratio that is an area ratio of a luminance edge region to entire region of the inspection target and a luminance-unevenness area ratio that is an area ratio of a luminance-unevenness region to the entire region of the inspection target are used.
12. The unevenness inspection system according to claim 11, wherein
as the luminance-unevenness evaluation parameter, the luminance edge area ratio, the luminance-unevenness area ratio, and a maximum luminance difference are used, the maximum luminance difference being a maximum value of an absolute value of a difference between luminance in the entire luminance-unevenness region and average luminance of a white image.
13. The unevenness inspection system according to claim 12, wherein
the calculation section uses the luminance-unevenness inspection image to calculate the luminance edge area ratio, the luminance-unevenness area ratio, and the maximum luminance difference, and weights and adds the luminance edge area ratio, the luminance-unevenness area ratio, and the maximum luminance difference to calculate the luminance-unevenness evaluation parameter.
14. The unevenness inspection system according to claim 1, wherein
one or more of the image generation section, the calculation section, and the inspection section are provided in a single server, and
the image pickup section is provided in each of one or a plurality of image pickup apparatuses that are directly or indirectly connected to the server through network.
15. The unevenness inspection system according to claim 14, wherein
the image pickup apparatus is provided for every plurality of steps in manufacturing the inspection target, and
unevenness inspection by the inspection section is performed individually for every plurality of steps.
16. The unevenness inspection system according to claim 15, further comprising
a management section connected to the network and configured to collectively manage results of the unevenness inspection performed for every plurality of steps.
17. The unevenness inspection system according to claim 14, wherein
the image generation section, the calculation section, and the inspection section are provided in the server, and the image pickup section is provided in each of the one or the plurality of image pickup apparatuses, and
the picked-up image is supplied from the image pickup apparatus to the server through the network, and result data of the unevenness inspection is supplied from the server to the image pickup apparatus through the network.
18. The unevenness inspection system according to claim 1, wherein
the inspection target is a display screen of a display unit performing color picture display.
19. An unevenness inspection method comprising:
a step of acquiring a picked-up image of an inspection target;
a generation step of generating a color-unevenness inspection image and a luminance-unevenness inspection image, based on the picked-up image;
a calculation step of using both of the color-unevenness inspection image and the luminance-unevenness inspection image to calculate an evaluation parameter; and
an inspection step of using the calculated evaluation parameter to perform unevenness inspection, wherein
in the generation step, image separation processing to separate a color component and a luminance component is performed on the picked-up image to generate a color-component image and a luminance-component image, and filter processing taking account of visual spatial frequency characteristics is individually performed on the color-component image and the luminance-component image to respectively generate the color-unevenness inspection image and the luminance-unevenness inspection image, based on the filter-processed color-component image and the filter-processed unevenness-component image, and
in the calculation step, the evaluation parameter is calculated in consideration of unevenness visibility with respect to both of color and luminance.
20. An unevenness inspection program causing a computer to execute:
a step of acquiring a picked-up image of an inspection target;
a generation step of generating a color-unevenness inspection image and a luminance-unevenness inspection image, based on the picked-up image;
a calculation step of using both of the color-unevenness inspection image and the luminance-unevenness inspection image to calculate an evaluation parameter; and
an inspection step of using the calculated evaluation parameter to perform unevenness inspection, wherein
in the generation step, image separation processing to separate a color component and a luminance component is performed on the picked-up image to generate a color-component image and a luminance-component image, and filter processing taking account of visual spatial frequency characteristics is individually performed on the color-component image and the luminance-component image to respectively generate the color-unevenness inspection image and the luminance-unevenness inspection image, based on the filter-processed color-component image and the filter-processed luminance-component image, and
in the calculation step, the evaluation parameter is calculated in consideration of unevenness visibility with respect to both of color and luminance.